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WO/2024/049780A1 |
A method and device for pore network extraction by one or more processing units are disclosed. The method may include decomposing the global image into a set of overlapping subimages, extracting a set of subnetworks corresponding to the ...
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WO/2024/048758A1 |
This porous network complex is represented by formula (I) to (VIII), wherein: M2+ represents a divalent metal ion; M3+ represents a trivalent metal ion; L1a and L1b each represent a tridentate ligand having hexaazaphenalenyl; L2a and L2b...
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WO/2024/048200A1 |
This X-ray phase imaging system (100) comprises: an imaging system (6) including an X-ray source (1), an X-ray detector (2), and a plurality of lattices; a first rotation mechanism (7) which relatively rotates a subject (90) and the imag...
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WO/2024/044966A1 |
The present application provides an electrode plate detection apparatus, which is capable of effectively measuring the surface density of an electrode plate material over a whole area. The apparatus comprises: a radiation mechanism, wher...
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WO/2024/044968A1 |
Provided in the present application are a measurement method and apparatus for an electrode sheet. By means of the present application, the surface density of the entire area of an electrode sheet material can be effectively measured. Th...
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WO/2024/046030A1 |
A mineral separation apparatus and a mineral separation method. The mineral separation apparatus comprises a conveying mechanism (1), a first light source assembly (2) located above the conveying mechanism (1), a first detector assembly ...
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WO/2024/050027A1 |
Systems, methods, apparatuses, and computer program products for nonintrusive scanning of objects using x-ray electromagnetic radiation. One method may include adjusting, by a computed tomography scanning device, at least one operation p...
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WO/2024/043190A1 |
Provided are an inspection device, an inspection system, and an inspection method capable of accurately detecting a specific target object in an inspection target. According to an embodiment, the inspection device includes an image acq...
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WO/2024/044146A1 |
Parameters from an inspection image representing mechanical vibrations and electromagnetic interference can be determined. An X-direction vibration spectrum can be determined based on the X-direction offsets. A Y-direction vibration spec...
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WO/2024/043034A1 |
An X-ray inspecting device 1 comprises: an X-ray radiating device 2 for radiating X-rays toward a measurement target object OB; a scintillator 4 for converting incident X-rays that have passed through the measurement target object OB int...
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WO/2024/042865A1 |
A soft X-ray multilayer film diffraction grating according to the present invention comprises: a substrate in which diffraction grating grooves are formed; a reflection layer provided on the substrate; and a multilayer film provided on t...
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WO/2024/043000A1 |
Provided is a layered body comprising a metal particle aggregate layer, which is formed from multiple metal particles disposed spaced apart from each other, and a silicon-atom-containing layer. The silicon-atom-containing layer has a fir...
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WO/2024/041265A1 |
The present application relates to an X-ray fluorescence imaging method and apparatus, an electronic device, and a storage medium. The method comprises: enabling incidence of X-rays into a sample to be scanned, to excite X-ray fluorescen...
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WO/2024/038954A1 |
A cylindrical battery non-destructive testing device according to an embodiment of the present disclosure includes: an X-ray tube that radiates, through an exit window, X-rays generated by injecting of electrons into a target; a flat pan...
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WO/2024/039413A1 |
Methods and systems for estimating values of parameters of interest from X-ray scatterometry measurements with reduced computational effort are described herein. Values of parameters of interest are estimated by regression using a traine...
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WO/2024/032986A1 |
The invention relates to a calibration apparatus for a measurement device and to a method for calibrating the measurement device for the purpose of analysing materials or layer thicknesses using a calibration apparatus (11), consisting o...
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WO/2024/031666A1 |
The present application relates to the technical field of batteries, and provides a battery infiltration state detection method and apparatus, a device, a system, and a medium. The detection method comprises: acquiring a three-dimensiona...
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WO/2024/030045A1 |
An invention is proposed, that consists of a device for obtaining a radiographic image in backscattered radiation and a method for determining the material composition of an inspected object. The device contains an x-ray source with a me...
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WO/2024/029060A1 |
This sample measuring device comprises: a light source that irradiates a sample including an insulating film with light; an excitation source that irradiates the sample with a primary beam to emit charged particles; a detector that appli...
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WO/2024/030046A1 |
The operating principle of the method for determining the spatial profile of an inspected object via the backscatter inspection unit is based on registering the ionizing radiation scattered by the object of inspection towards the source....
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WO/2024/028117A1 |
The invention relates to a method for synthesis and analysis of the compound prepared by the synthesis, comprising the following steps: – liquid reactants and/or reactants dissolved in a liquid phase are introduced into a reactor; – ...
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WO/2024/029474A1 |
This X-ray imaging device (100) comprises: an X-ray tube (1) including a target (30), an electron beam emitting unit (11), and a vacuum container (15); a detector (2); a subject placement unit (3); and an image processing unit (5). The t...
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WO/2024/024796A1 |
Provided are an image management system, a sample selection method, an image management device, an image display device, and a program that are capable of accumulating, as know-how, the reason and the intent behind a selection of a regio...
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WO/2024/024296A1 |
This X-ray inspection device includes: an X-ray emission device for emitting X-rays toward a measurement target; a scintillator for converting the X-rays, that are emitted from the X-ray emission device and that enter through the measure...
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WO/2024/023536A1 |
A method of reconstructing electron microscopy images of size [M x N] pixels of a first sample, the method implemented by a computer comprising a processor and a memory, the method comprising: obtaining, using a first detector, a first e...
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WO/2024/023341A1 |
A dye-exchanged zeolite marker wherein the zeolite is characterized by a pores size comprised between 4 Å and 12 Å and the dye is an organic cationic molecule, characterized by an amount of dye comprised between 0.05 %wt and 1 %wt with...
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WO/2024/024797A1 |
Provided are an image management system, an image management device, an image management method, and an image management program with which it is possible to more suitably associate a parent sample and evaluation results of a child sampl...
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WO/2024/024771A1 |
Provided is a fluorescent plate configured to convert X-rays to visible light, the fluorescent plate having a first layer, a second layer, and a phosphor-containing third layer disposed between the first layer and the second layer, where...
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WO/2024/023240A1 |
The present invention relates to a biodegradable compostable polymer composition comprising at least one diacid-diol polyester and at least one marker, and a method for tracking biodegradable compostable polymer compositions. Said marker...
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WO/2024/026152A1 |
The specification discloses methods of adjusting calibration data in an X-ray inspection system. Calibration data is initially generated. X-ray scan images of a cargo container are then acquired. Each of the X-ray scan images are segment...
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WO/2024/025413A1 |
The invention relates to a method and a dual beam FIB/(S)TEM apparatus for in-situ sample quality inspection in cryogenic focused ion beam milling. The method comprises the steps of: loading the sample into a sample holder of the 5 dual ...
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WO/2024/021269A1 |
The present invention relates to the technical field of electron microscope equipment, and specifically disclosed are a cryo-stage for a cryo-electron microscope and a control system therefor. The cryo-stage comprises a cryo-electron mic...
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WO/2024/023248A1 |
The present invention relates to a segmenting method for delimiting objects (O) as segments (S) in a package (G) in an x-ray diffraction analysis, said method having the following steps: ‐ detecting pulse transmission functions (20) fo...
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WO/2024/022929A1 |
The invention relates to a method for measuring a test object (27) using a measuring device (11) by means of x-ray fluorescence, more particularly for measuring the thickness of thin layers on the test object (27) or for determining an e...
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WO/2024/026158A1 |
An x-ray fluorescence system and method of fabrication are provided which include a titanium x-ray source (510), a focusing, doubly-curved lithium fluoride (LiF) crystal optic (512), and a detector (518). The titanium x-ray source includ...
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WO/2024/023537A1 |
A method of reconstructing an electron microscopy image of size [M x N] pixels of a first sample, the method implemented by a computer comprising a processor and a memory, the method comprising: providing a set of pre-learned dictionarie...
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WO/2024/018249A1 |
This invention concerns in particular a device for generating thermal neutrons and X rays for thermal neutron imaging and for X ray imaging, comprising: - a generator (2) to produce fast neutrons and X-rays; - a neutron moderator (4) to ...
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WO/2024/018681A1 |
According to an embodiment, an inspection device comprises: an image capture mechanism; a two-dimensional directional filter processing circuit that performs, for each pixel, filter processing using a plurality of two-dimensional directi...
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WO/2024/020336A1 |
Embodiments described herein relate to methods of sorting energy storage devices. In some aspects a method can include measuring, via a physical sensing device, a physical property of a first plurality of energy storage devices. The meth...
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WO/2024/018275A1 |
A method for adaptive secondary ion mass spectroscopy, the method may include (a) adaptively setting a detection parameter that impacts an instantaneous count rate of a detector; (b) scanning an evaluated sample with a focused primary io...
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WO/2024/014178A1 |
Provided is a photography jig used when a radiographic image is captured by irradiating an imaging target with radioactive rays. The photography jig includes a moving mechanism which moves the position of the imaging target such as to ch...
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WO/2024/013039A1 |
The present disclosure relates to apparatus and methods for assessing samples (208) using charged particles. In one arrangement, a degassing action is performed by exposing a target area of a sample (208) with charged particles to stimul...
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WO/2024/015970A1 |
An example method to configure a radiography system (100) having a radiation emitter (106) and a radiation detector (108) involves: analyzing, using processing circuitry, a reference image captured using a first value of a first power pa...
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WO/2024/015795A1 |
A non-invasive semiconductor technique for measuring dielectric/semiconductor interface trap density can be performed by charging the dielectric by creating charges on the top surface of the dielectric layer over the wafer using Scanning...
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WO/2024/009278A1 |
The invention relates to a method of verifying the detection capability of an X-ray inspection apparatus with respect to a product type of in particular a food product, wherein a body is subject to X-rays propagating through the body in ...
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WO/2024/009572A1 |
This information processing device determines whether to re-capture a radiographic image, on the basis of: capture conditions which include the capture direction of a radiographic image captured by projecting radiation towards an examina...
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WO/2024/010360A1 |
Disclosed are a three-dimensional image generation method and an electronic device for performing same, according to various embodiments. The electronic device according to one embodiment of the present invention comprises: an image capt...
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WO/2024/008824A1 |
The invention relates to a plenoptic imaging system for acquiring an image of an object, this system comprising: - a source for generating an X-ray beam towards the object, - a main optical device for receiving and reflecting the beam co...
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WO/2024/008792A1 |
A device (200) comprising a plurality of structures (220a-h) formed on a substrate (210) and defining a metasurface is disclosed. The device comprises a marker structure (215; 225) formed on the substrate amongst the plurality of structu...
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WO/2024/006990A1 |
Embodiments determine the density of materials and objects imaged using computed tomography (CT). An embodiment co-images a material of unknown density with a calibrant of known density. The digitally reconstructed CT images are segmente...
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