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Patent Searching and Data


Matches 101 - 150 out of 27,123

Document Document Title
WO/2018/235676A1
The present invention eliminates defects caused by moisture and achieves stable electrical connection between a contact probe of a socket and an electrode of an inspection board. A socket 1 is provided with a contact probe 20 and an insu...  
WO/2018/235233A1
A contact probe inspection device that comprises: support parts (H1, H2) that support a pin board jig (PB1) that has a contact probe (P) arranged thereon; a load cell (LS) that, while in contact with the contact probe (P), applies a load...  
WO/2018/232404A1
A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be conf...  
WO/2018/230752A1
The present invention relates to a wafer inspecting device. According to the present invention, the wafer inspecting device comprises: a magnetic field generating unit for forming a magnetic field such that magnetic field lines travel in...  
WO/2018/230627A1
An electrically conductive contact unit according to the present invention is provided with: a holder base plate, which is an electrically conductive contact holder having a coaxial structure for accommodating an electrically conductive ...  
WO/2018/230085A1
This inspection device has: electric contacts (51) that are electrically connected to an object to be measured by making contact with the object to be measured; conductive sections (52) that are electrically connected to the electric con...  
WO/2018/224458A1
The invention relates to a contact element system having a plurality of pin-type or needle-type and electrically conductive contact elements (4, 5) of equal length, which each have two end regions (4', 5', 4", 5") for electrically contac...  
WO/2018/226745A1
A battery system (12) includes battery cells to store electrical energy and to output electrical power. The battery system further includes a housing (150, 152), a shunt (146), a control board (98), and a connector assembly (148). The ho...  
WO/2018/225152A1
[Problem] To provide a load testing system that has a structure that makes it difficult for humidity, dust, debris, and the like, to enter a testing device from the outside and thus prevents load test disturbance and makes it possible to...  
WO/2018/221834A1
Provided are a wafer probe card that matches in one-to-one correspondence with an LED wafer by implementing a probe system having the same size as the LED wafer, and inspects brightness and wavelength of light emitted from a plurality of...  
WO/2018/221886A1
The present invention relates to a vertical probe pin and a probe pin assembly comprising same. The present invention provides a probe pin used for a probe pin assembly comprising a first support body having a first through-hole formed t...  
WO/2018/221777A1
The present invention relates to a contact and a socket device for testing a semiconductor device, and the contact of the present invention is a spring contact integrally formed by punching and bending a metal plate, and comprises an ela...  
WO/2018/221234A1
This electrical connection apparatus is provided with: a wiring arrangement member (30); a probe (10) that has a base end connected to a wiring pattern formed in the wiring arrangement member (30) and a tip that makes contact with a body...  
WO/2018/221640A1
Provided is a resin composition capable of effectively preventing a conduction test target member from scratching, and thus capable of effectively improving the reliability of a conduction test. This resin composition contains conductive...  
WO/2018/220096A1
The invention relates to a contact module (1) for making electrical tactile contact with a component, having a carrier (2) which has a contact side (3) that can be assigned to the component and a connection side (4) facing away from the ...  
WO/2018/216588A1
This probe is provided with: a rod-shaped plunger (11) including a distal end portion (111) and an insertion portion (112) coupled to the distal end portion (111); a tube-shaped barrel (12) inside which the insertion portion (112) of the...  
WO/2018/217450A1
A method and apparatus for measuring multiple parameters of drilling fluid using electric field perturbation, permittivity curves, time domain analysis and frequency domain analysis to identify constituents of drilling fluid and ratios o...  
WO/2018/214347A1
A power electronic reactor performance testing device, comprising, sequentially connected, a soft start module (1), an LCL filter module (2), a rectifier module (3), an energy storage module (4), an inverter module (5), a measurement mod...  
WO/2018/215694A8
A probe apparatus of a millimeter or submillimeter radio frequency band comprises transition layers (104, 106) having outermost layers (110, 116) on opposite surfaces of the probe apparatus. An internal transition cavity (114) extends th...  
WO/2018/215694A1
A probe apparatus of a millimeter or submillimeter radio frequency band comprises transition layers (104, 106) having 5 outermost layers (110, 116) on opposite surfaces of the probe apparatus. An internal transition cavity (114) extends ...  
WO/2018/216273A1
Through the configuration of a part or the entirety of a probe from components formed using MEMS element technology, the present invention provides an MEMS-type probe that is resistant to deformation and damage and capable of keeping a l...  
WO/2018/218248A1
Methods, systems, and apparatus for electrical connector assemblies. The assemblies include a socket defining a signal cavity, the socket having a first socket opening and a second socket opening. The assemblies include a signal contact ...  
WO/2018/214393A1
A fast detection method for a functional defect of a PCB micro pad having a minimum width of 1 millimeter. The method comprises the following steps: first generating, by means of automatic point determination of an engineering software, ...  
WO/2018/209901A1
A vertical probe card, comprising: a printed circuit board (PCB) (10), a cover plate (20), and a probe (30). The PCB (10) comprises a lower opening (11) and a PCB solder pad (12) arranged to surround the lower opening (11). The cover pla...  
WO/2018/205347A1
A trolley (10), comprising a trolley body (11), a plurality of bearing platforms (12), a power supply (30), a signal generator (40), a first placement area (13), a second placement area (14), and wheels (15). The trolley body (11) compri...  
WO/2018/206506A1
The invention refers to a method for producing a multi-layer (30) of a probe card (1) for a testing apparatus of electronic devices, comprising the steps of: providing a plurality of dielectric layers (30a-30n) starting from a first diel...  
WO/2018/206377A1
The invention relates to a shunt resistor (2) for detecting the status of an electrical energy storage unit (1), wherein the shunt resistor (2) comprises a first layer (4), a second layer (6) and a third layer (8). According to the inven...  
WO/2018/208117A1
The present invention relates to an inspection socket, and more particularly, to an inspection socket including: an anisotropic conductive sheet including a first conductive part, an insulating support part disposed around the first cond...  
WO/2018/208604A1
One example includes a device (100) that is comprised of a plurality of printed circuit boards (200), a plurality of vias (110), and a plurality of castellations (130). The plurality of printed circuit boards (200) are laminated together...  
WO/2018/203945A3
A method and apparatus for detecting and identifying hazardous objects in electric fields. In one embodiment, the apparatus comprises two or more sensor probes mounted on a mobile vehicle and spaced apart from one another, wherein each s...  
WO/2018/203428A1
The present invention provides a contact pin module that enables reducing manufacturing cost therefor and allows for automatization of the fabrication therefor. A pair of projection parts 22fa and a pair of temporary fixation lugs 22fc i...  
WO/2018/202857A2
The invention relates to a device for making contact with an electronic or electric system, in particular for making contact with a circuit carrier. Said device comprises at least one measurement tip or consists of same, the measurement ...  
WO/2018/202857A3
The invention relates to a device for making contact with an electronic or electric system, in particular for making contact with a circuit carrier. Said device comprises at least one measurement tip or consists of same, the measurement ...  
WO/2018/198859A1
In an inspection jig 4 provided with a movable plate 8, a probe insertion hole 16 for insertion of a distal end portion of a probe Pr is formed in an opposing plate 51 of an inspection side supporting body 5, a probe supporting hole 23 t...  
WO/2018/197504A1
A power resistor for use in an automotive battery diagnosis circuit. The resistor includes a length of conductive material stamped to form a ribbon, which has formed along its length pins arranged perpendicular to the length of the ribbo...  
WO/2018/199403A1
The present invention relates to a socket for testing semiconductor devices, the socket comprising: a base disposed below the socket; a contact pin which is disposed on the base and is shifted in the longitudinal direction so as to conta...  
WO/2018/197598A1
It is described a probe card for a testing apparatus of electronic devices comprising at least one probe head (21) housing a plurality of contact probes (22), each contact probe (22) having at least one contact tip adapted to abut onto c...  
WO/2018/194276A1
Disclosed is a probe socket for inspecting electric characteristics of an object to be tested. The probe socket includes a plurality of power pins for applying power to the object to be tested, a plurality of ground pins arranged in para...  
WO/2018/193832A1
Provided is an electrical connection apparatus comprising: a probe head (20) which has a guide hole (200) and in which the shape of the guide hole (200) in a plane perpendicular to an extending direction of the guide hole (200) is a poly...  
WO/2018/188169A1
A Recognition head, comprising a housing (1), a circuit board (2), and probes (3). The circuit board (2) is mounted in the housing (1). The probes (3) are mounted on the housing (1). There are one or more probes (3). Each probe (3) separ...  
WO/2018/190194A1
The present invention is provided with: probes (10); and a probe head (20) having a top part (21) through which the probes (10) penetrate, a bottom part (23) disposed further toward distal-end parts than the top part (21) and through whi...  
WO/2018/190632A1
Disclosed is a device pickup module that picks up semiconductor devices from a shuttle in which the semiconductor devices are loaded in order to perform an electrical inspection on the semiconductor devices in a test handler. The device ...  
WO/2018/190633A1
A low insertion force connector assembly according to the present invention comprises a first connector and a second connector which are detachably coupled to each other, wherein the first connector and the second connector are easily as...  
WO/2018/190195A1
The present invention is provided with: a plurality of probes (10) of which a distal-end part comes into contact with a specimen (2) during measurement; and a space transformer (30) having a plurality of connection wirings (33) electrica...  
WO/2018/186802A1
A vertical type test assembly with adjustable contact pressure feature for test on wafer. The test assembly having a probe head comprising a plurality of guide plates with a plurality of through holes wherein at least one the plurality o...  
WO/2018/187068A1
Probe systems and methods including electric contact detection. The probe systems include a probe assembly and a chuck. The probe systems also include a translation structure configured to operatively translate the probe assembly and/or ...  
WO/2018/180633A1
The objective of the present invention is to prevent localized wear of a socket and a plunger even if the plunger has a small diameter. A Kelvin inspection jig 1 is provided with a socket 90 and a pair of probes 10 attached to the socket...  
WO/2018/182727A1
A coaxial wire interconnect architecture and associated methods are described. In one example, the coaxial wire interconnect architecture is used in a test socket interconnect array. Flexible bends are formed in one or more of the coaxia...  
WO/2018/181776A1
This contact probe is a conductive contact probe capable of extending/retracting in the axis line direction. The contact probe is provided with: a first contact member to be in contact with one subject to be in contact with; a second con...  
WO/2018/182719A1
Space transformation technology for probe cards at sort is disclosed. In one example, a space transformer transforms a pitch of electrical contacts from a first distribution to a second distribution. The space transformer comprises a sub...  

Matches 101 - 150 out of 27,123