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Patent Searching and Data


Matches 1 - 50 out of 7,702

Document Document Title
WO/2021/003444A2
3D metrology techniques are disclosed for determining a changing topography of a substrate processed in an additive manufacturing system. Techniques include fringe scanning, simultaneous fringe projections, interferometry, and x-ray imag...  
WO/2020/259368A1
Disclosed are an article dose distribution measurement method and apparatus. The article dose distribution measurement method comprises: performing perspective scanning on an article to be measured, and acquiring mass data per unit area ...  
WO/2020/263391A1
A method for process control in the manufacture of semiconductor devices including performing metrology on at least one Design of Experiment (DOE) semiconductor wafer included in a lot of semiconductor wafers, the lot forming part of a b...  
WO/2020/241008A1
Provided is a surface profile detection device for blast furnace charge that has a simple configuration but still detects the turning of a shooter and the accumulation of charge to make it possible to achieve operations that approach a t...  
WO/2020/243280A1
A processing system (10) and a corresponding method are provided for processing work products (WP), including food items, to locate and quantify voids, undercuts and similar anomalies in the work products. The work products are conveyed ...  
WO/2020/233591A1
Disclosed is an InSAR and GNSS weighting method for three-dimensional earth surface deformation estimation, including the following steps: step 1: establishing a functional relationship between a three-dimensional deformation d 0 of an u...  
WO/2020/234996A1
This edge extraction device (1) comprises: a transmission antenna (11a) for emitting, toward an object (20), electromagnetic waves only polarized in one direction perpendicular to the propagation direction; a reception antenna (12a) for ...  
WO/2020/225876A1
To measure the three-dimensional shape of a pattern formed on a sample obtained through the lamination of a plurality of different materials: for each of the materials composing the pattern, an attenuation rate μ is stored in advance th...  
WO/2020/221975A1
The invention proposes an inspection line (100) thus comprising at least: - at a collar inspection station, a collar inspection installation (200) capable of contactlessly detecting, using light rays, crizzling type defects in the neck o...  
WO/2020/222454A1
A thickness measuring device of the present invention comprises: a supporter for supporting a specimen; an emission unit for emitting an electromagnetic wave toward the specimen; a chamber for encompassing the specimen; a receiving unit ...  
WO/2020/214745A1
Methods and systems for measuring a complex semiconductor structure based on measurement data before and after a critical process step are presented. In some embodiments, the measurement is based on x-ray scatterometry measurement data. ...  
WO/2020/208111A1
One example of a method for the time-resolved calculation of a deformation of a body comprises calculating (110) a model of the body during the deformation. The method furthermore comprises calculating (120) a predicted x-ray image for t...  
WO/2020/207104A1
Provided are a vehicle inspection method, apparatus and system, and a computer-readable storage medium, which relate to the technical field of security inspection. The vehicle inspection method comprises: acquiring vehicle contour inform...  
WO/2020/209312A1
This inspecting device is provided with a first image generating unit, a reconstructing unit, an identifying unit, and a removing unit. The first image generating unit generates a plurality of two-dimensional X-ray images in which a posi...  
WO/2020/202644A1
This X-ray fluorescence analyzer comprises a counting time calculation means (13) that uses a prescribed quantitative calculation method to determine quantitative values using reference intensities for a single standard sample and, while...  
WO/2020/190643A1
Quantification of the passivation and the selectivity in deposition process is disclosed. The passivation is evaluated by calculating film thicknesses on pattern lines and spaces. An XPS signal is used, which is normalized with X-ray flu...  
WO/2020/186402A1
A cavity length measuring device for a dielectric cavity. The cavity length measuring device comprises a sensor and a demodulating device, wherein the sensor comprises an open hollow coaxial cable-Fabry Perot resonant cavity (5), a first...  
WO/2020/191371A1
A system for estimating front side overlay on a sample based on shape data is disclosed. The system includes a characterization sub-system and a controller. The controller includes one or more processors configured to: generate a vacuum ...  
WO/2020/160106A1
Described are system and method embodiments for measuring a thickness of a material layer using electromagnetic radiation. In some embodiments, a system includes a radiation source configured to direct first radiation towards a first sur...  
WO/2020/154368A1
A method of quantifying an antimicrobial coatings using a handheld XRF analyzer is disclosed. The method provides an estimate of the expected level of antimicrobial efficacy for a thin film comprising silicon and/or titanium by obtaining...  
WO/2020/153063A1
It is possible to detect, with high accuracy, whether a structure is a good product or a defective product. This inspection apparatus for a structure comprises: X-ray emitting means (1a, 1b) for emitting X-rays through two or more paths;...  
WO/2020/150035A1
An article-inspection apparatus includes a light source for directing light energy with multiple wavelengths at the article and multiple sensors to receive light reflected from external and internal surfaces of the wall of the article, w...  
WO/2020/149765A1
The invention relates to monitoring and measuring technology. The physical and mechanical characteristics of elongate entities as well as the parameters of active seismic waves are determined by measuring the distribution of the differen...  
WO/2020/121739A1
The present invention pertains to an image-matching process for carrying out positioning of a pattern on design data and a pattern in an image, and in particular pertains to an image-matching process in which there is used a model constr...  
WO/2020/109406A1
A device for detecting an ice cover layer on a sample comprises: a source for generating and emitting pulses of electromagnetic radiation, the pulses of electromagnetic radiation being directable on a sample, a detector for detecting pul...  
WO/2020/104217A1
The invention relates to the thickness measurement of a layer of a casting powder (5) in a mold (3). The problem to be solved by the invention is that of increasing the reliability and the accuracy of the thickness measurement of the lay...  
WO/2020/097237A1
Methods, systems, devices, and products for hydrocarbon tubular evaluation. Methods comprise conveying the logging tool in the tubular with a carrier; inducing with a transmitter a horizontal shear (SH) wave; identifying higher order SH ...  
WO/2020/095346A1
The present disclosure pertains to a method, a system, and a computer-readable medium for highly precisely measuring the depth of a recess formed in a sample even when, inter alia, the material or pattern density of the sample differs. I...  
WO/2020/090784A1
The present invention provides an electromagnetic-wave detecting device including: a plurality of electromagnetic-wave detecting elements; a plurality of voltage application units that respectively apply bias voltages to the plurality of...  
WO/2020/075385A1
A measuring device, for irradiating a sample having an uneven portion with a charged particle beam and measuring the shape of the sample, irradiates the sample with the charged particle beam at any angle, generates a profile indicating a...  
WO/2020/074374A1
The invention relates to an enveloping body (1) for at least partly detecting a contour of a limb, wherein the enveloping body (1) has a base body (2), wherein the enveloping body (1) has at least one sensor (6) which is configured to de...  
WO/2020/068468A1
Systems and methods are described herein for manufacturing and using roofing membranes that are faster and easier to install than conventional adhesive-only membrane materials. In some embodiments, membrane materials are surface treated ...  
WO/2020/066128A1
The present invention suppresses an influence of noise caused by a device or an environment, and evaluates line edge roughness or a line width roughness. To this end, an averaged signal profile 405 is obtained from a moving average of S ...  
WO/2018/226449A3
A method of measuring thickness of a material generally includes applying an oscillating signal to a first electrode at a fixed frequency, passing the signal through the material to a second electrode, and measuring the magnitude of the ...  
WO/2020/060226A1
Suggested are process quality verification method and apparatus using quantitative statistical values through grain boundary scanning electron microscope image treatment of a low-temperature poly-silicon thin film transistor active layer...  
WO/2020/061294A1
A SAR microwave reflectometer for detecting cracks in metal surfaces may comprise a microwave signal source, an antenna coupled to the signal source and configured to radiate a plurality of electric field vector directions, a receiver co...  
WO/2020/053016A1
The invention relates to an apparatus for detecting an object conveyed by means of a conveying device through a measuring area of the apparatus, comprising a transmitting device for transmitting measuring radiation with a frequency in th...  
WO/2020/048346A1
A correction device (100) for an X-ray inspection device, comprising: at least one surface mount element (110) having several welding ends; several correction sheets (120) made of metal material, each of the correction sheets (120) havin...  
WO/2020/045852A1
A method for measuring the thickness of a specimen, according to an embodiment, can measure the thickness of a specimen having multiple layers in a contactless and non-destructive manner. In addition, when the refractive indexes of mater...  
WO/2020/017907A1
A system for detecting misalignment, according to one embodiment of the present invention, comprises: a reference jig on which an electrode assembly is placed; a beam generation unit for irradiating X-rays at a first angle and a second a...  
WO/2020/011730A1
The invention relates to a device for the additive manufacture of a workpiece (10; 30), comprising a cell-like construction chamber (24) for a workpiece which is to be constructed preferably in layers and additives manufacturing means (1...  
WO/2020/012730A1
Provided is an X-ray analysis system that makes it possible to simply set appropriate vapor phase decomposition conditions. This X-ray analysis system comprises an X-ray analysis device and a vapor phase decomposition device. The X-ray a...  
WO/2020/003675A1
The present invention enables realizing, at low costs and in a simplified manner: a method for measuring the density and the thickness of a measurement sample; and a total reflection X-ray fluorescence analysis device for measuring the d...  
WO/2019/238384A1
The invention concerns a Method for detecting a fault condition in the measurement of the level of a medium (1) in a tank (2) with a floating roof (3), whereby the floating roof (3) is floating on the medium (1) and is vertically guided ...  
WO/2019/239546A1
In the present invention, an electro-optical condition generation unit includes: a condition setting unit that sets, as a plurality of electro-optical conditions, a plurality of electro-optical conditions in which the combinations of the...  
WO/2019/230040A1
This X-ray thickness measurement device (12) is connected to a prediction data server (14), and is equipped with an X-ray control power supply, an X-ray generator, and a detection unit. The prediction data server (14) is equipped with an...  
WO/2019/230010A1
In this invention, an X-ray generator (30) has a filament (38) which is supplied with power from a power supply (22), and emits X-rays. An output detection unit (34) outputs a detection value for calculating the thickness of a subject be...  
WO/2019/198039A3
The present invention relates to a system and a method for accurately estimating the thickness of extruded plastic films. In particular, the invention relates to automatic allocation of a recipe-dependent calibration factor and a scannin...  
WO/2019/198039A2
The present invention relates to a system and a method for accurately estimating the thickness of extruded plastic films. In particular, the invention relates to automatic allocation of a recipe-dependent calibration factor and a scannin...  
WO/2019/198916A1
The present invention relates to a system for inspecting the surface of a hole in a rock, wherein the system can be inserted into a hole in a rock to measure the surface roughness precisely and swiftly, and ensures that measurement of th...  

Matches 1 - 50 out of 7,702