| Document |
Document Title |
|
JP2007085975 |
To solve the problem wherein it is useful to remove an optically active substance other than a desired optically active substance in a sample by a filter using a packing, such as ion exchange resin, synthetic adsorbents, activated carbon...
|
|
JP2007079436 |
To provide an arbitrary polarized light generating device capable of generating arbitrary polarized light taking even wavelength dispersion into consideration.The arbitrary polarized light generating device is equipped with a light sourc...
|
|
JP3928714 |
To determine a thin-film multi-layer structure by setting a combined model of film thickness and complex index of refraction, calculating the simulation spectrum thereof, and fitting the simulation spectrum to measured spectrum by using ...
|
|
JP2007057244 |
To provide a polarization measuring device capable of miniaturization and cost reduction following a simple constitution, and capable of measuring the polarization state of light with accuracy required for an exposure device.This polariz...
|
|
JP2007046943 |
To provide an observation device which enables high-speed measurement, and also to provide an observation method.A first side surface is provided to the observation device which keeps a liquid crystal modulation element controlled so tha...
|
|
JP2007043150 |
To provide a wavelength-sensitive detector that is based on elongated nanostructures, for example, nanowires.The elongated nanostructures are parallel with respect to a common substrate, and they are grouped in at least first and second ...
|
|
JP2007040805 |
To effectively reduce errors in measuring parameters, which indicate a two-dimensional spatial distribution of a polarization state, caused by the variations in the retardation of a pair of double refraction prisms due to temperature cha...
|
|
JP2007040977 |
To measure the maximum value of a shift of peak wavelength of interference intensity accompanying polarization variation and the worst value of extinction ratio deterioration accompanying the polarization variation.At least any one of lo...
|
|
JP2007033187 |
To achieve polarization analysis by in-line measurement having nearly the same measurement convenience as in-situ measurement and also having higher measurement accuracy than in-situ measurement.The in-line measuring polarization analysi...
|
|
JP3909363 |
To remove effectively a measurement error of a parameter, showing spectropolarization characteristics of a sample which are generated through variously varying, depending on the state of the sample in retardation of a retarder, in a chan...
|
|
JP2006317424 |
To provide a method and an apparatus for measuring birefringence and PMD of an optical fiber with relatively small PMD in a free state correctly in a short time.The method of measuring the birefringence of the optical fiber includes step...
|
|
JP2006308286 |
To provide an apparatus for measuring a Stokes parameter for highly accurately and correctly measuring Stokes parameters without the occurrence of variations in polarization or PDL when incident light is branched.The apparatus is provide...
|
|
JP2006308477 |
To provide a method for efficiently discriminating crack defects by visualizing cracks generated in a wide core pattern, and to provide a method for manufacturing a polymer optical waveguide using it.The method for inspecting the polymer...
|
|
JP2006308550 |
To remove effectively a measurement error of a parameter, showing spectropolarization characteristics of a sample which are generated through variously varying, depending on the state of the sample in retardation of a retarder, in a chan...
|
|
JP2006300919 |
To provide an apparatus and method for measuring the kind of phase delays to achieve the purpose of phase delay measurement.In the apparatus and method for measuring a kind of phase delay, the apparatus includes the following. First, a m...
|
|
JP3873082 |
To enable measurement of a polarizing angle rotation generated by an object to be measured even when another object generating polarizing angle rotation exists besides the object to be measured, and enable measurement of the polarizing a...
|
|
JP3871818 |
To conduct accurate measurement of characteristics in the degree of polarization by controlling the temperature of a polarization scrambler to be inspected at a predetermined temperature, and maintaining approximately constant coherent l...
|
|
JP2006284397 |
To correct errors by calculations to improve the accuracy of measuring a Stokes parameter.Electric signals I0, I1, I2, and I3 corresponding to a four-part split component, a 0-degree linearly polarized component, a 45-degree linearly pol...
|
|
JP3866849 |
To simultaneously measure light through each analyzer and to reduce measurement time by using an analysis means where at least three types of analyzers are combined for measurement. A sample-transmission-type spectral polarization analys...
|
|
JP2006267078 |
To provide a polarization monitor using a reduced number of inexpensive components, capable of attaining sufficient precision by a simple manufacturing process, and capable manufacturing easily the polarization monitor of high performanc...
|
|
JP2006267393 |
To provide a method for evaluating a light leak by previously and precisely evaluating a frame-shaped light leak in a screen end part of a liquid crystal display device in a state wherein the polarizing plate is not mounted on the liquid...
|
|
JP3858101 |
To provide an orientation system for keeping the thickness and the degree of orientation of an oriented film or the like uniformly at high speed, orienting a molding material after introducing the same into an extrusion device, shortenin...
|
|
JP2006250631 |
To simply and precisely inspect an optical compensation sheet by controlling the inspection light amount, while meeting the constitution of the actual applied state of the optical compensation sheet to the liquid crystal panel.The optica...
|
|
JP3848833 |
To provide an evaluating method for measuring the thickness of a region where crystallinity is disturbed and the degree in disturbance of the crystallinity in non-destructive manner when a semiconductor region is implanted with impurity ...
|
|
JP2006226984 |
To effectively reduce a measuring error of a parameter indicating a spectral polarization condition generated by fluctuation caused by a temperature change and other factor in retardation of a phaser, while succeeding various features pr...
|
|
JP3844222 |
To inexpensively provide a birefringence measuring apparatus that can measure the amount of birefringence and the orientation of a birefringence principal axis by a relatively simple configuration even in a specimen such as a polymer mat...
|
|
JP2006214856 |
To provide a measuring apparatus and method for extensively measuring double refraction on a body under test with high accuracy.This measuring apparatus is equipped with an interferometer for measuring a wave front transmitted by the bod...
|
|
JP2006215197 |
To provide a quantum computing machine and a quantum computing method utilizing a bond of an optical resonator and an atom and having expandability for the number of quantum bits.Each optical system is provided with a switchable mirror (...
|
|
JP2006201162 |
To improve match of data calculated by a polarizing analysis device and a spectrophotometer with a measured value.An optical measuring system having the polarizing analysis device and the spectrophotometer is calibrated, and the polarizi...
|
|
JP2006201152 |
To provide a device and method for measuring a polarizing plate that can increase the accuracy of measurement to 0.1 degrees or less, increase the contrast and luminance, improve the yield and usage rate, and secure the measuring quality...
|
|
JP2006189411 |
To provide a measuring instrument and a measuring method for a phase delay.This measuring instrument of the present invention includes a monochromatic light source part, a photodetecting part, a polarizing plate and a polarization spectr...
|
|
JP3824885 |
To actualize a polarization corrector 100 which polarizes and corrects a light wave of linear polarized light, circular polarized light or elliptic polarized light into linear polarized light having a plane of polarization in a specific ...
|
|
JP2006179660 |
To provide a polarization measurement device which can measure the polarization state of light highly accurately without being practically affected by error regarding optical characteristics of a phase shifter and a polarizer.The polariz...
|
|
JP2006173628 |
To provide a lithographic apparatus arranged with the capability to measure the polarization of radiation projected by a projection system.An analyzer plate AP positioned between the projection system PL and a radiation sensor DS is illu...
|
|
JP2006153503 |
To provide a birefrigence measuring device capable of acquiring a highly accurate measurement result, even if an inexpensive phase plate is used, without using a high-accuracy quarter wave plate, and to provide a stress distribution meas...
|
|
JP2006145305 |
To efficiently conduct tests, even in testing almost the whole surface to be tested, in a surface tester, and to prevent overlapping of noise components, when the surface is coarse.Specific region P0 of the surface to be tested is irradi...
|
|
JP3791975 |
To provide method and system for measuring the phase difference between two orthogonal polarized components of a test beam and the intensity of these components. A partial polarization beam splitter 101 splits a polarized test beam 103 i...
|
|
JP2006078494 |
To measure polarization angle rotation for measuring electron density of a tokamak device, and to stably measure the electron density of the tokamak device with high reliability.A light source for generating a single wavelength of light ...
|
|
JP3782673 |
To provide a film thickness measuring instrument which can easily and securely manage a beam spot diameter and perform the management corresponding to user specifications and a sample for beam spot diameter management used for the method...
|
|
JP3782481 |
PURPOSE: To improve measuring accuracy and also enable measurement of polarization analyzing parameter of a sample as function of excitation frequency by exciting a sample by optical beam from an external optical system and phase modulat...
|
|
JP2006071458 |
To provide a measuring device and a measuring method capable of measuring a phase difference immediately only by setting a sample without a rotation mechanism.This double refraction phase difference measuring device is equipped with a li...
|
|
JP2006058055 |
To provide a birefringence measurement device that is easily manufactured and capable of high accuracy measurements, while having an inexpensive and simple structure.This birefringence measuring device 100 for measuring a birefringence c...
|
|
JP2006058299 |
To provide an improved determining method for the behavior of polarization of an optical device under test.The polarization dependent characteristic JDUT of the optical device 2 under test is determined. A response signal R is received f...
|
|
JP2006042234 |
To present an OSNR measuring method and apparatus capable of measuring an optical signal noise ratio (OSNR).An optical band pass filter (OBPF) 20 extracts a waveform of a target to be measured or a signal light component of a channel. A ...
|
|
JP2006030212 |
To provide an elliptic polarimeter, a measuring device and a method, a lithography device and a method.The elliptic polarimeter has an optical component and a detector. The optical component has two double-refractive parts which carry ou...
|
|
JP2005345391 |
To provide a semiconductor device capable of directly and accurately converting a difference of circularly polarized light states into a current or a voltage (a physical value), and a circularly polarized light detector composed by using...
|
|
JP2005337785 |
To accurately acquire information utilized for polarization analysis, while simplifying the configuration of an ellipsometer.This ellipsometer 1 is equipped with an irradiation part 3 for guiding polarized light to a substrate 9, and a l...
|
|
JP2005327938 |
To perform CMP treatment to a thin film formed on a substrate more accurately than a conventional one, by measuring accurately its film thickness when subjecting it to the CMP treatment.A method for polishing a thin film formed on a subs...
|
|
JP2005321328 |
To provide a small-sized polarization state measuring instrument capable of measuring precisely a polarizing state of an input signal light, by correcting differences in arrival times of the signal light up to photoreception elements cau...
|
|
JP2005308607 |
To provide a spectroscopic ellipsometer capable of suppressing the adverse effect of primary or above diffracted light to the utmost to certainly take out a desired signal based on zero-order diffracted light.In the spectroscopic ellipso...
|
