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Patent Searching and Data


Matches 701 - 750 out of 27,081

Document Document Title
WO/2014/110260A1
An embodiment of an apparatus for providing a variable resistance may be configured to provide a resistance value according to a binary-coded decimal scheme. The apparatus may be referred to herein as a BCD variable resistance apparatus....  
WO/2014/109165A1
Provided is an electric connector which has a configuration wherein a plurality of spring contact probes are connected in a prescribed order and which can be preferably provided with a common cover for the spring contact probes. Groundin...  
WO/2014/101984A1
The present invention relates to a measuring tip comprising a base body, at least two measuring conductors that are connected to the base body, and at least two connecting conductors, a first connecting conductor being electrically condu...  
WO/2014/105243A1
An example test system includes: a pin electronics board for exchanging signals with a device under test (DUT), where the pin electronics board includes first electrical contacts; an interposer between the pin electronics board and a pad...  
WO/2014/105896A1
Nano spike contactors suitable for semiconductor device test, and associated systems and methods are disclosed. A representative apparatus includes a translator having a wafer side positioned to face toward a device under test and an inq...  
WO/2014/102102A1
The invention relates to a contact head for contacting an electric test object, in particular a wafer, comprising contact needles mounted in receiving openings, comprising at least two mutually spaced guide plates, and comprising at leas...  
WO/2014/104782A1
The present invention relates to a test socket, and more specifically, to a test socket for electrically connecting a terminal of a test target device with a pad of a test device, comprising: a socket guide provided with a center hole at...  
WO/2014/097896A1
A battery state monitoring device (3) is provided with: a substrate (100) that is provided with a terminal insertion hole (111B) into which an electrode terminal (75) of a battery (2) is inserted; a stator (141B) which is formed of a hea...  
WO/2014/094819A1
Embodiments of the present invention provide an RF probe for coupling out a probe signal from a transmission line of a circuit. The RF probe comprises at least two probe pins having first ends for contacting the circuit and second ends. ...  
WO/2014/099052A1
A probe and method of probing conduct testing of a circuit. The probe 100 includes a base 110 coupled to a substrate 120. The probe also includes a cantilever 115 attached to the base 110 at a first end, the cantilever 115 deflecting fro...  
WO/2014/089803A1
Embodiments of the present invention provide a radio frequency connector, a radio frequency board and a calibration component. The radio frequency connector comprises an inner conductor, a dielectric layer and an outer conductor. The die...  
WO/2014/092171A1
This electrical contact member repeatedly contacts a subject. The surface of the electrical contact member that contacts a subject is configured from a metallic-element-containing carbon coating film containing a metallic element. The su...  
WO/2014/087906A1
The purpose of the present invention is to suppress the occurrence of shavings produced by interference of a contact probe with a guide plate. [Solution] An electrical contact provided with: a contact part (2) having a layered structured...  
WO/2014/088131A1
The present invention relates to a socket for testing a semiconductor, which can precisely come into contact with a solder ball, has no limitations of height, is capable of providing elasticity and being electrically conductive by formin...  
WO/2014/082742A1
A cantilever contact probe (20, 20', 20") comprising at least a probe body (21) and a hook-shaped end portion (22), being joined to the probe body (21) and ending with a slanted section (23) being configured as a hook, the end portion (2...  
WO/2014/079913A1
In a method for testing a workpiece (3), in particular a circuit board, by means of a test pin (2) arranged on a holder (1), said test pin (2) approaching a predetermined position on or in the workpiece (3), a position of the test pin (2...  
WO/2014/081664A1
Electrically conductive columns of intertwined carbon nanotubes embedded in a mass of material flexible, resilient electrically insulating material can be used as electrically conductive contact probes. The columns can extend between opp...  
WO/2014/075989A1
The invention relates to a protective circuit (12) for a current transformer (10) for preventing a secondary voltage (Us) on a secondary circuit (10.1) of the current transformer (10) exceeding a secondary voltage threshold. The protecti...  
WO/2014/077869A1
An apparatus for testing electronic devices is disclosed. The apparatus includes a plurality of probes attached to a substrate; each probe capable of elastic deformation when the probe tip comes in contact with the electronic; each probe...  
WO/2014/073368A1
Provided is a connection terminal that has high contact reliability and, by being very elastic, does not damage a part that is being contacted. A connection terminal (11) comprising a support (20) that is for supporting an elastically de...  
WO/2014/074238A1
A system and method for adjusting a common mode output voltage in an instrumentation amplifier is provided. In one aspect, the common mode output voltage is increased or decreased with respect to the common mode input voltage to enable h...  
WO/2014/074208A1
An electrical joint monitoring device (20,20') including a mounting assembly (21,21') and a wireless transponder unit (25). The mounting assembly includes a first conductive contact (23,23') structured to electrically connect to a first ...  
WO/2014/072347A1
The invention relates to a kit for protecting a microelectronic component or a chip (10) comprising connection terminals (14) against electrostatic discharges during connection of the terminals to a conductor device, said kit comprising:...  
WO/2014/070788A1
Elongated flexible probes can be disposed in holes of upper and lower guide plates of a probe card assembly. Each probe can include one or more spring mechanisms that exert normal forces against sidewalls of holes in one of the guide pla...  
WO/2014/063138A8
Electrochemical methods for probing solid polymer electrolyte surface coatings on electrically conducting, active, three-dimensional electrode materials for use in lithium-ion batteries, to quantitatively determine the conformity, unifor...  
WO/2014/059637A1
A gold finger connection device comprising an upper clamping plate (1) and a lower clamping plate (2), as well as a rubber pad (21) provided on the inner surface of the lower clamping plate (2); the rubber pad (21) is provided with a plu...  
WO/2014/059634A1
A connection device for testing liquid crystal displays (LCDs), comprising a pressure plate (2a) and a conductive rubber rod (1a), said conductive rubber rod (1a) being provided with a plurality of conductive rings (11a) capable of respe...  
WO/2014/060105A1
The invention relates to a measurement device in which voltage and/or a current sensor in a casted measurement device housing, wherein the sensor component is connected with a externally ending output connector by a signal wire, and with...  
WO/2014/059634A9
A connection device for testing liquid crystal displays (LCDs), comprising a pressure plate (2a) and a conductive rubber rod (1a), said conductive rubber rod (1a) being provided with a plurality of conductive rings (11a) capable of respe...  
WO/2014/063138A1
Electrochemical methods for probing solid polymer electrolyte surface coatings on electrically conducting, active, three-dimensional electrode materials for use in lithium-ion batteries, to quantitatively determine the conformity, unifor...  
WO/2014/060704A2
The invention relates to a detection terminal (2) that comprises a securing portion (4) to be secured in a structure, an electrically conducting protection portion (5) that is rigidly connected to the securing portion (4) and arranged su...  
WO/2014/047978A1
A detecting device of a TFT-LCD substrate comprises a machine main body (2), a circuit board (7) arranged on the machine main body (2), a plurality of motors (4) arranged on the machine main body (2) and a plurality of probes (6) arrange...  
WO/2014/051619A1
An intelligent electronic device (100) for metering a characteristic of electricity that has a rear opening (214) and a side opening (216) in a housing of the device for accepting a connector of an expansion module through one or the oth...  
WO/2014/049874A1
The present invention provides a metal material for uses in electrical/electronic devices, which is characterized by being formed of 20-50% by mass of Ag, 20-50% by mass of Pd, 10-40% by mass of Cu and 0.5-30% by mass of Co, and which is...  
WO/2014/044483A1
The invention relates to a method (38) for ascertaining a current (I) flowing through an electrical conductor (4) into which a measuring resistor (20) has been introduced. A first electrical voltage (U1) is sensed that drops across a fir...  
WO/2014/041877A1
[Problem] To provide an electrode section contactor for a laminated secondary cell, with which faulty contact can be prevented by the provision of contact sections that can stably contact even an electrode tab for making an insulating ox...  
WO/2014/042597A1
A detachable member and a processing member for an analysis tool, the detachable member comprising a housing for a probe member, said probe member capable of obtaining one or more characteristics information; and a circuitry component fo...  
WO/2014/043592A3
Techniques are disclosed for measurement devices and methods to obtain various physical and/or electrical parameters in an integrated manner. For example, a measurement device may include a housing, an optical emitter, a sensor, a distan...  
WO/2014/039926A1
Disclosed are systems, devices and methods related to mapping of electromagnetic (EM) field near a radio-frequency (RF) module. In some embodiments, a miniature probe such as a magnetic probe can be configured to obtain near-field measur...  
WO/2014/036770A1
Provided are a micromechanical chip test probe card and a method of fabricating same. A cantilever beam pattern (20) is defined in an SOI substrate. A blind hole (105) whose inner wall is insulated is fabricated on a floating end (201) o...  
WO/2014/037465A1
The invention relates to a method for checking the plausibility of a measurement result for an electric current (20) by means of a current sensor (2) connected to an electrical circuit (22), said method comprising: making a predetermined...  
WO/2014/036030A1
An apparatus and method for protecting probes used in automated testing is disclosed. The apparatus comprises a probe operable to provide power to a device under test (DUT) from a device power source (DPS), wherein the probe is coupled t...  
WO/2014/031688A1
A self-powered current sensor is described. The self-powered current sensor including an electrical signal input configured to receive a current signal. Further, the self-powered current sensor includes a power circuit configured to gene...  
WO/2014/030536A1
As an anisotropic conductive member provided with an electric penetration part capable of achieving all of contact stabilization, density growth, and decrease in thickness at high levels, provided is an anisotropic conductive member prov...  
WO/2014/026678A1
The invention relates to a device for reversible mechanical fixation and electrical contacting of one or more electrical conductors (11) of a cable (10). According to the invention, the cable (10) is fixed mechanically by means of the ca...  
WO/2014/023402A1
The invention relates to a medium or high voltage arrangement with cable connection terminal and voltage sensor, wherein the voltage sensor has a resistive voltage divider (3, 5) and shielding electrodes (10, 11). In order to enhance the...  
WO/2014/019061A1
A measuring instrument for detection of electrical properties in a liquid includes a main body configured to hold a tester, a first pole extending from the main body, and a second pole extending from the main body that is spaced apart fr...  
WO/2014/021465A1
Provided are an alloy material having excellent electrical conductivity and high hardness and excellent workability for use in a contact probe, a contact probe consisting of this alloy material, and a connection terminal. In a compositio...  
WO/2014/021194A1
[Problem] The purpose of the present invention is to provide a guide plate for a probe guard that can be provided with fine through holes at a narrow pitch interval and that makes it possible to achieve improved strength. [Configuration]...  
WO/2014/019692A1
The invention relates to a voltage measurement device with an insulating body, for the use in medium or high voltage equipment or switchgears, with an impedance divider consisting of at least one high voltage impedance and at least one l...  

Matches 701 - 750 out of 27,081