Login| Sign Up| Help| Contact|

Patent Searching and Data


Matches 1 - 50 out of 40,235

Document Document Title
WO/2018/222613A1
Methods and systems for estimating values of process parameters, structural parameters, or both, based on x-ray scatterometry measurements of high aspect ratio semiconductor structures are presented herein. X-ray scatterometry measuremen...  
WO/2018/219406A1
The invention relates to a method for multielement analysis on the basis of neutron activation, comprising the steps: generating fast neutrons having energy in the range of 10keV to 20MeV; irradiating a sample (1) with the neutrons; meas...  
WO/2018/221636A1
The present invention provides an inclination angle amount calculation device used in a charged particle beam device in which a charged particle beam is impinged on the surface of a sample mounted on a sample stand, the inclination angle...  
WO/2018/221010A1
A method for measuring the stress of a test subject which comprises a metal, the method including: a detection step for detecting, using a two-dimensional detector, a diffraction ring of diffracted X-rays which is formed by causing X-ray...  
WO/2018/222658A1
Described herein are embodiments of methods and apparatus for determining the SoC and SoH a lithium ion battery and for restoring capacity to a lithium ion battery. Some embodiments provide a method and apparatus including an ultrasound ...  
WO/2018/221929A1
The present invention provides a method for measuring a pore distribution in an electrode for a secondary battery, which can easily measure a pore distribution inside an electrode for a secondary battery.  
WO/2018/221009A1
A method for measuring the stress of a concave section of a test subject which comprises a metal and has a surface and a concave section, the method including: a detection step for detecting, using a two-dimensional detector, a diffracti...  
WO/2018/220935A1
Provided is a sample holder for an X-ray fluorescence analyzer, wherein the sample holder enables a small amount of a liquid sample that cannot be drip-dried to be measured when performing measurement with an upper surface irradiation-ty...  
WO/2018/221718A1
Provided is a method which is capable of calculating a calculation parameter with high accuracy from an observation diffraction pattern of a powder sample. A best solution calculation method for a calculation parameter in an observation ...  
WO/2018/221605A1
The present invention provides a method for evaluating a processing deterioration level of a medical glass container, including (a) a step of imaging a surface of a medical glass container molded from a borosilicate glass tube to obtain ...  
WO/2018/222277A1
A containerized system for vehicle scanning, includes a container; the container having a vertically movable top portion of the container, the top portion including an X-ray source and a collimator; the container having a bottom portion,...  
WO/2018/215277A1
The invention relates to an assembly (10) comprising a carrier substrate (12) and at least one electronic component (14) connected to the carrier substrate (12), wherein the electronic component (14) has connection regions (18) on its lo...  
WO/2018/217646A1
A High Energy Beam Processing (HEBP) system (1) provides feedback signal monitoring and feedback control for the improvement of process repeatability and three-dimensional (3D) printed part quality. Signals (301, 302, 303, 308) reflectin...  
WO/2018/217453A1
To address the shortcomings presented in the prior art, the present invention provides a system and method to provide improved irrigation management through the detection of fast neutrons. According to a preferred embodiment, the fast ne...  
WO/2018/217788A1
Methods, systems, and apparatus for distributed ledger for physical material. In one aspect, a method includes obtaining a first set of information regarding a physical material to be verified, the first set of information including hund...  
WO/2018/216329A1
Provided is an X-ray tomography device that has a large photography range for which a short data collection time is sufficient. In the present invention, a first X-ray detector has an input surface provided within a plane perpendicular t...  
WO/2018/215762A2
A method for optimising detector performance in a dual-energy detector system comprising high-energy X-ray detection and low-energy X-ray detection, wherein the method comprises one or more steps from a group comprising: utilising differ...  
WO/2018/215802A1
A test apparatus (1), for challenging contaminant monitoring apparatus, the test apparatus (1) comprising: contaminant means (3), having a pre-selected property comprising any one or more of the group comprising composition, material, ma...  
WO/2018/217831A1
Methods and systems are provided for serial femtosecond crystallography for reducing the vast amount of waste of injected crystals practiced with traditional continuous flow injections. A micrometer-scale 3-D printed water-in-oil droplet...  
WO/2018/217793A1
A 3D printed hybrid nozzle device combining a microfluidic mixer with a liquid jet injector that addresses the bottleneck of investigating substrate-initiated biological reaction paths employing serial crystallography with XFELs. The hyb...  
WO/2018/217150A1
Disclosed is a method for reconstructing image data from x-ray data measured with an imaging system comprising at least one photon-counting detector. The method comprises the step of obtaining a representation of data measured by said ph...  
WO/2018/217817A1
A method is provided that includes applying at least one radiofrequency saturation pulse at a frequency or a range of frequencies to substantially saturate magnetization corresponding to an exchangeable proton in the ROI to generate magn...  
WO/2018/215449A1
The present disclosure relates to a method for detecting a fibre misalignment in an elongated structure, such as a wind turbine blade component. The elongated structure has a length along a longitudinal direction and comprises a pluralit...  
WO/2018/209381A1
A method and apparatus for analysing particulate material having one or more crystalline substances, the apparatus including: a grinder for receiving a sample extracted from the particulate material and grinding the sample into powdered ...  
WO/2018/213487A1
A system, computer program product and a method for detecting manufacturing process defects, the method may include: obtaining multiple edge measurements of one or more structural elements after a completion of each one of multiple manuf...  
WO/2018/211664A1
This X-ray spectrometer is provided with: an excitation source 12 for irradiating excitation rays onto an irradiation area A of a sample S, a diffraction member 14 provided so as to face the irradiation area A, a slit member 13 that is p...  
WO/2018/213794A1
According to some aspects, a carrier configured for use with a broadband x-ray source comprising an electron source and a primary target arranged to receive electrons from the electron source to produce broadband x-ray radiation in respo...  
WO/2018/211502A1
Systems and methods for marking of objects, such as keys/key-blanks, in a production line are disclosed. The objects are marked by applying a marking composition(s) to pre-selected areas on the surface thereof. The system includes a mark...  
WO/2018/213104A1
The present invention provides a method, a computer program and a system for analyzing rock from an image of a sample region of the rock, including accessing element maps of the sample region in a database, with each element map includin...  
WO/2018/212217A1
The objective of the present invention is to enhance an interface function for identification processing, with which the result of an identification of the type or the properties of a substance being X-ray inspected does not depend on th...  
WO/2018/207533A1
The present invention is provided with, in said order: a first observation step for enlarging and observing a specific region (R) of a polished surface (S1a) formed on an end surface (S1) of a glass plate (S) to be inspected, and acquiri...  
WO/2018/207678A1
This unmanned aerial vehicle moves in midair and is capable of performing fluorescent X-ray analysis of a predetermined object of measurement, and is characterized by being provided with: an aerial vehicle main body; a fluorescent X-ray ...  
WO/2018/207180A1
Methods and system for management of transactions of marked objects are disclosed. In an embodiment, a method for recording a marked object includes: determining specific and unique marking of the object by a reader unit; and communicati...  
WO/2018/207919A1
A photon counting-type radiation detector according to an embodiment is provided with a first cell and a second cell. The first cell transmits radiation. The second cell is laminated with the first cell and absorbs the radiation that has...  
WO/2018/208810A1
A quadrupole ion trap apparatus includes a main electrode, a first end-cap electrode, a second end-cap electrode, and a phase-controlled waveform synthesizer.The phase-controlled waveform synthesizer generates a main RF waveform for the ...  
WO/2018/209134A1
Methods and systems for positioning a specimen and characterizing an x-ray beam incident onto the specimen in a Transmission, Small-Angle X-ray Scatterometry (T-SAXS) metrology system are described herein. A specimen positioning system l...  
WO/2018/203800A1
Disclosed is a detector system for x-ray imaging. The detector system comprises a detector having a plurality of edge-on detector modules. Each of the edge-on detector modules comprises a first edge that is adapted to be oriented towards...  
WO/2018/202946A1
A system (100) for producing analysis data indicative of presence of one or more predetermined components in a sample (110) is presented. The system comprises source equipment (120) for directing a particle stream (130) towards the sampl...  
WO/2018/201911A1
Disclosed in the present invention is an X-ray diffraction in situ characterization method for thin film crystal growth orientation: first, using a symmetric reflective scanning mode to measure an out-of-plane diffraction peak position o...  
WO/2018/201586A1
A measurement device and method for an in-situ time-resolved X-ray absorption spectrum. The measurement device mainly comprises an X-ray source (1), a first slit (2), an acousto-optic X-ray filter (9), a radio frequency transmitter (10),...  
WO/2018/203925A1
Backscatter imaging systems and methods that involve moving an emitter and a broad spectrum detector in helical motion along a medium being imaged while the emitter emits substantially monochromatic X-rays and/or gamma rays, and the broa...  
WO/2018/198553A1
Provided are an X-ray inspection system and an X-ray image reception device that make it possible to carry out X-ray inspection suitable also for a large object of inspection. In the present invention, an X-ray irradiation device (100) i...  
WO/2018/198589A1
The purpose of the present invention is to provide a multi-coordinated analyzing device that makes it possible to readily observe the same visual field by using a plurality of different kinds of analyzing device and in which observation ...  
WO/2018/198242A1
This inspection device has a ray source for irradiating energy rays toward an object to be inspected, a detection unit for detecting energy rays that have passed through the object to be inspected, a displacement mechanism for setting th...  
WO/2018/196840A1
Provided is a particle flow probe. The probe comprises a particle receiving layer and a specially designed columnar heat sink, capable of actively reducing the temperature of the particle receiving layer. The probe can also comprise a st...  
WO/2018/193800A1
In order to capture without deficiency the unique spatial distortion of an X-ray CT device and evaluate the three-dimensional shape measuring accuracy of the X-ray CT device, supporting rods 36, 37, 38 having different lengths and each h...  
WO/2018/195016A1
An X-ray inspection system for scanning items is provided. The system includes: a stationary X-ray source extending around a rectangular scanning volume, and defining multiple source points from which X-rays can be directed through the s...  
WO/2018/194422A1
A device for detecting a defect in an insulating material according to the present invention includes: an outer case including therein, a test chamber for storing an insulating material to be measured; a withstand voltage tester for appl...  
WO/2018/191714A1
Methods and systems for characterizing dimensions and material properties of semiconductor devices by transmission small angle x-ray scatterometry (TSAXS) systems having relatively small tool footprint are described herein. The methods a...  
WO/2018/191167A1
Liquid sample imaging devices and processes are disclosed for high resolution TEM imaging and multimodal analyses of liquid sample materials in situ under high vacuum that are compatible with standard type TEM chip membranes and TEM samp...  

Matches 1 - 50 out of 40,235