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JP2015059743A |
To uniform light quantity of branched light.An optical branched element includes: a first surface; a second surface opposite to the first surface; a first light take-out unit that is provided in a first area where light flux is made inci...
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JP5648780B2 |
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JP5644069B2 |
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JP5637448B2 |
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JP5631636B2 |
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JP5605399B2 |
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JP5587057B2 |
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JP2014160175A |
To propose a new method for improving the purity of linear polarization.A linear polarization purity improving unit 1A comprises a circular polarization section 40, and a linear polarization section 50 that converts outgoing light from t...
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JP5555099B2 |
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JP5548989B2 |
Provided is present invention a measurement method of Fourier coefficients using an integrating photometric detector, wherein, when measuring an exposure (S j ) with a predetermined time interval during a predetermined time period using ...
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JP5516802B1 |
To provide a photo-alignment irradiation device capable of accurately measuring the polarization characteristics of polarized light according to the light actually irradiated. In a photo-alignment irradiation device 2 provided with a pol...
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JP5469590B2 |
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JP5472096B2 |
The invention relates to an imaging optical inspection setup for inspecting a sample (5). Said inspection setup comprises a source of light (3) illuminating a specified portion of the sample surface by non-collimated light (4) in a plane...
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JP5448494B2 |
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JP5446644B2 |
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JP2014035254A |
To provide a back focal plane microscopic ellipsometer which obtains a further accurate optical constant and a film thickness of a sample in consideration of contribution of an objective lens by determining accurate polar coordinates of ...
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JP2014035257A |
To provide a Mueller matrix microscopic ellipsometer capable of measuring the Mueller matrix of a sample if either one of an irradiation optical system side and a detection optical system side includes an active element.An incident optic...
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JP2014016197A |
To provide an optical signal measuring device capable of estimating OSNR of the polarized and multiplexed signal.An optical signal measuring device includes: an optical port for input from which an optical signal to be measured is inputt...
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JP5370155B2 |
A surface examining device exhibiting an improved defect detection accuracy by increasing the amount of information used for pattern defect detection. A diverging light beam emitted from a light source (1) is converted into a linearly po...
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JP5368507B2 |
Two phase modulators or polarizing elements are employed to modulate the polarization of an interrogating radiation beam before and after the beam has been modified by a sample to be measured. Radiation so modulated and modified by the s...
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JP5361843B2 |
To evaluate optical anisotropy irrelevantly to a retardation value of a retardation plate and a DC component of transmitted light intensity. Progressions äϕP,i}=äcP+APti}, äϕA,i}=äcA+AAti}, and äϕR,i}=äcR+ARti} are c...
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JP5318823B2 |
To provide a light spectrum analyzer and a light spectrum analysis method capable of measuring an OSNR with an easy control. The light spectrum analyzer 91 is configured to obtain a spectrum of an optical signal to be measured by using a...
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JP5319437B2 |
An apparatus includes an electromagnetic signal device (712), a medium, and a sound wave generator (714). The sound wave generator (714) includes a carbon nanotube structure. The electromagnetic signal device (712) transmits an electroma...
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JP5319468B2 |
To provide an optical circuit that can be used in a small, reliable, and inexpensive polarization degree monitor or an OSNR monitor. The optical circuit includes: a polarization beam splitter (PBS) which splits an input optical signal in...
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JP5318832B2 |
To provide an optical spectrum analyzer and an optical spectrum analysis method that measure an OSNR under easy control. The optical spectrum analyzer 91 performs orthogonal detection of signal light to be measured with local light, and ...
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JP5296731B2 |
An apparatus for detecting electromagnetic wave includes an electromagnetic wave sensor, a first electrode and a second electrode spaced from each other and electrically connected to the electromagnetic wave sensor, and a measuring devic...
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JP5289989B2 |
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JP2013170866A |
To provide an optical measurement apparatus in which error is reduced.An optical measurement apparatus is configured to measure light transmitted from a measurement target disposed in an optical path of light emitted from a light source ...
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JP5248722B2 |
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JP2013137209A |
To shorten a time required for measuring wavelength dependence of an angle change of a plane of polarization in a material.A magneto-optical effect measuring device 10 comprises: a white light source 1 for generating white light; a polar...
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JP5223585B2 |
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JP5209880B2 |
A method for approximating an influence of an optical system (12) on the state of polarisation of optical radiation is provided. The method comprises the steps of providing incoming optical radiation (24) for the optical system (12) in s...
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JP5191851B2 |
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JP5165278B2 |
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JP2013053921A |
To provide an ellipsometer capable of accurately measuring a measuring object in vacuum atmosphere, and even when an optical fiber is attached/detached, capable exerting no influence on measurement accuracy.A light projection part 13 and...
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JP2013505459A |
An apparatus and system for use in determining location of a celestial body are presented. The apparatus comprises: a polarizer comprising an array of polarized light filter cells and a light sensor array. The array of polarized light fi...
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JP5140789B2 |
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JP5140409B2 |
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JP5133242B2 |
The method for measuring the porosity of an element is performed by means of a measuring device comprising a measuring chamber in which the element is disposed, a solvent tank associated with an adsorption valve, and a pump associated wi...
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JP5120927B2 |
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JP5118311B2 |
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JP5116346B2 |
An apparatus for measuring a phase difference using a spectrometer is provided to improve the measurement accuracy by correcting a loss of transmittance due to absorption and dispersion. An apparatus for measuring a phase difference usin...
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JP5113987B2 |
A passive optical system substantially simultaneously separates light received at an optical input into three or more output light beams on optical outputs. The output light beams may have intensities that are proportional to intensities...
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JP2013002900A |
To provide an ellipsometer device for effectively measuring a film thickness and a refractive index of an anti-reflection film formed on a surface of a mono-crystalline silicon solar cell.An ellipsometer device 10 comprises: a light sour...
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JP5109112B2 |
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JP5096519B2 |
A method for detecting polarizing direction of electromagnetic wave includes disposing a carbon nanotube structure in a vacuum environment, irradiating a surface of the carbon nanotube structure by an electromagnetic wave with a polarizi...
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JP2012233901A |
To provide a method for evaluating the birefringence of a novel adhesive, a method for designing and a method for producing an adhesive using the evaluation method, and to provide the adhesive obtained by the production method, and a pol...
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JP5056543B2 |
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JP5054127B2 |
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JP5053327B2 |
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