Login| Sign Up| Help| Contact|

Patent Searching and Data


Matches 701 - 750 out of 2,114

Document Document Title
JP5209880B2  
JP2013520675A
A method, a system, and a polarizing filter for analyzing the polarization characteristic of light are explained, and it is the method, It has a stage of separating polarization information and spectacle image data of a spectacle which w...  
JP5191851B2  
JP5165278B2  
JP2013053921A
To provide an ellipsometer capable of accurately measuring a measuring object in vacuum atmosphere, and even when an optical fiber is attached/detached, capable exerting no influence on measurement accuracy.A light projection part 13 and...  
JP2013047669A
To provide an analysis apparatus and an analysis method for detecting an increase position of birefringence in an optical fiber with a simple structure in a short period of time.In an apparatus for analyzing an optical fiber, a light sou...  
JP2013505459A
This device is an array of polarization philharmonic Tercel, and each cell was provided with the second polarizing filter that has the second different polarization direction from the first polarizing filter and the first polarization di...  
JP5140789B2  
JP5140409B2  
JP2013019812A
To provide an optical tomographic image forming system capable of achieving size reduction and cost reduction attendant thereon, and a detection unit used therein.An optical tomographic image forming system 100 includes a detection unit ...  
JP5133242B2  
JP5120927B2  
JP5118311B2  
JP5116346B2  
JP5113987B2  
JP2013002900A
To provide an ellipsometer device for effectively measuring a film thickness and a refractive index of an anti-reflection film formed on a surface of a mono-crystalline silicon solar cell.An ellipsometer device 10 comprises: a light sour...  
JP5109112B2  
JP5096519B2  
JP2012233901A
To provide a method for evaluating the birefringence of a novel adhesive, a method for designing and a method for producing an adhesive using the evaluation method, and to provide the adhesive obtained by the production method, and a pol...  
JP2012208104A
To provide an infrared sensor and an infrared sensor array capable of detecting specific polarization without using additional configuration such as a polarization filter.An infrared sensor 100 as a semiconductor optical element includes...  
JP5056543B2  
JP5054127B2  
JP2012202812A
To provide a CD measuring apparatus having enhanced measurement sensitivity and improved reliability, and a CD measuring method.A circular dichroism measuring apparatus comprises elliptical polarization modulation means which modulates t...  
JP2012198183A
To manufacture a plurality of gas cells in which capacity and the concentration of gas to be stored are uniform as compared with a case using a glass tube for exhaust.A gas cell manufacturer performs an arrangement step for respectively ...  
JP5053327B2  
JP5041508B2  
JP5037506B2  
JP2012181098A
To provide an optical intensity spectrum measuring method and device that are capable of achieving high-wavelength resolution and high-speed measurement simultaneously.An optical intensity spectrum measuring device comprises; a wavelengt...  
JPWO2010100766A1
本発明は旋光性をもつ生体や組織、血液、分 子などの存在やその含有量を高精度に測定で き、小型化できる旋光測定装置と、旋光性を もつ生体や組織、血液、分子などの存在...  
JPWO2010100766A
Let it be a subject to provide the 旋光 measuring method which the present invention can measure the existence of a living body, an organization and blood, a molecule, etc. with optical rotation, and its content with high precision, an...  
JP5012145B2  
JP5014337B2  
JP5007979B2  
JP2012154847A
To prevent false recognition of a polarization characteristic distribution in an imaging area.The imaging device includes a polarization filter array 2 formed on the light-incident side of an image sensor 4 having photo detectors C0-C5 a...  
JP4997385B2  
JP2012141264A
To evaluate the accuracy of a measurement result of a wavelength resolved Stokes vector.An apparatus for measuring a wavelength resolved Stokes vector includes: wavelength sweeping means for resolving an inputted optical signal in a spec...  
JP2012141623A
To provide a retarder system which has small wavelength dependence.Two rhombohedral bodies in a parallelogram shape are placed in such fixed directions that an incident electromagnetic beam is totally reflected at least once inside each ...  
JP2012122835A
To calibrate and efficiently measure an absolute value of a signal observed as a magneto-optical effect.A magneto-optical spectral instrument 1 includes: linear polarizing plates 4 and 7 with rotary mechanisms which can adjust angles φ1...  
JP2012114639A
To provide a communication system for measuring a power deviation between polarized waves using a simple structure.In a communication system, a modulation unit superimposes signals with different frequencies on a plurality of lights, res...  
JP4950234B2  
JP4950813B2  
JP4947998B2  
JP2012103222A
To evaluate optical anisotropy irrelevantly to a retardation value of a retardation plate and a DC component of transmitted light intensity.Progressions {P,i}={cP+APti}, {A,i}={cA+AAti}, and {R,i}={cR+ARti} are calculated from a progress...  
JP4936477B2  
JP2012093098A
To provide a measuring instrument for measuring the thickness of a thin film in a very small area or two-dimensional distribution of an optical constant at high speed and with high definition.An ellipsometer comprises an incident optical...  
JP4928897B2
A polarization evaluation mask for evaluating the state of polarization of an illumination light in exposure equipment comprises a transparent substrate; a light interceptor formed in said transparent substrate and having a plurality of ...  
JP2012083311A
To provide a miniaturizable high accuracy polarimeter by constituting the polarimeter without using a Faraday cell.A polarimeter generates linearly polarized light by a polarizer 14, branches the linearly polarized light, which has passe...  
JP4921090B2  
JP2012068031A
To separate each polarized light of a polarization multiple signal light in which orthogonal polarized waves with the same wavelength are multiplexed, and to evaluate the characteristics of each signal light.Rays of light made incident o...  
JP2012507027A
A spectroscopic polarimetric system of broad spectral range, includes a light source suitable for emitting an incident light beam over a wavelength range, a polarization state generator (PSG), a polarization state analyzer (PSA), and a d...  

Matches 701 - 750 out of 2,114