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Patent Searching and Data


Matches 501 - 550 out of 27,285

Document Document Title
WO/2017/047362A1
Disclosed is a probe pin (15) comprising an electroconductive plunger part (16), and a coil spring (50) arranged so as to be wound around the plunger part (16). In particular, the plunger part (16) includes: a hook-shaped plunger body (3...  
WO/2017/043879A1
A high frequency (RF) probe socket is disclosed. The disclosed RF probe socket comprises: a conductive noise shield main body for shielding the probe socket from noise by accommodating a plurality of signal probes to be parallel with eac...  
WO/2017/007200A3
A test socket manufacturing method comprises the steps of: preparing a PCB, which is provided with a bonding pad; bonding a conductive wire on the bonding pad; mounting a space, which exposes the bonding pad, on the upper surface of the ...  
WO/2017/043704A1
An ultraviolet photodetector and a method for manufacturing the same are provided. The ultraviolet photodetector comprises: a substrate; a transparent conductive layer formed on the substrate; and a heterojunction layer comprising a firs...  
WO/2017/035871A1
A signal transferring apparatus and a testing system. The signal transferring apparatus comprises multiple first assembling units, multiple second assembling units, multiple gating switches (50, 70), and a circuit board (80) comprising t...  
WO/2017/036621A1
The invention relates to an apparatus (100) for recording a resistance value of a measuring resistor of a measuring sensor, having a passive electrical resonant circuit (101) for generating a predetermined calibration current, wherein th...  
WO/2017/036723A1
The invention relates to a connection device (100) for connecting a measuring device (119) to a connection pole of an energy store of a motor vehicle, comprising a connecting clamp (101) which is designed to surround the connection pole ...  
WO/2017/039936A1
A test system includes a transporter having test sockets, where each test socket is configured to receive a device to be tested by the test system, and each test socket includes an element that is controllable to change a temperature of ...  
WO/2017/034127A1
An apparatus for assembly and disassembly of a cartridge, according to the present invention, automatically assembles a portable chuck, a wafer, and a contactor to provide a finished cartridge, or disassembles the cartridge into the port...  
WO/2017/032532A1
The invention relates to a device for positioning and contacting a test contact (5) of a test contact arrangement that is arranged on a contact carrier (19), wherein the device comprises a contact head (10) having at least one transmissi...  
WO/2017/032575A1
The invention relates to a method for covering an electric unit which is covered with two plastic molded bodies. Said invention also relates to an electric component which was been produced by means of said method.  
WO/2017/033795A1
In the present invention, a socket body in which an IC package is contained is provided with a contact pin 32, and is electrically contacted with a connection terminal of the contained IC package. The contact pin 32 has a plurality of la...  
WO/2017/028960A1
The invention relates to a battery sensor unit (1) having a first fastening device (2) which can be connected to a terminal of a battery, in particular a pole terminal, a resistance element (3), in particular a measuring shunt, a second ...  
WO/2017/026789A1
The present invention relates to a printed circuit board inspection apparatus for inspecting a hole machined on a printed circuit board. Disclosed are a printed circuit board inspection apparatus and a printed circuit board inspection me...  
WO/2017/026997A1
According to an example, operation of a processing device having a plurality of pins may be enabled through a detection that the plurality of pins of the processing device are in electrical communication with a plurality of contacts in a...  
WO/2017/026675A1
A single-phase multi-circuit measurement device (100) according to the present invention calculates electric power using current data, which is derived from a current signal generated by an embedded penetration-type CT, and voltage data,...  
WO/2017/026304A1
A probe pin comprises an elastic part that comprises a plurality of elastic units (31) connected along a center line (CL2) and that expands and contracts along the center line (CL2), and contact parts (41, 51) provided at both ends of th...  
WO/2017/026802A1
Provided are a probe bonding device and a bonding method using the same, the probe bonding device comprising: at least one tray on which a plurality of probes are loaded; a first gripper for gripping the probes loaded on the tray; a form...  
WO/2017/023053A1
The present invention relates to a stage module of a cryogenic, high magnetic field testing device to be utilized in physical, material, and electrical and electronic experiments utilized in the cryogenic and high magnetic field area, an...  
WO/2017/023130A1
The present invention relates to a probe pin bonding apparatus and, more particularly, to a probe pin bonding apparatus for automatically bonding a probe pin to a probe card. One embodiment of the present invention provides a probe pin b...  
WO/2017/022035A1
[Purpose] The present invention provides a probe card that makes it possible to increase the space between a probe and a side wall of a holder that faces the probe. [Structure] A probe card C is provided with a holder 100a, a holder 100g...  
WO/2017/023037A1
One embodiment of the present invention provides a test socket comprising: a plurality of conductive elastic parts arranged at a position corresponding to a terminal of a device to be inspected, and in which a plurality of conductive par...  
WO/2017/015979A1
A test lead line structure (21), which is used for connecting a signal line (22) inside a display apparatus and an external test line (23), and comprises a first insulation layer (211), a second insulation layer (212), a first lead line ...  
WO/2017/014961A1
Electrical current sensing and monitoring methods include connecting a compensation circuit across a conductor having a non-linear resistance such as a fuse element. The compensation circuit injects a current or voltage to the conductor ...  
WO/2017/014908A1
A method and apparatus for testing electronic devices installed in a portable device. The apparatus incorporates a socket with receptacles for alignment pins, and an alignment plate with openings for the alignment pins. The holes for the...  
WO/2017/007200A2
A test socket manufacturing method comprises the steps of: preparing a PCB, which is provided with a bonding pad; bonding a conductive wire on the bonding pad; mounting a space, which exposes the bonding pad, on the upper surface of the ...  
WO/2017/005473A1
The invention relates to an accessory device assembly for low or medium voltage electric applications. The accessory device comprises a casing and electronic means including one or more current sensors configured to detect a current flow...  
WO/2017/008057A1
A ground loss detection circuit identifies a faulty ground connection in a vehicle electrical system including a pair of redundant ground lines connected between a vehicle battery /chassis ground and an electronic control unit (ECU). In ...  
WO/2017/005809A1
The invention relates to a contacting device (1) with an electrically conductive contact (4) for reversibly contacting an object (5) to be measured. The contacting device additionally contains a plurality of particles (3) which can be in...  
WO/2017/003700A1
A EUT (equipment under test) positioning device is disclosed. The device comprises a holder element configured to hold EUT, a sliding element configured to move the holder element horizontally, a rotating element attached to the sliding ...  
WO/2016/209087A1
A Kelvin probe system (100) for analyzing a sample for testing (134), the Kelvin probe system comprising: a drive (102) controlled and powered by a drive control/power (103) for rotating an object (106, 120) around a rotational axis; a K...  
WO/2016/210287A1
A technique for an AMR-based sensing circuit allows current measurements over a wide frequency range. This is accomplished by folding the current carrying trace around the AMR sensor to concentrate and normalize the magnetic field genera...  
WO/2016/204369A1
The present invention relates to a semiconductor chip test socket and, more specifically, to a semiconductor chip test socket readily transferring, to a latch system, force in accordance with the movement of a cover so as to reduce the w...  
WO/2016/202535A1
The invention relates to a measuring system (200) for measuring equalising current at at least one electrically-conductive current collector unit (20) of an electrical energy store (10), comprising a measurement device (210) for electric...  
WO/2016/203360A1
Device for measuring the electric power drawn by a railway vehicle from a high-voltage electric supply line including a current sensor connected to the supply line, a resistive voltage divider connected between the line and earth, first ...  
WO/2016/204878A1
A method for measuring a position of an object, the method includes probing a sensing mark arranged in a first plane on a substrate to determine the position of the object, a portion of the substrate connecting the sensing mark to the ob...  
WO/2016/156002A9
It is described a vertical contact probe (21) for a testing head for a testing apparatus of electronic devices comprising a probe body (20C) extended in a longitudinal direction between respective end portions (24, 25) adapted to contact...  
WO/2016/198377A1
The invention relates to an electrical circuit, comprising a first power converter unit (12; 70), at least a second power converter unit (14; 76), an intermediate circuit (16; 72), which connects the power converter units (12, 14; 70, 76...  
WO/2016/195251A1
The present invention relates to a rubber socket for a semiconductor test that can be manufactured with a low cost and can prevent an electric shock from being applied to a semiconductor package in a process of testing the semiconductor ...  
WO/2016/188873A1
Current sensor arrangement which is designed for attachment to a battery terminal or is integrated into the battery terminal, wherein the current sensor arrangement comprises a shunt and a signal processing device which is connected and ...  
WO/2016/190601A1
An embodiment provides a film contactor for electrically connecting a terminal of a device to be tested and a pad of a testing device, the contactor comprising: an insulation sheet having the shape of a porous mesh; an electrode formed i...  
WO/2016/155936A3
The invention relates to a method for producing at least one spring contact pin (9) acting as an electrical contact, or a spring contact pin arrangement (25) comprising at least one such spring contact pin (9). The following steps are pr...  
WO/2016/125028A8
A system for monitoring electrical properties of a power line includes a current sensor with a gapped core and a conductive winding, The system further includes output control circuitry coupled with the current sensor, and including volt...  
WO/2016/183174A1
Disclosed herein are a monitoring system and a method for monitoring and reporting an aggregate system status of a DC subsystem and a battery charger. The monitoring system comprises at least one monitoring-enabled module; an aggregator ...  
WO/2016/182289A1
The present invention relates to a test socket adapter, and more specifically to a test socket adapter for guiding the loading of an element on a test socket. The present invention, which is a test socket adapter (200), disposed on a tes...  
WO/2016/177493A1
A measurement apparatus for measuring at least one property of an electron bunch or other group of charged particles travelling through a cavity (310), comprises a plurality of electrodes (302-308) arranged around the cavity, a plurality...  
WO/2016/177850A1
A testing head (20) having vertical probes for testing the working of a device under test (24) is described, such a testing head comprising a plurality of contact probes (21), each contact probe (21) having a rod-like body of a predeterm...  
WO/2016/176469A1
Multiple pin probes and methods for controlling such multiple pin probes to support parallel measurements are disclosed. The method may include: establishing electrical contact between a multiple pin probe and a subject of measurement; s...  
WO/2016/172242A1
A pin mechanism and a method for reducing backside particle induced out-of-plane distortions in semiconductor wafers involving such pin mechanisms. Geometric parameters of the pin are optimized so as to maximize the height of a particle ...  
WO/2016/171596A1
A probing apparatus (100) for detection of an electric signal generated by a device-under-test (102). The probing apparatus (100) comprises a rigid support structure (100a) having a contact surface (100e) adapted for sliding contact with...  

Matches 501 - 550 out of 27,285