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WO/1993/007444A1 |
An apparatus (102) and method for detecting the position of a piston and piston rod (104, 106) within a housing (108) of a hydraulic cylinder (110). The piston (104), piston rod (106), and housing (108) form first and second coaxial reso...
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WO/1993/005388A1 |
In an apparatus for detecting the accumulation of particulate material on a filter medium formed of dielectric material and disposed in a chamber, the apparatus being operable for generating and transmitting an RF signal through the filt...
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WO/1993/005359A1 |
Disclosed is a method/apparatus to determine any one of a plurality of parameters: shape, area, chemical composition, diameter, colour, number, thickness, width, length, absorptivity, reflectivity, transmittivity, dielectric constant, ra...
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WO/1993/001470A1 |
An apparatus (102) is adapted to detect the linear extensions of a plurality of hydraulic cylinders. Each hydraulic cylinder defines a variable length coaxial resonant cavity. Under the control of a controller (112), a transmitting secti...
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WO/1993/000567A1 |
X-ray gauges for measuring the thickness of a material or a coating on a substrate lose their original accuracy due to variations in the high voltage supply of the X-ray tube, so that it is often necessary to perform a complete recalibra...
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WO/1992/016819A1 |
A method of calculating the thickness of a sheet material comprising directing a beam of photons against the sheet material from a photon source (1) located on one side of said sheet material (7), detecting reflected radiation from said ...
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WO/1992/015011A1 |
Apparatus for continuously determining the areal density along a length of a material includes a radioactive source and a scintillating receiver. In a first embodiment, the invention measures the thickness of a traveling web simultaneous...
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WO/1991/019189A1 |
An apparatus and method for determining the shape specific contraction and expansion of cylindrical or otherwise geometrically regular-shaped products as a function of time and temperature through high precision, continuous, nondestructi...
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WO/1991/019164A1 |
An apparatus and method for controlling the quality of cylindrical or other geometrically regular-shaped products, such as tube or rounds, through high precision, continuous, real-time three-dimensional analysis of hot or cold products d...
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WO/1991/002216A1 |
A diamond half-mirror is provided at the tip of a collimator that focuses the primary X-ray, in order to obtain a sample image of a very small portion as a clean image without distortion in real time without decreasing the excitation eff...
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WO/1991/000513A1 |
The present invention relates to a method, or process, for deriving compositional information from a multi-layer composition which includes the steps of obtaining multi-layer fractional composition information using a non-contact gauge s...
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WO/1989/012281A1 |
Tomographic imaging of an inanimate object (22) is used for non-contact dimensional and weight measurements during rolling of manufactured articles. A fan-shaped beam of radiation (24) is generated comprising a plurality of fan ray eleme...
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WO/1989/011205A1 |
Computed tomography inspection apparatus (30) and method of inspecting electronic devices and features of PCBs/PWBs (11), such as solder bonds, tracings and vias. The system scans radiation passed through the devices in thin slices and d...
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WO/1989/011095A1 |
A method of measuring both the thickness of a coating (A, B) on a substrate (S) and the relative concentration of the elements of the coating consists of directing an incident beam of radiation (2) at a predetermined acute angle of incid...
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WO/1989/004477A1 |
A tomographic inspection system wherein the electron beam (285) of a microfocus X-ray tube (200) is deflected in a circular scan pattern onto the tube anode (287) in synchronization with a rotating detector (30) that converts the X-ray s...
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WO/1989/003973A1 |
A method of controlling the condition of a lengthy construction element (1) consists in placing and fixing along at least three generatrices of the surface of said element a prolongated line (5) for transmitting wave energy. The measured...
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WO/1989/003972A1 |
A method for controlling the condition of a prolongated envelope provides for the use of a line (4) for transmitting wave energy, as a widely-spread sensitive element and as a channel for transmitting the information on geometrical surfa...
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WO/1988/008960A1 |
A method for controlling the condition of lengthy objects provides for synthesizing such characteristics of an extended wave-energy transmitting line (3) that would enable the use of that line (3) as an expanded sensitive element and as ...
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WO/1988/007671A1 |
A low-voltage, compact thickness/density measuring apparatus (7) is disclosed which uses a PIN diode (21) in conjunction with a low noise processing circuit (23, 25, 27, 29, 31, 35) to detect particle radiation emitted from a source (15)...
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WO/1988/004201A1 |
A transmitter (36) and associated receiver (38) interrogate the surface of a rotor (R) at one or more radial positions from the center of rotation using emitted pulses of energy. Signature signals representative of the distance traveled ...
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WO/1988/003652A1 |
A pair of loop antennas (40, 44) mounted internal to an extensible coaxial cavity (20) respectively transmit and receive electromagnetic signals in the radio frequency range exciting a transverse electromagnetic field in the cavity (20) ...
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WO/1987/007021A1 |
A method, whereby it is possible to stabilize a beta square weight detector continuously even during the measuring process. The method is based on the use of fast detecting elements (4) and amplifiers (5), whereat the energy of each beta...
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WO/1987/002136A1 |
A system for achieving inspecting and/or positioning of an object (132) that includes: an array (133) that is operable to generate acoustic or low-frequency electromagnetic wave energy of a single or narrow band of frequencies, to transm...
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WO/1986/002164A1 |
A method of determining the thickness and composition of an alloy film consisting of one layer which contains a metal identical with a substrate metal, or two layers of different composition, which method is suitably used to analyze a st...
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WO/1986/001176A1 |
An ice measurement instrument includes a waveguide (53) operating in a transmission mode passing energy from an input port to an output port. The resonant frequency of the waveguide depends on the presence and/or thickness of ice at a me...
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WO/1985/004250A1 |
A method and apparatus for making precise measurements as small as in submicron distances of an object or specimen (13) includes a stage (18) which is movable under the control of a microprocessor (20). An instrument, such as a scanning ...
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WO/1985/002266A1 |
Process and apparatus for measuring the state changes induced by weather elements on traffic surfaces, wherein a microwave beam is directed from above to the surface to be monitored and the reflected portion of the beam is examined in or...
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WO/1985/000123A1 |
A system to measure geometric and electromagnetic characteristics of objects (74). Wave energy (76) of a single frequency (or very narrow band of frequencies) is directed upon an object (74) which reflects (or otherwise interacts with) t...
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WO/1985/000122A1 |
A system for sorting parts wherein a part to be sorted is irradiated with wave energy of a single frequency (or very narrow band of frequencies) which interacts with the part. Wave energy (76) emanating from the part (74) is sensed at ma...
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WO/1983/002497A1 |
System for indicating ice thickness and rate of ice thickness growth on surfaces. The region to be monitored for ice accretion is provided with a resonant surface waveguide (15) which is mounted flush, below the surface being monitored. ...
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JP2024047481A |
[Problem] To improve the success rate of overlay measurement. [Solution] A measurement image of a sample taken by a microscope is acquired, a first degree indicating the degree to which the second layer (upper layer) of the sample passes...
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JP7461958B2 |
Described are system and method embodiments for measuring a thickness of a material layer using electromagnetic radiation. In some embodiments, a system includes a radiation source configured to direct first radiation towards a first sur...
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JP7460667B2 |
A device for measuring a strand that is tubular includes a first radiation source to emit terahertz radiation in a first measurement region from an inside onto an inner surface of the strand. A first radiation receiver receives terahertz...
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JP7458935B2 |
A measuring device includes a measuring stage on which a subject is placed, an X-ray irradiation unit, an X-ray detection unit that detects scattered X-rays generated from the subject and an analysis unit that analyzes the diffraction im...
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JP7458414B2 |
Apparatus comprising at least one Terahertz, THz, device (110, 110a) configured to transmit and/or receive THz radiation (TR) to and/or from a measuring object 10, said apparatus being configured to provide a flow of protective gas (PG) ...
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JP2024041572A |
The present invention provides a measuring method and a measuring device capable of suppressing deterioration in reliability of a display device. [Solution] A measurement method according to an embodiment includes forming a partition wal...
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JP7452771B1 |
The thin line index calculation method of the present disclosure includes the steps of obtaining X-ray images of a plurality of cross sections perpendicular to the longitudinal direction of a cable having a plurality of thin wires; and o...
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JP2024037033A |
[Problem] To provide an X-ray thickness meter that can increase the accuracy of measuring the thickness of a plate to be measured. [Solution] The X-ray thickness gauge includes an X-ray source that emits X-rays, a case that houses the X-...
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JP7451287B2 |
This method includes: generating a backscattered-electron image of a multilayered structure (400) including a plurality of patterns formed in a plurality of layers by a scanning electron microscope (50); classifying a plurality of region...
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JP2024032466A |
An object of the present invention is to provide an oil thickness measuring device capable of measuring the thickness of oil. [Solution] A first acquisition unit that acquires the relationship between the difference in CT (Computed Tomog...
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JP7446453B2 |
Depth information of a multilayer structure is acquired quickly and with high accuracy. An analysis system includes (a) acquiring a first captured image of a sample SAM viewed from a first direction by irradiating the sample SAM includin...
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JP7445786B2 |
The purpose of the present disclosure is to provide a pattern measurement device that can accurately measure positional deviation between a center of gravity of a top surface of a pattern and a center of gravity of a bottom surface of th...
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JP2024509348A |
A method, system and non-transitory computer readable medium for evaluating X-ray signals. The method includes calculating an estimated field for each of a plurality of unperturbed objects, the plurality of unperturbed objects representi...
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JP7440857B1 |
The present invention makes it possible to measure and store the film thickness of a paint on a workpiece using a film thickness management device. Note that loss of information is prevented by fixing a wireless communication device that...
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JP7440008B2 |
To provide a non-destructive inspection method capable of accurately determining the position, depth and thickness of reinforcing bars in an existing reinforced concrete structure.An inspection method for reinforcing bars embedded in a r...
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JP7434579B2 |
A method and apparatus for determining a line angle and a line angle rotation of a grating or line feature is disclosed. An aspect of the present disclosure involves, measuring coordinate points of a first line feature using a measuremen...
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JP2024021724A |
[Problem] When inspecting an inspection object including the target part by irradiating the object with X-rays, the inspection can be easily performed regardless of the three-dimensional depth direction position of the target part. An ob...
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JP2024505941A |
Based on the X -ray scattrometry measurement, a method of estimating the value of a geometric parameter that features a distortion shape of a semiconductor structure of a high aspect ratio is presented in the present fine note. The param...
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JP7429722B2 |
A method for identifying a foil position in a power storage device (10) includes: analyzing (S1) the power storage device (10) by X-ray CT analysis to obtain an X-ray absorbed amount (AB(r, θ, z)) at each position; acquiring (S2) an on-...
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JP7425812B2 |
To provide a foil position specifying method of a power storage device capable of appropriately specifying a foil position of electrode foil included in an electrode plate of the power storage device.A method for evaluating a power stora...
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