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Patent Searching and Data


Matches 501 - 550 out of 26,928

Document Document Title
WO/2016/043814A1
A test fixture used to calibrate an electronic device is disclosed. The test fixture includes several modules positioned on a rack. The modules may include either a conductive rubber or light-absorbing material. An actuator connected to ...  
WO/2016/042109A1
The invention relates to a method for calibrating a current sensor (20) in a vehicle (2), said sensor being designed to measure an electric current (6) through a measuring resistor (28) on the basis of a voltage drop (32) across the meas...  
WO/2016/042091A1
The invention relates to a first method for calibrating a current sensor (4) which is configured to determine, in an on-board power system (2) of a vehicle, an electric operating current (12) which flows through a measuring resistor (20)...  
WO/2016/041658A1
The invention relates to a method for calibrating a current sensor (20) in a vehicle (2), said sensor being designed to measure an electric current (6) through a measuring resistor (28) on the basis of a voltage drop (32) across the meas...  
WO/2016/031512A1
In the present invention, an inspection terminal unit is provided with: at least two inspection pins (20) having, at one end, a contact part that comes into contact with an element to be inspected and having, at the other end, a connecti...  
WO/2016/027953A1
Disclosed is a test socket for inspecting an electronic device that is particular about properties. The test socket for inspecting electric properties of a subject includes a plurality of probes configured to be retractable in an inspect...  
WO/2016/026707A1
A test head is provided for contacting at least one electrically conductive region of a contact partner having a housing, the outer contour of which is adapted to the inner contour or the receiving region in order to be inserted into a r...  
WO/2016/028883A1
A probe for automatic test equipment (ATE) includes: an outer shroud including a course alignment feature configured to receive a target device and to guide the target device into an interior of the outer shroud, where the target device ...  
WO/2016/024542A1
 When a first housing 11 and a second housing 13 are placed in a second orientation during a procedure of attachment to an electrical cable, the rotational positions of the first housing 11 and the second housing 13 are prescribed such...  
WO/2016/025727A3
Embodiments of the present invention relate to an apparatus. In an embodiment, the apparatus comprises a sensor comprised of a printed graphene-based circuit. An electronic device is in communication with the sensor. A radio transponder ...  
WO/2016/024534A1
This invention provides a probe card that makes it possible to reduce the repair cost incurred when an unexpectedly large current flows through a power-supply line. Said probe card 1a, which is used when electrically testing a device und...  
WO/2016/021723A1
A contact probe of the present invention is a needle-like conductive connecting terminal that can extend and retract in the longitudinal direction. The connecting terminal is provided with: a first plunger, which has a first leading end ...  
WO/2016/015842A1
The invention relates to a U-shaped resistor (1), in particular a low-resistance current-measuring resistor (1), comprising a first connection part (2) made of a conductive material having a first current contact surface for conducting a...  
WO/2016/014896A1
A sachet includes a first wing made of a flexible material and having a first perimeter region circumscribing a first central region; a second wing made of the flexible material; a hinge connecting the first and second wings along a comm...  
WO/2016/011664A1
A high-temperature test fixture. The fixture comprises at least three noble metal electrodes (11, 12, 13) arranged in parallel, noble metal wires (1, 2, 5) and a thermocouple for measuring the temperature of a material to be tested. The ...  
WO/2016/014906A1
A test instrument for use with a sample having a plurality of electrically conducting contact pads, the instrument including: a controllable, variable force linear actuator; a probe assembly operated by the linear actuator, the probe ass...  
WO/2016/009293A1
A contact probe for a testing head of an apparatus for testing electronic devices is described comprising a body extending between a contact tip and a contact head, that contact probe comprising at least one first section and one second ...  
WO/2016/010928A3
A transformer-less method and system for voltage and current sensing using voltage drops across resistors is disclosed. Using optically coupled isolators, the sensed voltages in the high voltage power lines are optically coupled and elec...  
WO/2016/010383A1
A test socket is configured to be disposed between a test target device and a test apparatus for electrically connecting terminals of the test target device to pads of the test apparatus. The test socket includes: a support sheet formed ...  
WO/2016/008406A1
A self-compensation device and method for a BGO crystal electro-optic coefficient temperature correlation. The device comprises a Faraday collimation rotator, a quartz tube (4), an antireflection film (7), a reflecting film (8), a BGO cr...  
WO/2016/003184A1
The present invention relates to a probe kit for checking whether an LED is good or bad and, more specifically, to an LED probe kit assembly that includes first and second terminals, which are equipped to a body and a probe pin provided ...  
WO/2015/197301A1
The invention provides a method of manufacturing a contactor body having contact tips configured for temporarily contacting respective contact areas of a semiconductor device, the method of manufacturing the contactor body comprising the...  
WO/2015/200724A1
A method for probing a semiconductor device under test (DUT) using a combination of scanning electron microscope (SEM) and nanoprobes, by: obtaining an SEM image of a region of interest (ROI) in the DUT; obtaining a CAD design image of t...  
WO/2015/200719A1
System for performing in-line nanoprobing on semiconductor wafer. A wafer support or vertical wafer positioner is attached to a wafer stage. An SEM column, an optical microscope and a plurality of nanoprobe positioners are all attached t...  
WO/2015/196875A1
A battery test platform (10),comprising a battery rack frame (110), a plurality of battery rack baffles (120) and a controller (130). Each battery rack baffle (120) comprises a plurality of battery test units, each battery test unit comp...  
WO/2015/194882A1
The present invention relates to an indirect contact probing system and a probing method using the same which can stably and quickly test semiconductor device characteristics of through electrodes, integrated circuits or memory devices o...  
WO/2015/194384A1
This probe pin (10) comprises a coil spring (50), a main body (31, 41), and first and second elastic prongs (32, 42, 34, 44) that extend in the same direction from said main body (31, 41). Said probe pin (10) is provided with second and ...  
WO/2015/195970A1
A socket assembly including a housing that has one or more spring probes therein. The socket assembly further includes a leadframe assembly that has one or more cantilever members, and the leadframe assembly has microwave structures and ...  
WO/2015/194385A1
This invention provides a probe pin that has a high integration density and can be laid out at a narrow pitch. To that end, said probe pin comprises a coil spring (10), a first plunger (20) that is inserted from one end of said coil spri...  
WO/2015/186932A1
The present invention relates to a contact sheet, and more specifically, to a contact sheet which is electrically connected with a test target device by coming into contact with the test target device which has electrode patterns having ...  
WO/2015/187492A1
An impedance tuner having an RF transmission line, with a single lead screw extending along the RF transmission line. A plurality of movable carriages are engaged with the lead screw, wherein each of the plurality of movable carriages is...  
WO/2015/184491A1
A voltage detector comprising positive and negative probes as input; a self-test input; a self-test output; a voltage level output; a transformer connected, in use, to a power source, where the transformer generates a known transformer v...  
WO/2015/188093A1
A method of assessing functionality of a probe card includes providing a probe card analyzer without a probe card interface, removably coupling a probe card having probes to a support plate of the probe card analyzer, aligning a sensor h...  
WO/2015/184265A1
An impedance tuner includes a controller, an RF transmission line, and a movable capacitive object configured for movement commanded by the controller relative to the transmission line to alter impedance. A position sensor is configured ...  
WO/2015/182885A1
The present invention relates to a socket for inspecting a semiconductor package and a substrate, a flexible contact pin used therein, and a method for manufacturing the flexible contact pin, the socket comprising: a seat portion made of...  
WO/2015/182996A1
The present invention relates to a connection connector and a connection connector manufacturing method and, more specifically, to a connection connector and a manufacturing method therefor, and the connection connector arranged between ...  
WO/2015/174886A1
A multi-functional diagnostic system relates to devices for diagnosing and repairing electronic and electrical circuits and systems. A common probe housing, the external structure of which resembles a multi-color ballpoint pen, is equipp...  
WO/2015/170601A1
Provided is a socket capable of making the inclination of a plunger smaller than the conventional art. A second plunger (12) includes a base-end columnar portion (12a) and a pin-shaped portion (12b). An outer peripheral surface of the pi...  
WO/2015/167178A1
The present invention relates to a socket apparatus for a semiconductor device test, comprising: body elements (100) (200) into which a contact (400) is fixedly inserted; movable elements (300) (500) on which a semiconductor device (IC) ...  
WO/2015/162267A1
The invention relates to a method for measuring an electric current (6) that is supplied by a vehicle battery (4) and is conducted across a shunt (28), said method involving: - detecting a measurement voltage (32) dropping across the shu...  
WO/2015/163160A1
 Provided is a probe pin that poses a negligible risk of a continuity defect or operational defect occurring during use, the probe pin being provided with: a moveable member having on one end thereof either an electrode contact portion...  
WO/2015/162253A1
The invention relates to a docking module (22) for a current transformer (10) comprising: − an electronic circuit (12) and − at least one electric connecting element (28.3) for electrically coupling the circuit (12) to the current tr...  
WO/2015/157296A1
A faulted circuit indicator (FCI) device for installation on a power line includes a housing, a laminate structure fastened to the housing and configured to receive the power line, and a clamp mechanism pivotally fastened to the housing ...  
WO/2015/156104A1
Provided is a prove cover capable of being mounted to sockets having different shapes. A probe cover (1) is adapted to be mounted to a socket which supports contact probes. The probe cover (1) comprises a base (2), two positioning pins (...  
WO/2015/157363A3
An integrated apparatus and method to provide test, diagnostics and characterization access to backplane electrical signals during electronic product development is presented. The apparatus removes need for manual and ad hoc connections ...  
WO/2015/153063A1
This disclosure provides for an electrical probe, which can include a shell extending along a longitudinal axis and defining an internal cavity with an opening at a first end, where the shell can include a neck portion defined by a hollo...  
WO/2015/150548A1
The invention relates to a contact-distance transformer (4) of an electrical testing device (1) for testing an electrical test item (7), in particular wafers (8), said contact-distance transformer (4) being suitable for reducing the dist...  
WO/2015/151809A1
 A laminated wiring board obtained by laminating a resin laminate on a ceramic laminate, wherein interfacial peeling between the ceramic laminate and the resin laminate is reduced. The laminated wiring board (1a) is provided with: a ce...  
WO/2015/149893A1
The invention relates to a contacting assembly (10; 10'), in particular an HF measuring tip, comprising a carrier (12), on which a conductor structure (20) is arranged, wherein the conductor structure (20) has, at a contact end (16), at ...  
WO/2015/144592A1
Electrical current transducer for measuring an electric current in a primary conductor, including a housing (4), a magnetic core (6) surrounding a central aperture (9) through which the primary conductor extends, and a magnetic field sen...  

Matches 501 - 550 out of 26,928