Login| Sign Up| Help| Contact|

Patent Searching and Data


Matches 151 - 200 out of 2,113

Document Document Title
WO/2012/002720A2
The present invention relates to an optical interferometer and a microscope using the same, and the optical interferometer comprises: a light source; a beamsplitter which splits light generated from said light source; a polarization spli...  
WO/2012/002207A1
Disclosed is a polarization imaging apparatus (1) which is capable of acquiring the detailed three-dimensional information and the polarization distribution of a subject by one image pickup, the polarization imaging apparatus being provi...  
WO/2011/155903A1
An apparatus and method of testing a magnetic medium at temperatures of interest is disclosed. Properties of the magnetic medium are determined by focusing light from a source of polarized light on a magnetic surface of the magnetic medi...  
WO/2011/150680A1
A broadband polarization spectrometer with normal incidence of easy focus-adjusting, chromatism-free, polarization characteristic maintaining, and a simple structure. In the broadband polarization spectrometer with normal incidence, at l...  
WO/2011/150673A1
Disclosed is a broadband spectrometer with inclined incidence of easy focus-adjusting, chromatism-free, polarization characteristic maintenance, and a simple structure, which comprises at least one polarizer (P, A), at least one curved r...  
WO/2011/123848A1
A method for imaging skin includes illuminating a subject with at least one light source of one or more light sources. The method includes acquiring a first image of the subject in a first polarization with a respective photodetector of ...  
WO/2011/098113A3
The invention relates to novel polymers containg repeating units based on benzodithiophene or derivatives thereof, monomers and methods for their preparation, their use as semiconductors in organic electronic (OE) devices, especially in ...  
WO/2011/117873A1
A system and method are presented for use in measuring polarization of an optical beam. The system is configured and operable for determining polarization profile along a cross section of the input optical beam, and comprises an optical ...  
WO/2011/098113A2
The invention relates to novel polymers containg repeating units based on benzodithiophene or derivatives thereof, monomers and methods for their preparation, their use as semiconductors in organic electronic (OE) devices, especially in ...  
WO/2011/075645A1
A polarimeter and polarimetry method are disclosed of the type in which light polarization rotating properties of a sample are measured by interposing the sample in the path of a light beam having base plane polarization in a plane of kn...  
WO/2011/058987A1
Disclosed is a polarimeter that employs a light source (31) other than LEDs or other sodium vapor lamps, which measures optical rotation of a specimen in solution and converts the optical rotation thus measured to an optical rotation wit...  
WO/2011/043930A1
Asymmetry metrology is performed using at least a portion of Mueller matrix elements, including, e.g., the off-diagonal elements of the Mueller matrix. The Mueller matrix may be generated using, e.g., a spectroscopic or angle resolved el...  
WO/2011/036662A1
An apparatus comprising an array of polarized light filter cells, each cell has a first polarized filter having a first polarization direction and a second polarized filter having a second polarization direction, the second polarization ...  
WO/2011/023765A1
A laser system (100) includes a laser (110), a housing (101) including the laser and a first chamber (120) arranged to receive laser radiation from the laser during operation of the laser system. The system also includes a first optical ...  
WO/2010/144866A3
A polarization camera (100) includes a microlement polarizer (104) that is situated in proximity to a focal plane array (106). The microlement polarizer is selectively scanned with respect to an optical image direct to the focal plane ar...  
WO/2011/011511A1
A method for determining an overlay offset may include, but is not limited to: obtaining a first anti-symmetric differential signal (ΔS1) associated with a first scatterometry cell; obtaining a second anti-symmetric differential signal ...  
WO/2011/006250A1
The present invention is a waveguide structure that facilitates guiding of IPPs and a method of IPP mode-matching. The structure of the waveguide of the present invention, and its channels in particular, may be lithographically defined t...  
WO/2011/007374A1
A method for identifying the orientation of wood fibres (2) comprises the operating steps of generating at least one beam of light (4) polarised in a predetermined first polarisation plane, projecting the beam of light (4) onto a surface...  
WO/2011/003041A1
An apparatus, for measuring an applied electrical field (130) and for reducing perturbation to the electrical field being measured, includes a laser (116) integrated into an electro optic crystal sensor head (101) prior to the output fib...  
WO/2010/151304A1
The present invention relates to ellipsometer and polarimeter systems, and more particularly is an ellipsometer or polarimeter or the like system which operates in a frequency range between 300 GHz or lower and extending to higher than a...  
WO/2010/144866A2
A polarization camera includes a microlement polarizer that is situated in proximity to a focal plane array. The microlement polarizer is selectively scanned with respect to an optical image direct to the focal plane array, and an image ...  
WO/2010/128307A1
A method of obtaining, in a single exposure, imaging information from an object (16) representative of more than two distinct illumination images, the method comprising the steps of generating first electromagnetic waves (14) at least so...  
WO/2010/128014A1
The invention relates to a method for identifying images of a scene (1), comprising a step of illuminating the scene by a beam of N wavelengths, polarised in a determined direction, N being a whole number higher than, or equal to, 3. Sai...  
WO/2010/127273A1
An optical device has the structure to perform switching and attenuation of an optical beam with reduced polarization dependent loss (PDL). The optical device includes a birefringent displacer and two liquid crystal (LC) structures. The ...  
WO/2010/098740A1
The present invention relates to ellipsoineter and polarimeter systems, and more particularly is an ellipsometer or polarimeter or the like system which operates in a frequency range between 300 GHz or lower and extending to higher than ...  
WO/2010/096637A1
This invention relates to the manufacture of semiconductor substrates such as wafers and to a method for monitoring the state of polarization incident on a photomask in projection printing using a specially designed polarization monitori...  
WO/2010/096407A1
Methods of monitoring critical dimensions in a semiconductor fabrication process include capturing at least one image of a first structure that has an effect on the polarization state of light reflected therefrom. For at least some of th...  
WO/2010/082000A1
The invention relates to a method and to a device (2) for determining a piece of polarisation information on a measurement point of a target sample (8), the device (2) comprising: - a light source (4) capable of emitting a rectilinearly ...  
WO/2010/081999A1
The invention relates to a method and to a device (2) for determining at least one piece of polarisation information on a measurement point of a target sample (8), the device (2) comprising: - a light source (4) capable of emitting a rec...  
WO/2010/068355A1
A polarimeter and method of polarizing incoming light includes an optical assembly, a first adjustable circular retarder (36) that rotates the polarization content of incoming light, a polarization beam splitter (38) that receives light ...  
WO/2010/035260A1
The present invention relates to a method and a device capable of measuring the rotation of linearly polarized light, with improved resolution and accuracy, by employing an efficient background subtraction system. The method and device a...  
WO/2009/019690A3
An optical measurement Method and System for spectroscopy are disclosed for evaluating the parameters of a sample. The device generally includes a broadband source for generating a light beam. Reflected light beam are simultaneously anal...  
WO/2010/005703A1
Disclosed embodiments pertain to optical assemblies which impart a spatially dependent rotation to linearly polarized light. A pair of optical assemblies may be used to apply a spatially dependent rotation to linearly polarized light in ...  
WO/2010/005874A1
Improving the throughput of systems for measuring birefringence of optical samples includes techniques for directing multiple beams through the photoelastic modulator component of the system so that, along with expanded detection mechani...  
WO/2009/150661A1
A PC based Polarimeter based on Malus' law comprising of a polarizer (P) and an analyzer (A1), arranged on a common axis so that their transmission axes are parallel. Linear polarized light passes through the analyzer (A1). The transmiss...  
WO/2009/127250A1
A circular polarisation spectrometer is disclosed comprising a source (1) of essentially monochromatic electromagnetic radiation preferably in the infrared range, an element (21, 37-45) for the generation of altematingly left and right c...  
WO/2009/059313A8
Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light so...  
WO/2009/127355A1
A scatterometer configured to measure a property of a substrate, includes a radiation source configured to provide a radiation beam; and a detector configured to detect a spectrum of the radiation beam reflected from a target (30) on the...  
WO/2009/118148A1
Four separately polarized beams are simultaneously measured upon diffraction from a substrate (W) to determine properties of the substrate. Linearly, circularly or elliptically polarized radiation is transmitted through a first beam spli...  
WO/2009/115342A1
The measurement of two separately polarized beams (Ix, Iy) upon diffraction from a substrate (W) in order to determine properties of the substrate is disclosed. Circularly or elliptically polarized radiation is passed via a variable phas...  
WO/2009/112174A1
Disclosed is an integrated polarization sensor comprising a polarization sensor element (30) that has an optoelectronic sensor (31) and a polarizing filter structure (32). The optoelectronic sensor (31) and the polarizing filter structur...  
WO/2009/106728A1
The present invention relates to a method and a device for direct, non-deformed one-shot measurement of the transient birefringence induced in an optical medium by a perturbation lying within the terahertz frequency range. The aim of the...  
WO/2007/061981A3
Instruments and methods relating to surface plasmon imaging are described. An instrument comprises a semi-circular rail and a driving mechanism. The driving mechanism is attached to a light source mount and a detector mount, and both the...  
WO/2009/069127A1
A polarimeter based on a modified Fizeau interferometer and a method for measuring the optical rotation of a polarized light beam by an optically active substance using the polarimeter, are provided.  
WO/2009/059313A1
Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light so...  
WO/2009/039274A3
A method is provided for measurement of dispersion or other optical and mechanical properties within a waveguide by inducing four-photon mixing at different locations within the waveguide by timing a pump signal to counter-collide with a...  
WO/2006/116701A3
An optical technique improving the imaging of a target inside suspensions of scattering particles includes the illumination of the scattering particles with circularly polarized light The backscattered light from the host medium preserve...  
WO/2008/147575A3
Methods and apparatus (10, 20, 25, 60, 70) for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices (120) and...  
WO/2009/048003A1
A surface examining device exhibiting an improved defect detection accuracy by increasing the amount of information used for pattern defect detection. A diverging light beam emitted from a light source (1) is converted into a linearly po...  
WO/2008/130383A9
The present invention generally relates to new photophysical characteristics associated with certain macromolecules, heterogeneous phases with a pronounced index of refraction contrast, and biological complex macromolecules. Given this, ...  

Matches 151 - 200 out of 2,113