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WO/2021/032396A1 |
The present invention relates to a test method for an unpopulated printed circuit board, comprising the steps of: exposing the unpopulated printed circuit board to temperatures of a reflow soldering process in a first step; and testing t...
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WO/2021/027472A1 |
A high pressure accelerated aging test machine for finished chip test and a use method therefor. The test machine comprises an upper machine body (1), a pressure door (2) being movably mounted on a front surface of the upper machine body...
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WO/2021/023740A1 |
A probe head (20) adapted to verify the operation of a device to be tested integrated on a semiconductor wafer comprises at least one guide (40, 50) provided with a plurality of guide holes (40h, 50h) adapted to house a plurality of cont...
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WO/2021/023790A1 |
A mass connection system (1) for a test system has a receiving frame (10) and at least one support frame (30, 30', 30'', 30#). The receiving frame (10) has a plurality of recesses (12) which each completely penetrate the receiving frame ...
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WO/2021/023472A1 |
The invention relates to the protection of an AC device, in particular an inductive voltage converter (11), electrically connected to an AC line (5), from damage caused by direct currents flowing in the AC line (5). In this case, at leas...
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WO/2021/023739A1 |
The invention describes a probe head (21) for a test equipment of electronic devices comprising a plurality of contact probes (22) inserted in guide holes provided in at least one upper guide (23) and one lower guide (24), a bending area...
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WO/2021/017555A1 |
A waterproof housing for an oscilloscope, comprising an upper cover (1), a base (8), and an annular plastic sealing ring (3). A hollow screw thread sleeve (6) extends integrally upwards on an upper end surface of the base (8). The upper ...
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WO/2021/019399A1 |
It is disclosed a power supply system (50) comprising a power supply circuit (1), a sensor (3) of the current (I_HV+) flowing through a terminal of the power supply circuit and a protection circuit (2). The protection circuit comprises a...
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WO/2021/013674A1 |
The invention relates to a test card (1) for electrically testing electrical/electronic test objects (2), such as solar cells, wafers or circuit boards, comprising a contact head (11) having at least one retaining unit on which at least ...
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WO/2021/013249A1 |
A partial discharge detection sensor and a manufacturing method therefor. The partial discharge detection sensor comprises a first half-ring magnetic core member (1), and a second half-ring magnetic core member (2) disposed corresponding...
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WO/2021/013229A1 |
A testing circuit for a cascaded converter multi-submodule. A current generator (1) provides a testing current to a tested module group (2); the tested module group (2) comprises two tested bridge arms (201) consisting of multiple tested...
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WO/2021/015388A1 |
Disclosed are an overcurrent protection device and a power conversion device using same. A power conversion device according to an embodiment of the present invention comprises: a control unit for providing a collector-emitter voltage to...
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WO/2021/013318A1 |
The invention relates to an arrangement (1) for determining the magnitude of a current (IS) flowing through a busbar, having a measurement conductor (5) which is electrically connected to the busbar (3) at a first contact point (A) and e...
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WO/2021/010583A1 |
A technical idea of the present invention provides an interface which enables a test object to be tested reliably and quickly, an interface assembly and a test socket including same interface, and a method of manufacturing same interface...
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WO/2021/006609A1 |
Disclosed is a test device for testing electric characteristics of an object-to-be-tested. The test device includes: a test socket including a probe configured to transmit a test signal to the object-to-be-tested; and a pusher unit confi...
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WO/2021/006956A1 |
Systems for probing superconducting circuits, including using a non-magnetic cryogenic heater, are disclosed. A system including a circuit board having a socket and a heater, mounted on the socket, is provided. The heater includes a resi...
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WO/2021/005136A1 |
The present invention relates to a an anti-tamper device (11, 11') for a utility meter (1), in particular for an enclosure (2) thereof, providing a guideway (23, 23') for a sealing element (20), wherein in a sealed state (S) of the utili...
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WO/2021/002690A1 |
The present invention relates to a test socket used for measuring electrical properties of an electric element. The present invention provides a test socket disposed between opposing terminals to electrically connect the terminals, the t...
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WO/2021/002572A1 |
A probe block assembly for inspecting a display panel, according to the present invention, may comprise: a plurality of probe blocks being in contact with a plurality of electrode pads of a display panel so as to inspect whether there is...
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WO/2021/003486A1 |
A ratio metric (RM) approach to providing the current sensing function of service currents to smart metering applications results in an RM current sensor assembly and RM differential current sensor assembly that can replace prior art sen...
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WO/2020/259253A1 |
An analysis device for a detection chip, and an operation method and an analysis system thereof. The analysis device comprises a base and a control module. The control module comprises a positioning sub-module, an operation sub-module an...
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WO/2020/253552A1 |
Disclosed are a high-precision resistor measurement system and method based on the combination of a differential method and a proportional method. The system comprises: a constant-current source, a reference resistor, a first differentia...
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WO/2020/257190A1 |
A probe chip consisting of multiple probes integrated on a single substrate. The layout of the probes could be designed to match specific features on the device under test. The probes are spring-loaded to allow for reversible deformation...
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WO/2020/256132A1 |
The present invention pertains to a microfabrication device and a microfabrication method by which products of the same or greater precision can be obtained as when using an electroforming method, etc., the device and the method being su...
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WO/2020/250638A1 |
This probe pin comprises: a plate-shaped body section; a first contact point section provided on one end of the body section in a first direction; and a pair of second contact point sections that are provided on one end of the body secti...
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WO/2020/250637A1 |
This probe pin comprises: an elastic section that can be elastically deformed along a first direction; a first contact section to which one end of the elastic section, in the first direction thereof, is connected; and a second contact se...
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WO/2020/247239A1 |
Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems. The calibration chucks include a calibration chuck body that defines a calibration ...
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WO/2020/242208A1 |
A technology for a current sensor is disclosed. The current sensor comprises: a magnetic core having an opening through which a conductor can pass, wherein a current to be measured flows through the conductor; a magnetic core gap provide...
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WO/2020/242805A1 |
A damper for a semiconductor metrology or inspection system includes a pair of parallel plates with a fluid with a variable viscosity retained between plates. At least one wire is disposed between the plates, which may include one or mor...
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WO/2020/239515A1 |
A duct probe (20) for sampling a fluid from a main fluid flow (Fm) in a duct (10) defines an elongated supply channel (21) and an elongated discharge channel (22). The supply channel has at least one inflow opening (23) for diverting a p...
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WO/2020/241990A1 |
The present invention relates to a conductive pin using a spring, and a test socket and an interposer using same. The conductive pin, according to the present invention, comprises: an upper pin making contact with an upper device; a lowe...
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WO/2020/242216A1 |
Disclosed is a contact for electrically connecting a first contact point and a second contact point. The contact includes: a first contact part in contact with the first contact point; a second contact part in contact with the second con...
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WO/2020/235769A1 |
Disclosed is a contact probe comprising: an upper plunger which is formed by a first processing method, and in which a first tip coming into contact with a terminal of an object to be inspected is formed at one end thereof; a board conta...
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WO/2020/229240A1 |
The invention relates to a test adapter (1; 1') for testing an electrical connection, comprising a body (10) comprising a plug-in portion (100), on which an electrical test contact (11) is arranged and which can be plugged into a test sh...
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WO/2020/230945A1 |
The present invention relates to a socket having a thin structure and a spring contact suitable for same, the socket enabling durability degradation of a contact itself to be alleviated, having excellent electrical characteristics in hig...
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WO/2020/228261A1 |
A support mechanism for chip testing. A chip is fixed on a circuit board; a testing base is provided on an upper side surface of the circuit board; the support mechanism comprises a support frame (200) supported on a bottom side surface ...
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WO/2020/226194A1 |
A probe assembly and a micro vacuum probe station comprising same are disclosed. A probe assembly according to one embodiment may comprise: a base; a guide rail installed on the base; a guide member sliding along the guide rail; a probe ...
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WO/2020/226009A1 |
This connection device for inspection comprises: a probe head (30) which retains an electrical connector (10) and an optical connector (20) in a state in which the leading end parts thereof are exposed on the lower surface; and a transfo...
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WO/2020/225337A1 |
The invention relates to a device for detecting electrical currents on or in the vicinity of electrical conductors that are part of a lightning current arrester, an interception rod or the like, the device comprising a plurality of reed ...
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WO/2020/226963A1 |
A voltage/current probe includes: a circuit board; a first inductor that is located on the circuit board, that is wound in a first direction, and that includes: a first end connected to a first output conductor; and a second end; a secon...
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WO/2020/222327A1 |
A pin for testing a microelectrode circuit according to the present invention comprises: a pin having a pair of contact portions formed at both ends thereof and an elastic portion formed to connect the both ends with an elastic restoring...
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WO/2020/220598A1 |
A display screen (10) and a test device (20). The display screen (10) comprises: a display part (11); a non-display part (12) located on the periphery of the display part (11); a plurality of test terminals arranged on the non-display pa...
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WO/2020/220605A1 |
Provided are a probe (120) module (100), and a machining method and test method therefor. The probe (120) module (100) comprises: a substrate (110) and a plurality of probes (120) located on the substrate (110), wherein a second part of ...
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WO/2020/221830A1 |
Examples of a test switch unit (100, 300, 600, 900, 1200, 1500) for testing an IED are described. Each of the test switch units may be utilized for opening of a trip circuit, the shorting of a CT circuit and subsequently the isolation of...
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WO/2020/217816A1 |
A contact probe (10), which can be used to inspect a semiconductor package (80) in which a recess is formed in a terminal part (81), comprises a plunger (10a) having a distal-end part (11A) for contacting the terminal part (81). The dist...
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WO/2020/218779A1 |
Disclosed is a test device for testing an electric characteristic of an object to be tested. The test device includes a block comprising a probe hole, a probe supported in the probe hole and retractably configured to connect a first cont...
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WO/2020/219362A1 |
Circuits and methods for testing power electronics devices. In some examples, a reconfigurable load tester includes a power conversion circuit configured to couple to a device under test (OUT). The power conversion circuit includes a num...
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WO/2020/217561A1 |
[Problem] In order to enhance conduction performance, the present invention makes it possible to reduce the number of component parts and enhance sliding ability of an elastic member, to control elastic force in accordance with the chara...
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WO/2020/220012A1 |
A probe-on-carrier architecture is provided, where several vertical probes are disposed on each probe carrier and the probe carriers are affixed to the space transformer. Each vertical probe has two flexible members. The first flexible m...
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WO/2020/217804A1 |
This probe pin comprises an elastic part capable of elastically deforming along a first direction, a first contact part provided at one first-direction end of the elastic part, and a second contact part provided at the other first-direct...
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