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Patent Searching and Data


Matches 501 - 550 out of 27,128

Document Document Title
WO/2016/161522A1
A test switch for use in electrical power distribution networks is provided. The test switch facilitates the connection between the power distribution networks' equipment and test equipment used to effect tests on the power distribution ...  
WO/2016/162460A1
The invention relates to an electrical subassembly (1) having a printed circuit board (2) and having an electrical resistor element (3), particularly in the style of a shunt for current measurement. The resistor element (3) is electrical...  
WO/2016/159316A1
This alloy material has copper (Cu) as the main component thereof and has added thereto 10-30 wt% silver (Ag) and 0.5-10 wt% nickel (Ni). As a result, an alloy material having no coating and having excellent Sn-corrosion resistance, a co...  
WO/2016/155936A3
The invention relates to a method for producing at least one spring contact pin (9) acting as an electrical contact, or a spring contact pin arrangement (25) comprising at least one such spring contact pin (9). The following steps are pr...  
WO/2016/155937A1
The invention relates to a method for producing a contact spacing converter (4) (space transformer) which has electrical contacts (9) that form electrical paths (10) and in which a first contact spacing of the contacts (9) is converted i...  
WO/2016/159315A1
This alloy material has a composition of 20-30wt% of silver (Ag), 35-55 wt% vanadium (Pd), and 20-40wt% copper (Cu) in a compositional range for a ternary alloy of Ag, Pd, and Cu, uses said composition as a base, and has added to said ba...  
WO/2016/159548A1
Disclosed is a test socket in which a floating member for accommodating a test object at a test is prevented from separating from a socket main body. The separation preventer of the test socket includes hooking projections which protrude...  
WO/2016/160730A1
A laminated heater socket useful in association with an integrated circuit (IC) device tester is having a socket with an embedded integrated heater. This laminated heater socket configuration allows for good thermal conductivity and bett...  
WO/2016/156002A9
It is described a vertical contact probe (21) for a testing head for a testing apparatus of electronic devices comprising a probe body (20C) extended in a longitudinal direction between respective end portions (24, 25) adapted to contact...  
WO/2016/156003A1
It is described a contact probe (21) for a testing head for a testing apparatus of electronic devices, the probe comprising a probe body (20C) extended in a longitudinal direction between respective end portions (24, 25) adapted to conta...  
WO/2016/158567A1
[Problem] To provide a socket for electrical components which is capable of greatly reducing the contact pressure exerted on electrodes of electrical components by electrical contacts. [Solution] In this electrical component socket, a fi...  
WO/2016/157964A1
[Problem] To provide an inspection jig and a substrate inspection apparatus capable of improving the contact stability of a probe with respect to an inspection point. [Solution] A facing plate 51 and a support plate 61 are provided. On t...  
WO/2016/160009A1
An integrated circuit test socket includes a highly conductive compliant material that is cut and installed into the test socket. The conductive material draws electrical charge away from the test socket, leading to more accurate testing...  
WO/2016/156002A1
It is described a vertical contact probe (21) for a testing head for a testing apparatus of electronic devices comprising a probe body (20C) extended in a longitudinal direction between respective end portions (24, 25) adapted to contact...  
WO/2016/156248A1
A probe card (20) for a testing apparatus of electronic devices is described, the probe card (20) comprising at least one testing head (21) housing a plurality of contact probes (22), each contact probe (22) having at least one contact t...  
WO/2016/155936A2
The invention relates to a method for producing at least one spring contact pin (9) acting as an electrical contact, or a spring contact pin arrangement (25) comprising at least one such spring contact pin (9). The following steps are pr...  
WO/2016/146451A1
A contact probe (10) for a testing head of a testing apparatus of electronic devices is described, the contact probe (10) comprising a body essentially extended in a longitudinal direction between respective end portions adapted to conta...  
WO/2016/146499A1
A testing head (20) with vertical probes for the functionality testing of a device under test (28), the testing head (20) comprising at least one couple of plate-like supports (22, 23) separated from each other by a suitable gap (29) and...  
WO/2016/149600A1
A testing device including a housing having an indicator, a first test probe configured to be inserted into an alternating-current (AC) receptacle, a second test probe configured to be inserted into a universal serial bus (USB) receptacl...  
WO/2016/146476A1
It is described a testing head (20) with vertical contact probes for the functionality testing of a device under test (26), the testing head comprising a plurality of vertical contact probes (21), each vertical contact probe (21) having ...  
WO/2016/147691A1
A probe pin (2) is provided with: a coil spring (30) extending and contracting along the center axis; an electrically conductive first plunger (10) having a gripped section (11) inserted along the center axis into the coiled spring (30) ...  
WO/2016/140377A1
An apparatus for inspecting defects of a multi-junction semiconductor according to an embodiment of the present invention is disclosed, the apparatus characterized by comprising: a light source; a slit antenna probe; a parallel light rad...  
WO/2016/140505A1
Disclosed is a test device for testing electric characteristics of a test object having a test contact point. The test device includes an insert which accommodates the test object; a socket which supports a plurality of probes having one...  
WO/2016/133240A1
Disclosed is a probe block for a display panel test device. A probe block according to the present invention comprises: a pressing protrusion for pressing a contact pad formed on the display panel; and a buffer member disposed at a tip e...  
WO/2016/128226A1
The invention relates to a method for assembling a component which has a sleeve (2), a piston (7) with a piston head (11), and a spring (6). The spring (6) is first inserted into the sleeve (2), and a first piston region (8) of the pisto...  
WO/2016/125028A8
A system for monitoring electrical properties of a power line includes a current sensor with a gapped core and a conductive winding, The system further includes output control circuitry coupled with the current sensor, and including volt...  
WO/2016/126411A1
Electrode foil (6) comprising a) an electrode layer (60) comprising - a sensing electrode portion (100), operable as an electrode of a sensing capacitor for sensing a voltage of an inner conductor (20) of a medium or high voltage power c...  
WO/2016/125028A3
A system for monitoring electrical properties of a power line includes a current sensor with a gapped core and a conductive winding, The system further includes output control circuitry coupled with the current sensor, and including volt...  
WO/2016/124969A2
All-printed paper-based substrate memory devices are described. In an embodiment, a paper-based memory device is prepared by coating one or more areas of a paper substrate with a conductor material such as a carbon paste, to form a first...  
WO/2016/126024A1
The purpose of the present invention is to provide a test socket, which: provides a conduction unit having conductive particles easily coupled by dot, line, and surface contact, and thus, when a semiconductor device is tested, has a lowe...  
WO/2016/126036A1
Disclosed is a test device for testing electric properties of an object. The test device includes an object support unit configured to support an object; a cover unit configured to include a cover body coupled to the object support unit ...  
WO/2016/119010A1
A computer system for household energy management having a sensor hub including environmental sensors for sensing the environment within a household, a usage data communications link providing a data link to. a device adapted to measure ...  
WO/2016/122039A1
The present invention relates to a pin block and a testing device having same. A pin block, according to the present invention, has two pogo pins and enables identical connecting pins on a module substrate to be connected to the two pogo...  
WO/2016/119337A1
An electric device testing fixture. The electric device testing fixture comprises: a fixing base (11), an electrode fixing frame (12), two electrodes (13), i.e. an anode and a cathode, a stopper bracket (14) and a stopper (15), wherein t...  
WO/2016/119016A1
There is provided a system for industrial electrical appliance tagging and compliance system (100) comprising power outlets configured for selectively providing power to validly tagged electrical appliances. In preferred embodiments, the...  
WO/2016/112933A1
The invention relates to a coupling (6) for electrically and mechanically connecting components in medium-voltage engineering or in high-voltage engineering, in particular for voltages of 1 kV to 52 kV, comprising a first connection piec...  
WO/2016/114506A1
A probe for testing charging/discharging of a secondary battery comprises: an outer plunger having the shape of a cylinder, the interior of which is penetrated; an inner plunger, which is formed coaxially with the outer plunger, which is...  
WO/2016/114094A1
[Solution] A cable disconnection checker with which it is possible to measure resistance by a four-terminal method due to a configuration provided with an inlet 11 having an insertion connector terminal structure 10 configured so that a ...  
WO/2016/114170A1
A multilayer wiring board for probe cards, which has a laminate of resin layers, and wherein separation of an electrode having a large area from a resin layer is suppressed, said electrode being provided for the purpose of decreasing the...  
WO/2016/111293A1
A Kelvin probe (30) provided with first and second probe pins (40, 50) that are disposed in parallel with an interval interposed therebetween, wherein the first and second probe pins (40, 50) each have a coil spring (80) that expands and...  
WO/2016/106641A1
Disclosed is a test joint, which comprises a housing (10), a connector (17), a cable assembly, an elastic element (11) and a calibration nut (13), wherein the housing (10) is tubular with one end closed and the other end open, the connec...  
WO/2016/109010A1
A voltage sensor housing (40) includes a top portion including a conductive top portion (48) composed of conductive material and non-conductive top portions (50,52) composed of non-conductive material, a bottom portion (54) composed of n...  
WO/2016/107859A1
It is described a manufacturing method of contact probes (10) for a testing head (18) comprising the steps of: providing a substrate (11) made of a conductive material; and - defining at least one contact probe (10) by laser cutting the ...  
WO/2016/107729A1
It is described a contact probe for a testing head of an apparatus for testing electronic devices including a body essentially extended according to a longitudinal direction between a contact tip and a contact head (30A, 30B), that conta...  
WO/2016/109842A1
Systems and methods exposing a sample of atoms to an electromagnetic (EM) field. The EM includes one or more frequencies. The EM field is configured to promote at least a subset of the sample of atoms to one or more excited states based ...  
WO/2016/108520A1
The present invention relates to a contact inspection device comprising: a first guide plate having a first probe hole formed therein; a second guide plate which is positioned parallel to the first guide plate and has a second probe hole...  
WO/2016/101675A1
A testing device comprises a testing bench (10) for testing a product, a base (20) and a bracket (30) which are connected with the testing bench (10), a switch (40) for controlling the power-on/off of the testing bench (10), and a clamp ...  
WO/2016/106293A2
A wafer probe station system for reliability testing of a semiconductor wafer. The wafer probe station is capable of interfacing with interchangeable modules for testing of semiconductor wafers. The wafer probe station can be used with d...  
WO/2016/105031A1
The present invention relates to an electrical test socket and a method for manufacturing a conductive particle for an electrical test socket and, more specifically, to an electrical test socket, disposed between terminals of a device to...  
WO/2016/102172A1
The invention relates to a high-frequency test probe (S) for testing an electrical test object, comprising a contacting connector assembly (1) for establishing a releasable contact between the high-frequency test probe (S) and the electr...  

Matches 501 - 550 out of 27,128