Login| Sign Up| Help| Contact|

Patent Searching and Data


Matches 551 - 600 out of 26,993

Document Document Title
WO/2015/194384A1
This probe pin (10) comprises a coil spring (50), a main body (31, 41), and first and second elastic prongs (32, 42, 34, 44) that extend in the same direction from said main body (31, 41). Said probe pin (10) is provided with second and ...  
WO/2015/195970A1
A socket assembly including a housing that has one or more spring probes therein. The socket assembly further includes a leadframe assembly that has one or more cantilever members, and the leadframe assembly has microwave structures and ...  
WO/2015/194385A1
This invention provides a probe pin that has a high integration density and can be laid out at a narrow pitch. To that end, said probe pin comprises a coil spring (10), a first plunger (20) that is inserted from one end of said coil spri...  
WO/2015/186932A1
The present invention relates to a contact sheet, and more specifically, to a contact sheet which is electrically connected with a test target device by coming into contact with the test target device which has electrode patterns having ...  
WO/2015/187492A1
An impedance tuner having an RF transmission line, with a single lead screw extending along the RF transmission line. A plurality of movable carriages are engaged with the lead screw, wherein each of the plurality of movable carriages is...  
WO/2015/184491A1
A voltage detector comprising positive and negative probes as input; a self-test input; a self-test output; a voltage level output; a transformer connected, in use, to a power source, where the transformer generates a known transformer v...  
WO/2015/188093A1
A method of assessing functionality of a probe card includes providing a probe card analyzer without a probe card interface, removably coupling a probe card having probes to a support plate of the probe card analyzer, aligning a sensor h...  
WO/2015/184265A1
An impedance tuner includes a controller, an RF transmission line, and a movable capacitive object configured for movement commanded by the controller relative to the transmission line to alter impedance. A position sensor is configured ...  
WO/2015/182885A1
The present invention relates to a socket for inspecting a semiconductor package and a substrate, a flexible contact pin used therein, and a method for manufacturing the flexible contact pin, the socket comprising: a seat portion made of...  
WO/2015/182996A1
The present invention relates to a connection connector and a connection connector manufacturing method and, more specifically, to a connection connector and a manufacturing method therefor, and the connection connector arranged between ...  
WO/2015/174886A1
A multi-functional diagnostic system relates to devices for diagnosing and repairing electronic and electrical circuits and systems. A common probe housing, the external structure of which resembles a multi-color ballpoint pen, is equipp...  
WO/2015/170601A1
Provided is a socket capable of making the inclination of a plunger smaller than the conventional art. A second plunger (12) includes a base-end columnar portion (12a) and a pin-shaped portion (12b). An outer peripheral surface of the pi...  
WO/2015/167178A1
The present invention relates to a socket apparatus for a semiconductor device test, comprising: body elements (100) (200) into which a contact (400) is fixedly inserted; movable elements (300) (500) on which a semiconductor device (IC) ...  
WO/2015/162267A1
The invention relates to a method for measuring an electric current (6) that is supplied by a vehicle battery (4) and is conducted across a shunt (28), said method involving: - detecting a measurement voltage (32) dropping across the shu...  
WO/2015/163160A1
 Provided is a probe pin that poses a negligible risk of a continuity defect or operational defect occurring during use, the probe pin being provided with: a moveable member having on one end thereof either an electrode contact portion...  
WO/2015/162253A1
The invention relates to a docking module (22) for a current transformer (10) comprising: − an electronic circuit (12) and − at least one electric connecting element (28.3) for electrically coupling the circuit (12) to the current tr...  
WO/2015/157296A1
A faulted circuit indicator (FCI) device for installation on a power line includes a housing, a laminate structure fastened to the housing and configured to receive the power line, and a clamp mechanism pivotally fastened to the housing ...  
WO/2015/156104A1
Provided is a prove cover capable of being mounted to sockets having different shapes. A probe cover (1) is adapted to be mounted to a socket which supports contact probes. The probe cover (1) comprises a base (2), two positioning pins (...  
WO/2015/157363A3
An integrated apparatus and method to provide test, diagnostics and characterization access to backplane electrical signals during electronic product development is presented. The apparatus removes need for manual and ad hoc connections ...  
WO/2015/153063A1
This disclosure provides for an electrical probe, which can include a shell extending along a longitudinal axis and defining an internal cavity with an opening at a first end, where the shell can include a neck portion defined by a hollo...  
WO/2015/150548A1
The invention relates to a contact-distance transformer (4) of an electrical testing device (1) for testing an electrical test item (7), in particular wafers (8), said contact-distance transformer (4) being suitable for reducing the dist...  
WO/2015/151809A1
 A laminated wiring board obtained by laminating a resin laminate on a ceramic laminate, wherein interfacial peeling between the ceramic laminate and the resin laminate is reduced. The laminated wiring board (1a) is provided with: a ce...  
WO/2015/149893A1
The invention relates to a contacting assembly (10; 10'), in particular an HF measuring tip, comprising a carrier (12), on which a conductor structure (20) is arranged, wherein the conductor structure (20) has, at a contact end (16), at ...  
WO/2015/144592A1
Electrical current transducer for measuring an electric current in a primary conductor, including a housing (4), a magnetic core (6) surrounding a central aperture (9) through which the primary conductor extends, and a magnetic field sen...  
WO/2015/139402A1
The present invention relates to the technical field of radio-frequency microwave measurement, and particularly to a radio-frequency asymmetrical low-impedance test fixture. The test fixture comprises: a PCB board (7) and a bottom plate ...  
WO/2015/142447A1
A sensor attachment assembly (100) for an electrical system (2) includes a sensor housing (102) at least partially enclosing a sensor (4), and a fastening member (200) coupled to the sensor housing (102) and being structured to extend fr...  
WO/2015/135170A1
A method (700) for reconfiguring pin assignments on a connector (100) is provided. The method (700) includes reading a present accessory type (34a) from an accessory (30) coupled to the connector (100) having a plurality of pins (110) wh...  
WO/2015/138388A3
A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). To prevent rotation ...  
WO/2015/133016A1
A probe pin (1) is provided with a coil spring (30), and first and second plungers (10, 20). The first and second plungers (10, 20) are formed such that, when the first and second plungers are inserted toward the inside from both the end...  
WO/2015/131875A1
The object of the present invention is to reduce the manual assembly effort of current sensors, and to specify a configuration for a fastening element (1) by means of which a current sensor (2) can be fastened on a fastening surface (3) ...  
WO/2015/132748A1
A probe card for a testing apparatus of electronic devices is described comprising at least one testing head (21) which houses a plurality of contact probes (22), each contact probe (22) having at least one contact tip suitable to abut o...  
WO/2015/132747A1
A probe card for a testing apparatus of electronic devices is described comprising at least one testing head (21) which houses a plurality of contact probes (22), each contact probe (22) having at least one contact tip suitable to abut o...  
WO/2015/134040A1
A probe includes a main electro-optical modulator (130), first (150) and second (160) optical couplers each having a respective input (152, 162), through (154, 164) and isolated (156, 166) port, and reference (170) and test (174) optical...  
WO/2015/128679A1
A sample holding system comprises a sample holder adapted to operate in an operational temperature range of below 1K to at least 380K. The system may also comprise a substrate support. The sample holder has a substrate in the form of a c...  
WO/2015/130708A1
An integrated circuit test socket is adapted to use with Kelvin connectors by creating closely spaced connectors and counter-rotating links that are nested to conserve space. The connectors are shaped to make contact with a chip and comm...  
WO/2015/122472A1
A contact probe according to the present invention is provided with: a base portion; an inclined portion having a first inclined surface that inclines with respect to the longitudinal direction of the base portion; an extension portion h...  
WO/2015/116224A1
A test probe includes an outer tube, a rod, a first and a second probe tip, and an adjustable positioner. The outer tube has a first end and an opposing second end. The rod coaxially extends along a longitudinal axis within the outer tub...  
WO/2015/116207A1
A probe tip assembly includes a probe tip, an insulating member, and a lead element. The probe tip includes glassy metal. The probe tip includes a head, a tail end, and a shaft extending between the head and the tail end. The head has a ...  
WO/2015/113036A1
A computer system, computer program product and method of performing traffic analysis on a communications network includes time stamped packets and related metadata from an intercepted steam of real-time traffic on a backhaul network dis...  
WO/2015/108051A1
The purpose of the invention is, with respect to a laminated wiring board formed by stacking a resin laminate on a ceramic laminate, to reduce debonding at the interface between the resin laminate and the ceramic laminate and reduce warp...  
WO/2015/109208A3
Devices and methods for multilayer packages, antenna array feeds, test interface units, connectors, contactors, and large format substrates. The device comprising a 3D coaxial distribution network structure including a plurality of coaxi...  
WO/2015/106302A1
The invention relates to a vertical probe card (1) provided with a housing (8) which has a pressure chamber (11) made of a portion (10) of the housing (8) that is in the shape of a cylinder jacket. Outside the pressure chamber (11) an ax...  
WO/2015/109208A9
Devices and methods for multilayer packages, antenna array feeds, test interface units, connectors, contactors, and large format substrates. The device comprising a 3D coaxial distribution network structure including a plurality of coaxi...  
WO/2015/105209A1
The present invention relates to a probe device, and more specifically, to a probe device for electrically connecting a terminal of a blood test device to a pad of a testing apparatus, the probe device comprising: a first probe member co...  
WO/2015/102107A1
Provided is a stacked wiring substrate which is obtained by stacking a resin stacked body upon a ceramic stacked body, said stacked wiring substrate wherein peeling at an interface between the resin stacked body and the ceramic stacked b...  
WO/2015/102304A1
The present invention relates to a sheet-type connector and an electrical connector device and, particularly, to a sheet-type connector capable of easily aligning the positions of terminals of a device to be tested since a sheet member p...  
WO/2015/103365A1
A latch assembly that can lock and unlock a probe core with respect to a circuit board is provided. The latch assembly can engage with the probe core to align the probe core with respect to a circuit board, and press down the probe core ...  
WO/2015/095775A1
A probe assembly for probing a semiconductor device on a semiconductor wafer is provided. The probe assembly includes a stack of planar sheets each having a planar, sheet structure and defining a sheet tip thereof. The planar sheets are ...  
WO/2015/085876A1
A standard inductance box, relating to the fields of measurement or calibration, and relating in particular to a standard gauge for transferring an inductance parameter. The standard inductance box uses unary, binary and quinary, and com...  
WO/2015/089121A2
A wireless coupling method is suitable for use in calibration and testing of a radiofrequency device under test (DUT). The DUT includes a printed circuit board having one or more integral antennas. The wireless coupling method comprises ...  

Matches 551 - 600 out of 26,993