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WO/2018/235167A1 |
This position/orientation measurement method is for determining the position and/or orientation of an object of measurement consisting of a metal plate using the following antennas that have been placed on one side of the object of measu...
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WO/2018/229848A1 |
This charged particle beam device is provided with: a storage unit that stores relationship information indicating a relationship between the intensity or the intensity ratio of a charged particle signal and the thickness of a layer disp...
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WO/2018/222613A1 |
Methods and systems for estimating values of process parameters, structural parameters, or both, based on x-ray scatterometry measurements of high aspect ratio semiconductor structures are presented herein. X-ray scatterometry measuremen...
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WO/2018/212037A1 |
A testing device (100) is provided with: an emission unit (110) that emits a terahertz wave (THz) to a sample (S) having a plurality of layers (L) which are layered; a detection unit (130) that detects the terahertz wave from the sample ...
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WO/2018/210501A1 |
The invention relates to a method for determining the external and internal geometry of a component (1) with at least one cavity, wherein - a component (1) to be measured is provided (S1) with at least one cavity, - the external geometry...
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WO/2018/206225A1 |
The invention relates to a computer-implemented method for measuring an object on the basis of a digital representation of the object, wherein the object representation comprises a plurality of image information items for the object. An ...
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WO/2018/206226A1 |
The invention relates to a computer-implemented method for determining a local deviation of a geometry of an object from a target geometry of the object on the basis of a digital representation of the object, wherein the object represent...
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WO/2018/193800A1 |
In order to capture without deficiency the unique spatial distortion of an X-ray CT device and evaluate the three-dimensional shape measuring accuracy of the X-ray CT device, supporting rods 36, 37, 38 having different lengths and each h...
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WO/2018/182360A1 |
A thickness measurement apparatus is provided. The thickness measurement apparatus may comprise: a terahertz wave signal processing unit for receiving a terahertz wave according to at least one mode among a reflection mode and a transmis...
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WO/2018/175995A1 |
An apparatus and associated methods for measuring thickness and velocity of flat moving materials utilizing high frequency radar technologies. Two identical radar-based systems for measuring absolute distances between the source of the r...
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WO/2018/154587A1 |
A control system is presented for use in measuring one or more parameters of a three-dimensional patterned structure. The control system is configured as a computer system comprising a data processor configured to receive and process raw...
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WO/2018/156084A1 |
Systems and methods for monitoring plastic deformation of a structural material are provided. An acoustic wave actuator is configured to generate acoustic wave signals to be propagated within the structural material and is in-situ fabric...
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WO/2018/147929A3 |
Examples of imaging systems are described herein which may implement microwave or millimeter wave imaging systems. Examples described may implement partitioned inverse techniques which may construct and invert a measurement matrix to be ...
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WO/2018/139413A1 |
In this method for measuring the thickness of water on ice, one surface of the ice is irradiated with a terahertz wave having a frequency of 10 THz or less, the terahertz waves which pass through or are reflected are measured, and the th...
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WO/2018/131101A1 |
In a semiconductor manufacturing process, it is necessary to cut a die close to the edge of a wafer in order to obtain as many dies as possible from one wafer. Accordingly, with respect to a charged particle beam device and an optical ex...
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WO/2018/128988A1 |
Methods and systems for controlling illumination beam spot size for Transmission, Small-Angle X-ray Scatterometry (T-SAXS) measurements of different sized metrology targets are described herein. An X-ray illumination optics subsystem inc...
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WO/2018/119160A1 |
An inspection system can include a handheld inspection device having a meter portion comprising at least two different paint meters, at least one display, at least one processor configured to present paint measuring locations on an inspe...
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WO/2018/108902A1 |
The subject matter of the invention is a method for determining the mother-of-pearl thickness of a pearl, in particular a cultured pearl, comprising a spherical nucleus, mother-of-pearl and possibly at least one cavity, by means of x-ray...
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WO/2018/105332A1 |
An inspecting device (100) is provided with: a radiating unit (110) which radiates terahertz waves (THz) onto a sample (S) laminated into a plurality of layers (L); a detecting unit (130) which acquires a detected waveform (DW) by detect...
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WO/2018/100404A3 |
The present invention relates to a method to determine geometrical parameters of an object under study by means radiography, the object can be described geometrically, wherein intercepts that go through the material of the object under s...
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WO/2018/094681A1 |
Disclosed is an I-V conversion module, comprising: a current output sensor (1), a pre-integration circuit (4), a charge transfer auxiliary circuit (3) and an I-V conversion circuit (2) comprising an inverting amplifier, wherein the curre...
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WO/2018/094383A1 |
A technique for estimating a whole object surface area and volume of a micro-scale three-dimensional model with a partially visible surface includes receiving a single-view stereoscopic image of an object of interest and an unconstrained...
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WO/2018/089044A1 |
Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, ...
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WO/2018/085452A1 |
Systems and methods for automatic irrigation for a micro-climate areas and subterranean soil modeling are provided herein. Some methods include receiving collection of micro-climate data having weather data from a weather station that is...
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WO/2018/066359A1 |
This examination device 100 is provided with: an irradiation unit 110 which irradiates a sample S having a plurality of layers L with terahertz waves THz; a detection unit 130 which detects the terahertz waves from the sample and acquire...
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WO/2018/066360A1 |
This examination device 100 is provided with: an irradiation unit 110 which irradiates a sample S having a plurality of layers L with terahertz waves THz; a detection unit 130 which detects the terahertz waves from the sample and acquire...
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WO/2018/066361A1 |
This examination device 100 is provided with: an irradiation unit 110 which irradiates a sample S having a plurality of layers L with terahertz waves THz; a detection unit 130 which detects the terahertz waves from the sample and acquire...
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WO/2018/061135A1 |
A purpose of the present invention is to provide a pattern measurement device that allows the selection of device parameters for calculating proper variability and allows the estimation of proper variability. The present invention provid...
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WO/2018/060325A1 |
This invention relates to method of generating a three dimensional surface profile of a food object, where the food object is exposed with a conical X-ray beam while the food object is conveyed. The attenuation of the X-rays after penetr...
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WO/2018/052808A1 |
Provided is a device and method of determining the thickness of accumulating scale on surfaces exposed to a liquid media. More particularly, it is a method for determining the comparable accumulation of scale such as, calcium or magnesiu...
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WO/2018/042600A1 |
The purpose of the present invention is to provide an image analysis device enabling easy extraction of an edge of an upper layer pattern, which is formed across a lower pattern, without being affected by the lower pattern. The image ana...
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WO/2018/042535A1 |
To provide a sample for particle measurement that makes it possible to evaluate the three-dimensional shape and fine particle type of a fine particle, a sample for particle measurement is provided with a substrate, an isolated fine parti...
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WO/2018/042581A1 |
The purpose of the present invention is to provide a pattern measurement device that achieves both high-throughput measurement using a small number of measurements and high-accuracy measurement that uses statistical processing. To accomp...
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WO/2018/042655A1 |
A dielectric boundary surface estimation device (100) is provided with a pre-processing unit (300) for performing pre-processing of wave motion data obtained by observation of a dielectric by a radar device, a three-dimensional-synthetic...
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WO/2018/020627A1 |
The purpose of the present invention is to provide a pattern measurement method and a pattern measurement device, whereby high-precision measurement of a pattern in a depth direction thereof is realized. Provided are a pattern measuremen...
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WO/2018/003018A1 |
In order to obtain the same size measuring result in an X-ray inspection of a structure formed in a sample irrespective of the positions within the field of view for the same structure, this X-ray inspection method comprises irradiating ...
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WO/2017/212156A1 |
The invention relates to a method for ascertaining the capacity of containers (1), wherein a plurality of radiographic images (I) of the container is acquired from different viewing angles by a computer-assisted x-ray tomography apparatu...
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WO/2017/203406A1 |
A reference-standard device (20) for calibration of measurements of length, comprising a substrate (10) that includes a surface (10a) having at least one calibration pattern (11). According to the invention, this pattern comprises a plur...
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WO/2017/186952A1 |
The invention relates to a device (1) for applying pasty or liquid substances onto and/or introducing them into a vehicle body component (4), particularly for applying wax onto and/or introducing it into the vehicle body component or for...
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WO/2017/183167A1 |
When a sample is inserted into a scanning electron microscope, to prevent the sample from coming into contact with an objective lens/detector, a height adjustment jig is used to adjust and confirm the height of the sample such that the h...
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WO/2017/179138A1 |
The purpose of the present invention is to provide a pattern measurement device that is capable of highly accurately measuring a groove bottom, hole bottom, or the like, regardless of the accuracy of the formation of a deep groove or dee...
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WO/2017/173533A1 |
A system and method for measuring thicknesses of layers of a multi-layered structure, The method includes generating a terahertz wave pulse, transmitting the terahertz wave pulse to a multi-layered structure having multiple layers of mat...
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WO/2017/174135A1 |
The invention relates to a radar antenna device (16) comprising an antenna assembly (19) which is accommodated in a housing (17) and which is provided with a radar-transparent protective panel (20) on the housing in order to separate the...
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WO/2017/168542A1 |
This position detection apparatus detects the position, etc., of an object by using a plurality of arranged RFID tags while reducing the number of necessary RFID tags. The position detection apparatus has: one or more axis parts in which...
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WO/2017/149526A2 |
A method and apparatus for an angle meter cooperatively using two or more non-contact distance meters for measuring distances to a surface along substantially parallel lines. The measured distances are used for estimating or calculating ...
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WO/2017/145513A1 |
This medium detecting device comprises: a transport path on which a paper sheet medium is transported; a transport guide that forms the transport path and that guides the medium along the surface of the medium; a board placement guide th...
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WO/2017/140541A1 |
The invention relates to a method and a device for the extrusion of a non-rotationally symmetrical strand comprising at least two, in particular three, at least partially overlapping strand components, wherein the device for the extrusio...
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WO/2017/130365A1 |
The purpose of the present invention is to provide an overlay error measurement device that is capable of accurately recognizing patterns and executing overlay error measurement, even when one pattern overlaps with another pattern in som...
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WO/2017/130477A1 |
Provided are a defect inspection device, method, and program that make it possible for a radiographer to accurately and efficiently detect a defect when carrying out inspection for determining the presence or absence of a defect using an...
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WO/2017/130366A1 |
The purpose of the present invention is to provide a pattern measurement device for performing evaluation of superposition of a region selection pattern and a selected pattern selected by the region selection pattern. The present inventi...
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