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JP2005010312 |
To provide an apparatus and method for wavelength independent phase modulation which generates a phase shift without depending on wavelength and does not assume the presence of a theoretically ideal optical element.A phase shifter in the...
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JP3632825 |
To actualize the wavelength measuring instrument which has a wide wavelength measurement range and high resolution. This is a physical measurement system which has more than one Bragg diffraction grating formed in an optical fiber where ...
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JP2005003680 |
To provide an optical spectrum analyzer which can correctly handle the phases of heterodyne signals.This phase-diverse coherent optical spectrum analyzer 100 is provided with an optical receiver 110 for receiving a 1st input signal and a...
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JP2005003389 |
To perform accurate measurement in a short time by reducing sufficiently a speckle noise by acquiring a sufficient integration effect on a line sensor in the short time, when measuring an oscillation center wavelength or the like of lase...
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JP2005003594 |
To provide a reflection wavelength measuring method for optical fiber grating which is capable of quick response and economical, and to provide a physical quantity measuring method.The measuring method utilizes the relation between the l...
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JP2004361284 |
To monitor and measure a measuring object over a distant and wide range.Light is made to get incident from a light source 17 into FBG sensors 10-13 for detecting a strain, a temperature and the like, via a photo-demultiplexer 18, a wavel...
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JP3630983 |
To obtain a method and an apparatus in which every component of a transmission wave front aberration is found by a method wherein an optical system, to be measured, which is turned is irradiated with a thin luminous flux, a change in an ...
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JP3630342 |
To provide an object measuring method and a device by which an end part position of a measuring object can be accurately measured, regardless of a color pattern of the measuring object or its transmitting characteristic. Transmissivity o...
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JP3632009 |
To provide a reaction control device to control various reactions by laser beam. The reaction control device consists of a single mode semiconductor laser oscillation device 11, a wavelength correction device 12 correcting so as to be th...
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JP3629446 |
To shorten the time required for inspecting many semiconductor lasers. The oscillation wavelength of a semiconductor laser is tuned to a prescribed target wavelength, by acquiring a corrected wavelength coefficient of replacing the funda...
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JP2004354209 |
To precisely measure the wavelength of a light without using a reference light source.The light to be measured is branched to two by a branching means 21, and the intensity Ea of one light Pd is detected by a light receiver 22. The other...
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JP2004348068 |
To provide an ultra-violet light producing device adaptive even to the case that a long optical path difference is required.A narrow band continuous laser beam emitted from a narrow band continuous laser beam source 1 is modulated by an ...
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JP2004340690 |
To provide a light frequency measuring instrument and a measuring method having a wide range of measurable wavelengths and used for finding a carrier envelope offset frequency fceo with a high S/N.The range of measurable wavelengths can ...
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JP2004333331 |
To provide a new laser wavelength measuring method capable of measuring simultaneously the wavelength of laser light highly accurately without requiring operation such as calibration, and a new sufficiently-miniaturizable laser wavelengt...
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JP2004325176 |
To provide an optical interference measuring device having easy constitution and an optical interference measuring method thereof for stably measuring coherence of light.The optical interference measuring device is constituted of a first...
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JP2004317460 |
To provide a method and apparatus for measuring optical wavefront, and to provide a method for adjusting a light source, wherein the wavefront of light flux emitted from the light source is easily observed.An optical wavefront measuring ...
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JP2004317376 |
To provide a wave front measuring method that can measure an accurate wave front by suppressing the influence of crosstalk, without enlarging a device therefor.In the past method, all the ray spot data were used for the fitting calculati...
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JP2004309201 |
To substantially shorten measuring time in comparison with conventional ones by application to measurement on the coherent length of a laser beam, for example, emitted in pulses.In this optical interferometer, light to be measured from a...
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JP3609460 |
PURPOSE: To reduce the range of light branch and convergence and to attain object detection using light having plural traveling routes by irradiating an object to be irradiated with at least one of plural separated light beams and detect...
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JP2004279142 |
To provide a method and device for measuring the wavelength of each channel of a wavelength-division multiplexing optical communication system, and a system for measuring the electric power of each wavelength-division multiplexing channe...
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JP2004273665 |
To provide an aberration measuring apparatus which can accurately measure the wave aberration of an optical system to be detected for a long period of time.The aberration measuring apparatus is for measuring the wave aberration of the op...
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JP2004273572 |
To provide equipment and a method for measuring wave aberration with high precision without using actual wavelength.Equipment for measuring the wave aberration of an optical system for soft X-rays comprises a light intensity detector for...
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JP2004271305 |
To provide a measuring instrument for performing cat's eye measurement with high accuracy on a high-NA Fizeau lens with respect to p-polarization, and to provide a Fizeau interferometer, an exposing device, and a device manufacturing met...
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JP2004264148 |
To provide a photographing device causing no danger of being broken even if a high-intensity laser beam enters it while providing low-cost measurement, and to provide a device and method using the same for measuring a laser interference ...
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JP3594335 |
PURPOSE: To enhance the accuracy of wave-length measurement by splitting an incident light beam into two beams advancing along two optical paths and by splitting another incident light beam having a known wave length into two beams advan...
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JP2004245626 |
To determine the high-speed wavelength variation characteristics of optical devices with high resolution.Emergent light X of an optical device 1 is made incident onto an orthogonal double luminous flux interferometer 23 via an incident p...
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JP2004226112 |
To make obtainable a clear interference pattern image without noise and measurable the shape of transmission wave front in surface shape measurement by passing low coherence light flux through a pathway during low coherence measurement, ...
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JP2004228284 |
To provide equipment for measuring the oscillation light frequency of a variable wavelength laser in which specific optical frequency characteristics is measured in a short period of time.The equipment for measuring the oscillation light...
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JP2004219423 |
To measure the quality of the wave front in a photolithographic tool, without disassembling the photolithographic tool, while producing wafers and performing exposures.A wave front measuring system comprises an electromagnetic radiation ...
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JP2004208257 |
To provide a control unit and a controlling method for stabilizing a wavelength whereby a channel is precisely obtained with an accurate specific wavelength from light outputted from a tunable element in an optical communications system....
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JP2004198381 |
To provide an interference device which measures the surface profile of a surface to be examined and the homogeneity of an object or the like, with high precision.The interference measuring device comprises an optical means, which causes...
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JP2004198382 |
To provide an interference device which measures the surface profile of a surface to be examined and the homogeneity of an object or the like, with high precision.The interference device comprises an optical means, which forms a light fl...
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JP2004199020 |
To accurately fix the light signal which is inputted by a simple member to a wavelength conforming to a fiber communication standard channel.When split beams are incident on an etalon, a different angle of incidence is given them by the ...
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JP2004191349 |
To provide a device and a method which determine an absolute wavelength of an optical signal by the following process, a determination of a coarse wavelength response and a fine wavelength response is made, then, the absolute wavelength ...
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JP2004184309 |
To enhance contrast of interference pattern for an interferometer.In the interferometer, a diffraction grating 21, a condenser lens 22, a transparent plate 23, a field lens 24, and an imaging element 25 are arranged in this order. Relate...
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JP2004187299 |
To provide an improved control method for an optical signal using a TLS (Tunable Laser Source).The method for controlling the optical source using the beat frequency includes the steps of: filtering at least two or preferably three actua...
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JP2004184686 |
To securely hold a ferrule at a prescribed position with a prescribed posture by providing a support portion to position and hold a posture of the ferrule and a displacement portion to hold the ferrule inserted into a ferrule insertion h...
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JP2004170383 |
To provide a WDM signal monitor which can improve the accuracy of wavelength measurement and will not be affected by an environment.A wavelength dispersion element spectrally separates a light to be measured at a different angle for each...
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JP2004170411 |
To provide a means for efficiently determining an optical property of a device under test.The optical property of the device under test DUT is determined from a detected DUT response signal or a signal derived therefrom, whereby the DUT ...
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JP2004163384 |
To provide a time resolution/nonlinear complex susceptibility measuring apparatus which can measure, without being affected by the distortions in the wavefront of a probe beam.Polarizations, which are mutually orthogonal by generating th...
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JP2004150939 |
To evaluate a characteristic such as a wave aberration and an individual aberration by a plurality of wavelengths, using relatively simple constitution.In this optical system for an optical characteristic evaluating device for collimatin...
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JP2004147323 |
To improve the S/N of a heterodyne beat signal and to prevent a photo-detector from being damaged.An optical heterodyne detection system includes an attenuator (124) for attenuating an input signal (102) before composing the input signal...
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JP2004138524 |
To provide an interpulse phase difference measuring method which has a sufficient sensitivity even to general optical combs, has high precision, is provided with a calibration means, and ensures precision.In this interpulse phase differe...
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JP2004132704 |
To provide a wavelength monitor capable of monitoring accurately the wavelength of a light source, and its reference value setting method.Light used for wavelength division multiplexing from a wavelength variable light source 1 is branch...
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JP2004125664 |
To provide a phase distribution measuring instrument for accurately calculating the center position of gravity even if a luminescent spot has greatly got out of position.This instrument is equipped with a compound-eye lens 30 formed by d...
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JP2004125768 |
To provide a method for accurately synthesizing a full aperture data map from sub aperture data maps sequentially overlapped.A totalized compensation frame includes independent compensation elements at sub apertures and corrects various ...
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JP2004126398 |
To provide an optical circuit which is superior in versatility and is proof against disturbance and to provide an evaluation device for the circuit.An input optical waveguide 12, an optical coupler 13, an optical interference circuit 14,...
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JP3544901 |
To maintain performance for a long term and execute measurement without selecting an installation environment by a method wherein intensity changes of spectrum components in mixed lights in accordance with changes of relative phases of l...
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JP2004109137 |
To provide a measuring system capable of substantially reducing a wavelength measured value, that is, a discrimination error caused by environmental change, and having a high-integration structure.In this measuring system 100, an inciden...
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JP2004101427 |
To provide an interferometer apparatus for easily performing alignment work of incident light beam while being simple in constitution.This interferometer apparatus includes: an interferometer apparatus body 1; a CCD camera 10 mounted on ...
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