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Patent Searching and Data


Matches 101 - 150 out of 27,289

Document Document Title
WO/2019/082259A1
Provided is an inspection jig for allowing easy replacement of plungers. A jig base 20 has: plunger accommodation chambers 20a that each accommodate and hold a large-diameter section 13 of a plunger 10 so as to be capable of advancing an...  
WO/2019/084318A1
An integrated chip package assembly test system (100) and method for testing a chip package assembly are described herein. In one example, an integrated circuit chip package test system (100) includes a socket (120) and a workpress (106)...  
WO/2019/081565A2
The invention relates to a connection strip (10) for a counter (20), wherein the connection strip (10) has either at least one movable housing element (104), which is in a first position when the counter (20) is connected to the connecti...  
WO/2019/083485A2
The present invention differs in air and leakage testing machines of endoscopic scopes used in medicine and industry, is unlike conventional operator manual mechanical air leakage testers and specially designed to automatically and conti...  
WO/2019/081365A1
The invention relates to a method for operating a battery sensor and to a battery sensor, comprising at least one first battery sensor connection (Vat+) and a second battery sensor connection (Vba-), in particular for connecting to a bat...  
WO/2019/082014A1
The present invention concerns a heating assembly (10, 15) for generating heat in order to carry out temperature-dependent tests on an electronic component (3, 200) arranged inside a socket (2), the heating assembly (10, 15) comprising: ...  
WO/2019/075663A1
An electrical connection device (10) and a test machine (100) used for connecting to a workpiece to be tested (200). The workpiece to be tested (200) comprises a first connection surface (210) and a test area (220) formed on the first co...  
WO/2019/077849A1
This electrical connection device is provided with: a probe (10) having a tubular barrel (11) and also having a bar-shaped top-side plunger (121) and a bar-shaped bottom-side plunger (122), which are joined to the barrel (11) with the fr...  
WO/2019/076164A1
The present invention relates to a waveform splitter, comprising a first electronic switch, a second electronic switch and a control module. The first electronic switch and the second electronic switch are separately connected to a curre...  
WO/2019/078364A1
A ceramic which comprises, in terms of mass%, 20.0-55.0% of BN, 5.0-40.0% of SiC and 3.0-60.0% of ZrO2 and/or Si3N4. This ceramic has a heat expansion coefficient at -50 to 500°C of 1.0×10-6 to 5.0×10-6/°C, a low chargeability (106 t...  
WO/2019/077428A1
The invention relates to a multipart housing (1) comprising a first and a second housing part (2, 3) which are secured against each other by means of a latching connection (6). The aim of the invention is to protect the latching connecti...  
WO/2019/070518A1
Probe systems for testing a device under test are disclosed herein. The probe systems include a platen that defines an upper surface, an opposed lower surface, and a platen aperture. The probe systems also include a chuck that defines a ...  
WO/2019/069576A1
Provided is a probe that can accurately perform characteristic testing of a connector terminal. This probe for performing characteristic testing of a connector comprises: a flange; a housing; a fixed plunger; a first elastic body; a mova...  
WO/2019/066365A1
The present invention relates to an anisotropic conductive sheet used for a test socket or the like used to inspect a semiconductor element or the like and, more particularly, to an anisotropic conductive sheet comprising: a plurality of...  
WO/2019/066135A1
The present invention relates to a bidirectional conductive module and a method for manufacturing the same. A bidirectional conductive module according to the present invention comprises: an insulative body which is made of an insulative...  
WO/2019/066256A1
The present invention relates to a substrate testing cartridge provided for simultaneously testing multiple substrates for which a substrate treatment process has been finished, and a method for manufacturing same. According to an embodi...  
WO/2019/066410A1
A printed circuit board according to various embodiments of the present invention may comprise: a plurality of layers having at least one opening formed therein; and at least one antenna included in at least one layer of the plurality of...  
WO/2019/064265A1
The invention relates to a sensor (3) for measuring a voltage in a HV/MV power network in a separable connector (2), the sensor comprising: - an adapter element (11) comprising a high voltage connection adapted to be mechanically and ele...  
WO/2019/062207A1
An impedance test probe, comprising: at least two probe pins (1, 2) and a probe pin short-circuiting device (3). The probe pin short-circuiting device (3) is an elastic short-circuiting device. One end of the probe pin short-circuiting d...  
WO/2019/060877A1
A test socket for a testing an integrated circuit with controlled impedance while maintaining the structural integrity of the test pins. The pin can have a sidewall with a thick portion and a thinner portion along the length of the pin. ...  
WO/2019/056624A1
Disclosed is a probe device (100), comprising: a base (10), a probe (20) and a conductive member (30), wherein the base (10) comprises a body (11), a cavity (12) provided in the body (11) and a through hole (14) provided in the body (11)...  
WO/2019/059629A1
The present invention relates to a test socket and, more specifically, to a test socket comprising: a housing having an accommodation space, in which an test connector for electrically connecting, with a test device, a device to be teste...  
WO/2019/054761A1
An FPCB replacement system for display panel inspection is provided to select a clamp block having an appropriate FPCB mounted thereon according to the specifications of a display panel placed on a pallet for inspection and facilitate re...  
WO/2019/049482A1
This electric connection socket (1), for relaying electric signals between a circuit substrate (P) and an electric component (B), is provided with: a metal housing (10) which has a through hole (10a) enabling communication between the to...  
WO/2019/048299A1
An interface element (20) for a testing apparatus of electronic devices comprises at least one support (21) provided with a plurality of through-openings (22) that house respective interconnections elements (23), which extend between a f...  
WO/2019/049481A1
This electric connection socket (1), for relaying electric signals between a circuit substrate (P) and an electric component (B), is provided with: a metal housing (10) which has a through hole (10a) enabling communication between the to...  
WO/2019/046419A1
Vertical probe heads having a space transformer laterally tiled into several sections are provided. This change relative to conventional approaches improves manufacturing yield. These probe heads can include metal ground planes, and in e...  
WO/2019/046631A1
A probe device is disclosed that includes one or more insulating layers and a glassy carbon layer. The glassy carbon layer includes one or more channels. Each channel includes a microstructure, which may include an electrode region, inte...  
WO/2019/045425A1
The present invention relates to a test socket comprising carbon nanotubes and, more specifically, to a test socket comprising carbon nanotubes, comprising: a plurality of conductive parts located at respective positions corresponding to...  
WO/2019/045426A1
The present invention relates to a test socket and conductive particles, and more specifically, to a test socket disposed between a device to be tested and a testing device so as to electrically connect a terminal of the device to be tes...  
WO/2019/039628A1
The present invention relates to a bidirectional conductive pin, a bidirectional conductive pattern module, and a method for manufacturing the same. The bidirectional conductive pin according to the present invention comprises: a pin bod...  
WO/2019/039231A1
This probe is provided with a rod-shaped plunger (11) having a tip part (111) and an insertion part (112), and with a barrel (12) having an open end into which the insertion part (112) is inserted. The barrel (12) has multiple slits (121...  
WO/2019/039232A1
This probe is provided with a rod-shaped plunger (11) having a tip part (111) and an insertion part (112), and with a tube-shape barrel (12) having an open end into which the insertion part (112) is inserted. The barrel (12) has a pair o...  
WO/2019/039233A1
This electrical connection device is provided with: a probe (10) which comprises a top-side plunger (121) and a bottom-side plunger (122), the tip of each exposed from the open ends at both ends of a barrel (11), and which comprises a st...  
WO/2019/031826A1
Disclosed is a test device for testing electric characteristics of an object to be tested. The test device comprises a test circuit board comprising an insulating base substrate formed with a printed circuit, a plurality of signal contac...  
WO/2019/029757A1
The invention relates to a method and a device for determining the electrical resistance of an object. According to the invention, the method is for measuring the electrical resistance of an object, in which at least four measurement con...  
WO/2019/024360A1
Provided are a probe changing device and a PCB impedance tester. The probe changing device comprises: a supporting body (10); a first probe portion configured to be movable relative to the supporting body (10), the first probe portion ha...  
WO/2019/024567A1
The present application relates to the technical field of electromagnetic interference processing, and provides an electromagnetic shield structure, comprising a first shield piece and a second shield piece. The first piece comprises a f...  
WO/2019/026880A1
This board for inspection is board for inspection for electrically connecting, in a thickness direction, an inspecting device and an inspected device disposed respectively on one side and the other side thereof in the thickness direction...  
WO/2019/022204A1
This contact probe is provided with: a cylindrical pipe member; a collar that has a hollow portion, and that is fixed to the inner peripheral side of at least one end in the lengthwise direction of the pipe member; and an inner conductor...  
WO/2019/022721A1
An apparatus and method for performing optical caliper measurements remotely, including an unmanned aerial vehicle, a camera attached to the unmanned aerial vehicle, and an optical caliper measurement tool attached to the unmanned aerial...  
WO/2019/021749A1
The present invention eliminates a tilt of a contact point section of a flexible substrate with respect to a subject to be inspected, and obtains a uniform contact state by making the contact point section inclinable. An inspection jig 1...  
WO/2019/022391A1
Disclosed is a test probe for testing electric characteristics of an object to be test. The test probe includes a barrel; a plunger including at least two divisional plungers which are in parallel and partially inserted facing with each ...  
WO/2019/022272A1
The present invention relates to a probe pin for a probe card and, more specifically, to a probe pin with reduced flux diffusion, which prevents flux from diffusing along the probe pin when the probe pin is attached to an electrode of a ...  
WO/2019/017515A1
The present invention relates to a thin film resistor for a probe card, and more specifically, to a thin film resistor for a probe card in which the occurrence of cracks in the thin film resistor during repeated thermal expansion and con...  
WO/2019/012929A1
The composite wiring board according to the present invention is provided with: a ceramic multilayer wiring board including internal wiring and a plurality of low temperature sintered ceramic layers; and a glass multilayer wiring board s...  
WO/2019/011624A1
The invention relates to a coaxial resistor (1), comprising a forward conductor (6) and a return conductor (7) for conducting the current to be measured in opposite directions and comprising a resistance element made of a resistive mater...  
WO/2019/013289A1
A probe unit according to the present invention comprises: a plurality of contact probes that each contact, on one longitudinal end side, an electrode to be contacted; first grounding members that connect to an external ground; second gr...  
WO/2019/013534A1
The present invention relates to a rechargeable battery defect inspection device and defect inspection method. The rechargeable battery defect inspection device, according to the present invention, comprises: a pair of pressing jigs whic...  
WO/2019/013163A1
[Problem] To manufacture a conductive member using a material and a working method that are different from conventional ones, paying attention to a material constituting a contact pin and to a working method therefor. [Solution] Although...  

Matches 101 - 150 out of 27,289