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Patent Searching and Data


Matches 451 - 500 out of 33,328

Document Document Title
WO/2022/259291A1
[Problem] To provide a nondestructive test evaluation data management device capable of improving the ease of work for an evaluator and reducing the burden on a requester of evaluation work. [Solution] A nondestructive test evaluation da...  
WO/2022/260930A1
A segmented detector device with backside illumination. The detector is able to collect and differentiate between secondary electrons and backscatter electrons. The detector includes a through-hole for passage of a primary electron beam....  
WO/2022/259667A1
An X-ray fluorescence analysis device according to the present invention comprises a quantitative means (13) that uses the FP method, the quantitative means (13) executing: an intensity ratio instrument sensitivity curve creation step fo...  
WO/2022/259197A1
The present invention relates to a system (S) and a process for determining the water equivalent content of a snowpack (Snow Water Equivalent - SWE)  
WO/2022/255629A1
Disclosed is a Mossbauer analysis method for the simultaneous action effect of magnetic dipole and electric quadrupole interaction. The present invention is characterized by comprising the steps of: obtaining a Mossbauer spectrum of a sa...  
WO/2022/255494A1
A crushing system (1) according to the present invention comprises: at least one crusher (10) that crushes iron scrap source material (24); at least one component analyzer (13) that analyzes the components of shredder scrap (25) produced...  
WO/2022/253939A1
The invention relates to a device (1) for characterising a surface (SE) of a sample (E), comprising: − a chamber (C) comprising a medium (PE) for said sample, said chamber being connected to a pump, referred to as the primary pump (PP)...  
WO/2022/248471A1
The invention refers to an X-ray scattering apparatus (10), comprising: - a sample vacuum chamber (26); - a sample holder (20) placed inside the sample vacuum chamber (26) for aligning and/or orienting a sample (18) to be analyzed by X-r...  
WO/2022/250038A1
This non-destructive inspection system 1 has a non-destructive inspection device 2 and a management device 3. The non-destructive inspection device 2 is provided with: a neutron emission unit 10 capable of emitting a neutron beam; a gamm...  
WO/2022/248982A1
Object detection including receiving a fluoroscopic video including a plurality of fluoroscopic images captured by a fluoroscope rotated about a patient, generating a three-dimensional (3D) volumetric reconstruction from the fluoroscopic...  
WO/2022/250685A1
In one example in accordance with the present disclosure, a fluorescence detection system is described. The fluorescence detection system includes a microfluidic chamber to receive a sample containing a compound to be detected. The syste...  
WO/2022/246884A1
The present application relates to a deflector mechanism capable of reducing a phase difference, comprising a rotatable deflector, a connection rod, a fixed deflector, and a mounting portion. The central axis of rotation of the rotatable...  
WO/2022/248563A1
The invention relates to a method for operating a CT scanner (1), wherein, according to an inspection task, radiograms (11) of an inspection object (10) are captured for different radiographic directions using an X-ray source (2) and an ...  
WO/2022/246881A1
A detector (500) test device and a method for testing a detector. The test device comprises a sealed chamber (100), a moving assembly, a positioning test module (300), and a test light source module (400); the moving assembly is mounted ...  
WO/2022/249343A1
This particle analyzing device for analyzing a certain particle to be analyzed, using an electron microscope, with the particle placed on an implement: acquires a first reference value and a second reference value relating to brightness ...  
WO/2022/243576A1
The invention relates to the method for characterising a recrystallised dual-phase steel sample, which comprises identifying the TAF areas of the sample, comprising the following steps: a) carrying out at least one EBSD scan of a surface...  
WO/2022/245535A2
A system for detecting radiation includes a first array of neutron radiation detection devices, each radiation detection device including a charge storage region and a radiation reactive material; a first set of decoders to address the n...  
WO/2022/242152A1
Provided in the present invention is a multi-specification microscope linkage analysis sample table for a transmission electron microscope sample, the sample table comprising a unit body, an instrument compatible housing and an assembler...  
WO/2022/240547A1
A method of performing x-ray spectroscopy material analysis of a region of interest within a cross-section of a sample using an evaluation system that includes a focused ion beam (FIB) column, a scanning electron microscope (SEM) column,...  
WO/2022/239344A1
This additive manufacturing device additively manufactures a molding by supplying a powder material to a molding surface of the molding and irradiating the supplied powder material with a melting beam that melts the powder material. The ...  
WO/2022/238488A1
The invention relates to a detection device for carrying out multi-energy x-ray imaging, comprising a first detector, a second detector and a scintillator-filter sandwich which comprises the following features: a filter layer; a first sc...  
WO/2022/241427A1
An Al enhanced, self-correcting and closed loop SMT manufacturing system for fabricating PCBAs. The system includes a screen printer for depositing solder paste on solder pads on a RGB, an SRI sub-system for inspecting the solder paste d...  
WO/2022/239875A1
Provided are an analysis device and an analysis method with which it is possible to measure movement of macromolecules on a surface (interface) and obtain information regarding the vicinity of a surface being observed without labelling b...  
WO/2022/234000A1
The invention relates to a method for operating a computer tomography apparatus (1) in measuring a region of interest (11) of an object (10), wherein a source trajectory (20) of an x-ray source (2) with a focal point (2-1) is defined in ...  
WO/2022/235903A1
An x-ray system, comprising: a backscatter detector, comprising: an x-ray conversion material; a plurality of sensors configured to generate electrical signals in combination with the x-ray conversion material in response to incident x-r...  
WO/2022/234844A1
The present invention relates to a method for obtaining an x-ray CT image of a biological sample, and the like, said method including: a step for contrasting by causing a contrast medium that includes wax, that has a density of 0.95 g/cm...  
WO/2022/233154A1
A static CT inspection device, comprising: a shielding body (1), which is provided with an inspection channel (G) for an object to be inspected to pass; a ray source (3, 30) which emits, when the object to be inspected passes through the...  
WO/2022/235985A1
A through transmission-ray system with electron manipulation and accompanying methods of use are disclosed. The system may include an x-ray tube for accelerating influenced electrons under a high voltage potential for the purpose of irra...  
WO/2022/230112A1
This data analysis device comprises: an input unit that receives measured values of a photoelectron signal from a photoelectron spectroscopy device measuring the photoelectron signal that is produced from a sample by photoelectron spectr...  
WO/2022/232443A1
An apparatus for analyzing a core sample obtained from a subterranean formation includes a neutron generator, a plurality of detectors, a computed tomography scanner, an information processing device, and a transport system. The neutron ...  
WO/2022/231673A1
A method of evaluating a region of a sample, the method comprising: positioning a sample within a vacuum chamber; generating an electron beam with a scanning electron microscope (SEM) column that includes an electron gun at one end of th...  
WO/2022/231608A1
A microfluidic device is described. The microfluidic device comprises a reaction chamber and a temperature control module overlaying the reaction chamber. The temperature control module comprises a temperature regulating flow channel dis...  
WO/2022/228840A1
The invention relates to a method for measuring the detection sensitivity of an x-ray device for recognizing foreign matter in a product, the x-ray device having a detector, the detection signal of which results in a detection image havi...  
WO/2022/230538A1
Provided are a radiation detector and radiation detection device capable of suppressing performance degradation. This radiation detector, which comprises a radiation detection element, a circuit element, and a housing for accommodating...  
WO/2022/230539A1
Provided are a radiation detector and a radiation detecting device in which the use of wire bonding is reduced, and which allows a radiation detecting element to be replaced. This radiation detector includes a radiation detecting eleme...  
WO/2022/224240A1
Method and system are presented for managing material recycling process. Plastic and rubber material condition data is provided being indicative, for each of one or more plastic materials in a product, of preceding use of said plastic ma...  
WO/2022/225747A1
Methods and systems are disclosed that enhance the yield and speed of emission and control the spectral and angular emission of light emitted by materials under irradiation by high-energy particles through a process known as scintillatio...  
WO/2022/221956A1
Provided are systems and methods for determining 3D structure and 3D motion of a protein molecule from 2D or 3D particle observation images. The method including: initializing pose parameters and unknown model parameters; the parameters ...  
WO/2022/224654A1
Provided are a radiation detection element, radiation detector, and radiation detection device that make it possible to suppress reduction in the sensitivity of radiation detection. This radiation detection element comprising a flat-pl...  
WO/2022/224558A1
[Problem] To provide an X-ray inspection device comprising a processing means for taking in and processing X-ray images acquired by a two-dimensional X-ray detector disposed such that the two-dimensional X-ray detector and an X-ray gener...  
WO/2022/224414A1
This quality evaluation device 10: detects a defect present in a component X on the basis of a detection result obtained by a nondestructive inspection method; extracts a feature amount of the defect from detection information about the ...  
WO/2022/221908A1
An X-ray imaging apparatus comprises a digital X-ray detector housed in a radiation shielded enclosure with multiple pinhole apertures in the front panel of the housing. An X-ray source illuminates a target and X-rays are backscattered t...  
WO/2022/224653A1
Provided are a signal processing method, a computer program, a signal processing device, and a radiation detection device for improving the efficiency of detecting radiation. The signal processing method counts, by wave height, stepped...  
WO/2022/223055A1
A target assembly(1) and an X-ray microscope. The target assembly(1) includes a first section(101) including a first heat dissipating layer(3), in which the first heat dissipating layer(3) is provided with a first groove(301), a first ta...  
WO/2022/221948A1
A method of imaging an object in a first material having a different charge density to the object is provided, the method comprising: focusing a charged particle beam to a virtual charged particle beam source in the first material; movin...  
WO/2022/219946A1
The present invention provides a see-through-image-capturing device in which it is made possible to appropriately evaluate the internal structure of a device under test. This see-through-image-capturing device 1 is provided with: a timin...  
WO/2022/219667A1
The present invention relates to a defect inspection device that captures a mirror electron image. First, an objective lens parameter value that gives a predetermined defocus amount is determined from a plurality of mirror electron image...  
WO/2022/220918A1
A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned betw...  
WO/2022/173634A9
Methods and systems for estimating values of geometric parameters characterizing in-plane, distorted shapes of high aspect ratio semiconductor structures based on x-ray scatterometry measurements are presented herein. A parameterized geo...  
WO/2022/220721A1
There is provided a method and system for determining one or more confidence indications for machine-learning image reconstruction in Computed Tomography, CT. The method comprises acquiring (S1) energy-resolved x-ray data, and processing...  

Matches 451 - 500 out of 33,328