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Patent Searching and Data


Matches 651 - 700 out of 27,016

Document Document Title
WO/2014/167410A3
The invention describes a testing head (20) for a testing equipment of electronic devices comprising a plurality of contact probes (22) inserted into guide holes being realized in at least one upper guide (23) and in one lower guide (24)...  
WO/2014/161270A1
Disclosed is a probe apparatus for hardware testing, comprising: a probe, and a probe pin and a transmission line that are disposed on the probe; and further comprising: a connection piece disposed on an upper surface of the probe, and a...  
WO/2014/161068A1
The present document describes a method for building a part for use with a test equipment in the performance of a test of electrical equipment. The part comprises at least one of a connector, an interface cable, and a test program. The m...  
WO/2014/161624A1
The invention relates to a measuring resistor (1), in particular a low-resistance current-measuring resistor, comprising two terminal parts (2, 3) that consist of a conductor material for introducing and discharging a current, and a resi...  
WO/2014/158035A1
A diode (or a semiconductor circuit functionally equivalent to a diode) is formed in the upper surface of a silicon substrate. Resonating element mounting pads are formed on the same substrate surface and a resonating element is mounted ...  
WO/2014/156531A1
The purpose of the present invention is to provide an electric contact having a stable electrical resistance value. An insertion rod passing through a coil spring is provided on a first contact member, while a cylindrical part into which...  
WO/2014/147436A1
An apparatus for sensing current of a vehicle battery employs an extended counting analogue-to-digital conversion process (212) to a chopped and amplified voltage appearing across a low ohmic shunt resistor (203) placed between the negat...  
WO/2014/139333A1
Provided is a current waveform generation device, comprising: a high-voltage power supply (10), a bridge rectifier module (20), a waveform module (30), a discharging switch (40) and a test module (50). The waveform module (30) is provide...  
WO/2014/140029A1
The invention relates to a crossmember unit (2) for a test apparatus (1) for printed circuit boards, wherein the crossmember unit (2) has at least one crossmember (9), which spans a test area in which a printed circuit board to be tested...  
WO/2014/135312A1
The invention relates to a current sensor device (1) for measuring a current, in particular for measuring a battery current in motor vehicles. Said device comprises a clamping device (20) for fixing the current sensor device (1) to a mai...  
WO/2014/135451A1
The invention relates to a current sensor device (1) for measuring a current, in particular for measuring a battery current in motor vehicles, comprising an electric resistance element (40) on which the current (I) can be determined by m...  
WO/2014/136884A1
[Problem] To provide a contact pin exhibiting good electrical characteristics and improved reliability. [Solution] A contact pin (1) is provided with a first plunger (10), a second plunger (20), and a coil spring (30) that generates a re...  
WO/2014/129784A1
The present invention relates to a test socket with a high density conduction section, and more particularly the test socket arranged between a blood test device and a test apparatus for electrically connecting the terminal of the blood ...  
WO/2014/123235A1
The base member for a probe unit pertaining to the present invention is provided to a probe unit which is provided with an electroconductive probe for contacting each of both ends of two different contacted elements, and a probe holder f...  
WO/2014/123031A1
Through the present invention, the effective buckling length of a probe can easily be changed while keeping manufacturing cost low. The present invention is provided with a plurality of probes (11a), a support part for supporting the pro...  
WO/2014/114616A1
The invention relates to a current-measuring device (1) for measuring a current through a bus bar (2), in particular for measuring a large current, comprising two clamping contacts (4), by means of which an electrical and mechanical conn...  
WO/2014/111188A1
The invention relates to a measuring arrangement comprising at least one measuring resistor 8 that is formed from a centre portion 12 and two end portions 10, 11. The measuring resistor 8 is formed in a U-shape or a C-shape.  
WO/2014/110260A1
An embodiment of an apparatus for providing a variable resistance may be configured to provide a resistance value according to a binary-coded decimal scheme. The apparatus may be referred to herein as a BCD variable resistance apparatus....  
WO/2014/109165A1
Provided is an electric connector which has a configuration wherein a plurality of spring contact probes are connected in a prescribed order and which can be preferably provided with a common cover for the spring contact probes. Groundin...  
WO/2014/101984A1
The present invention relates to a measuring tip comprising a base body, at least two measuring conductors that are connected to the base body, and at least two connecting conductors, a first connecting conductor being electrically condu...  
WO/2014/105243A1
An example test system includes: a pin electronics board for exchanging signals with a device under test (DUT), where the pin electronics board includes first electrical contacts; an interposer between the pin electronics board and a pad...  
WO/2014/105896A1
Nano spike contactors suitable for semiconductor device test, and associated systems and methods are disclosed. A representative apparatus includes a translator having a wafer side positioned to face toward a device under test and an inq...  
WO/2014/102102A1
The invention relates to a contact head for contacting an electric test object, in particular a wafer, comprising contact needles mounted in receiving openings, comprising at least two mutually spaced guide plates, and comprising at leas...  
WO/2014/104782A1
The present invention relates to a test socket, and more specifically, to a test socket for electrically connecting a terminal of a test target device with a pad of a test device, comprising: a socket guide provided with a center hole at...  
WO/2014/097896A1
A battery state monitoring device (3) is provided with: a substrate (100) that is provided with a terminal insertion hole (111B) into which an electrode terminal (75) of a battery (2) is inserted; a stator (141B) which is formed of a hea...  
WO/2014/094819A1
Embodiments of the present invention provide an RF probe for coupling out a probe signal from a transmission line of a circuit. The RF probe comprises at least two probe pins having first ends for contacting the circuit and second ends. ...  
WO/2014/099052A1
A probe and method of probing conduct testing of a circuit. The probe 100 includes a base 110 coupled to a substrate 120. The probe also includes a cantilever 115 attached to the base 110 at a first end, the cantilever 115 deflecting fro...  
WO/2014/089803A1
Embodiments of the present invention provide a radio frequency connector, a radio frequency board and a calibration component. The radio frequency connector comprises an inner conductor, a dielectric layer and an outer conductor. The die...  
WO/2014/092171A1
This electrical contact member repeatedly contacts a subject. The surface of the electrical contact member that contacts a subject is configured from a metallic-element-containing carbon coating film containing a metallic element. The su...  
WO/2014/087906A1
The purpose of the present invention is to suppress the occurrence of shavings produced by interference of a contact probe with a guide plate. [Solution] An electrical contact provided with: a contact part (2) having a layered structured...  
WO/2014/088131A1
The present invention relates to a socket for testing a semiconductor, which can precisely come into contact with a solder ball, has no limitations of height, is capable of providing elasticity and being electrically conductive by formin...  
WO/2014/082742A1
A cantilever contact probe (20, 20', 20") comprising at least a probe body (21) and a hook-shaped end portion (22), being joined to the probe body (21) and ending with a slanted section (23) being configured as a hook, the end portion (2...  
WO/2014/079913A1
In a method for testing a workpiece (3), in particular a circuit board, by means of a test pin (2) arranged on a holder (1), said test pin (2) approaching a predetermined position on or in the workpiece (3), a position of the test pin (2...  
WO/2014/081664A1
Electrically conductive columns of intertwined carbon nanotubes embedded in a mass of material flexible, resilient electrically insulating material can be used as electrically conductive contact probes. The columns can extend between opp...  
WO/2014/075989A1
The invention relates to a protective circuit (12) for a current transformer (10) for preventing a secondary voltage (Us) on a secondary circuit (10.1) of the current transformer (10) exceeding a secondary voltage threshold. The protecti...  
WO/2014/077869A1
An apparatus for testing electronic devices is disclosed. The apparatus includes a plurality of probes attached to a substrate; each probe capable of elastic deformation when the probe tip comes in contact with the electronic; each probe...  
WO/2014/073368A1
Provided is a connection terminal that has high contact reliability and, by being very elastic, does not damage a part that is being contacted. A connection terminal (11) comprising a support (20) that is for supporting an elastically de...  
WO/2014/074238A1
A system and method for adjusting a common mode output voltage in an instrumentation amplifier is provided. In one aspect, the common mode output voltage is increased or decreased with respect to the common mode input voltage to enable h...  
WO/2014/074208A1
An electrical joint monitoring device (20,20') including a mounting assembly (21,21') and a wireless transponder unit (25). The mounting assembly includes a first conductive contact (23,23') structured to electrically connect to a first ...  
WO/2014/072347A1
The invention relates to a kit for protecting a microelectronic component or a chip (10) comprising connection terminals (14) against electrostatic discharges during connection of the terminals to a conductor device, said kit comprising:...  
WO/2014/070788A1
Elongated flexible probes can be disposed in holes of upper and lower guide plates of a probe card assembly. Each probe can include one or more spring mechanisms that exert normal forces against sidewalls of holes in one of the guide pla...  
WO/2014/063138A8
Electrochemical methods for probing solid polymer electrolyte surface coatings on electrically conducting, active, three-dimensional electrode materials for use in lithium-ion batteries, to quantitatively determine the conformity, unifor...  
WO/2014/059637A1
A gold finger connection device comprising an upper clamping plate (1) and a lower clamping plate (2), as well as a rubber pad (21) provided on the inner surface of the lower clamping plate (2); the rubber pad (21) is provided with a plu...  
WO/2014/059634A1
A connection device for testing liquid crystal displays (LCDs), comprising a pressure plate (2a) and a conductive rubber rod (1a), said conductive rubber rod (1a) being provided with a plurality of conductive rings (11a) capable of respe...  
WO/2014/060105A1
The invention relates to a measurement device in which voltage and/or a current sensor in a casted measurement device housing, wherein the sensor component is connected with a externally ending output connector by a signal wire, and with...  
WO/2014/059634A9
A connection device for testing liquid crystal displays (LCDs), comprising a pressure plate (2a) and a conductive rubber rod (1a), said conductive rubber rod (1a) being provided with a plurality of conductive rings (11a) capable of respe...  
WO/2014/063138A1
Electrochemical methods for probing solid polymer electrolyte surface coatings on electrically conducting, active, three-dimensional electrode materials for use in lithium-ion batteries, to quantitatively determine the conformity, unifor...  
WO/2014/060704A2
The invention relates to a detection terminal (2) that comprises a securing portion (4) to be secured in a structure, an electrically conducting protection portion (5) that is rigidly connected to the securing portion (4) and arranged su...  
WO/2014/047978A1
A detecting device of a TFT-LCD substrate comprises a machine main body (2), a circuit board (7) arranged on the machine main body (2), a plurality of motors (4) arranged on the machine main body (2) and a plurality of probes (6) arrange...  
WO/2014/051619A1
An intelligent electronic device (100) for metering a characteristic of electricity that has a rear opening (214) and a side opening (216) in a housing of the device for accepting a connector of an expansion module through one or the oth...  

Matches 651 - 700 out of 27,016