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Matches 1 - 50 out of 7,477

Document Document Title
WO/2019/094225A1
A method and system for estimating a thickness of at least one casing string in a cased hole may comprise obtaining a plurality of induction measurements from a plurality of channels using a casing inspection tool, computing a quality ve...  
WO/2019/094754A1
Material loss may be estimated from 2D digital radiographs using double wall single imaging (DWSI) technique using a system for estimation of material loss from 2D digital radiographs comprising one or more calibration samples (10), each...  
WO/2019/094209A1
A method and system for determining properties of a pipe string using multi-channel induction measurements. The method may comprise disposing a multi-channel induction tool in a cased hole, obtaining a multi-channel measurement, forming ...  
WO/2019/089686A1
An apparatus having a layer of fats, oils and grease (F.O.G) on water includes a tank having an inlet and an outlet. The inlet connects to a source of F.O.G.-laden effluent and the outlet connects to a sewer pipe so that the outlet defin...  
WO/2019/081876A1
The invention concerns a method for measuring dimensions of empty glass containers (2) consisting of: - choosing at least one region to be inspected of the container, - transporting the containers, - positioning, to either side of the re...  
WO/2019/081875A1
The invention concerns a measurement method consisting in; - acquiring, by means of image sensors (Cji), for each object during the movement of same, at least three radiographic images of the region to be inspected, obtained from at leas...  
WO/2019/079630A1
Methods and systems for realizing a high brightness, liquid based x-ray source suitable for high throughput x-ray metrology are presented herein. A high brightness x-ray source is produced by bombarding a rotating liquid metal anode mate...  
WO/2019/073592A1
The present invention comprises a computation device for measuring the dimensions of patterns formed on a sample on the basis of a signal obtained from a charged particle beam device. The computation device comprises a positional deviati...  
WO/2019/064293A1
A control system for use in measuring one or more parameters of a patterned structure. The control system is configured as a computer system and comprises: an input utility configured to receive input data comprising raw measured TEM ima...  
WO/2019/063185A1
The present invention relates to a measuring device for determining the thickness of a dielectric coat on a conductive substrate. The device comprises a resonance cavity for electromagnetic fields, which has a rotationally symmetrical wa...  
WO/2019/051616A1
A system for producing a peening process model comprises a peening load modeling module for obtaining models of peening induced loads as a function of a plurality of peening treatments. A peening optimization module obtains models of a c...  
WO/2019/049234A1
When calculating a distortion amount in a detection surface 31 of a plane surface detector 3 of X-ray equipment 1, a user first disposes a calibration phantom 10 between a light source 2 and the plane surface detector 3. Then, the attitu...  
WO/2019/038917A1
In order to achieve a correction sample and an electron beam adjustment method and an electron beam device using the correction sample, with which a high-precision measurement of an incident angle can be performed, this correction sample...  
WO/2019/038841A1
The present invention quantitatively evaluates a crystal growth amount by nondestructive inspection in a wide area from an undergrowth state to an overgrowth state. According the present invention, a plurality of image feature amounts ar...  
WO/2019/035425A1
A coated plate material (10) comprising: a base material (11) having as a surface (11a) thereof an uneven area (11P) having uniformly spaced undulations that reflect terahertz waves (L); and a coating layer (12) formed on the surface (11...  
WO/2019/014283A1
Methods and systems for performing measurements of semiconductor structures based on high-brightness, polychromatic, reflective small angle x-ray scatterometry (RSAXS) metrology are presented herein. RSAXS measurements are performed over...  
WO/2018/235167A1
This position/orientation measurement method is for determining the position and/or orientation of an object of measurement consisting of a metal plate using the following antennas that have been placed on one side of the object of measu...  
WO/2018/229848A1
This charged particle beam device is provided with: a storage unit that stores relationship information indicating a relationship between the intensity or the intensity ratio of a charged particle signal and the thickness of a layer disp...  
WO/2018/222613A1
Methods and systems for estimating values of process parameters, structural parameters, or both, based on x-ray scatterometry measurements of high aspect ratio semiconductor structures are presented herein. X-ray scatterometry measuremen...  
WO/2018/212037A1
A testing device (100) is provided with: an emission unit (110) that emits a terahertz wave (THz) to a sample (S) having a plurality of layers (L) which are layered; a detection unit (130) that detects the terahertz wave from the sample ...  
WO/2018/210501A1
The invention relates to a method for determining the external and internal geometry of a component (1) with at least one cavity, wherein - a component (1) to be measured is provided (S1) with at least one cavity, - the external geometry...  
WO/2018/206225A1
The invention relates to a computer-implemented method for measuring an object on the basis of a digital representation of the object, wherein the object representation comprises a plurality of image information items for the object. An ...  
WO/2018/206226A1
The invention relates to a computer-implemented method for determining a local deviation of a geometry of an object from a target geometry of the object on the basis of a digital representation of the object, wherein the object represent...  
WO/2018/193800A1
In order to capture without deficiency the unique spatial distortion of an X-ray CT device and evaluate the three-dimensional shape measuring accuracy of the X-ray CT device, supporting rods 36, 37, 38 having different lengths and each h...  
WO/2018/182360A1
A thickness measurement apparatus is provided. The thickness measurement apparatus may comprise: a terahertz wave signal processing unit for receiving a terahertz wave according to at least one mode among a reflection mode and a transmis...  
WO/2018/175995A1
An apparatus and associated methods for measuring thickness and velocity of flat moving materials utilizing high frequency radar technologies. Two identical radar-based systems for measuring absolute distances between the source of the r...  
WO/2018/154587A1
A control system is presented for use in measuring one or more parameters of a three-dimensional patterned structure. The control system is configured as a computer system comprising a data processor configured to receive and process raw...  
WO/2018/156084A1
Systems and methods for monitoring plastic deformation of a structural material are provided. An acoustic wave actuator is configured to generate acoustic wave signals to be propagated within the structural material and is in-situ fabric...  
WO/2018/147929A3
Examples of imaging systems are described herein which may implement microwave or millimeter wave imaging systems. Examples described may implement partitioned inverse techniques which may construct and invert a measurement matrix to be ...  
WO/2018/139413A1
In this method for measuring the thickness of water on ice, one surface of the ice is irradiated with a terahertz wave having a frequency of 10 THz or less, the terahertz waves which pass through or are reflected are measured, and the th...  
WO/2018/131101A1
In a semiconductor manufacturing process, it is necessary to cut a die close to the edge of a wafer in order to obtain as many dies as possible from one wafer. Accordingly, with respect to a charged particle beam device and an optical ex...  
WO/2018/128988A1
Methods and systems for controlling illumination beam spot size for Transmission, Small-Angle X-ray Scatterometry (T-SAXS) measurements of different sized metrology targets are described herein. An X-ray illumination optics subsystem inc...  
WO/2018/119160A1
An inspection system can include a handheld inspection device having a meter portion comprising at least two different paint meters, at least one display, at least one processor configured to present paint measuring locations on an inspe...  
WO/2018/108902A1
The subject matter of the invention is a method for determining the mother-of-pearl thickness of a pearl, in particular a cultured pearl, comprising a spherical nucleus, mother-of-pearl and possibly at least one cavity, by means of x-ray...  
WO/2018/105332A1
An inspecting device (100) is provided with: a radiating unit (110) which radiates terahertz waves (THz) onto a sample (S) laminated into a plurality of layers (L); a detecting unit (130) which acquires a detected waveform (DW) by detect...  
WO/2018/100404A3
The present invention relates to a method to determine geometrical parameters of an object under study by means radiography, the object can be described geometrically, wherein intercepts that go through the material of the object under s...  
WO/2018/094681A1
Disclosed is an I-V conversion module, comprising: a current output sensor (1), a pre-integration circuit (4), a charge transfer auxiliary circuit (3) and an I-V conversion circuit (2) comprising an inverting amplifier, wherein the curre...  
WO/2018/094383A1
A technique for estimating a whole object surface area and volume of a micro-scale three-dimensional model with a partially visible surface includes receiving a single-view stereoscopic image of an object of interest and an unconstrained...  
WO/2018/089044A1
Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, ...  
WO/2018/085452A1
Systems and methods for automatic irrigation for a micro-climate areas and subterranean soil modeling are provided herein. Some methods include receiving collection of micro-climate data having weather data from a weather station that is...  
WO/2018/066359A1
This examination device 100 is provided with: an irradiation unit 110 which irradiates a sample S having a plurality of layers L with terahertz waves THz; a detection unit 130 which detects the terahertz waves from the sample and acquire...  
WO/2018/066360A1
This examination device 100 is provided with: an irradiation unit 110 which irradiates a sample S having a plurality of layers L with terahertz waves THz; a detection unit 130 which detects the terahertz waves from the sample and acquire...  
WO/2018/066361A1
This examination device 100 is provided with: an irradiation unit 110 which irradiates a sample S having a plurality of layers L with terahertz waves THz; a detection unit 130 which detects the terahertz waves from the sample and acquire...  
WO/2018/061135A1
A purpose of the present invention is to provide a pattern measurement device that allows the selection of device parameters for calculating proper variability and allows the estimation of proper variability. The present invention provid...  
WO/2018/060325A1
This invention relates to method of generating a three dimensional surface profile of a food object, where the food object is exposed with a conical X-ray beam while the food object is conveyed. The attenuation of the X-rays after penetr...  
WO/2018/052808A1
Provided is a device and method of determining the thickness of accumulating scale on surfaces exposed to a liquid media. More particularly, it is a method for determining the comparable accumulation of scale such as, calcium or magnesiu...  
WO/2018/042600A1
The purpose of the present invention is to provide an image analysis device enabling easy extraction of an edge of an upper layer pattern, which is formed across a lower pattern, without being affected by the lower pattern. The image ana...  
WO/2018/042535A1
To provide a sample for particle measurement that makes it possible to evaluate the three-dimensional shape and fine particle type of a fine particle, a sample for particle measurement is provided with a substrate, an isolated fine parti...  
WO/2018/042581A1
The purpose of the present invention is to provide a pattern measurement device that achieves both high-throughput measurement using a small number of measurements and high-accuracy measurement that uses statistical processing. To accomp...  
WO/2018/042655A1
A dielectric boundary surface estimation device (100) is provided with a pre-processing unit (300) for performing pre-processing of wave motion data obtained by observation of a dielectric by a radar device, a three-dimensional-synthetic...  

Matches 1 - 50 out of 7,477