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Patent Searching and Data


Matches 701 - 750 out of 27,602

Document Document Title
WO/2016/122039A1
The present invention relates to a pin block and a testing device having same. A pin block, according to the present invention, has two pogo pins and enables identical connecting pins on a module substrate to be connected to the two pogo...  
WO/2016/119337A1
An electric device testing fixture. The electric device testing fixture comprises: a fixing base (11), an electrode fixing frame (12), two electrodes (13), i.e. an anode and a cathode, a stopper bracket (14) and a stopper (15), wherein t...  
WO/2016/119016A1
There is provided a system for industrial electrical appliance tagging and compliance system (100) comprising power outlets configured for selectively providing power to validly tagged electrical appliances. In preferred embodiments, the...  
WO/2016/112933A1
The invention relates to a coupling (6) for electrically and mechanically connecting components in medium-voltage engineering or in high-voltage engineering, in particular for voltages of 1 kV to 52 kV, comprising a first connection piec...  
WO/2016/114506A1
A probe for testing charging/discharging of a secondary battery comprises: an outer plunger having the shape of a cylinder, the interior of which is penetrated; an inner plunger, which is formed coaxially with the outer plunger, which is...  
WO/2016/114094A1
[Solution] A cable disconnection checker with which it is possible to measure resistance by a four-terminal method due to a configuration provided with an inlet 11 having an insertion connector terminal structure 10 configured so that a ...  
WO/2016/114170A1
A multilayer wiring board for probe cards, which has a laminate of resin layers, and wherein separation of an electrode having a large area from a resin layer is suppressed, said electrode being provided for the purpose of decreasing the...  
WO/2016/073020A3
The present invention is directed towards a mobile apparatus mounted to a motor vehicle for detecting energized objects. In some embodiments, the mobile apparatus comprising two or more photonic sensors, mounted to the motor vehicle, and...  
WO/2016/111293A1
A Kelvin probe (30) provided with first and second probe pins (40, 50) that are disposed in parallel with an interval interposed therebetween, wherein the first and second probe pins (40, 50) each have a coil spring (80) that expands and...  
WO/2016/106641A1
Disclosed is a test joint, which comprises a housing (10), a connector (17), a cable assembly, an elastic element (11) and a calibration nut (13), wherein the housing (10) is tubular with one end closed and the other end open, the connec...  
WO/2016/109010A1
A voltage sensor housing (40) includes a top portion including a conductive top portion (48) composed of conductive material and non-conductive top portions (50,52) composed of non-conductive material, a bottom portion (54) composed of n...  
WO/2016/107859A1
It is described a manufacturing method of contact probes (10) for a testing head (18) comprising the steps of: providing a substrate (11) made of a conductive material; and - defining at least one contact probe (10) by laser cutting the ...  
WO/2016/107729A1
It is described a contact probe for a testing head of an apparatus for testing electronic devices including a body essentially extended according to a longitudinal direction between a contact tip and a contact head (30A, 30B), that conta...  
WO/2016/109842A1
Systems and methods exposing a sample of atoms to an electromagnetic (EM) field. The EM includes one or more frequencies. The EM field is configured to promote at least a subset of the sample of atoms to one or more excited states based ...  
WO/2016/108520A1
The present invention relates to a contact inspection device comprising: a first guide plate having a first probe hole formed therein; a second guide plate which is positioned parallel to the first guide plate and has a second probe hole...  
WO/2016/101675A1
A testing device comprises a testing bench (10) for testing a product, a base (20) and a bracket (30) which are connected with the testing bench (10), a switch (40) for controlling the power-on/off of the testing bench (10), and a clamp ...  
WO/2016/106293A2
A wafer probe station system for reliability testing of a semiconductor wafer. The wafer probe station is capable of interfacing with interchangeable modules for testing of semiconductor wafers. The wafer probe station can be used with d...  
WO/2016/105031A1
The present invention relates to an electrical test socket and a method for manufacturing a conductive particle for an electrical test socket and, more specifically, to an electrical test socket, disposed between terminals of a device to...  
WO/2016/102172A1
The invention relates to a high-frequency test probe (S) for testing an electrical test object, comprising a contacting connector assembly (1) for establishing a releasable contact between the high-frequency test probe (S) and the electr...  
WO/2016/104942A1
Disclosed is a wafer inspection equipment for inspecting a semiconductor wafer. The wafer inspection equipment comprises: a main body which defines a chamber on the inside thereof, a probe card being disposed at the top of the chamber; a...  
WO/2016/098175A1
Provided is a circuit inspection probe device with which it is easy to visually confirm, from the front of the device, that a stroke contraction state of an appropriate ratio is reached. A circuit inspection probe device (10) for perform...  
WO/2016/099783A1
Example automatic test equipment (ATE) includes: a per-pin measurement unit (PPMU); logic configured to execute a state machine to control the PPMU; memory that is part of, or separate from, the logic; and a control system to command the...  
WO/2016/092916A1
A probe pin (30) is provided with: at least one coiled spring (60) extending and contracting along the centerline; a first contact point (46) disposed on a first straight line (A3) parallel to the centerline of the coiled spring (60); an...  
WO/2016/089861A1
Systems and methods for measuring the integrity of insulation components in electrical systems. In preferred embodiments, an active sensor is coupled to a test tap of a bushing, the active sensor having an electrical circuit electrically...  
WO/2016/087369A2
It is described a testing head (20) comprising vertical probes including at least one guide (22) provided with guide holes (22A) for housing a plurality of contact probes (21), each of the contact probes (21) having at least one contact ...  
WO/2016/085206A1
Disclosed herein is a test handler. In accordance with an embodiment of the present invention, the test handler comprises: a loading device configured to load electronic components into a test tray; a test chamber including a tester conf...  
WO/2016/085135A1
The present invention relates to a handler for testing an electronic component. The handler for testing an electronic component, according to the present invention, is provided with a cooling pocket in a pushing head of a connection unit...  
WO/2016/082439A1
A probe component and a detection apparatus comprising same. The probe component is configured for detecting a display panel and comprises a first probe area (2) corresponding to leads (13) in the display panel, wherein a probe (1) is ar...  
WO/2016/080670A1
The present invention relates to a test tray for a test handler and an interface board for a tester. According to the present invention, a secondary calibration hole is additionally formed in an insert of a test tray, and a secondary cal...  
WO/2016/076671A1
According to the present invention, provided are a method and an apparatus for testing a flexible element, the method comprising: a step for fixing, to a main body unit, a flexible element to be measured; a step for making an electrical ...  
WO/2016/074907A1
A measuring circuit (1) for measuring and evaluating a voltage (U) to be measured comprises a circuit input (2) designed to feed the voltage (U) to be measured to the measuring circuit (1) as an analog signal (A), a first analog to digit...  
WO/2016/077217A1
An example process places dice that have been cut from a first semiconductor wafer on a second wafer. The example process includes arranging the dice in a pattern on a the second wafer, where the second wafer has a coefficient of thermal...  
WO/2016/073042A1
A solderless test fixture (10), including a conductive base (12), a clamp (14), and a connector (16) is described. The conductive base has at least one cable groove (20) with a cable grounding portion (22). A clamp is mounted on the base...  
WO/2016/072187A1
Provided are a cassette and an inspection unit whereby a coaxial connector for inspection can be fitted to a receptacle, even if there is displacement between the coaxial connector for inspection and the receptacle. This cassette is prov...  
WO/2016/072193A1
The purpose of the present invention is to provide a probe whereby increased density of electronic components, being the measurement target, is possible on a circuit board. The probe (1) is capable of simultaneously measuring a plurality...  
WO/2016/073020A2
The present invention is directed towards a mobile apparatus mounted to a motor vehicle for detecting energized objects. In some embodiments, the mobile apparatus comprising two or more photonic sensors, mounted to the motor vehicle, and...  
WO/2016/068541A1
The present invention relates to an electrical connector for electrically connecting a device to be tested with a testing device, and a manufacturing method therefor, wherein the electrical connector improves high-current characteristics...  
WO/2016/065723A1
A high frequency cable testing platform, comprising: a conductive contact (30) and a clamp (2) for pressing a conductor of a cable (4) against the conductive contact (30), and further comprising a wire splitting base (1), the wire splitt...  
WO/2016/055277A1
The invention relates to a device for ascertaining a current strength of an electric current (I) flowing through a conductor track (3) of a printed circuit board (1). At least one section of the at least one conductor track (3) has a res...  
WO/2016/055796A1
A current measurement circuit suitable for measuring the flow of current along a path in an electrical circuit such as a part of an electric power assisted steering system comprises a current measurement resistor that is located in serie...  
WO/2016/053743A1
A system and method of detecting, quantifying, and characterizing corrosion and degradation of an article, includes receiving signals indicative of a stack of images of a surface of the article; determining depth and nature of features i...  
WO/2016/048626A1
Flexible film electrical-test substrates with at least one conductive contact post for integrated circuit (IC) bump(s) electrical testing, and related methods and testing apparatuses are disclosed. The backside structure of an electrical...  
WO/2016/047857A1
The present invention relates to a battery charging/discharging pin preventing a lack of contact or non-uniform contact by being naturally tilted so as to correspond to and fit with the surface of an electrode of a battery even when the ...  
WO/2016/047963A1
Disclosed is a contact probe for a high current, which electrically connect a contact point of an object to be tested and a contact point of a test circuit. The contact probe comprises a first plunger configured to be in contact with the...  
WO/2016/045840A1
The invention is directed to a cable assembly (1) comprising a coaxial cable (2) with an inner conductor (3) and a shield (4) and a dielectric (5) arranged between the inner conductor (3) and the shield (4). The cable assembly (1) furthe...  
WO/2016/043327A1
In this probe unit that houses multiple contact probes for electrically connecting a test object and a signal processing device that outputs test signals, the probe unit is configured so that large current probes (3) electrically connect...  
WO/2016/044786A1
A probe card assembly is disclosed. The probe card assembly includes a probe card plate, a probe core, and an expansion gap defined in the probe card plate, The probe core includes a bonding portion for fixing the probe core to the probe...  
WO/2016/043814A1
A test fixture used to calibrate an electronic device is disclosed. The test fixture includes several modules positioned on a rack. The modules may include either a conductive rubber or light-absorbing material. An actuator connected to ...  
WO/2016/042109A1
The invention relates to a method for calibrating a current sensor (20) in a vehicle (2), said sensor being designed to measure an electric current (6) through a measuring resistor (28) on the basis of a voltage drop (32) across the meas...  
WO/2016/042091A1
The invention relates to a first method for calibrating a current sensor (4) which is configured to determine, in an on-board power system (2) of a vehicle, an electric operating current (12) which flows through a measuring resistor (20)...  

Matches 701 - 750 out of 27,602