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WO/2023/230069A1 |
A system herein includes one or more processors to determine asymmetric compensation measurements from at least one receiver antenna pair and at least one transmitter antenna pair on a tool body in an underground formation. The asymmetri...
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WO/2023/229281A1 |
Provided is a test connector disposed between a test device and a test subject device and used to test the test subject device. The connector comprises a conductive portion, a frame, and a first elastic sheet. The conductive portion is p...
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WO/2023/227538A1 |
It is herein described a probe card (20) for the testing of devices under test (DUT), comprising a stiffener (21), an interface board (22) associated with the stiffener (21) and configured to interface the probe card (20) to a testing ap...
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WO/2023/226449A1 |
A structural member of a measurement connector and a PCB. The structural member comprises: a main body portion (1), a groove provided on the main body portion (1), and avoidance holes (11) formed in the groove, wherein the groove is used...
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WO/2023/227628A1 |
A radio/microwave frequency current probe comprising one or more resistive elements electrically connected between a current input region and a current output region, and a stack of layers each comprising a dielectric material. For each ...
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WO/2023/228844A1 |
The present invention makes it possible to reliably generate internal side pressure of a plunger to stabilize the value of resistance. This probe comprises: a first plunger provided in one end portion of a barrel; a second plunger that...
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WO/2023/229149A1 |
This battery device comprises: a battery pack including a plurality of battery cells; a battery disconnect unit (BDU) which includes high-voltage operating elements connected to the battery pack and monitors a current of a battery pack c...
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WO/2023/228846A1 |
The present invention makes it possible to reliably generate an internal side pressure of a plunger to stabilize the value of resistance. This probe comprises: a first plunger having a hollow barrel section; a second plunger that slide...
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WO/2023/222110A1 |
A processing system is provided which includes a substrate (80); an array of thin pins (81-85) positioned on the substrate; a holding member (12) configured to hold the substrate; an electrolyte tank (21) configured to receive an electro...
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WO/2023/222615A1 |
The invention relates to a device (100) for checking the functionality of a charging station for electric vehicles. The device (100) has (a) a housing (110) with an input-side first end section (110a) and an output-side second end sectio...
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WO/2023/219883A1 |
An engaging device in a Mass-Interconnect, which provides an apparatus and method to change test adapters for testing applications. An engaging device of a Mass-Interconnect includes an interchangeable test adapter (ITA) (2) and a lockin...
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WO/2023/217102A1 |
A conduction mechanism and a crimping jig. The conduction mechanism comprises a connector (1) and multiple elastic pins (2). The connector (1) comprises a base (11) and multiple contact units (12) for conducting a panel. The multiple con...
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WO/2023/216975A1 |
A current sampling circuit and an electronic device. The circuit comprises: a resistance adjustable module (1) comprising a power transistor Q1 and a power transistor group, the power transistor Q1 having a drain connected to a current i...
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WO/2023/217643A1 |
The invention relates to a current sensor comprising: - a sensitive component (110) with an electrically resistive bar (111) between two interconnection plates (112); and - a printed circuit board accommodating electronics for measuring ...
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WO/2023/219322A1 |
The present invention provides an electro-conductive contact pin which can implement a narrow-pitch and an inspection device including same. Furthermore, the present invention provides an electro-conductive contact pin which uses a guide...
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WO/2023/214640A1 |
The present invention provides a large-capacity shunt comprising: a first shunt block; a second shunt block partially overlapping the first shunt block in a vertical direction; and a shunt fixedly coupled between the first and second shu...
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WO/2023/214784A1 |
Disclosed is a probe-head enabling a plurality of devices being inspected to be measured simultaneously. The probe-head, according to the present invention, comprises: an elastic body formed by laminating a plurality of elastic layers; a...
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WO/2023/213136A1 |
A limiting device for automobile electric motor fault detection, belonging to the field of electric motor fault detection. The device comprises a workbench (1), wherein a clamping mechanism (2) is arranged on the workbench (1); the clamp...
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WO/2023/211659A1 |
A method of forming a probe (3500), comprises providing a first (3500-U) and a second probe module (3500-L), having respective compliant elements (3521-U, 3521-L) functionally joining respective probe arms that directly or indirectly hol...
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WO/2023/211016A1 |
The present invention relates to a method for manufacturing conductive particles which are provided inside a conductive part of a connector for electric connection, which electrically connects a terminal of a test target device and a pad...
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WO/2023/210894A1 |
The present invention allows the height of a spacer, comprising multiple blocks, to be controlled to adjust the length by which a probe protrudes below a lower plate, thereby having the benefit of: increasing the number of inspections to...
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WO/2023/210895A1 |
The present invention relates to a probe head, of which the protrusion length of a probe is adjusted by changing the support distance according to the change of the support axis between a plate and a spacer, in which, by adjusting the pr...
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WO/2023/207386A1 |
A universal detection apparatus and method for a high-speed digital interface of an integrated circuit. The apparatus comprises a medium-low-speed digital testing channel mother board (4) and a high-speed digital interface testing channe...
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WO/2023/201965A1 |
A probe mount and a testing platform having same, which belong to the technical field of chip testing. The probe mount comprises a main body (1) and an adjustment table (2), wherein the main body (1) is connected to a swing arm (5) by me...
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WO/2023/202854A1 |
The invention relates to a current-measuring device for measuring an electrical current (I), comprising a low-resistance current-measuring resistor (1) and a circuit board (7) which is connected to the two connector parts (2, 4) of the c...
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WO/2023/202855A1 |
The invention relates to a current measuring device for measuring an electrical current (I). The current measuring device firstly comprises a current measuring resistor (1) comprising: two connection parts (2, 3) made of a conductor mate...
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WO/2023/197845A1 |
The present application relates to a battery internal resistance measurement device and a battery production system. The battery internal resistance measurement device comprises a first probe used for being electrically connected to a po...
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WO/2023/198296A1 |
Embodiments according to the invention comprise an automated test equipment component, ATE component, e.g. a handler component, e.g. a handler arm, comprising a first antenna adapted to establish a wireless, e.g. nearfield, coupling with...
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WO/2023/200094A1 |
A probe pin according to an embodiment of the present invention comprises: an upper plunger including a first tip configured to be in contact with a circuit to be inspected to transmit and receive an electrical signal to and from the cir...
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WO/2023/198407A1 |
The invention relates to a monitoring device for highly dynamic currents, comprising: A shunt resistor (203) in the supply line (204) directing the current (Idrive) to be monitored; a measurement amplifier circuit (217) with an entire dy...
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WO/2023/196473A2 |
The present technology relates generally to compounds, compositions, and methods useful for treating, preventing, and/or ameliorating pathogenic cellular proliferation, angiogenesis, cancer, metastatic disease, and/or a pathogenic vascul...
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WO/2023/196428A1 |
Probe array for contacting electronic components includes a plurality of probes (3500) for making contact between two electronic circuit elements and an array plate (3540) mounting and retention configuration. The probes may comprise low...
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WO/2023/196438A1 |
Probe for making contact between two electronic circuit elements comprises a feature selected from the group consisting of: (A) at least one first tip (3531-UA) and second tip arm (3531-LA) supporting a shunting element (3571-U, 3571-L) ...
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WO/2023/196431A1 |
Probe array for contacting electronic components includes a plurality of probes (3500) for making contact between two electronic circuit elements and an array plate mounting and retention configuration. The probes may comprise lower rete...
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WO/2023/195997A1 |
A sensor device for non-invasive monitoring of energy consumption usage attached to a power cable. The sensor includes a housing having a bottom part and a top part each presenting end sides and side walls, a controller having a software...
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WO/2023/196425A1 |
Probe array for contacting electronic components includes a plurality of probes (3500) for making contact between two electronic circuit elements and a dual array plate mounting and retention configuration. The probes comprise lower rete...
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WO/2023/196427A1 |
Probe array for contacting electronic components includes a plurality of probes (3500) for making contact between two electronic circuit elements and a dual array plate mounting and retention configuration. The probes may comprise lower ...
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WO/2023/196436A1 |
Probe array for contacting electronic components includes a plurality of probes (3500) for making contact between two electronic circuit elements and an array plate mounting and retention configuration. The probes may comprise one or mor...
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WO/2023/188166A1 |
A probe comprises a first metal part (N) and a plate-shaped second metal part (K). The second metal part (K) is embedded in one end of the first metal part (K) in the longitudinal direction (X) thereof in a predetermined range, protrudes...
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WO/2023/188165A1 |
A probe card (100) comprises a probe pin (20), and guides (11, 12) having guide holes (11H, 12H) through which the probe pin (20) is inserted and that guide the probe pin (20), and inspects the electrical characteristics of an electronic...
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WO/2023/188243A1 |
[Problem] To facilitate passing of a probe through two or more guide plates. [Solution] Provided is a probe passing method for a probe card 1 in which two guide plates 301, 302 are spaced apart from each other, and a probe 50 is passed t...
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WO/2023/187701A1 |
A test system (100) is described for high-voltage and high-current testing of power semiconductor devices comprised in a wafer, particularly for dynamic high-voltage and high-current testing, comprising a test machine, a needle probe car...
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WO/2023/190830A1 |
A rhenium tungsten alloy wire according to an embodiment is a wire composed of a tungsten alloy containing rhenium, wherein the NH4 amount on the wire surface, as obtained from the weight of NH4 ions on the wire surface/the weight of the...
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WO/2023/191410A1 |
The present invention provides an electro-conductive contact pin and an inspection device with improved inspection reliability with respect to an object to be inspected. The electro-conductive contact pin, comprising: a metal body part i...
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WO/2023/191394A1 |
A test connector is disposed between a test device and a device under test. The connector comprises a housing, a signal-conducting part, an insulating support part, and an air insulation part. The signal-conducting part is vertically dis...
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WO/2023/185529A1 |
A detection clamp (10), comprising a clamp body (11) and a base (12). The clamp body (11) is used for clamping a member to be detected. The base (12) is connected to the clamp body (11), and the base (12) is detachably connected to a pre...
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WO/2023/189157A1 |
This probe contains more than 20 mass% to no more than 60 mass% Pd, 3 mass% to less than 20 mass% Ag, 3 mass% to 50 mass% Ni, and 3 mass% to 74 mass% Cu.
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WO/2023/186878A1 |
The present invention targets a power converter, in particular configured to be housed on board an electric or hybrid motor vehicle, comprising at least one arm through which an output current of the power converter flows, a switch syste...
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WO/2023/188369A1 |
A probe pin (20) comprises: a low-resistance portion (L) made of a first metal having conductivity; and a high-resistance portion (H) made of a second metal having conductivity with higher resistivity than the low-resistance portion (L)....
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WO/2023/185473A1 |
A battery detection apparatus (13) and a battery detection system (100). The battery detection apparatus (13) comprises a high-voltage harness plug (131) and a detection assembly (132); the high-voltage harness plug (131) is used for plu...
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