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Patent Searching and Data


Matches 51 - 100 out of 26,928

Document Document Title
WO/2018/206377A1
The invention relates to a shunt resistor (2) for detecting the status of an electrical energy storage unit (1), wherein the shunt resistor (2) comprises a first layer (4), a second layer (6) and a third layer (8). According to the inven...  
WO/2018/208117A1
The present invention relates to an inspection socket, and more particularly, to an inspection socket including: an anisotropic conductive sheet including a first conductive part, an insulating support part disposed around the first cond...  
WO/2018/208604A1
One example includes a device (100) that is comprised of a plurality of printed circuit boards (200), a plurality of vias (110), and a plurality of castellations (130). The plurality of printed circuit boards (200) are laminated together...  
WO/2018/203945A3
A method and apparatus for detecting and identifying hazardous objects in electric fields. In one embodiment, the apparatus comprises two or more sensor probes mounted on a mobile vehicle and spaced apart from one another, wherein each s...  
WO/2018/203428A1
The present invention provides a contact pin module that enables reducing manufacturing cost therefor and allows for automatization of the fabrication therefor. A pair of projection parts 22fa and a pair of temporary fixation lugs 22fc i...  
WO/2018/202857A2
The invention relates to a device for making contact with an electronic or electric system, in particular for making contact with a circuit carrier. Said device comprises at least one measurement tip or consists of same, the measurement ...  
WO/2018/202857A3
The invention relates to a device for making contact with an electronic or electric system, in particular for making contact with a circuit carrier. Said device comprises at least one measurement tip or consists of same, the measurement ...  
WO/2018/198859A1
In an inspection jig 4 provided with a movable plate 8, a probe insertion hole 16 for insertion of a distal end portion of a probe Pr is formed in an opposing plate 51 of an inspection side supporting body 5, a probe supporting hole 23 t...  
WO/2018/197504A1
A power resistor for use in an automotive battery diagnosis circuit. The resistor includes a length of conductive material stamped to form a ribbon, which has formed along its length pins arranged perpendicular to the length of the ribbo...  
WO/2018/199403A1
The present invention relates to a socket for testing semiconductor devices, the socket comprising: a base disposed below the socket; a contact pin which is disposed on the base and is shifted in the longitudinal direction so as to conta...  
WO/2018/197598A1
It is described a probe card for a testing apparatus of electronic devices comprising at least one probe head (21) housing a plurality of contact probes (22), each contact probe (22) having at least one contact tip adapted to abut onto c...  
WO/2018/194276A1
Disclosed is a probe socket for inspecting electric characteristics of an object to be tested. The probe socket includes a plurality of power pins for applying power to the object to be tested, a plurality of ground pins arranged in para...  
WO/2018/193832A1
Provided is an electrical connection apparatus comprising: a probe head (20) which has a guide hole (200) and in which the shape of the guide hole (200) in a plane perpendicular to an extending direction of the guide hole (200) is a poly...  
WO/2018/188169A1
A Recognition head, comprising a housing (1), a circuit board (2), and probes (3). The circuit board (2) is mounted in the housing (1). The probes (3) are mounted on the housing (1). There are one or more probes (3). Each probe (3) separ...  
WO/2018/190194A1
The present invention is provided with: probes (10); and a probe head (20) having a top part (21) through which the probes (10) penetrate, a bottom part (23) disposed further toward distal-end parts than the top part (21) and through whi...  
WO/2018/190632A1
Disclosed is a device pickup module that picks up semiconductor devices from a shuttle in which the semiconductor devices are loaded in order to perform an electrical inspection on the semiconductor devices in a test handler. The device ...  
WO/2018/190633A1
A low insertion force connector assembly according to the present invention comprises a first connector and a second connector which are detachably coupled to each other, wherein the first connector and the second connector are easily as...  
WO/2018/190195A1
The present invention is provided with: a plurality of probes (10) of which a distal-end part comes into contact with a specimen (2) during measurement; and a space transformer (30) having a plurality of connection wirings (33) electrica...  
WO/2018/186802A1
A vertical type test assembly with adjustable contact pressure feature for test on wafer. The test assembly having a probe head comprising a plurality of guide plates with a plurality of through holes wherein at least one the plurality o...  
WO/2018/187068A1
Probe systems and methods including electric contact detection. The probe systems include a probe assembly and a chuck. The probe systems also include a translation structure configured to operatively translate the probe assembly and/or ...  
WO/2018/180633A1
The objective of the present invention is to prevent localized wear of a socket and a plunger even if the plunger has a small diameter. A Kelvin inspection jig 1 is provided with a socket 90 and a pair of probes 10 attached to the socket...  
WO/2018/182727A1
A coaxial wire interconnect architecture and associated methods are described. In one example, the coaxial wire interconnect architecture is used in a test socket interconnect array. Flexible bends are formed in one or more of the coaxia...  
WO/2018/181776A1
This contact probe is a conductive contact probe capable of extending/retracting in the axis line direction. The contact probe is provided with: a first contact member to be in contact with one subject to be in contact with; a second con...  
WO/2018/182719A1
Space transformation technology for probe cards at sort is disclosed. In one example, a space transformer transforms a pitch of electrical contacts from a first distribution to a second distribution. The space transformer comprises a sub...  
WO/2018/181273A1
The probe according to one embodiment of the present invention is provided with: a first plunger; a first end section having a first cutout for fitting in the first plunger; a first spiral section having a first spiral groove; and a firs...  
WO/2018/182327A1
A semiconductor package test socket and a method for manufacturing the same are disclosed. The test socket of the present invention is manufactured by the steps of: disposing a first film layer on a lower portion of a support plate havin...  
WO/2018/181216A1
This probe holder holds a plurality of contact probes each contacting, on one end side in the longitudinal direction thereof, one electrode to be contacted, wherein a plurality of holder holes are formed which comprise a single sheet of ...  
WO/2018/178847A1
A wire harness test system designed to facilitate and harmonize the integration of electrical test modules into the test table is disclosed, making it more versatile and multipurpose in terms of the diversity of wire harness families tha...  
WO/2018/182116A1
The present invention relates to an electric conductance inspection device installed on a printed circuit board, the electric conductance inspection device comprising: a probe pin contacting an inspection device for inspecting the perfor...  
WO/2018/171187A1
Disclosed is a panel testing device, comprising: a support member (1) and a plurality of testing needles (2) arranged on the support member (1), wherein the plurality of testing needles (2) correspond to a plurality of signal needles (4)...  
WO/2018/173448A1
The present invention is provided with: a probe (11); a probe head (12) that holds the probe (11); and an electrode substrate (13), on which an electrode pad (131) for connecting to a base end portion of the probe (11) is disposed. A gui...  
WO/2018/173884A1
This probe structure 1 is provided with: a holding plate 2 which has a first surface 21 and a second surface 22, and wherein at least the first surface 21 is insulated; a plurality of electrodes 3 which are formed on the first surface 21...  
WO/2018/168136A1
The present invention is provided with a coil spring that expands and contracts along a center line and a first plunger and second plunger that are disposed serially with the coil spring on both sides of the direction following the cente...  
WO/2018/166737A1
The invention relates to a test socket having a plurality of contact elements, each for contacting an electrical signal or an electrical potential, and having at least one contacting device for contacting a high frequency signal each. Th...  
WO/2018/169308A1
The present invention relates to a voltage conversion device having an improved inductor current cutoff speed, the device comprising: a current measuring means installed in a path through which an inductor current flows; a threshold curr...  
WO/2018/167207A1
Disclosed is a carrier including: a base (100) on which a circuit board (121) is mounted; a loading device (111) mounted on the base (100) and configured to load an electronic device (1) thereon; a first pressing device mounted on the ba...  
WO/2018/162956A1
A method of testing a transistor component, the method comprising the step of, (a) capturing a first image of the transistor component which is to be positioned into a nest for testing; (b) identifying from the first image the locations ...  
WO/2018/163755A1
This positioning mechanism for a Kelvin inspection terminal makes it possible to simply assemble a Kelvin inspection terminal together with an IC socket and enhance the accuracy of the positioning of the Kelvin inspection terminal in rel...  
WO/2018/162343A2
A probe for direct nano- and micro-scale electrical characterization of materials and semi conductor wafers. The probe comprises a probe body, a first cantilever extending from the probe body. The first cantilever defining a first loop w...  
WO/2018/163487A1
[Problem] To provide a current measurement apparatus that is capable of reducing or removing the necessity of the work of pulling out a conductor in which measurement is to be performed, from a wiring duct or the like, and facilitating c...  
WO/2018/162343A3
A probe for direct nano- and micro-scale electrical characterization of materials and semi conductor wafers. The probe (10) comprises a probe body (12), a first cantilever (20a) extending from the probe body. The first cantilever definin...  
WO/2018/160557A1
A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combina...  
WO/2018/158330A1
A current sensor for detecting a current from or into a vehicle battery, comprising: * a measurement circuit; and * an electric conductor, having: - at least one first measurement path, defined by a first potential pick-up contacting mea...  
WO/2018/154586A1
A system and methods are provided for robot-assisted, interactive testing of electronic circuits comprising a test fixture comprising a robotic arm, a probe, and a bracket configured to hold a unit-under-test, wherein the probe is config...  
WO/2018/153963A1
A testing head (20), apt to verify the working of a device under test integrated on a semiconductor wafer, said testing head (20) comprising at least one guide (40) provided with a plurality of guide holes (40h) and a plurality of contac...  
WO/2018/153949A1
It is hereinafter described a testing head (10) adapted to verify the functionality of a device under test (16) integrated on a semiconductor wafer, such testing head (10) comprising at least one guide (14, 13, 24) provided with a plural...  
WO/2018/155005A1
Provided is an electrical characteristic inspection tool that is capable of electrical characteristic inspection even if an oxide film has been formed on pads or bumps formed at a fine pitch. This electrical characteristic inspection too...  
WO/2018/149847A1
A probe card (20) of a testing apparatus of electronic devices comprises a testing head (21), which houses a plurality of contact elements (22) extending along a longitudinal axis (H-H) between a first end portion (24A) and a second end ...  
WO/2018/150478A1
The present invention provides a substrate inspection probe capable of reliably and easily touching electrodes of an extremely small surface-mount component, particularly a chip component or QFP LSI. In the present invention, a contact b...  
WO/2018/151398A1
The present invention relates to a system and a method for assigning a unique number to a cell module controller and, more specifically, to a system and a method for assigning a unique number to a cell module controller, the system and t...  

Matches 51 - 100 out of 26,928