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WO/2018/167207A1 |
Disclosed is a carrier including: a base (100) on which a circuit board (121) is mounted; a loading device (111) mounted on the base (100) and configured to load an electronic device (1) thereon; a first pressing device mounted on the ba...
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WO/2018/162956A1 |
A method of testing a transistor component, the method comprising the step of, (a) capturing a first image of the transistor component which is to be positioned into a nest for testing; (b) identifying from the first image the locations ...
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WO/2018/163755A1 |
This positioning mechanism for a Kelvin inspection terminal makes it possible to simply assemble a Kelvin inspection terminal together with an IC socket and enhance the accuracy of the positioning of the Kelvin inspection terminal in rel...
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WO/2018/162343A2 |
A probe for direct nano- and micro-scale electrical characterization of materials and semi conductor wafers. The probe comprises a probe body, a first cantilever extending from the probe body. The first cantilever defining a first loop w...
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WO/2018/163487A1 |
[Problem] To provide a current measurement apparatus that is capable of reducing or removing the necessity of the work of pulling out a conductor in which measurement is to be performed, from a wiring duct or the like, and facilitating c...
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WO/2018/160557A1 |
A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combina...
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WO/2018/158330A1 |
A current sensor for detecting a current from or into a vehicle battery, comprising: * a measurement circuit; and * an electric conductor, having: - at least one first measurement path, defined by a first potential pick-up contacting mea...
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WO/2018/154586A1 |
A system and methods are provided for robot-assisted, interactive testing of electronic circuits comprising a test fixture comprising a robotic arm, a probe, and a bracket configured to hold a unit-under-test, wherein the probe is config...
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WO/2018/153963A1 |
A testing head (20), apt to verify the working of a device under test integrated on a semiconductor wafer, said testing head (20) comprising at least one guide (40) provided with a plurality of guide holes (40h) and a plurality of contac...
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WO/2018/153949A1 |
It is hereinafter described a testing head (10) adapted to verify the functionality of a device under test (16) integrated on a semiconductor wafer, such testing head (10) comprising at least one guide (14, 13, 24) provided with a plural...
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WO/2018/155005A1 |
Provided is an electrical characteristic inspection tool that is capable of electrical characteristic inspection even if an oxide film has been formed on pads or bumps formed at a fine pitch. This electrical characteristic inspection too...
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WO/2018/149847A1 |
A probe card (20) of a testing apparatus of electronic devices comprises a testing head (21), which houses a plurality of contact elements (22) extending along a longitudinal axis (H-H) between a first end portion (24A) and a second end ...
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WO/2018/150478A1 |
The present invention provides a substrate inspection probe capable of reliably and easily touching electrodes of an extremely small surface-mount component, particularly a chip component or QFP LSI. In the present invention, a contact b...
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WO/2018/151398A1 |
The present invention relates to a system and a method for assigning a unique number to a cell module controller and, more specifically, to a system and a method for assigning a unique number to a cell module controller, the system and t...
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WO/2018/149838A1 |
A probe card (20) for a testing apparatus of electronic devices comprises a testing head (21), which houses a plurality of contact elements (22) extending along a longitudinal axis (H-H) between a first end portion (24A) and a second end...
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WO/2018/147024A1 |
A probe 20 that electrically connects to each other a first object to be in contact and a second object to be in contact is provided with: a cylindrical barrel section 50 extending in vertical direction Z; a first plunger section 60, a p...
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WO/2018/146911A1 |
Provided is a magnetically shielded room that is capable of suppressing positional deviation of a measuring tool in an interior space. The magnetically shielded room 1 is provided with: an upper shielding body 11, side periphery shieldin...
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WO/2018/147246A1 |
Provided is a jig which enables a probe head to be detached from and attached to an electrical connection device, without using a special holding device. This jig (50) is applicable to an electrical connection device (10) which electrica...
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WO/2018/145143A1 |
The invention relates to a measuring device such as a multimeter, comprising a retractable assembly, and including (i) a cable comprising a first end portion having a first probe and a second end portion having a second probe; (ii) a ree...
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WO/2018/147511A1 |
The present invention relates to a bidirectional conductive pin using carbon fiber and a bidirectional conductive pattern module, and a bidirectional conductive socket using the same. The bidirectional conductive pin using carbon fiber a...
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WO/2018/144878A1 |
A flexible electric probe can include: a flexible substrate; and probe line conductors on the flexible substrate, the probe line conductors being essentially parallel to each other and having separations of about 5-50 microns. The flexib...
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WO/2018/143577A1 |
Disclosed is a test probe for an object with a barrel-shaped contact terminal having a curved surface. The test probe includes a first contact member configured to comprise a contact portion having a pair of contact surfaces which are ar...
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WO/2018/143541A1 |
A battery management system may comprise: a charge control switch disposed in a high current path between a plurality of pack terminals and a battery module; and a controller which detects a cell voltage of each of a plurality of cells c...
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WO/2018/142170A1 |
The invention is a contacting device suitable for measurements and/or other contact tests, the device comprising a head unit comprising a plunger (14) having a broadened portion (28) at its first end, and a head element (16) being on a s...
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WO/2018/135782A1 |
A probe card according to an embodiment of the present invention is disposed in a state where two probe assemblies are functionally combined, corresponding to a component non-mounted region (R1) and a component mounted region (R2) of a t...
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WO/2018/135674A1 |
The present invention relates to a bidirectional conductive pattern module, wherein the bidirectional conductive pattern module comprises: a main body in which a plurality of base substrates having an insulating layer made of an insulati...
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WO/2018/132963A1 |
A capacitance detection apparatus, an electronic device and a pressure detection apparatus. The capacitance detection apparatus comprises: a coding circuit (110) for periodically charging and discharging at least one capacitor to be dete...
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WO/2018/132064A1 |
Testing apparatus operable to collect optical performance data of optoelectronic devices at different temperatures includes thermal-adjustment devices in thermal and mechanical contact with the optoelectronic devices via optoelectronic d...
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WO/2018/130684A1 |
The present invention provides an apparatus for controlling the temperature of a substrate, and a corresponding production method. The apparatus is equipped with a planar main body (1; 1a, 1b) with a substrate contact surface (SF), with ...
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WO/2018/132599A1 |
Crosstalk between probes in a vertical probe array is reduced by providing a grounded metal carrier disposed between the guide plates of the probe array. The metal carrier includes pockets that are laterally separated from each other by ...
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WO/2018/130965A1 |
The present invention relates to an enclosure assembly (9) and to a metering apparatus (1), comprising a first enclosure portion (10) and a second enclosure portion (11) which are configured to be assembled by being moved towards each ot...
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WO/2018/129439A2 |
An integrated circuit device testing system includes a socket configured to receive an integrated circuit device, wherein the socket comprises at least one conductive trace made of a material with a resistivity that is a function of temp...
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WO/2018/128699A1 |
An automated microtester array, for simultaneously testing a plurality of devices under test, includes a plurality of automated microtesters, wherein each of the plurality of automated microtesters is configured to test a plurality of de...
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WO/2018/128361A1 |
A probe card according to an embodiment of the present invention comprises: a plurality of probes that are in contact with a test target for transmitting an electrical signal; a probe PCB that has a signal line for distributing and trans...
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WO/2018/124737A1 |
A probe card of the present invention can adjust the movement amount of a second plate and a needle fall prevention plate when moving the same in a first direction with respect to a first plate in the state where a straight needle has be...
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WO/2018/122041A1 |
The present invention relates to the field of apparatuses and methods for determining or measuring current. In order to present a solution which enables a lower outlay on apparatus and improved stability with regard to failure with respe...
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WO/2018/123878A1 |
[Problem] To provide an electric contact, as well as a socket for an electric component, in which the plastic deformation of a spring part can be prevented. [Solution] Disclosed is an electric contact 60 that is configured such that a fi...
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WO/2018/121895A1 |
The invention relates to an adapter device (10, 110, 210) for positioning at least one conductor (68), such as a conductor pair, for example, of a cable (70) to be measured, which adapter device comprises a receiving device (12) and a ho...
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WO/2018/123876A1 |
[Problem] To provide an electrical contact and an electrical component socket that are configured to come into electric contact with an electrical component as a result of contact between multiple protrusions and a terminal, such that a ...
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WO/2018/123877A1 |
[Problem] To provide an electric contact, as well as a socket for an electric component, in which the number of components in the electric contact can be reduced, and the resistance value of the electric contact when a first electric com...
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WO/2018/116568A1 |
This probe structure for characteristic inspection of a connector having at least one terminal is provided with a plunger, a coaxial probe, a flange, a housing, and a spring. One end of the housing and a through hole of the flange have e...
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WO/2018/118894A1 |
A shunt (100) is composed of multiple pieces (102,104,106) with at least some of the pieces being connected by a conductive channel (108,110) that provides uniform flow of current. The conductive channel may be a recess, raised portion, ...
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WO/2018/119004A1 |
A universal multi-pin, adjustable probing assembly (100) or manipulator for use in parametric and reliability testing of devices on a semiconductor wafer. The probing assembly can be mounted and adjusted on a metal platen (120) using a m...
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WO/2018/118075A1 |
An embodiment includes an apparatus comprising: a substrate including a surface that comprises first, second, and third apertures; and first, second, and third probes comprising proximal ends that are respectively included within and pro...
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WO/2018/118909A1 |
A thermocouple device includes a shared conductor for a shunt measurement and a thermocouple measurement. For example, the thermocouple device may include a shared conductor that provides a signal to both calculate current of a shunt and...
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WO/2018/113059A1 |
Provided is a circuit protection component with an external electrical test point. The circuit protection component includes a copper-clad laminate, a protective element with a positive temperature effect of resistance, a conductive comp...
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WO/2018/112166A1 |
A test probe for use with a testing apparatus. The test probe includes a first portion, a second portion, and a third portion, with hinges between the first and second portions and the second and third portions. The first portion folded ...
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WO/2018/108514A1 |
The invention relates to a motor vehicle with an electric motor (2), in particular a hybrid or electric vehicle, comprising a high-voltage vehicle electrical system (1) with a high-voltage stored energy source (3) which supplies electric...
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WO/2018/108790A1 |
A testing head (20), adapted to verify the operation of a device under test integrated on a semiconductor wafer, comprises at least one guide (40, 41, 42) provided with a plurality of guide holes (40h, 41h, 42h) adapted to house a plural...
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WO/2018/110044A1 |
The purpose of the present invention is to provide a contact probe, the durability of which is improved by reduction of the contraction amount after probing in a high temperature environment. A contact probe 1 is provided with a Ni pipe ...
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