Login| Sign Up| Help| Contact|

Patent Searching and Data


Matches 601 - 650 out of 27,052

Document Document Title
WO/2015/144592A1
Electrical current transducer for measuring an electric current in a primary conductor, including a housing (4), a magnetic core (6) surrounding a central aperture (9) through which the primary conductor extends, and a magnetic field sen...  
WO/2015/139402A1
The present invention relates to the technical field of radio-frequency microwave measurement, and particularly to a radio-frequency asymmetrical low-impedance test fixture. The test fixture comprises: a PCB board (7) and a bottom plate ...  
WO/2015/142447A1
A sensor attachment assembly (100) for an electrical system (2) includes a sensor housing (102) at least partially enclosing a sensor (4), and a fastening member (200) coupled to the sensor housing (102) and being structured to extend fr...  
WO/2015/135170A1
A method (700) for reconfiguring pin assignments on a connector (100) is provided. The method (700) includes reading a present accessory type (34a) from an accessory (30) coupled to the connector (100) having a plurality of pins (110) wh...  
WO/2015/138388A3
A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). To prevent rotation ...  
WO/2015/133016A1
A probe pin (1) is provided with a coil spring (30), and first and second plungers (10, 20). The first and second plungers (10, 20) are formed such that, when the first and second plungers are inserted toward the inside from both the end...  
WO/2015/131875A1
The object of the present invention is to reduce the manual assembly effort of current sensors, and to specify a configuration for a fastening element (1) by means of which a current sensor (2) can be fastened on a fastening surface (3) ...  
WO/2015/132748A1
A probe card for a testing apparatus of electronic devices is described comprising at least one testing head (21) which houses a plurality of contact probes (22), each contact probe (22) having at least one contact tip suitable to abut o...  
WO/2015/132747A1
A probe card for a testing apparatus of electronic devices is described comprising at least one testing head (21) which houses a plurality of contact probes (22), each contact probe (22) having at least one contact tip suitable to abut o...  
WO/2015/134040A1
A probe includes a main electro-optical modulator (130), first (150) and second (160) optical couplers each having a respective input (152, 162), through (154, 164) and isolated (156, 166) port, and reference (170) and test (174) optical...  
WO/2015/128679A1
A sample holding system comprises a sample holder adapted to operate in an operational temperature range of below 1K to at least 380K. The system may also comprise a substrate support. The sample holder has a substrate in the form of a c...  
WO/2015/130708A1
An integrated circuit test socket is adapted to use with Kelvin connectors by creating closely spaced connectors and counter-rotating links that are nested to conserve space. The connectors are shaped to make contact with a chip and comm...  
WO/2015/122472A1
A contact probe according to the present invention is provided with: a base portion; an inclined portion having a first inclined surface that inclines with respect to the longitudinal direction of the base portion; an extension portion h...  
WO/2015/116224A1
A test probe includes an outer tube, a rod, a first and a second probe tip, and an adjustable positioner. The outer tube has a first end and an opposing second end. The rod coaxially extends along a longitudinal axis within the outer tub...  
WO/2015/116207A1
A probe tip assembly includes a probe tip, an insulating member, and a lead element. The probe tip includes glassy metal. The probe tip includes a head, a tail end, and a shaft extending between the head and the tail end. The head has a ...  
WO/2015/113036A1
A computer system, computer program product and method of performing traffic analysis on a communications network includes time stamped packets and related metadata from an intercepted steam of real-time traffic on a backhaul network dis...  
WO/2015/108051A1
The purpose of the invention is, with respect to a laminated wiring board formed by stacking a resin laminate on a ceramic laminate, to reduce debonding at the interface between the resin laminate and the ceramic laminate and reduce warp...  
WO/2015/109208A3
Devices and methods for multilayer packages, antenna array feeds, test interface units, connectors, contactors, and large format substrates. The device comprising a 3D coaxial distribution network structure including a plurality of coaxi...  
WO/2015/106302A1
The invention relates to a vertical probe card (1) provided with a housing (8) which has a pressure chamber (11) made of a portion (10) of the housing (8) that is in the shape of a cylinder jacket. Outside the pressure chamber (11) an ax...  
WO/2015/109208A9
Devices and methods for multilayer packages, antenna array feeds, test interface units, connectors, contactors, and large format substrates. The device comprising a 3D coaxial distribution network structure including a plurality of coaxi...  
WO/2015/105209A1
The present invention relates to a probe device, and more specifically, to a probe device for electrically connecting a terminal of a blood test device to a pad of a testing apparatus, the probe device comprising: a first probe member co...  
WO/2015/102107A1
Provided is a stacked wiring substrate which is obtained by stacking a resin stacked body upon a ceramic stacked body, said stacked wiring substrate wherein peeling at an interface between the resin stacked body and the ceramic stacked b...  
WO/2015/102304A1
The present invention relates to a sheet-type connector and an electrical connector device and, particularly, to a sheet-type connector capable of easily aligning the positions of terminals of a device to be tested since a sheet member p...  
WO/2015/103365A1
A latch assembly that can lock and unlock a probe core with respect to a circuit board is provided. The latch assembly can engage with the probe core to align the probe core with respect to a circuit board, and press down the probe core ...  
WO/2015/095775A1
A probe assembly for probing a semiconductor device on a semiconductor wafer is provided. The probe assembly includes a stack of planar sheets each having a planar, sheet structure and defining a sheet tip thereof. The planar sheets are ...  
WO/2015/085876A1
A standard inductance box, relating to the fields of measurement or calibration, and relating in particular to a standard gauge for transferring an inductance parameter. The standard inductance box uses unary, binary and quinary, and com...  
WO/2015/089121A2
A wireless coupling method is suitable for use in calibration and testing of a radiofrequency device under test (DUT). The DUT includes a printed circuit board having one or more integral antennas. The wireless coupling method comprises ...  
WO/2015/081708A1
An improved low-impedance test fixture comprises: an impedance converter and a support piece. The impedance converter is fixed on the support piece. The impedance converter comprises: a first tapered microstrip line, a first bias circuit...  
WO/2015/083858A1
Disclosed are a display panel device for inspecting an AMOLED panel, and a method therefor. A display panel inspection device according to one embodiment of the present invention comprises: a main body which is installed on a work table ...  
WO/2015/078887A1
A test fixture and method of its use are disclosed. The test fixture includes a test fixture frame including a first test fixture mount having a first test head mounted thereon, the first test head slidable along a first axis, and a seco...  
WO/2015/076360A1
This socket attaching structure is provided with: a plurality of supporting members, which extend from a main surface of a substrate, and which are respectively inserted into inserting holes that are provided in a holder member; and a pl...  
WO/2015/077234A3
A circuit comprises a battery field-effect transistor (FET 512) coupled between a battery (502) and an electronic system (518) so that current from the battery flows through the battery FET to the electronic system. A replica FET couples...  
WO/2015/074412A1
A GIS field oscillation type impulse withstand voltage test waveform adjustment system and a method. The method comprises the following steps: calculating a capacitance value of a tested GIS (S101); determining a test waveform parameter ...  
WO/2015/071367A1
The invention relates to a printed circuit board (1) with at least two connection points (3) and at least one precision resistor (2) for measuring a current flowing between the connection points. The aim of the invention is to inexpensiv...  
WO/2015/068222A1
[Problem] Provided is a contact probe that can be easily handled and that can be substituted without socket development and manufacturing costs. [Solution] A contact probe composed of a coil spring and a pair of electroconductive vertica...  
WO/2015/067312A1
The invention relates to a test needle (100, 100') for electronically testing semiconductor elements, comprising an electrically conductive core element (200), said core element (200) being made of a metal alloy, and an electrically insu...  
WO/2015/068632A1
A solar cell output measurement tool having a current measurement terminal that is formed through the arrangement of a plurality of probe pins and is for measuring a current characteristic of a solar cell, a voltage measurement terminal ...  
WO/2015/062206A1
An adapter panel (1) for test signals of a liquid crystal panel (3), which is electrically connected between a signal generator (2) and a circuit board of the liquid crystal panel (3). The adapter panel (1) is provided with a group of si...  
WO/2015/062682A1
The invention relates to a resistor (1), in particular a low-resistance current measuring resistor (1), comprising two plate-shaped connection parts (2, 3) consisting of a conductor material for conducting in and conducting out an electr...  
WO/2015/055483A1
The invention relates to a method for measuring a temperature (26) in a current sensor (24), which comprises a first electrically conductive material (32) and a second electrically conductive material (34) connected in series with the fi...  
WO/2015/053150A1
This contact is provided with: a bellows body (20) having conductive terminals (30, 40) provided to both ends thereof; and pairs of first and second elastic movable arm parts (50, 60) which extends towards either side from respective bas...  
WO/2015/049605A1
An electrical measuring apparatus for measuring an alternating voltage between a first potential and a second potential comprises a voltage measuring device (1-3), a measuring electronic circuit (7) and a transformer (37, 38) for supplyi...  
WO/2015/048095A1
The total current flow in a given electric circuit path is estimated by measuring the current in a second parallel current path and applying a ratio of the conductivity of the main and secondary path. Earth leakage current is measured by...  
WO/2015/041099A1
[Problem] To provide an electrical component socket in which the stability of electrical resistance can be maintained even after repeated use. [Solution] A contact pin of an electrical component socket, provided with a lower contact part...  
WO/2015/037740A1
 Provided is a probe that maintains the electrical isolation of the probe and ensures the impedance matching of the probe, and which has a high detection accuracy for high-frequency electrical properties. Also provided is a probe card ...  
WO/2015/037741A1
 Provided are a probe and a probe card having higher detection accuracy and being easier to produce, even with the move to more highly integrated circuits, higher speeds and higher frequencies. A probe pertaining to a first aspect of...  
WO/2015/037696A1
Provided is a probe pin that is capable of inspection of an IC having a minute pitch, has a low risk of deformation or disassembly during use or after assembly of the probe pin even if the inner diameter of a coil spring is small, and is...  
WO/2015/035106A1
Managing power feeds includes monitoring a waveform of a high-voltage power feed supplied to an electrical load to detect potential interruption of the high-voltage power feed and switching to another power feed to supply power to the el...  
WO/2015/030028A1
The present invention provides a cantilever-type probe which makes it possible to eliminate the drawbacks of a conventional cantilevered probe and consequently raise the level of integration of an object to be measured. This cantilever-t...  
WO/2015/030357A1
Disclosed is an anisotropic conductive connector comprising: a planar elastic body which comprises a plurality of conductors in which conductive particles having magnetism to show conductivity in a thickness direction are oriented in the...  

Matches 601 - 650 out of 27,052