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Patent Searching and Data


Matches 851 - 900 out of 27,052

Document Document Title
WO/2013/037552A1
The invention relates to a measuring resistor (104) for a battery pole terminal, that is essentially in the form of a bolt and comprises a central section (124) and two opposing end sections (144, 164), wherein at least one region of the...  
WO/2013/038176A2
The present invention relates to current measurement apparatus100. The current measurement apparatus100 comprises a measurement arrangement 110, 114 which is configured to be disposed in relation to a load108 which draws a current signal...  
WO/2013/037677A1
The invention relates to a measuring resistor (1) for measuring an electric current, comprising two power connection devices (21); at least one resistor element (3), which is arranged between the power connection devices (21) and which i...  
WO/2013/037807A3
The invention relates to a method for a temporary electrical contact of a component arrangement (9) comprising a plurality of contact surfaces (93, 94). A connection board (1) having a plurality of connection surfaces (11, 12), on which ...  
WO/2013/035399A1
Provided is a contact terminal with which it is possible to transmit a comparatively large electric current. Provided is a contact terminal (10) for obtaining an electrical connection by making contact with a protruding end part (21a) fr...  
WO/2013/034418A1
The invention concerns a measuring device comprising a shunt (2), the device having first and second terminals (3, 4) between which a voltage representative of a current passing through the shunt can be measured, the measuring device fur...  
WO/2013/031822A1
A thin-film wiring substrate has a base (B) that includes a ceramic substrate (1) having a top surface and a wiring conductor (11) provided on the top surface of the ceramic substrate, a bonding layer (2) and a thin-film wiring layer (3)...  
WO/2013/032218A2
Disclosed is a coaxial probe capable of improved durability and productivity. The disclosed coaxial probe is characterized by comprising: an inner conductor including an upper contact capable of contacting a semiconductor device, a lower...  
WO/2013/032218A3
Disclosed is a coaxial probe capable of improved durability and productivity. The disclosed coaxial probe is characterized by comprising: an inner conductor including an upper contact capable of contacting a semiconductor device, a lower...  
WO/2013/026217A1
A glass-substrate detection device, including a test pin (22) and a pin base (21), and further including an elastic controller (23). The test pin (22) is provided on the elastic controller (23). The elastic controller (23) is used, when ...  
WO/2013/028634A2
A thermal wrap for testing electronic components has a web having an inside and an outside surface and a first end and a second end and a thermal element incorporated in said web. An edge element incorporated substantially along at least...  
WO/2013/026805A1
An adaptive voltage divider for measuring a high voltage between a ground terminal (GND) and a measurement terminal (U). It comprises a first branch comprising a first set of impedance elements (Z, R) forming a voltage divider circuit co...  
WO/2013/020698A1
The invention relates to a differential current sensor for measuring the differential current (ΔΙ) between an electric current (IH) flowing through a feed conductor (H) and an electric current (IR) flowing through a return conductor (R...  
WO/2013/018809A1
Provided is a probe unit whereby reliable conduction can be obtained between the probe unit and a subject to be in contact with. The probe unit has a plurality of probe groups (2), each of which is configured of two or more contact probe...  
WO/2013/018910A1
Provided is a probe card for power devices, which significantly reduces resistance of a measurement line between a probe and a tester, and resistance of a measurement line between a placing table and the tester, and is capable of suffici...  
WO/2013/018382A1
An anisotropic electroconductive member provided with electricity through-sections in which contact stability, high density, and a thinner configuration can be obtained, the anisotropic electroconductive member comprising: a plate-shaped...  
WO/2013/014242A1
What is proposed is: a vehicle battery circuit (4) for conducting an electrical current (12) between a vehicle battery (10) and an electrical network component (14, 16) that can be connected to the vehicle battery (10) via a current sens...  
WO/2013/014240A1
The invention relates to a circuit (2) for conducting an electric current, by means of an electrical component (6, 28, 30), between a vehicle battery and an electrical network component that can be connected to the vehicle battery. Said ...  
WO/2013/015515A1
Provided is an external chuck flatness adjustor provided with a prober. The external chuck flatness adjustor is provided with: a fastening plate bound to a base plate of the prober; an extending piezo-actuator receiving driving power; a ...  
WO/2013/012616A2
A non-mechanical contact signal measurement apparatus includes a first conductor on a structure under test and a gas in contact with the first conductor. At least one electron beam is directed into the gas so as to induce a plasma in the...  
WO/2013/011985A1
The aim of the present invention lies in providing a contact structure unit which can produce reliable conduction with an object to be contacted. A contact structure unit for providing conduction between a substrate having a plurality of...  
WO/2013/012616A3
A non-mechanical contact signal measurement apparatus includes a first conductor on a structure under test and a gas in contact with the first conductor. At least one electron beam is directed into the gas so as to induce a plasma in the...  
WO/2013/007833A1
The invention relates to a device (2) for measuring an electric current between a vehicle battery and an electrical consumer connected to the vehicle battery. Said claimed device (2) comprises a bus bar (4) which picks up the electric cu...  
WO/2013/004775A1
The present invention relates to an adapter for a parallel tester for testing bare printed circuit boards and to a parallel tester for testing bare printed circuit boards. According to the invention, in each case at least two test needle...  
WO/2013/006770A3
A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that prob...  
WO/2013/006771A3
A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that prob...  
WO/2013/000621A1
The invention relates to a shunt resistor (2) having two measuring connections (2a; 2b) for applying a measurement current (Jm) which flows through the shunt resistor (2) along a main direction of flow, slot-type structures (7; 8) which ...  
WO/2012/176289A1
In the present invention, the following are provided: a taper-shaped tip portion (2) that directly contacts a test subject; a tip-side main body portion (3) having a substantially hollow cylindrical shape, and extending in one direction ...  
WO/2012/173777A3
A probe module for testing an electronic device comprises at least two contacts, each contact including a first end portion extending in a first direction along a first line, a second end portion extending linearly in a second direction ...  
WO/2012/173379A3
The present invention relates to a pin for a semiconductor chip test, and to a socket for a semiconductor chip test including same, and more particularly, to a pin for a semiconductor chip test, and to a socket for a semiconductor chip t...  
WO/2012/173243A1
Provided is an electrical contact member which is capable of maintaining stable conductivity over a long period of time, while achieving low adhesion to a test subject, in particular, an electrical contact member which is capable of main...  
WO/2012/173379A2
The present invention relates to a pin for a semiconductor chip test, and to a socket for a semiconductor chip test including same, and more particularly, to a pin for a semiconductor chip test, and to a socket for a semiconductor chip t...  
WO/2012/173777A2
A probe module for testing an electronic device comprises at least two contacts, each contact including a first end portion extending in a first direction along a first line, a second end portion extending linearly in a second direction ...  
WO/2012/167866A1
The invention relates to a test arrangement (1) for electrically testing singulated circuit carriers (3), in particular in semiconductor technology, which testing is carried out by making electrical touching contact by means of a test ca...  
WO/2012/169831A3
The present invention relates to a probe apparatus for testing the quality of semiconductor chips, wherein the probe apparatus for testing the chips has superior reliability and durability. The probe apparatus of the present invention co...  
WO/2012/169831A2
The present invention relates to a probe apparatus for testing the quality of semiconductor chips, wherein the probe apparatus for testing the chips has superior reliability and durability. The probe apparatus of the present invention co...  
WO/2012/163472A1
The invention relates to a spring contact pin arrangement having a spring contact pin that comprises a pin housing in which a contact element is mounted so as to be longitudinally displaceable and is loaded by a spring device acting oppo...  
WO/2012/166025A1
Guide element (3) for a connector device (1), which element has a first and a second end (3a, 3b). The element (3) is adapted to be attached to a PCB (printed circuit board) (2) of the connector device. Further, the guide element compris...  
WO/2012/165936A1
An electrical test contact (20) is disclosed for electrically connecting a test terminal (12) of an IC test assembly (14) with an IC terminal (15) of an IC device (16) in an electrical interconnect assembly (10). The test contact (20) is...  
WO/2012/163472A4
The invention relates to a spring contact pin arrangement having a spring contact pin that comprises a pin housing in which a contact element is mounted so as to be longitudinally displaceable and is loaded by a spring device acting oppo...  
WO/2012/163472A8
The invention relates to a spring contact pin arrangement having a spring contact pin that comprises a pin housing in which a contact element is mounted so as to be longitudinally displaceable and is loaded by a spring device acting oppo...  
WO/2012/159677A1
According to the invention, there is provided a clamping test contacting setup, suitable for clamping a component so that the component is held in a fixed position while being processed, the clamp comprising, a first finger which is pivo...  
WO/2012/155886A1
The invention relates to a transducer tester (400) for testing an inductive single bushing transformer (101). The transducer tester (400) comprises a controllable voltage source (401) for emitting a test voltage (Up) to the secondary coi...  
WO/2012/154584A1
Probe head assemblies, components of probe head assemblies, test systems including the probe head assemblies and/or components thereof, and methods of operating the same. The probe head assemblies are configured to convey a plurality of ...  
WO/2012/146165A1
Disclosed in the invention is a flexible printed circuit (FPC) test line, which comprises a plurality of mainboard sockets for correspondingly plugging into connectors on the printer circuit board assembly (PCBA) of an electronic device ...  
WO/2012/143797A1
Testing assembly (A) for testing a singulated semiconductor die comprising a power component. The assembly comprises an current input connectable to a current source (5), for providing a current greater than 50 Amps to the power componen...  
WO/2012/145297A8
According to one aspect, embodiments of the invention provide a current monitoring device comprising a current transformer configured to be removeably coupled to a power line and to generate a reference signal having a level related to a...  
WO/2012/145297A1
According to one aspect, embodiments of the invention provide a current monitoring device comprising a current transformer configured to be removeably coupled to a power line and to generate a reference signal having a level related to a...  
WO/2012/137980A1
A shunt resistance type current sensor includes a bus bar which has a flat plate shape, a circuit board which is provided on the bus bar, connecting terminal portions which are extended from the bus bar, and are electrically connected to...  
WO/2012/136562A1
The invention relates to a testing pin (10; 10a; 10b) for making contact with an electrically conductive region (3) of a contact partner (1), having a housing element (11; 11a; 11b), in particular a sleeve-shaped housing element, a conta...  

Matches 851 - 900 out of 27,052