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Matches 1 - 50 out of 7,343

Document Document Title
WO/2018/066359A1
This examination device 100 is provided with: an irradiation unit 110 which irradiates a sample S having a plurality of layers L with terahertz waves THz; a detection unit 130 which detects the terahertz waves from the sample and acquire...  
WO/2018/066360A1
This examination device 100 is provided with: an irradiation unit 110 which irradiates a sample S having a plurality of layers L with terahertz waves THz; a detection unit 130 which detects the terahertz waves from the sample and acquire...  
WO/2018/066361A1
This examination device 100 is provided with: an irradiation unit 110 which irradiates a sample S having a plurality of layers L with terahertz waves THz; a detection unit 130 which detects the terahertz waves from the sample and acquire...  
WO/2018/061135A1
A purpose of the present invention is to provide a pattern measurement device that allows the selection of device parameters for calculating proper variability and allows the estimation of proper variability. The present invention provid...  
WO/2018/060325A1
This invention relates to method of generating a three dimensional surface profile of a food object, where the food object is exposed with a conical X-ray beam while the food object is conveyed. The attenuation of the X-rays after penetr...  
WO/2018/052808A1
Provided is a device and method of determining the thickness of accumulating scale on surfaces exposed to a liquid media. More particularly, it is a method for determining the comparable accumulation of scale such as, calcium or magnesiu...  
WO/2018/042600A1
The purpose of the present invention is to provide an image analysis device enabling easy extraction of an edge of an upper layer pattern, which is formed across a lower pattern, without being affected by the lower pattern. The image ana...  
WO/2018/042535A1
To provide a sample for particle measurement that makes it possible to evaluate the three-dimensional shape and fine particle type of a fine particle, a sample for particle measurement is provided with a substrate, an isolated fine parti...  
WO/2018/042581A1
The purpose of the present invention is to provide a pattern measurement device that achieves both high-throughput measurement using a small number of measurements and high-accuracy measurement that uses statistical processing. To accomp...  
WO/2018/042655A1
A dielectric boundary surface estimation device (100) is provided with a pre-processing unit (300) for performing pre-processing of wave motion data obtained by observation of a dielectric by a radar device, a three-dimensional-synthetic...  
WO/2018/020627A1
The purpose of the present invention is to provide a pattern measurement method and a pattern measurement device, whereby high-precision measurement of a pattern in a depth direction thereof is realized. Provided are a pattern measuremen...  
WO/2018/003018A1
In order to obtain the same size measuring result in an X-ray inspection of a structure formed in a sample irrespective of the positions within the field of view for the same structure, this X-ray inspection method comprises irradiating ...  
WO/2017/212156A1
The invention relates to a method for ascertaining the capacity of containers (1), wherein a plurality of radiographic images (I) of the container is acquired from different viewing angles by a computer-assisted x-ray tomography apparatu...  
WO/2017/203406A1
A reference-standard device (20) for calibration of measurements of length, comprising a substrate (10) that includes a surface (10a) having at least one calibration pattern (11). According to the invention, this pattern comprises a plur...  
WO/2017/186952A1
The invention relates to a device (1) for applying pasty or liquid substances onto and/or introducing them into a vehicle body component (4), particularly for applying wax onto and/or introducing it into the vehicle body component or for...  
WO/2017/183167A1
When a sample is inserted into a scanning electron microscope, to prevent the sample from coming into contact with an objective lens/detector, a height adjustment jig is used to adjust and confirm the height of the sample such that the h...  
WO/2017/179138A1
The purpose of the present invention is to provide a pattern measurement device that is capable of highly accurately measuring a groove bottom, hole bottom, or the like, regardless of the accuracy of the formation of a deep groove or dee...  
WO/2017/173533A1
A system and method for measuring thicknesses of layers of a multi-layered structure, The method includes generating a terahertz wave pulse, transmitting the terahertz wave pulse to a multi-layered structure having multiple layers of mat...  
WO/2017/174135A1
The invention relates to a radar antenna device (16) comprising an antenna assembly (19) which is accommodated in a housing (17) and which is provided with a radar-transparent protective panel (20) on the housing in order to separate the...  
WO/2017/168542A1
This position detection apparatus detects the position, etc., of an object by using a plurality of arranged RFID tags while reducing the number of necessary RFID tags. The position detection apparatus has: one or more axis parts in which...  
WO/2017/149526A2
A method and apparatus for an angle meter cooperatively using two or more non-contact distance meters for measuring distances to a surface along substantially parallel lines. The measured distances are used for estimating or calculating ...  
WO/2017/145513A1
This medium detecting device comprises: a transport path on which a paper sheet medium is transported; a transport guide that forms the transport path and that guides the medium along the surface of the medium; a board placement guide th...  
WO/2017/140541A1
The invention relates to a method and a device for the extrusion of a non-rotationally symmetrical strand comprising at least two, in particular three, at least partially overlapping strand components, wherein the device for the extrusio...  
WO/2017/130365A1
The purpose of the present invention is to provide an overlay error measurement device that is capable of accurately recognizing patterns and executing overlay error measurement, even when one pattern overlaps with another pattern in som...  
WO/2017/130477A1
Provided are a defect inspection device, method, and program that make it possible for a radiographer to accurately and efficiently detect a defect when carrying out inspection for determining the presence or absence of a defect using an...  
WO/2017/130366A1
The purpose of the present invention is to provide a pattern measurement device for performing evaluation of superposition of a region selection pattern and a selected pattern selected by the region selection pattern. The present inventi...  
WO/2017/126364A1
The present invention accurately inspects dimensions related to the position of a steel cord. An X-ray 34 is radiated in a fan shape along the extension direction of a steel cord 16, transmits through a conveyor belt 10, and reaches an X...  
WO/2017/123111A8
The invention relates to a method of measuring the internal volume of an object, in which an object is scanned in a non-contact manner using a computerized tomography scanner, the scan results are used to automatically construct a three-...  
WO/2017/123111A1
The invention relates to a method of measuring the internal volume of an object, in which an object is scanned in a non-contact manner using a computerized tomography scanner, the scan results are used to automatically construct a three-...  
WO/2017/108689A1
The present disclosure relates to a method for detecting a fibre misalignment in an elongated structure, such as a wind turbine blade component. The elongated structure has a length along a longitudinal direction and comprises a pluralit...  
WO/2017/098781A1
This thickness measuring device is provided with: a radiation source for irradiating an object to be measured with radiation; a radiation detector which is disposed at a position facing the radiation source with the object to be measured...  
WO/2017/063467A1
A method for observing settlement and convergence of a tunnel, which relates to the field of methods for observing settlement and convergence of tunnels. The method for observing settlement and convergence of a tunnel comprises: 1) selec...  
WO/2017/051579A1
Provided is a technique for performing a film thickness inspection on a film including an active material formed on a current collector in a non-contact manner during a process of manufacturing a lithium-ion battery. This film thickness ...  
WO/2017/051621A1
The purpose of the present invention is to provide a charged particle beam device capable of predicting the three-dimensional structure of a sample, without affecting the charge of the sample. The present invention provides a charged par...  
WO/2017/043198A1
An optical film which comprises a layer of a cured product of a curable composition, and wherein the curable composition contains a light emitting material having a molar extinction coefficient of 10,000 (L/mol·cm) or more at the wavele...  
WO/2017/043942A1
The present invention relates to a method for analyzing a three-dimensional specimen, the method comprising: a component measurement step for measuring components constituting a three-dimensional specimen by identifying an energy spectru...  
WO/2017/035663A1
A system and method are provided for mapping spatial and temporal measurements of motion constrained objects in a scene, e.g., vehicles. The method comprises determining a location parameter, and/or other interesting properties, for each...  
WO/2017/024765A1
A display apparatus (10), a display system and a resolution adjustment method. The display apparatus (10) comprises a display screen (11), and also comprises: a distance sensor (12) and an adjustment unit (13), wherein the distance senso...  
WO/2017/022004A1
The purpose of the present invention is to provide a method and device for measuring pattern height, with which it is possible for the height of a pattern included in a specific layer of a multilayered structure to be rapidly and accurat...  
WO/2017/022818A1
An antenna and a reflection plate are coupled with a coupling member with both being rotated in the same direction by a waveguide rotation means, and the reflection surface of the reflection plate is tilted to the antenna side or the sid...  
WO/2017/010617A1
The present invention relates to a detection method for detecting a change in an underground environment. The detection method of the present invention comprises the steps of: repeatedly sensing an alternating current signal, propagated ...  
WO/2016/198690A1
The present invention relates to a millimeter or terahertz wave sensor for providing inline inspection, preferably including but not limited to continuous monitoring of objects, for example thin sheet dielectric material.  
WO/2016/187623A1
Disclosed is a method and an apparatus for x-ray techniques using structured x-ray illumination for examining material properties of an object. In particular, an object with one or more regions of interest (ROIs) having a particular shap...  
WO/2016/185012A1
The invention relates to a method for characterizing the microstructure of a strip or sheet (8) of metal. The object of providing an improved method for characterizing the microstructure of a strip or sheet of metal is achieved by a meth...  
WO/2016/167166A1
A charged particle device is configured to be provided with: a charged-particle source; a blanking electrode unit (10) for blanking a charged particle beam emitted from the charged-particle source; a deflection electrode unit (11) for de...  
WO/2016/158576A1
The through-silicon via (TSV) forming production system according to the present invention includes: X-ray inspection devices (10, 11, 12) that acquire images showing the shape of a through-silicon via (70) formed in a silicon substrate ...  
WO/2016/132452A1
A terahertz wave measurement device (100) is provided with an irradiation means (110) for irradiating terahertz waves (THz) onto an object of measurement (10), a detection means (130, 151) for generating a first detection signal by detec...  
WO/2016/121265A1
The purpose of the present invention is to provide a method for observing a sample using a charged particle microscope such that a combined image can be generated from a plurality of images detected by a plurality of detectors while the ...  
WO/2016/121073A1
The purpose of the present invention is to provide a pattern matching device and computer program that carry out highly accurate positioning even if edge positions and numbers change. The present invention proposes a computer program and...  
WO/2016/117103A1
The purpose of the present invention is to provide a recipe creation device, with the goal of using past recipe data in order to highly efficiently create recipes. As an embodiment with which to achieve this goal, there is provided a rec...  

Matches 1 - 50 out of 7,343