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Patent Searching and Data


Matches 701 - 750 out of 27,016

Document Document Title
WO/2014/049874A1
The present invention provides a metal material for uses in electrical/electronic devices, which is characterized by being formed of 20-50% by mass of Ag, 20-50% by mass of Pd, 10-40% by mass of Cu and 0.5-30% by mass of Co, and which is...  
WO/2014/044483A1
The invention relates to a method (38) for ascertaining a current (I) flowing through an electrical conductor (4) into which a measuring resistor (20) has been introduced. A first electrical voltage (U1) is sensed that drops across a fir...  
WO/2014/041877A1
[Problem] To provide an electrode section contactor for a laminated secondary cell, with which faulty contact can be prevented by the provision of contact sections that can stably contact even an electrode tab for making an insulating ox...  
WO/2014/042597A1
A detachable member and a processing member for an analysis tool, the detachable member comprising a housing for a probe member, said probe member capable of obtaining one or more characteristics information; and a circuitry component fo...  
WO/2014/043592A3
Techniques are disclosed for measurement devices and methods to obtain various physical and/or electrical parameters in an integrated manner. For example, a measurement device may include a housing, an optical emitter, a sensor, a distan...  
WO/2014/039926A1
Disclosed are systems, devices and methods related to mapping of electromagnetic (EM) field near a radio-frequency (RF) module. In some embodiments, a miniature probe such as a magnetic probe can be configured to obtain near-field measur...  
WO/2014/036770A1
Provided are a micromechanical chip test probe card and a method of fabricating same. A cantilever beam pattern (20) is defined in an SOI substrate. A blind hole (105) whose inner wall is insulated is fabricated on a floating end (201) o...  
WO/2014/037465A1
The invention relates to a method for checking the plausibility of a measurement result for an electric current (20) by means of a current sensor (2) connected to an electrical circuit (22), said method comprising: making a predetermined...  
WO/2014/036030A1
An apparatus and method for protecting probes used in automated testing is disclosed. The apparatus comprises a probe operable to provide power to a device under test (DUT) from a device power source (DPS), wherein the probe is coupled t...  
WO/2014/031688A1
A self-powered current sensor is described. The self-powered current sensor including an electrical signal input configured to receive a current signal. Further, the self-powered current sensor includes a power circuit configured to gene...  
WO/2014/030536A1
As an anisotropic conductive member provided with an electric penetration part capable of achieving all of contact stabilization, density growth, and decrease in thickness at high levels, provided is an anisotropic conductive member prov...  
WO/2014/026678A1
The invention relates to a device for reversible mechanical fixation and electrical contacting of one or more electrical conductors (11) of a cable (10). According to the invention, the cable (10) is fixed mechanically by means of the ca...  
WO/2014/023402A1
The invention relates to a medium or high voltage arrangement with cable connection terminal and voltage sensor, wherein the voltage sensor has a resistive voltage divider (3, 5) and shielding electrodes (10, 11). In order to enhance the...  
WO/2014/019061A1
A measuring instrument for detection of electrical properties in a liquid includes a main body configured to hold a tester, a first pole extending from the main body, and a second pole extending from the main body that is spaced apart fr...  
WO/2014/021465A1
Provided are an alloy material having excellent electrical conductivity and high hardness and excellent workability for use in a contact probe, a contact probe consisting of this alloy material, and a connection terminal. In a compositio...  
WO/2014/021194A1
[Problem] The purpose of the present invention is to provide a guide plate for a probe guard that can be provided with fine through holes at a narrow pitch interval and that makes it possible to achieve improved strength. [Configuration]...  
WO/2014/019692A1
The invention relates to a voltage measurement device with an insulating body, for the use in medium or high voltage equipment or switchgears, with an impedance divider consisting of at least one high voltage impedance and at least one l...  
WO/2014/017426A1
The purpose of the present invention is to reduce manufacturing costs. The invention comprises a plurality of probes (11) and a body portion (12) having support plates (41, 42), supporting tips (21) of the probes (11), and support plates...  
WO/2014/017402A1
Provided are a test jig with a novel design for narrowing the contact pitch compared to conventional jigs, and a manufacturing method therefor. A slit (33b) is provided in the wall (33a) between two guide holes (33) (two adjacent guide h...  
WO/2014/017157A1
Provided are: a contact probe, which is capable of smoothly inspecting devices, while ensuring excellent electrical conductivity; and a semiconductor element socket that is provided with the contact probe. A contact probe (11) is provide...  
WO/2014/016018A1
The invention describes an apparatus for testing integrated circuits by means of a scanning head (7) comprising test contacts (8). The test contacts are pressed onto electrical contacts of a substrate (6), for example of a wafer comprisi...  
WO/2014/015594A1
A lighting jig for inspecting a liquid crystal panel (500) comprises a base plate (100); a first supporting plate (210) and a second supporting plate (220), positioned on the base plate (100) and perpendicular to the base plate (100) res...  
WO/2014/010411A1
A shunt resistance type current sensor includes a bus bar that is a path of an electric current to be measured, a circuit board (20) that is installed over the bus bar, a pair of connecting members (15) that electrically connect the circ...  
WO/2014/009542A3
For a device for producing and/or processing a workpiece, in particular circuit boards (1), in a work station (2), in particular for printing on a corresponding blank or for checking finished circuit boards (1), at least one mark (15) is...  
WO/2014/009980A1
An interface board (50) of a testing head (31) for a test equipment of electronic devices is described, such a testing head (31) comprising a plurality of contact probes (34), each contact probe (34) having at least one contact tip suita...  
WO/2014/010410A1
A shunt resistance type current sensor(1 ) includes a bus bar(10) that has an approximately flat plate shape, a circuit board(20) that is installed to the bus bar, a pair of connecting terminal portions (40)that electrically connects the...  
WO/2014/009542A2
For a device for producing and/or processing a workpiece, in particular circuit boards (1), in a work station (2), in particular for printing on a corresponding blank or for checking finished circuit boards (1), at least one mark (15) is...  
WO/2014/009980A8
An interface board (50) of a testing head (31) for a test equipment of electronic devices is described, such a testing head (31) comprising a plurality of contact probes (34), each contact probe (34) having at least one contact tip suita...  
WO/2014/001528A1
A solution for testing a set of one or more electronic device (105) is disclosed. A corresponding test board (100) comprises a support substrate (205), a set of one of more sockets (210) being mounted on the support substrate each one fo...  
WO/2014/003003A1
The present invention extends the life and reduces the cost of an electrical test contact, which is used for a conduction test of a device under test, such as an integrated chip (IC), in a high temperature environment. The electrical tes...  
WO/2014/000854A1
The invention relates to a resistor, in particular a low-resistance current-measuring resistor, comprising a first connection part (1) that consists of a conductor material for introducing an electrical current (I), a second connection p...  
WO/2013/192322A2
A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). The elastomer is pre...  
WO/2013/190844A1
Provided are a probe card-securing device, a probe inspection device, a probe inspection method, and a probe card, in which fluctuations in the distal end position of the probe needle caused by thermal expansion of the probe card and the...  
WO/2013/191432A1
The present invention relates to a test socket that is disposed between a blood test device and a test apparatus to electrically connect a terminal of the blood test device and a pad of the test apparatus with each other. Conduction unit...  
WO/2013/190025A1
A multipoint probe for establishing an electrical connection between a test apparatus and a test sample, the multipoint probe comprising a base defining a top surface and a plurality of traces provided on the top surface, each trace indi...  
WO/2013/192322A3
A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). The elastomer is pre...  
WO/2013/190952A1
Provided is an inspection device capable of uniformly supplying an antioxidant gas to the tips of a large number of probe needles disposed across a wide area. An inspection device for performing an electrical inspection of an inspection ...  
WO/2013/192374A2
A disassociated split sensor coil manufactured from hemi-toroidal cores. The cores each include a surface channel extending from end to end, with wire sections being wound about core to form helical sensor coils electrically connected to...  
WO/2013/187611A1
Disclosed are a test probe and a machining method of a test probe, the test probe including a plunger end part contacting a tested contact point, the plunger end part including a plurality of tips protruding toward the tested contact poi...  
WO/2013/182317A8
Herein described is a probe card for an apparatus for testing electronic devices, of the type comprising at least one probe head (21) which houses a plurality of contact probes (22), each contact probe (22) having at least one contact ti...  
WO/2013/183484A1
[Problem] An electrical contactor which is prevented from adhering to a terminal of an electrical part after a continuity test and thus exhibits improved durability; and a socket for an electrical part, using the electrical contactor. [S...  
WO/2013/182317A1
Herein described is a probe card for an apparatus for testing electronic devices, of the type comprising at least one probe head (21) which houses a plurality of contact probes (22), each contact probe (22) having at least one contact ti...  
WO/2013/176445A1
A probe card for inspecting semiconductor devices on a wafer comprises: a probe substrate on which a plurality of probes for inspecting the semiconductor devices are mounted; a printed circuit board which is arranged on the upper part of...  
WO/2013/176446A1
The present invention relates to a probe card for inspecting semiconductor devices. The probe card includes: a probe substrate having a bottom surface on which probes are mounted and a through hole respectively corresponding to the probe...  
WO/2013/171300A1
The invention relates to a spring contact structure for contacting an electronic assembly and at least one contact element of an electric or electronic component, wherein the contact element is a projecting metallically conducting elemen...  
WO/2013/168921A1
The method for manufacturing the lower contact terminal of a probe pin according to the present invention is a method for manufacturing the lower contact terminal of a probe pin used for electronic component meter-reading that comprises:...  
WO/2013/169608A1
A contact probe comprises conductively coupled plungers and a coil spring. The plungers have coupling means which enable them to be slidably and non-rotatably engaged. The spring is attached to the plungers in a manner that prevents rota...  
WO/2013/169783A1
A continuous variable spacing probe pin device, including first and second probe pins. The first and second probe pins are configured to measure a property of a conductive layer. In a first configuration, the first and second probe pins ...  
WO/2013/165174A1
The present invention relates to a test probe and a manufacturing method for the test probe and, more specifically, to a test probe and a manufacturing method for the test probe, wherein the test probe which is used to electrically conne...  
WO/2013/160118A1
The invention relates to a measuring device (100, 200) for detecting and displaying electric variables, in particular for detecting and displaying voltage, current, and/or resistance values. The measuring device (100, 200) has (a) a hous...  

Matches 701 - 750 out of 27,016