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JP2004325336A |
To provide a circular dichroism measuring apparatus which can measure circular dichroism in a powdery sample.The circular dichroism measuring apparatus 10 is provided with a polarization modulation means 14 which periodically modulates t...
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JP2004301827A |
To provide an organic polarization sensor of a great photoelectric current, having a high dichromic ratio in the photoelectric current.This organic polarization sensor has a layer containing a conjugated polymer, and a pair of electrodes...
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JP2004294355A |
To solve a problem wherein a measuring instrument itself is constituted to get complicated and large because a light source and a light intensity detector are provided in both sides with a sample therebetween, in the measuring instrument...
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JP2004294293A |
To provide a method for collectively observing and measuring the optical characteristics of a plurality of samaples different in component or composition to two-dimensionally and collectively evaluating them using circular polarization a...
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JP2004279380A |
To provide an instrument for measuring the angle of rotation, having a simple structure and which does not take much time for measurement.The instrument for measuring the angle of rotation is equipped with a light source 11, an optical r...
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JP2004530106A |
The invention relates to optical engineering, in particular to methods for measuring a microrelief, the distribution of optical material constants of a near-surface layer and can be used for microelectronic engineering, nanotechnology, m...
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JP3569217B2 |
An apparatus and method for measuring optical signal-to-noise ratio in optical communications includes (1) a variable optical band-pass filter (VOBPF) that passes the amplified output beam when the beam wavelength is the same as the pass...
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JP2004257883A |
To provide a light intensity measuring device capable of improving accuracy of a light intensity measurement and automatically measuring light intensity when two light beams having respective wavelength values pass through an object to b...
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JP2004233347A |
To provide a heterodyne receiver capable of more accurate polarization measurement.At the input of polarization of light waves to the heterodyne receiver can be obtained by measuring the amplitude of an electrical signal, without measuri...
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JP3554663B2 |
A system and method for the in-vivo measurement of optical characteristics of a cornea includes an ellipsometer (10) which measures the phase shift in reflected light after it has passed through the cornea or been reflected from the reti...
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JP3554374B2 |
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JP3550381B2 |
To provide a time region polarization analysis apparatus for deriving the complex optical constant spectrum of a sample at a tera Hertz region without requiring any reference measurement. The polarization analysis apparatus comprises a l...
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JP3551422B2 |
PURPOSE: To provide a method for obtaining accurate information by directly analyzing a fine space image on an imagery surface by using subwavelength slits or an element equivalent to them. CONSTITUTION: A phosphor 45 and a photodetector...
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JP2004205311A |
To obtain a reflection spectrum measuring apparatus capable of obtaining a reflection spectrum whose spatial resolution is less than the wavelength of measurement light, namely a submicron or less.In addition to a spectral ellipsometer, ...
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JP2004198286A |
To overcome the problem such that an optical rotation angle modulation means utilizing a Faraday effect represented as a polarizer rotation mechanism and a Faraday cell is necessary for accurate an angle-of-rotation measurement, and an a...
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JP2004184225A |
To provide a double refraction measuring instrument which detects an accurate axial orientation of a sample without rotating the sample, and also to provide a method for detecting the axial orientation of the sample.The double refraction...
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JP2004185748A |
To estimate the amount of birefringence resulting from the influence of the stress applied to an optical disk when rotation.A central processing unit (47) measures a signal acquired by reflecting from a reference optical disk by an optic...
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JP2004519682A |
Disclosed is an apparatus and method for measuring a changing amount of insertion loss of an optical device depending on a polarization state of an incident light, i.e., a polarization-dependent loss. An incident light that is periodical...
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JP3537732B2 |
To provide an ellipsometer using a voltage-controlled liquid crystal retarder for measuring a sample quickly, easily, and accurately. In this ellipsometer using the voltage-controlled liquid crystal retarder, a first liquid crystal retar...
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JP3532165B2 |
To provide a thin film measuring method, using a spectral ellipsometer for precisely and accurately determining a thin film structure and the wavelength dependence of a dielectric constant. For ΨE, ΔE spectrum measuring data forming st...
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JP2004138618A |
To measure a residual stress of an optical fiber having a circular asymmetric stress distribution.This instrument for measuring the residual stress of the optical fiber is constituted of a light source for generating light for measuring ...
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JP2004514129A |
The invention relates to a method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope with the tested material being illuminated point by po...
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JP2004138615A |
To estimate a polarization mode dispersion (PMD) failure even if the PMD in transmission signal has time dependency at PMD measurement in an optical fiber communication system.In a step 350, the optical signal in a plurality of frequency...
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JP2004125590A |
To provide a method and an apparatus for detecting an azimuth of a magnetic bead without an indication by a fluorescent dye.Illumination light 50 passes through a limiting aperture 24 for moving in a plane perpendicular to an optical axi...
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JP3518269B2 |
To inspect the optical axis of a polarizing plate precisely even visually by arranging the first and second polarizing plates on a light transmitting plate so that the optic axis of the first plate and that of the second plate are line- ...
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JP2004510972A |
Methods for differential numerical aperture analysis of samples, utilizing angle-of-incidence measurements resulting from variable illumination or observation numerical apertures, or both. Metrology applications are provided, and more pa...
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JP2004101235A |
To measure the amount of distortion of a semiconductor membrane and the distribution of the amount of distortion in the direction of a film thickness by a method easier than a conventional technique in real time when the semiconductor me...
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JP2004093549A |
To exactly measure Stokes parameters without causing polarization fluctuation and a PDL (polarization dependent loss), when branching an incident light.The incident light L1 is branched into first branched lights L2a and L2b, when it is ...
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JP2004077278A |
To detect high-speed optical fluctuations and minor optical fluctuations with a high time resolution using acoustic sense with an excellent time resolution.When a point 5 requiring optical measurement on a display 4 is specified, an imag...
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JP2004069713A |
To provide a kit for clinical diagnosis as to an amount of a specific DNA-binding protein and a function thereof.This kit for the clinical diagnosis as to the amount of specific DNA-binding protein and the function thereof comprises a fl...
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JP2004069453A |
To solve problems that a substance whose rotatory polarization direction is not clarified cannot be measured when a rotatory polarization substance is measured using liquid crystals, and that, when substances having different rotatory po...
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JP2004069452A |
To solve such a problem that an instrument gets complicated to bring high cost and size-up since a polarizer is required to be rotated mechanically or by a Faraday rotator as a method for rotating a plane of polarization.This optical rot...
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JP3502578B2 |
To realize a waveguide type polarization condition measuring apparatus which is compact and superior in reliability and suited for mass production. The apparatus comprises on a substrate 11 a polarized light separator element 13 for sepa...
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JP2004061515A |
To provide a method and a device for determining an influence onto a polarization state by an optical system, and an analyzer.In this method and the device for determining the influence onto the polarization state of emitted light by the...
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JP2004504591A |
The invention concerns a spectroscopic ellipsometer comprising: a source ( 2 ) capable of emitting a broadband ray ( 4 ), a polarizer ( 10 ) for polarizing the broadband beam (4), and for producing a polarised incident beam (12) adapted ...
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JP2004045397A |
To provide an optical measuring device and optical current measuring device of high practical use, which are highly precise and stable for a long period of time.An optics storage box 21 stores a collimator of a transmission fiber 3, pola...
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JP2004504590A |
The invention concerns a spectroscopic ellipsometer comprising: a source ( 2 ) capable of emitting a broadband ray ( 4 ), a polarizer ( 10 ) for polarizing the broadband beam (4), and for producing a polarised incident beam (12) adapted ...
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JP2004037137A |
To provide a birefringence measuring device that simply, quickly and precisely measures birefringence characteristics of a measured object in an ultraviolet range, a heat treatment method and a strain removing device that can shorten hea...
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JP2004028922A |
To provide an apparatus for quickly and accurately evaluating and measuring delicate double refraction generated due to residual distortion and process distortion in a semiconductor wafer and an optical crystal and used for inspecting an...
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JP2004020567A |
To provide a method and a device for the determination of polarization-resolved scattering parameters of a light device which enables accurate measurement of fields outgoing from the light device for a reduced time period.The method of t...
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JP2004020539A |
To provide an infrared circular dichroism measuring instrument and an infrared circular dichroism measuring method improved in measuring time and measuring accuracy to easily permit assignment.The infrared circular dichroism measuring in...
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JP2004020405A |
To provide an optical method of measuring physical property and an apparatus therefor, which have a small and versatile chamber wherein the temperature of a sample and its atmosphere can be controlled, and a window member can be exchange...
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JP3489027B2 |
A process for reproducing hand and/or finger lines with a camera works without skin contact with the recording device. By using linearly or circularly polarized light in the paths of the illuminating and the reproducing light rays, it is...
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JP2004004128A |
To provide a method for detecting mutual coupling of two giant molecules in liquid phase by measuring polarization of fluorescent light emission from a probe portion.This device for measuring polarization of fluorescent light emission in...
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JP2004004085A |
To provide a measuring means quickly and exactly measurable of desired optical parameters in an optical system.By carrying out combined measurement of an interferometer and a polarization meter for an objective device under test, the unc...
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JP2003536064A |
A spectroscopic ellipsometer comprising a light source (1) emitting a light beam, a polarizer (2) placed on the path of the light beam emitted by the light source, a sample support (9) receiving the light beam output from the polarizer, ...
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JP2003294531A |
To provide a polarized wave analyzer capable of high-speed measurement, while maintaining high sensitivity and high accuracy.Light to be measured entering via a fiber 101 and a collimator lens 102 is transmitted through a Faraday element...
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JP2003287717A |
To provide a device and a method for polarization control for always controlling output light to an arbitrary polarization state, continuously controlling the output light to a desired and fixed polarization state, controlling elliptic p...
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JP2003529067A |
[Task] To provide a practical device and method for the precise measurement of the low level linear and circularly polarized birefringence properties of optical materials. A device and method for the precise measurement of the low-level ...
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JP3451515B2 |
To provide an optical sensor device for reflex type having such a structure that its sensor head is separated from the amplifier, with which it is possible to perform the positioning and angle setting of each optical element inside the s...
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