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WO/2019/133097A1 |
A test socket assembly includes a contactor body having one or more compliant interconnects, and a socket opening sized and configured to receive a device under test therein. The test socket assembly further includes a lead frame assembl...
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WO/2019/127866A1 |
A fast detection apparatus and method for an encrypted magnetic head. The fast detection apparatus for an encrypted magnetic head comprises a comprehensive tester (100) for fast detection of an encrypted magnetic head, and a detection fi...
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WO/2019/120733A1 |
The invention relates to a circuit for detecting an input variable in an electronic control device having a measuring resistor. In addition to the measuring current loop having the measuring resistor, the circuit forms an additional refe...
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WO/2019/120961A1 |
A contact probe (10) for a testing head for testing electronic devices comprises a rod-like body (10'), which is made of a first conductive material and extends along a longitudinal axis (H-H), and a contact tip (11) supported by the bod...
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WO/2019/122592A1 |
The present invention relates to a device for measuring the intensity of a current, said device being designed to measure the intensity of a current flowing through a power supply of an electronic control unit of a motor vehicle. The dev...
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WO/2019/116512A1 |
This socket is provided with a housing having a first storing section and a second storing section, which can store contactors. The first storing section has: a first supporting wall section; and a second supporting wall section that is ...
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WO/2019/114470A1 |
A receiving structure of an automatic signal docking circuit, and an automatic signal docking device. When a male end of the automatic signal docking device approaches a female end of the automatic signal docking device, a plurality of a...
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WO/2019/114151A1 |
A waveform generating device, comprising a processor, a waveform preprocessing module and a filtering module; the processor is used for calculating pulse wave configuration parameters according to pulse wave parameters inputted by a user...
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WO/2019/117490A1 |
The present invention relates to a system and a method for diagnosing a relay fault and, more particularly, to a system and a method for diagnosing a relay fault by using a diagnosis resistor, in which the diagnosis resistor is directly ...
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WO/2019/118404A1 |
One aspect of the present technology relates to an optical electric field sensor device. The device includes a non-conductive housing configured to be located proximate to an electric field. A voltage sensor assembly is positioned within...
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WO/2019/114040A1 |
A press ram comprising press blocks (30) mounted on a bottom plate (10) and used for fixing one or more circuit boards (20) and moving blocks (40) having the same quantity as that of the circuit boards (20). The bottom plate (10) is used...
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WO/2019/115071A1 |
The invention relates to a high-frequency test connector device (12; 12') having an adapter housing which comprises a sleeve-like ground contact section (10; 10') axially at one end, means for external high-frequency signal contact (18) ...
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WO/2019/112134A1 |
The present invention relates to a history management pad of a semiconductor test socket, a manufacturing method thereof, and a semiconductor test device including the history management pad. According to the present invention, a history...
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WO/2019/107830A1 |
Disclosed is a test device for a high-speed/high-frequency test. The test device includes: a conductive block which includes a probe hole; at least one signal probe which is supported in an inner wall of the probe hole without contact, i...
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WO/2019/106871A1 |
This electrical connection socket for relaying exchange of electrical signals between a first electrical component and a second electrical component, is provided with: a signal pin which is inserted in a communication hole of a metallic ...
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WO/2019/106002A1 |
An improved test jig comprises a printed circuit board with a number of cantilever contacts on top. An electrically conducting grounding plane is mounted on top of the printed circuit board, spanning over the cantilever contacts, and gro...
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WO/2019/106872A1 |
This electrical connection socket for relaying exchange of electrical signals between a first electrical component and a second electrical component, is provided with: a metallic casing which has a communication hole for communication be...
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WO/2019/102880A1 |
An electrical inspection method that comprises: a step for preparing a wafer (100) on which are formed a plurality of Fabry-Perot interference filter parts at which the distance between facing first mirror parts and second mirror parts c...
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WO/2019/095792A1 |
Disclosed are a circulator/isolator text fixture, comprising a ground plate, a PCB board, an adjustable capacitor and a high-frequency connector. The PCB board is provided with a microstrip circuit; one end of the microstrip is electrica...
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WO/2019/095774A1 |
An automatic electric testing machine for a port element of a connector, the automatic electric testing machine comprising a machine frame (1) provided with a power allocation control chamber (2) and an operation display screen (3) mutua...
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WO/2019/098079A1 |
The present invention provides a probe head capable of reducing an inductance value of a ground probe. In this probe head 1, a pin plate 40, a pin block 50, and a solder resist film 60 are laminated integrally in said order from the side...
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WO/2019/096695A2 |
A probe for direct nano- and micro-scale electrical characterization of materials and semi conductor wafers. The probe comprises a probe body, a first cantilever extending from the probe body, and a first thermal detector extending from ...
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WO/2019/095258A1 |
A pressure resistance test platform for aluminum substrate, comprising a test stand (1) and a pressure resistance tester (2), the test stand (1) comprising a base (11), a bottom plate (12), a test support plate (13), an upper press plate...
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WO/2019/097629A1 |
A probe card (10) has an edge sensor (12). The edge sensor (12) has a first needle (14) and a second needle (16). The first needle (14) and the second needle (16) are in contact with each other when the first needle (14) and a wafer are ...
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WO/2019/093370A1 |
This ceramic includes, in mass%, 20.0-60.0% of Si3N4, 25.0-70.0% of ZrO2, and 5.0-15.0% of at least one selected from MgO, Y2O3, CeO2, CaO, HfO2, TiO2, Al2O3, SiO2, MoO3, CrO, CoO, ZnO, Ga2O3, Ta2O5, NiO, and V2O5. The ceramic has a ther...
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WO/2019/091946A1 |
A contact probe (10) for a testing head of an apparatus for testing electronic devices comprises a body (10') extending along a longitudinal axis (H-H) between a first end portion (10a) and a second end portion (10b), the second end port...
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WO/2019/093527A1 |
The purpose of the present invention is to provide an IC inspection device in which the electrical distance between an IC to be inspected and a bypass capacitor is less than in the prior art and which is maintenance-free. In order to ach...
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WO/2019/093614A1 |
Disclosed is a test probe assembly. The test probe assembly includes: a conductive pipe; a probe inserted in the pipe without contacts and elastically retractable along a lengthwise direction; and an insulation probe supporting member co...
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WO/2019/091782A1 |
The disclosure comprises an electric connection module (100) for connecting a signal line (101) to a communication line (103), wherein the signal line (101) has an electric shield (105), comprising a connecting contact (107) which can be...
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WO/2019/090324A1 |
An electric winch control module (28) of this disclosure provides improved means for detecting changes in a current carried by an electric winch motor power lead (59). The module's housing (41 ) includes a magnetic flux shield (60) conta...
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WO/2019/089332A1 |
A current sensing circuit includes a current sense amplifier and a correction circuit. The current sense amplifier has an offset voltage. The correction circuit is configured to evaluate the offset voltage of the current sense amplifier....
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WO/2019/088803A1 |
A battery pack is disclosed. The battery pack according to the present invention comprises: a cell module assembly having battery cells arranged in a stacked manner, a cell case accommodating the battery cells, and a first cathode bus ba...
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WO/2019/089611A1 |
Probes are connected to the space transformer via multiple carrier plates. Electrical contacts from the probes to the space transformer are by way of spring tail features on the probes that connect to the space transformer and not to the...
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WO/2019/082259A1 |
Provided is an inspection jig for allowing easy replacement of plungers. A jig base 20 has: plunger accommodation chambers 20a that each accommodate and hold a large-diameter section 13 of a plunger 10 so as to be capable of advancing an...
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WO/2019/084318A1 |
An integrated chip package assembly test system (100) and method for testing a chip package assembly are described herein. In one example, an integrated circuit chip package test system (100) includes a socket (120) and a workpress (106)...
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WO/2019/081565A2 |
The invention relates to a connection strip (10) for a counter (20), wherein the connection strip (10) has either at least one movable housing element (104), which is in a first position when the counter (20) is connected to the connecti...
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WO/2019/083485A2 |
The present invention differs in air and leakage testing machines of endoscopic scopes used in medicine and industry, is unlike conventional operator manual mechanical air leakage testers and specially designed to automatically and conti...
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WO/2019/081365A1 |
The invention relates to a method for operating a battery sensor and to a battery sensor, comprising at least one first battery sensor connection (Vat+) and a second battery sensor connection (Vba-), in particular for connecting to a bat...
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WO/2019/082014A1 |
The present invention concerns a heating assembly (10, 15) for generating heat in order to carry out temperature-dependent tests on an electronic component (3, 200) arranged inside a socket (2), the heating assembly (10, 15) comprising: ...
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WO/2019/075663A1 |
An electrical connection device (10) and a test machine (100) used for connecting to a workpiece to be tested (200). The workpiece to be tested (200) comprises a first connection surface (210) and a test area (220) formed on the first co...
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WO/2019/077849A1 |
This electrical connection device is provided with: a probe (10) having a tubular barrel (11) and also having a bar-shaped top-side plunger (121) and a bar-shaped bottom-side plunger (122), which are joined to the barrel (11) with the fr...
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WO/2019/076164A1 |
The present invention relates to a waveform splitter, comprising a first electronic switch, a second electronic switch and a control module. The first electronic switch and the second electronic switch are separately connected to a curre...
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WO/2019/078364A1 |
A ceramic which comprises, in terms of mass%, 20.0-55.0% of BN, 5.0-40.0% of SiC and 3.0-60.0% of ZrO2 and/or Si3N4. This ceramic has a heat expansion coefficient at -50 to 500°C of 1.0×10-6 to 5.0×10-6/°C, a low chargeability (106 t...
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WO/2019/077428A1 |
The invention relates to a multipart housing (1) comprising a first and a second housing part (2, 3) which are secured against each other by means of a latching connection (6). The aim of the invention is to protect the latching connecti...
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WO/2019/070518A1 |
Probe systems for testing a device under test are disclosed herein. The probe systems include a platen that defines an upper surface, an opposed lower surface, and a platen aperture. The probe systems also include a chuck that defines a ...
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WO/2019/069576A1 |
Provided is a probe that can accurately perform characteristic testing of a connector terminal. This probe for performing characteristic testing of a connector comprises: a flange; a housing; a fixed plunger; a first elastic body; a mova...
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WO/2019/066365A1 |
The present invention relates to an anisotropic conductive sheet used for a test socket or the like used to inspect a semiconductor element or the like and, more particularly, to an anisotropic conductive sheet comprising: a plurality of...
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WO/2019/066135A1 |
The present invention relates to a bidirectional conductive module and a method for manufacturing the same. A bidirectional conductive module according to the present invention comprises: an insulative body which is made of an insulative...
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WO/2019/066256A1 |
The present invention relates to a substrate testing cartridge provided for simultaneously testing multiple substrates for which a substrate treatment process has been finished, and a method for manufacturing same. According to an embodi...
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WO/2019/066410A1 |
A printed circuit board according to various embodiments of the present invention may comprise: a plurality of layers having at least one opening formed therein; and at least one antenna included in at least one layer of the plurality of...
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