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WO/2020/244107A9 |
Disclosed is a cathode protection test probe, comprising an outer cavity, a polarized test piece, an inner cavity, an alternating-current test piece, a copper electrode and a test cable, wherein the polarized test piece is of a hollow cy...
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WO/2021/208154A1 |
An AC voltage detection circuit and a power electronic device. The AC voltage detection circuit is used to implement voltage detection on N AC input signal lines, wherein N is an integer greater than or equal to 2. The AC voltage detecti...
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WO/2021/210720A1 |
The present invention pertains to: a method for producing a composite material for a semiconductor test socket, the method comprising (a) a step for preparing a mixed powder including (i) a metal powder including a magnesium powder and a...
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WO/2021/209508A1 |
The present invention generally relates devises, systems and methods for measuring effects of a radome on an electromagnetic wave. In a first aspect, the present invention relates to a radome measuring clamp comprising a base frame, a fi...
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WO/2021/210904A1 |
Provided are a voltage sensing circuit, a battery pack, and a battery system. The voltage sensing circuit comprises: a first sub-sensing circuit having a light-emitting element and electrically connected to a battery in parallel; and a s...
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WO/2021/206185A1 |
An inspection jig 3 comprises: a rod-like contact element Pr; a first support portion 311 supporting one end side of the contact element Pr; a second support portion 312 supporting another end side of the contact element Pr; and a spacin...
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WO/2021/206148A1 |
This ceramic contains, by mass%: 20.0-60.0% of Si3N4; 25.0-70.0% of ZrO2; 2.0-17.0% of at least one selected from SiC and AlN (where AlN is 10.0% or less); and 5.0-15.0% of at least one selected from MgO, Y2O3, CeO2, CaO, HfO2, TiO2, Al2...
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WO/2021/205911A1 |
An optical voltage probe comprising an optical modulator 1 which includes two modulation electrodes 11 and 12, intensity-modulates the incident light depending on the voltage between the modulation electrodes, and outputs the same, an in...
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WO/2021/207153A1 |
A test socket for an IC includes a socket body, a rotational contact, and an elastomer retainer. The socket body includes a top surface that faces the IC, and a bottom surface that faces a load board. The socket body defines a slot exten...
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WO/2021/200356A1 |
A contact unit 2 is provided with a tubular socket 20 including a socket main body 21 which is inserted into an accommodating hole 30, a distal end part 22 which is inserted into a hole portion 50, and an intermediate portion 29 provided...
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WO/2021/201485A1 |
The present invention provides a jig for manufacturing a probe card for testing a semiconductor, a probe alignment system comprising same, and a probe card manufactured thereby.
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WO/2021/197921A1 |
The invention relates to a device for temperature measurement comprising a circuit board (2) and a temperature sensor (3), wherein the circuit board (2) has a milled groove (4), which runs substantially in a spiral around the temperature...
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WO/2021/201345A1 |
A test adapter for establishing a test connection with a circuit board is provided. The circuit board includes an inter-board connector or a planar contact in close contact with the inter-board connector. The test adapter includes a meta...
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WO/2021/196497A1 |
The present utility model relates to the technical field of test devices, and provides an electrical connector and a test conduction device. By providing a first contact end having a planar structure, the contact area between the electri...
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WO/2021/191286A1 |
The invention relates to a meter arrangement (1) comprising a meter device (2) for measuring electrical measurands, the meter device (2) comprising a measuring unit (4), which has measuring electronics (3), and an output unit (5), which ...
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WO/2021/194213A1 |
The present invention relates to a probe head for testing, through a probe, patterns formed on a wafer pattern, and a probe card comprising same. Specifically, the present invention relates to: a probe head wherein formation of a guide h...
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WO/2021/193304A1 |
A probe unit according to the present invention is provided with: multiple first contact probes that each come into contact with an electrode of a contact object on a longitudinal one-end side; a second contact probe that is connected to...
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WO/2021/190323A1 |
An instrument interface device and method. The instrument interface device comprises two capacitors. One end of one of the capacitors is a device input end (1) and is connected to an output power live wire of an artificial power network,...
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WO/2021/193098A1 |
This probe head (10A) is provided with a guide pin (100). The guide pin (100) has a tapered portion, an outer wall diameter of which spreads from one end side of the guide pin (100) toward the other end side thereof.
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WO/2021/190759A1 |
Test arrangement for testing high-frequency components, particularly Silicon Photonics Devices Under Test The invention relates to a probe card (PC) for use with an automatic test equipment (ATE), wherein the probe card (PC) comprises a ...
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WO/2021/195614A1 |
A portable analyte detection system and related methods are provided. The detection system includes a detector having one or more probes and associated detector circuitry that is in communication with a mobile device. The system displays...
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WO/2021/189146A1 |
Example embodiments of the described technology provide an apparatus for testing an electrochemical system. The apparatus may comprise a testing module electrically coupled to the electrochemical system. The testing module may comprise a...
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WO/2021/193579A1 |
Provided is an inspection probe 2 that is used to inspect an inspection target provided with a plurality of inspection points. The inspection probe 2 comprises: a plurality of contact pads 22 that can contact the inspection points; a plu...
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WO/2021/187339A1 |
This contact terminal comprises: a cylindrical body; and a first conductor having a first insertion part. The cylindrical body has: an end-section-side cutout that is disposed in an end section on one side in an axial direction of the cy...
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WO/2021/185463A1 |
A busbar (100) for connecting power electronic components comprises at least one conductive layer. On a first conductive layer (10), there is a machined pattern (13) which defines a meandering conductive path between the input area (11) ...
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WO/2021/185985A1 |
Test apparatus (1) for test cards (37), having a receiving device (3) for holding at least one test card (37) to be tested, having at least one contact device (4) for making electrical touch contact with electrically conductive contact p...
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WO/2021/182082A1 |
Provided is a clamp-type AC voltage probe enabling easy measurement of high AC voltage. A clamp-type AC voltage probe 1 comprises: a clamp part 2 for clamping a cable CBL to be measured; an electrode E which is arranged to face the cable...
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WO/2021/182084A1 |
Provided is a circuit substrate inspection device with which it is possible to shorten an inspection time for a substrate to be inspected. A circuit substrate inspection device 1 has an inspection processing unit 3 that inspects an elect...
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WO/2021/180421A1 |
The invention relates to a wire (1) or strip for production of test needles or slide contacts, the wire (1) or strip including a material or consisting of a material, the material having a matrix composed of copper, palladium, rhodium, o...
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WO/2021/182083A1 |
Provided is a configuration with which it is possible to suppress warping of a substrate used in an inspection jig. The inspection jig 4 has: a first substrate 10; a probe unit 70 having a probe 71; a second substrate 40 positioned align...
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WO/2021/182193A1 |
The present invention relates to a probe card for providing electrical connection between an object to be inspected and a circuit for generating an inspection signal, the probe card comprising: a plurality of electrically conductive cont...
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WO/2021/182708A1 |
The present invention consists of: a base plate (40) in which vacuum holes (41) are respectively formed at seating points of devices (30), and which, in a state in which a device (30) is loaded, suctions the loaded device (30) with a fin...
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WO/2021/182766A1 |
It is the object of the invention, which relates to an arrangement for current measurement, to specify an arrangement for current measurement which is inexpensive and simple to manufacture, has a high level of robustness with respect to ...
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WO/2021/179077A1 |
The present disclosure describes a probe design to measure cycles of microdevices. In particular, the probe comprises, electrodes, dielectric, stimulating capacitor, voltage stimulating source for time varying stimulating voltage signal ...
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WO/2021/175382A1 |
The invention relates to a battery sensor for detecting a current flowing through an electrical conductor, the battery sensor having at least two mutually independent measuring devices for detecting the current flowing through the electr...
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WO/2021/177086A1 |
Provided is an inspection connector in which an adapter is fixed to the lower end of a first housing and to the upper end of a second housing. The adapter is a conductor member that supports an external conductor of a coaxial cable. The ...
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WO/2021/174583A1 |
The present invention provides a transmission module testing device. The testing device comprises a first plate body, a second plate body connected to the first plate body, a radio frequency signal adapter installed on the first plate bo...
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WO/2021/173221A1 |
A radio frequency (RF) test probe adapter comprises a cable adapter (18) operable for use with a RF test probe (30) and a housing (100). The cable adapter comprises a cable connector (20) configured to physically couple to a connector of...
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WO/2021/172061A1 |
This cylindrical body is conductive and extends in the longitudinal direction. The cylindrical body comprises: a first spring part where a spiral notch is formed on the circumferential surface of the cylindrical body; a second spring par...
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WO/2021/171199A1 |
The inventive wrist-band voltage detector provides a wearable device for detecting the presence of AC voltage without interference with work activities. Embodiments of the inventive wrist-band voltage detector include monopole aerials po...
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WO/2021/171844A1 |
A spring connector (10) comprising: an insulating housing (1) having a through-hole (11); a conductor (2) disposed on one end side of the through-hole (11); and a conductive external contact pin (3) disposed on the other end side of the ...
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WO/2021/172736A1 |
The present invention relates to a device and a method for diagnosing a failure of an inverter initial charging circuit. The device for diagnosing a failure of an initial charging circuit according to the present invention is advantageou...
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WO/2021/167216A1 |
The present invention relates to a probe positioner. A probe positioner according to an embodiment of the present invention comprises: a probe card support arranged to support a probe card; a first shaft portion for reciprocating the pro...
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WO/2021/166949A1 |
[Problem] To guarantee positioning of an elastic pin during manufacturing without using a guide member, and to prevent contamination from a guide member in a final product. [Solution] An electronic device inspection socket having a plura...
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WO/2021/166732A1 |
A heater substrate comprising an insulation substrate having a first surface and a second surface that is on the opposite side from the first surface, and at least one spiral-shaped heating body that includes a plurality of heater wires ...
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WO/2021/167878A1 |
A burn-in board for burn-in testing of semiconductor devices includes a strip socket mounted to a PCB. The strip socket includes a socket base configured to receive a device strip including an array of semiconductor devices, and a socket...
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WO/2021/161237A1 |
The invention draws upon an insight that if the distance between the Sensing Points of a shunt is precisely defined and is repeatable (for example, due to the punching tool used to create the holes for the Sensing Points), then accurate ...
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WO/2021/162311A1 |
The present invention relates to a detachable probe array block comprising: a case forming an outer body; a plurality of probes which are mounted in the case; a pedestal which accommodates the plurality of probes such that the plurality ...
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WO/2021/163734A1 |
Switching of particular inputs in a signal processing channel permits an independent evaluation of that signal processing channel, in a system where there are at least two signal processing channels, one of which is able to be calibrated...
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WO/2021/162314A1 |
Provided is a test socket for electrically connecting a device under test to a tester. The test socket comprises a housing, a probe, and an insulating member. The housing has a through-hole formed in the vertical direction. The probe is ...
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