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Patent Searching and Data


Matches 651 - 700 out of 27,081

Document Document Title
WO/2015/037740A1
 Provided is a probe that maintains the electrical isolation of the probe and ensures the impedance matching of the probe, and which has a high detection accuracy for high-frequency electrical properties. Also provided is a probe card ...  
WO/2015/037741A1
 Provided are a probe and a probe card having higher detection accuracy and being easier to produce, even with the move to more highly integrated circuits, higher speeds and higher frequencies. A probe pertaining to a first aspect of...  
WO/2015/037696A1
Provided is a probe pin that is capable of inspection of an IC having a minute pitch, has a low risk of deformation or disassembly during use or after assembly of the probe pin even if the inner diameter of a coil spring is small, and is...  
WO/2015/035106A1
Managing power feeds includes monitoring a waveform of a high-voltage power feed supplied to an electrical load to detect potential interruption of the high-voltage power feed and switching to another power feed to supply power to the el...  
WO/2015/030028A1
The present invention provides a cantilever-type probe which makes it possible to eliminate the drawbacks of a conventional cantilevered probe and consequently raise the level of integration of an object to be measured. This cantilever-t...  
WO/2015/030357A1
Disclosed is an anisotropic conductive connector comprising: a planar elastic body which comprises a plurality of conductors in which conductive particles having magnetism to show conductivity in a thickness direction are oriented in the...  
WO/2015/024068A1
An electrical utility meter base unit is disclosed in this specification. The base unit has an expansion interface that connects a removable expansion module to circuitry within the base unit. The expansion interface has an electrical co...  
WO/2015/025662A1
A probe pin is provided with: a coil spring (3); a first plunger (1) having a body section (11), a first elastic section (12), and a second elastic section (13), the first and second elastic sections (12, 13) extending in the same direct...  
WO/2015/023062A1
A pin for inspecting a microelectrode circuit is disclosed. The pin for inspecting a microelectrode circuit according to an embodiment of the present invention comprises: a pin, at least one of both ends of which has a contact part forme...  
WO/2015/020353A1
The present invention provides a probe apparatus for a Kelvin test which contacts terminals of a device. The probe apparatus comprises: a contact layer which has conductivity and is stacked at the lowermost end thereof; an interposer lay...  
WO/2015/016099A1
A contact element (25) (electroformed product) is manufactured by electroforming. An insulating film (28), formed using a dry film resist or the like, is provided on the surface of the contact element (25). The insulating film (28) is pr...  
WO/2015/012498A1
Disclosed are a conductive connector arranged between a device to be tested and a test device to electrically connect terminals of the device to be tested and pads of the test device to each other, and a manufacturing method therefor. Th...  
WO/2015/008887A1
The present invention relates to a spring contact, which is integrally formed by press-blanking and bending a metal plate member, the spring contact comprising: an upper head portion (32) having an upper tip portion (31) protruding upwar...  
WO/2015/006499A1
A multiple conduction path probe can provide an electrically conductive signal path from a first contact end to a second contact end. The probe can also include an electrically conductive secondary path and an electrically insulated gap ...  
WO/2015/006624A2
A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and...  
WO/2015/006625A3
The test system provides an array of test probes having a cross beam. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. The probes ar...  
WO/2015/000924A1
The invention relates to a measuring resistor (28) for conducting an electric current (6) to be measured, comprising - a current-receiving point (38) and a current-discharging point (42), which are designed to receive and discharge the e...  
WO/2014/205935A1
Provided are a test substrate and a probe card manufactured using the test substrate. Test-end micro bulges (2) on a top surface of the test substrate are arranged according to the layout of contacts (7) to be detected at the bottom of a...  
WO/2014/206594A1
The invention relates to a testing device (1) for electrically testing an electrical test specimen (2), in particular a wafer, said testing device having a test head (4) in which at least one testing contact (5) is mounted for electrical...  
WO/2014/201867A1
A probe module for detecting a contact effect. In the process of liquid crystal alignment, the probe module is used for detecting the contact effect between itself and the substrate external test circuit of a liquid crystal panel, and co...  
WO/2014/198382A1
The invention relates to a punched part for producing an electrical resistor, in particular a current measuring resistor, comprising a resistor element (9) consisting of a low-resistance resistive material (for example Manganin®) and tw...  
WO/2014/194779A1
A measurement device for a full-shielding high-voltage current comprises a left shell (2) and a right shell (3) forming a ring-shaped shielding chamber (1); a test core line hole (4) is arranged at a top end of the right shell (3), and a...  
WO/2014/191776A1
The present invention relates to electrical measurement apparatus (10). The electrical measurement apparatus (10) comprises a measurement arrangement (20,24) configured to be disposed in relation to an electrical circuit (12,14,16,18) wh...  
WO/2014/190894A1
A test probe, a test probe component and a test platform. The test probe comprises a probe body (301), wherein an end of the probe body (301) is of a hollow design, thereby cooperating with a gold finger (40) through insertion. The desig...  
WO/2014/188416A1
The present invention discloses a sensor device comprising a probe carrying a three-dimensional magnetic field sensor. The probe has a conical tip portion with an edge being configured as the three-dimensional magnetic field sensor. The ...  
WO/2014/188702A1
In a first step, a substrate 11 is gripped by central clamps 40 and 43 of a first clamping mechanism 31 and a second clamping mechanism 32. In a second step, the substrate 11 is gripped by a third clamping mechanism 33 and a fourth clamp...  
WO/2014/189077A1
The multi-point probe is obtained from a tubular laminate configured by winding an electronic contact sheet, which has multiple electronic contacts disposed on a sheet-shaped insulating base material so as to be separated from each other...  
WO/2014/186289A3
A probe card apparatus can comprise a tester interface to a test controller, probes for contacting terminals of electronic devices to be tested, and electrical connections there between. The probe card apparatus can comprise a primary su...  
WO/2014/180137A1
A connector of a display panel detecting device, and a display panel detecting device and method, which can realize the detection of a display panel with small-pitch signal lines without producing a shorting bar, thereby saving costs. Th...  
WO/2014/182633A1
A probe card assembly can comprise a guide plate comprising probe guides for holding probes in predetermined positions. The probe card assembly can also comprise a wiring structure attached to the guide plate so that connection tips of t...  
WO/2014/180596A1
The invention relates to an electrical contacting device (1) for electrical physical contact with a specimen (5), particularly a wafer, taking place in a contacting direction (15), said electrical contacting device having at least one co...  
WO/2014/175014A1
An electronic component testing device is provided that is capable of efficiently causing heat to be emitted (causing heat dissipation) from a self-heated electronic component and of efficiently carrying out the intended test while keepi...  
WO/2014/172282A1
Testing stacked devices. In accordance with a first method embodiment, a primary circuit assembly is accessed from a first circuit assembly carrier. The primary circuit assembly is placed into a test fixture. A secondary circuit assembly...  
WO/2014/167410A3
The invention describes a testing head (20) for a testing equipment of electronic devices comprising a plurality of contact probes (22) inserted into guide holes being realized in at least one upper guide (23) and in one lower guide (24)...  
WO/2014/161270A1
Disclosed is a probe apparatus for hardware testing, comprising: a probe, and a probe pin and a transmission line that are disposed on the probe; and further comprising: a connection piece disposed on an upper surface of the probe, and a...  
WO/2014/161068A1
The present document describes a method for building a part for use with a test equipment in the performance of a test of electrical equipment. The part comprises at least one of a connector, an interface cable, and a test program. The m...  
WO/2014/161624A1
The invention relates to a measuring resistor (1), in particular a low-resistance current-measuring resistor, comprising two terminal parts (2, 3) that consist of a conductor material for introducing and discharging a current, and a resi...  
WO/2014/158035A1
A diode (or a semiconductor circuit functionally equivalent to a diode) is formed in the upper surface of a silicon substrate. Resonating element mounting pads are formed on the same substrate surface and a resonating element is mounted ...  
WO/2014/156531A1
The purpose of the present invention is to provide an electric contact having a stable electrical resistance value. An insertion rod passing through a coil spring is provided on a first contact member, while a cylindrical part into which...  
WO/2014/147436A1
An apparatus for sensing current of a vehicle battery employs an extended counting analogue-to-digital conversion process (212) to a chopped and amplified voltage appearing across a low ohmic shunt resistor (203) placed between the negat...  
WO/2014/139333A1
Provided is a current waveform generation device, comprising: a high-voltage power supply (10), a bridge rectifier module (20), a waveform module (30), a discharging switch (40) and a test module (50). The waveform module (30) is provide...  
WO/2014/140029A1
The invention relates to a crossmember unit (2) for a test apparatus (1) for printed circuit boards, wherein the crossmember unit (2) has at least one crossmember (9), which spans a test area in which a printed circuit board to be tested...  
WO/2014/135312A1
The invention relates to a current sensor device (1) for measuring a current, in particular for measuring a battery current in motor vehicles. Said device comprises a clamping device (20) for fixing the current sensor device (1) to a mai...  
WO/2014/135451A1
The invention relates to a current sensor device (1) for measuring a current, in particular for measuring a battery current in motor vehicles, comprising an electric resistance element (40) on which the current (I) can be determined by m...  
WO/2014/136884A1
[Problem] To provide a contact pin exhibiting good electrical characteristics and improved reliability. [Solution] A contact pin (1) is provided with a first plunger (10), a second plunger (20), and a coil spring (30) that generates a re...  
WO/2014/129784A1
The present invention relates to a test socket with a high density conduction section, and more particularly the test socket arranged between a blood test device and a test apparatus for electrically connecting the terminal of the blood ...  
WO/2014/123235A1
The base member for a probe unit pertaining to the present invention is provided to a probe unit which is provided with an electroconductive probe for contacting each of both ends of two different contacted elements, and a probe holder f...  
WO/2014/123031A1
Through the present invention, the effective buckling length of a probe can easily be changed while keeping manufacturing cost low. The present invention is provided with a plurality of probes (11a), a support part for supporting the pro...  
WO/2014/114616A1
The invention relates to a current-measuring device (1) for measuring a current through a bus bar (2), in particular for measuring a large current, comprising two clamping contacts (4), by means of which an electrical and mechanical conn...  
WO/2014/111188A1
The invention relates to a measuring arrangement comprising at least one measuring resistor 8 that is formed from a centre portion 12 and two end portions 10, 11. The measuring resistor 8 is formed in a U-shape or a C-shape.  

Matches 651 - 700 out of 27,081