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Matches 151 - 200 out of 27,602

Document Document Title
WO/2019/159718A1
In order to securely clamp a clamping target, the present invention is provided with a pair of clamp arms 11a which are each formed in a substantially curved shape when viewed in a plan view, wherein at least one of the clamp arms is con...  
WO/2019/154714A1
The invention relates to an electric touch contacting device (1), in particular for electrically testing a test piece (6), in particular a wafer, comprising at least one guide plate (2) which has a plate plane and through which guide hol...  
WO/2019/156585A1
A wedge three-axis inertial sensor damper suspension apparatus prevents shock and vibration impacts on a construction machine from being transferred to inertial sensors used by an automatic control system of the construction machine. ...  
WO/2019/156490A1
The present invention relates to a power interface and, more specifically, to a power interface for electrically connecting a subject to be inspected and a test driving apparatus. The power interface according to an embodiment of the pre...  
WO/2019/149552A1
The invention relates to a method for determining a status of a microwave antenna (103) of an exhaust gas treatment element (100) for a motor vehicle, comprising the following steps: specifying a frequency range (200) that is representat...  
WO/2019/146831A1
The present invention relates to a bidirectional conductive module for electrically connecting an upper device and a lower device. The bidirectional conductive module comprises: an insulative main body formed of an insulative material an...  
WO/2019/147100A1
The present invention relates to a test socket and, more specifically, to a test socket comprising: a housing which has an accommodation space accommodating a device-to-be-tested on which an electrical test is to be performed, and which ...  
WO/2019/141016A1
An aging test device and aging test method for a display module, wherein the aging test device comprises a base board (10), a test board (90), a pressure head (100) and a circuit switching board (80), wherein the test board (90) is dispo...  
WO/2019/142554A1
This inspection device is provided with: a stage that supports an interposer; a capacitive probe unit capacitively coupled to a pad; an electric manipulator that controls the relative positions of the stage and the capacitive probe unit ...  
WO/2019/141716A1
A cantilever contact probe (31) is described, comprising a probe body (40) included between a descending probe section (31b) and an ascending probe section (31c), the descending probe section (31b) extending along a predetermined longitu...  
WO/2019/141633A1
A cantilever probe head (30) is described comprising a support ring (32) associated with a PCB board (33) and a plurality of contact probes (31), protruding from the support ring (32) in a cantilever manner and being held by a support (3...  
WO/2019/143773A1
Probes with fiducial targets, probe systems including the same, and associated methods. The probes include a probe body, a probe beam, a probe tip configured to contact a device under test (DUT), and a fiducial target affixed to the prob...  
WO/2019/143595A1
A radio frequency sensor system comprising a housing defining a resonant cavity. Radio frequency probe(s) in the cavity transmit and/or receive radio frequency signals. A radio frequency control unit is in communication with the radio fr...  
WO/2019/143091A1
The present invention relates to a wafer prober. The wafer prober has a wafer probing stage comprising: a lower plate; multiple elevating columns mounted on the upper surface of the lower plate; and an upper plate mounted on the upper-en...  
WO/2019/141777A1
The invention relates to a test needle for measuring electrically conductive layers in holes in printed circuit boards, and to a test probe having a test needle of this type and a finger tester for testing printed circuit boards which ha...  
WO/2019/139548A1
Invention relates to a system showing direction to the operator and providing contacting and testing robustness of contacting in production of cable harnesses by means of software module (3), directing member (6) controlled by software m...  
WO/2019/138505A1
A probe pin according to the present invention is provided with an elastic section, a first contact section, and a second contact section. The elastic section includes: a first linear section having one end section in the extending direc...  
WO/2019/138853A1
This inspection device comprises: a plurality of electrical contacts (51) that are electrically connected to an object to be measured by contacting the object to be measured; a plurality of gripping parts (31,32) to which the plurality o...  
WO/2019/138507A1
A probe pin according to the present invention is provided with: a first contact section and a second contact section; an intermediate section that is disposed between the first contact section and the second contact section; a first ela...  
WO/2019/138504A1
A probe pin according to the present invention is provided with an elastic section (11), a first contact section (12), and a second contact section (13). The elastic section includes a plurality of strip-shaped elastic pieces (21-24), an...  
WO/2019/105900A3
The present invention relates to an aircraft power control device (100) comprising a housing structure (111), an input terminal (130) extending through an outside wall (115) of the housing structure and configured to be attached to an el...  
WO/2019/133093A1
A test socket assembly includes a contactor body, the contactor body having a socket opening sized and configured to receive a device under test therein. A lead frame assembly is disposed within the contactor body, the lead frame assembl...  
WO/2019/133079A1
A test socket assembly includes a socket housing having one or more spring probes therein, and a lead frame assembly including one or more cantilever members. The test socket assembly further includes at least one linear spring damper di...  
WO/2019/130511A1
Provided is an alloy with superior overall balance and a higher hardness than before, and which exhibits good contact resistance stability (oxidation resistance) and plastic workability while maintaining a low level of resistivity compar...  
WO/2019/129585A1
A probe head (20) having vertical probes for testing a device under test (29) integrated on a semiconductor wafer (29') comprises at least one upper guide (22) and at least one lower guide (23) separated from each other by an air gap (26...  
WO/2019/131438A1
A probe pin according to the present invention is provided with: a first plunger in which a first contact part is provided at one end thereof; a second plunger disposed further toward another end than the first plunger, and in which a se...  
WO/2019/133097A1
A test socket assembly includes a contactor body having one or more compliant interconnects, and a socket opening sized and configured to receive a device under test therein. The test socket assembly further includes a lead frame assembl...  
WO/2019/127866A1
A fast detection apparatus and method for an encrypted magnetic head. The fast detection apparatus for an encrypted magnetic head comprises a comprehensive tester (100) for fast detection of an encrypted magnetic head, and a detection fi...  
WO/2019/120733A1
The invention relates to a circuit for detecting an input variable in an electronic control device having a measuring resistor. In addition to the measuring current loop having the measuring resistor, the circuit forms an additional refe...  
WO/2019/120961A1
A contact probe (10) for a testing head for testing electronic devices comprises a rod-like body (10'), which is made of a first conductive material and extends along a longitudinal axis (H-H), and a contact tip (11) supported by the bod...  
WO/2019/122592A1
The present invention relates to a device for measuring the intensity of a current, said device being designed to measure the intensity of a current flowing through a power supply of an electronic control unit of a motor vehicle. The dev...  
WO/2019/116512A1
This socket is provided with a housing having a first storing section and a second storing section, which can store contactors. The first storing section has: a first supporting wall section; and a second supporting wall section that is ...  
WO/2019/096695A3
A probe for direct nano- and micro-scale electrical characterization of materials and semi conductor wafers. The probe comprises a probe body, a first cantilever extending from the probe body, and a first thermal detector extending from ...  
WO/2019/114470A1
A receiving structure of an automatic signal docking circuit, and an automatic signal docking device. When a male end of the automatic signal docking device approaches a female end of the automatic signal docking device, a plurality of a...  
WO/2019/114151A1
A waveform generating device, comprising a processor, a waveform preprocessing module and a filtering module; the processor is used for calculating pulse wave configuration parameters according to pulse wave parameters inputted by a user...  
WO/2019/117490A1
The present invention relates to a system and a method for diagnosing a relay fault and, more particularly, to a system and a method for diagnosing a relay fault by using a diagnosis resistor, in which the diagnosis resistor is directly ...  
WO/2019/118404A1
One aspect of the present technology relates to an optical electric field sensor device. The device includes a non-conductive housing configured to be located proximate to an electric field. A voltage sensor assembly is positioned within...  
WO/2019/114040A1
A press ram comprising press blocks (30) mounted on a bottom plate (10) and used for fixing one or more circuit boards (20) and moving blocks (40) having the same quantity as that of the circuit boards (20). The bottom plate (10) is used...  
WO/2019/115071A1
The invention relates to a high-frequency test connector device (12; 12') having an adapter housing which comprises a sleeve-like ground contact section (10; 10') axially at one end, means for external high-frequency signal contact (18) ...  
WO/2019/112134A1
The present invention relates to a history management pad of a semiconductor test socket, a manufacturing method thereof, and a semiconductor test device including the history management pad. According to the present invention, a history...  
WO/2019/107830A1
Disclosed is a test device for a high-speed/high-frequency test. The test device includes: a conductive block which includes a probe hole; at least one signal probe which is supported in an inner wall of the probe hole without contact, i...  
WO/2019/106871A1
This electrical connection socket for relaying exchange of electrical signals between a first electrical component and a second electrical component, is provided with: a signal pin which is inserted in a communication hole of a metallic ...  
WO/2019/106002A1
An improved test jig comprises a printed circuit board with a number of cantilever contacts on top. An electrically conducting grounding plane is mounted on top of the printed circuit board, spanning over the cantilever contacts, and gro...  
WO/2019/106872A1
This electrical connection socket for relaying exchange of electrical signals between a first electrical component and a second electrical component, is provided with: a metallic casing which has a communication hole for communication be...  
WO/2019/102880A1
An electrical inspection method that comprises: a step for preparing a wafer (100) on which are formed a plurality of Fabry-Perot interference filter parts at which the distance between facing first mirror parts and second mirror parts c...  
WO/2019/095792A1
Disclosed are a circulator/isolator text fixture, comprising a ground plate, a PCB board, an adjustable capacitor and a high-frequency connector. The PCB board is provided with a microstrip circuit; one end of the microstrip is electrica...  
WO/2019/095774A1
An automatic electric testing machine for a port element of a connector, the automatic electric testing machine comprising a machine frame (1) provided with a power allocation control chamber (2) and an operation display screen (3) mutua...  
WO/2019/098079A1
The present invention provides a probe head capable of reducing an inductance value of a ground probe. In this probe head 1, a pin plate 40, a pin block 50, and a solder resist film 60 are laminated integrally in said order from the side...  
WO/2019/096695A2
A probe for direct nano- and micro-scale electrical characterization of materials and semi conductor wafers. The probe comprises a probe body, a first cantilever extending from the probe body, and a first thermal detector extending from ...  
WO/2019/095258A1
A pressure resistance test platform for aluminum substrate, comprising a test stand (1) and a pressure resistance tester (2), the test stand (1) comprising a base (11), a bottom plate (12), a test support plate (13), an upper press plate...  

Matches 151 - 200 out of 27,602