| Document |
Document Title |
|
WO/2018/225152A1 |
[Problem] To provide a load testing system that has a structure that makes it difficult for humidity, dust, debris, and the like, to enter a testing device from the outside and thus prevents load test disturbance and makes it possible to...
|
|
WO/2018/221834A1 |
Provided are a wafer probe card that matches in one-to-one correspondence with an LED wafer by implementing a probe system having the same size as the LED wafer, and inspects brightness and wavelength of light emitted from a plurality of...
|
|
WO/2018/221886A1 |
The present invention relates to a vertical probe pin and a probe pin assembly comprising same. The present invention provides a probe pin used for a probe pin assembly comprising a first support body having a first through-hole formed t...
|
|
WO/2018/221777A1 |
The present invention relates to a contact and a socket device for testing a semiconductor device, and the contact of the present invention is a spring contact integrally formed by punching and bending a metal plate, and comprises an ela...
|
|
WO/2018/221234A1 |
This electrical connection apparatus is provided with: a wiring arrangement member (30); a probe (10) that has a base end connected to a wiring pattern formed in the wiring arrangement member (30) and a tip that makes contact with a body...
|
|
WO/2018/221640A1 |
Provided is a resin composition capable of effectively preventing a conduction test target member from scratching, and thus capable of effectively improving the reliability of a conduction test. This resin composition contains conductive...
|
|
WO/2018/220096A1 |
The invention relates to a contact module (1) for making electrical tactile contact with a component, having a carrier (2) which has a contact side (3) that can be assigned to the component and a connection side (4) facing away from the ...
|
|
WO/2018/216588A1 |
This probe is provided with: a rod-shaped plunger (11) including a distal end portion (111) and an insertion portion (112) coupled to the distal end portion (111); a tube-shaped barrel (12) inside which the insertion portion (112) of the...
|
|
WO/2018/217450A1 |
A method and apparatus for measuring multiple parameters of drilling fluid using electric field perturbation, permittivity curves, time domain analysis and frequency domain analysis to identify constituents of drilling fluid and ratios o...
|
|
WO/2018/214347A1 |
A power electronic reactor performance testing device, comprising, sequentially connected, a soft start module (1), an LCL filter module (2), a rectifier module (3), an energy storage module (4), an inverter module (5), a measurement mod...
|
|
WO/2018/215694A1 |
A probe apparatus of a millimeter or submillimeter radio frequency band comprises transition layers (104, 106) having 5 outermost layers (110, 116) on opposite surfaces of the probe apparatus. An internal transition cavity (114) extends ...
|
|
WO/2018/216273A1 |
Through the configuration of a part or the entirety of a probe from components formed using MEMS element technology, the present invention provides an MEMS-type probe that is resistant to deformation and damage and capable of keeping a l...
|
|
WO/2018/218248A1 |
Methods, systems, and apparatus for electrical connector assemblies. The assemblies include a socket defining a signal cavity, the socket having a first socket opening and a second socket opening. The assemblies include a signal contact ...
|
|
WO/2018/214393A1 |
A fast detection method for a functional defect of a PCB micro pad having a minimum width of 1 millimeter. The method comprises the following steps: first generating, by means of automatic point determination of an engineering software, ...
|
|
WO/2018/209901A1 |
A vertical probe card, comprising: a printed circuit board (PCB) (10), a cover plate (20), and a probe (30). The PCB (10) comprises a lower opening (11) and a PCB solder pad (12) arranged to surround the lower opening (11). The cover pla...
|
|
WO/2018/205347A1 |
A trolley (10), comprising a trolley body (11), a plurality of bearing platforms (12), a power supply (30), a signal generator (40), a first placement area (13), a second placement area (14), and wheels (15). The trolley body (11) compri...
|
|
WO/2018/206506A1 |
The invention refers to a method for producing a multi-layer (30) of a probe card (1) for a testing apparatus of electronic devices, comprising the steps of: providing a plurality of dielectric layers (30a-30n) starting from a first diel...
|
|
WO/2018/206377A1 |
The invention relates to a shunt resistor (2) for detecting the status of an electrical energy storage unit (1), wherein the shunt resistor (2) comprises a first layer (4), a second layer (6) and a third layer (8). According to the inven...
|
|
WO/2018/208117A1 |
The present invention relates to an inspection socket, and more particularly, to an inspection socket including: an anisotropic conductive sheet including a first conductive part, an insulating support part disposed around the first cond...
|
|
WO/2018/208604A1 |
One example includes a device (100) that is comprised of a plurality of printed circuit boards (200), a plurality of vias (110), and a plurality of castellations (130). The plurality of printed circuit boards (200) are laminated together...
|
|
WO/2018/203428A1 |
The present invention provides a contact pin module that enables reducing manufacturing cost therefor and allows for automatization of the fabrication therefor. A pair of projection parts 22fa and a pair of temporary fixation lugs 22fc i...
|
|
WO/2018/202857A2 |
The invention relates to a device for making contact with an electronic or electric system, in particular for making contact with a circuit carrier. Said device comprises at least one measurement tip or consists of same, the measurement ...
|
|
WO/2018/198859A1 |
In an inspection jig 4 provided with a movable plate 8, a probe insertion hole 16 for insertion of a distal end portion of a probe Pr is formed in an opposing plate 51 of an inspection side supporting body 5, a probe supporting hole 23 t...
|
|
WO/2018/197504A1 |
A power resistor for use in an automotive battery diagnosis circuit. The resistor includes a length of conductive material stamped to form a ribbon, which has formed along its length pins arranged perpendicular to the length of the ribbo...
|
|
WO/2018/199403A1 |
The present invention relates to a socket for testing semiconductor devices, the socket comprising: a base disposed below the socket; a contact pin which is disposed on the base and is shifted in the longitudinal direction so as to conta...
|
|
WO/2018/197598A1 |
It is described a probe card for a testing apparatus of electronic devices comprising at least one probe head (21) housing a plurality of contact probes (22), each contact probe (22) having at least one contact tip adapted to abut onto c...
|
|
WO/2018/194276A1 |
Disclosed is a probe socket for inspecting electric characteristics of an object to be tested. The probe socket includes a plurality of power pins for applying power to the object to be tested, a plurality of ground pins arranged in para...
|
|
WO/2018/193832A1 |
Provided is an electrical connection apparatus comprising: a probe head (20) which has a guide hole (200) and in which the shape of the guide hole (200) in a plane perpendicular to an extending direction of the guide hole (200) is a poly...
|
|
WO/2018/188169A1 |
A Recognition head, comprising a housing (1), a circuit board (2), and probes (3). The circuit board (2) is mounted in the housing (1). The probes (3) are mounted on the housing (1). There are one or more probes (3). Each probe (3) separ...
|
|
WO/2018/190194A1 |
The present invention is provided with: probes (10); and a probe head (20) having a top part (21) through which the probes (10) penetrate, a bottom part (23) disposed further toward distal-end parts than the top part (21) and through whi...
|
|
WO/2018/190632A1 |
Disclosed is a device pickup module that picks up semiconductor devices from a shuttle in which the semiconductor devices are loaded in order to perform an electrical inspection on the semiconductor devices in a test handler. The device ...
|
|
WO/2018/190633A1 |
A low insertion force connector assembly according to the present invention comprises a first connector and a second connector which are detachably coupled to each other, wherein the first connector and the second connector are easily as...
|
|
WO/2018/190195A1 |
The present invention is provided with: a plurality of probes (10) of which a distal-end part comes into contact with a specimen (2) during measurement; and a space transformer (30) having a plurality of connection wirings (33) electrica...
|
|
WO/2018/186802A1 |
A vertical type test assembly with adjustable contact pressure feature for test on wafer. The test assembly having a probe head comprising a plurality of guide plates with a plurality of through holes wherein at least one the plurality o...
|
|
WO/2018/187068A1 |
Probe systems and methods including electric contact detection. The probe systems include a probe assembly and a chuck. The probe systems also include a translation structure configured to operatively translate the probe assembly and/or ...
|
|
WO/2018/180633A1 |
The objective of the present invention is to prevent localized wear of a socket and a plunger even if the plunger has a small diameter. A Kelvin inspection jig 1 is provided with a socket 90 and a pair of probes 10 attached to the socket...
|
|
WO/2018/182727A1 |
A coaxial wire interconnect architecture and associated methods are described. In one example, the coaxial wire interconnect architecture is used in a test socket interconnect array. Flexible bends are formed in one or more of the coaxia...
|
|
WO/2018/181776A1 |
This contact probe is a conductive contact probe capable of extending/retracting in the axis line direction. The contact probe is provided with: a first contact member to be in contact with one subject to be in contact with; a second con...
|
|
WO/2018/182719A1 |
Space transformation technology for probe cards at sort is disclosed. In one example, a space transformer transforms a pitch of electrical contacts from a first distribution to a second distribution. The space transformer comprises a sub...
|
|
WO/2018/181273A1 |
The probe according to one embodiment of the present invention is provided with: a first plunger; a first end section having a first cutout for fitting in the first plunger; a first spiral section having a first spiral groove; and a firs...
|
|
WO/2018/182327A1 |
A semiconductor package test socket and a method for manufacturing the same are disclosed. The test socket of the present invention is manufactured by the steps of: disposing a first film layer on a lower portion of a support plate havin...
|
|
WO/2018/181216A1 |
This probe holder holds a plurality of contact probes each contacting, on one end side in the longitudinal direction thereof, one electrode to be contacted, wherein a plurality of holder holes are formed which comprise a single sheet of ...
|
|
WO/2018/178847A1 |
A wire harness test system designed to facilitate and harmonize the integration of electrical test modules into the test table is disclosed, making it more versatile and multipurpose in terms of the diversity of wire harness families tha...
|
|
WO/2018/182116A1 |
The present invention relates to an electric conductance inspection device installed on a printed circuit board, the electric conductance inspection device comprising: a probe pin contacting an inspection device for inspecting the perfor...
|
|
WO/2018/171187A1 |
Disclosed is a panel testing device, comprising: a support member (1) and a plurality of testing needles (2) arranged on the support member (1), wherein the plurality of testing needles (2) correspond to a plurality of signal needles (4)...
|
|
WO/2018/173448A1 |
The present invention is provided with: a probe (11); a probe head (12) that holds the probe (11); and an electrode substrate (13), on which an electrode pad (131) for connecting to a base end portion of the probe (11) is disposed. A gui...
|
|
WO/2018/173884A1 |
This probe structure 1 is provided with: a holding plate 2 which has a first surface 21 and a second surface 22, and wherein at least the first surface 21 is insulated; a plurality of electrodes 3 which are formed on the first surface 21...
|
|
WO/2018/168136A1 |
The present invention is provided with a coil spring that expands and contracts along a center line and a first plunger and second plunger that are disposed serially with the coil spring on both sides of the direction following the cente...
|
|
WO/2018/166737A1 |
The invention relates to a test socket having a plurality of contact elements, each for contacting an electrical signal or an electrical potential, and having at least one contacting device for contacting a high frequency signal each. Th...
|
|
WO/2018/169308A1 |
The present invention relates to a voltage conversion device having an improved inductor current cutoff speed, the device comprising: a current measuring means installed in a path through which an inductor current flows; a threshold curr...
|
