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Matches 601 - 650 out of 2,113

Document Document Title
JP2017072526A
To provide a polarization measurement device that can quickly measure a light polarization state, for example, using only one intensity fringe image.A polarization measurement device measures a polarization state of light, and the polari...  
JP2017072527A
To provide a snap-shot imaging type polarization measurement device that makes it easy to secure an amount of light, and can achieve a high S/N level.An interferometer comprises: a division member that divides measurement light through a...  
JP2017067536A
To provide a PV vector measurement device capable of measuring a target PV vector.The PV vector measurement device includes: a light source 101 for outputting probe light for measurement; a polarization converter 102; a polarimeter 104; ...  
JP2017058559A
To provide an optical device that allows a simple configuration to acquire polarization information without losing chromatic information or resolution.An optical device 8 in which in order from a subject side, a first wavelength plate 3,...  
JP2015169599A5  
JP6094571B2  
JPWO2014208754A1
A polarization measuring instrument with which a light beam measuring device measures a polarization state of a laser beam reflected in part in the 1st measuring part beam splitter including the 1st measuring part beam splitter installed...  
JP2017504791A
A programmable multifunctional spectrum and/or a polarization imager. A imaging optical subsystem constituted so that this imager might receive electromagnetic radiation from a left scene for example, A focal plane array constituted so t...  
JP6068783B2  
JP6065875B2  
JP6058692B2  
JP6055006B2  
JP2016217752A
To make it possible to evaluate anti-corrosion of stainless steel non-destructively in a short time.A method for evaluating anti-corrosion of stainless steel comprises: measuring more than ten measuring points in a measurement range of m...  
JP6040162B2  
JP6029684B2
A terahertz ellipsometer, the basic preferred embodiment being a sequential system having a backward wave oscillator (BWO); a first rotatable polarizer that includes a wire grid (WGP1); a rotating polarizer that includes a wire grid (RWG...  
JP2016536609A
Since a device provides (ii) spectrum polarization analysis with the high-intensity light source which provides the irradiation beam of selectable many wavelengths in the range of a (i) far ultraviolet ray wavelength to an infrared wavel...  
JP2016535281A
The method and system which measure the optical different direction characteristic of the film on glass or other substrates are given. even if this art comes out and there is to a super-high pixel density display, it is suitable for manu...  
JP6018429B2  
JP2016533496A
The present invention relates to the device for analyzing and/or generating the polarization state of the point of measurement of a subject object, and is this device, Suitable light polarizer to choose the optical beam by which linear p...  
JP6013102B2  
JP2016180627A
To provide a polarized light measuring device and a polarized light irradiation device capable of accurately measuring polarization direction of polarized light and amount of light polarized light.A polarized light measuring device 1 inc...  
JP2016166841A
To provide a spectral device that can detect a polarization state at a selected wavelength.There is provided a spectral device separating a specific-wavelength component in an input signal, using a diffraction grating 15. The spectral de...  
JP2016163351A
To provide methods and systems for in-band optical signal-to-noise ratio (OSNR) monitoring.The methods and systems for in-band OSNR monitoring include a tunable optical filter to scan a passband of a desired optical channel. The optical ...  
JP5978528B2  
JP5972061B2  
JP2016142734A
To provide a light irradiation device capable of precisely measuring a polarization axis angle of polarization light that irradiates an object.A light irradiation device emits polarized light and includes: a light source 7; a device side...  
JP2016521866A
[Means for Solution] An invention about polarization Microscope using a polarization state of a cell by which spectrum coding was carried out. A polarization microscope based on this spectrum coding has optics and compatibility which hav...  
JP2016100440A
To provide a silicon carbide substrate manufacturing method which can detect at least one of an altered layer and stacking fault with high accuracy.A silicon carbide substrate manufacturing method comprises the steps of: preparing a sili...  
JP5914455B2  
JP5904793B2
A spectroscopic polarimetric system of broad spectral range, includes a light source suitable for emitting an incident light beam over a wavelength range, a polarization state generator (PSG), a polarization state analyzer (PSA), and a d...  
JP2016053499A
To provide a method and a device for quickly and accurately measuring polarization azimuth of an electromagnetic wave.An electromagnetic wave polarization azimuth measurement device comprises: at least one electromagnetic wave output par...  
JP2016509687A
The polarization measurement device (10) which asks for polarization of the optical beam (16, 46) provided with the reflector (12, 58) and the detector (14, 20) is indicated. a reflector (12, 58) plays the role which reflects an optical ...  
JP5897056B2  
JP2016014674A
To provide a method for determining an overlay offset amount of an object to be measured having an overlay structure.A method for determining an overlay offset includes: obtaining a first antisymmetric differential signal ΔS1 associated...  
JP5827507B2  
JP2015206599A
To expand a polarization angle at a fixed magnification.A polarimeter 1 uses a blazed diffraction grating having an approximate Littrow arrangement as a polarization angle expansion part 10. The Littrow arrangement is an arrangement in w...  
JP5800308B2  
JP5793854B2  
JP2015169599A
To acquire polarization information including linear polarization and circular polarization in a short time and statically with high accuracy.A sensor 100 has: a phase adjustment unit 110; a light detection unit 120; and a photoelectric ...  
JP5774030B2  
JP2015155896A
[Subject] A single camera which does not have or have a polarizing filter is used, and a system which can acquire polarization data is provided. [Means for Solution] When a polarizing filter is used, it is a data acquisition method, An a...  
JP2015127708A
To develop systems and methods for optical tools that are designed to use light that is at least partially absorbed by air and that have more efficient purging systems.A method for measurement of a specimen comprises: measuring reflectom...  
JP2015128228A
To improve recognition performance in object recognition processing using polarization information included in a polarization image that has been acquired by an imaging device.An image recognition unit 30-1 includes: a polarization infor...  
JP5740982B2  
JP2015114266A
To provide a polarization analyzing apparatus that can quickly measure polarization characteristic of samples.A polarization analyzing apparatus comprises a light source 2 that emits light having a prescribed wavelength range, a polarize...  
JP2015096864A
To provide a method for manufacturing a plurality of gas cells in which capacity and concentration of gas to be stored are uniform as compared with a case using a glass tube for exhaust.A gas cell manufacturer performs an arrangement ste...  
JP5722094B2  
JPWO2013077097A1
高速、高精度に電磁波の偏波方向と電場振幅 を測定することのできる偏波解析装置を提供 する。偏波解析装置は、電磁波を発生する電 磁波発生源と、電気光学効果を有する非...  
JPWO2013077097A
The 偏波 analysis device which can measure for 偏波方 and electric field amplitude of electromagnetic waves at high speed and with high precision is provided. The source of an electromagnetic wave generation where a 偏波 analysis ...  
JP2015075330A
To more accurately and easily measure circular dichroism of a sample.Artifact components included in conventional circular dichroism measurement results are removed by obtaining a matrix element S02 and a matrix element S20 of a Mueller ...  

Matches 601 - 650 out of 2,113