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Patent Searching and Data


Matches 151 - 200 out of 26,928

Document Document Title
WO/2018/095709A1
The invention relates to a current measuring device for measuring an electric current (Ip, In) in accordance with the four-wire technique with a low-resistance current-measuring resistor (RCu1, RCu, R0). The invention additionally provid...  
WO/2018/097446A1
The present invention relates to a screw fastening device for a probe card and a probe card assembling device having the same, the present invention comprising: a plurality of screws which are fastened to the probe card; a plurality of f...  
WO/2018/092909A1
Provided are an electrical contact and an electric component socket configured to be electrically connected to an electric component by a contacting portion coming into contact with a terminal, wherein the electrical contact is capable o...  
WO/2018/092967A1
Provided in one embodiment of the present invention is a test socket for a semiconductor comprising: a base layer having a first surface and a second surface opposite the first surface, provided with a first area and a second area outsid...  
WO/2018/091830A1
The subject matter of the present invention is a device for protecting an electronic computer (2) against a short circuit, the electronic computer (20), a sensor (40) comprising a first sensor pin (40_1), and a shunt resistor (100), char...  
WO/2018/093109A2
Disclosed is a probe for testing an electric characteristic of an object to be tested. The probe includes a core with conductive properties and shaped like a bar; and an elastic plating layer made of a material having higher elasticity t...  
WO/2018/093109A3
Disclosed is a probe for testing an electric characteristic of an object to be tested. The probe includes a core with conductive properties and shaped like a bar; and an elastic plating layer made of a material having higher elasticity t...  
WO/2018/086809A1
A contact system (100; 100'; 100'') contains at least one pneumatically driven contact pin (121, 122, 123), a pressure chamber (1) and a first bushing (37; 37') which is provided in a housing (2) of the pressure chamber (1) for each cont...  
WO/2018/088411A1
A probe 20 which electrically connects a first contact object and a second contact object to each other, and which is provided with a barrel part 50, a plunger part 60 and an insulation part 70. The barrel part 50 comprises spring parts ...  
WO/2018/089659A1
Systems and methods for testing semiconductor wafers are disclosed herein. In one embodiment, an apparatus for testing dies of a semiconductor wafer includes: a tester-side printed circuit board (PCB); a wafer-side support plate having a...  
WO/2018/088504A1
This probe pin (1) is provided with a barrel (2) having a hollow space (3), an elastic body (4) disposed within the barrel (2), a plunger (5), a slide part (5a) that is a portion of the plunger (5) that is accommodated within the barrel ...  
WO/2018/085015A1
A test socket with a link and mount system is used to couple a device under test to a testing apparatus for quick and reliable testing of microchips post-production. The socket includes a pivoting link that connects to the DUT, an elasto...  
WO/2018/083437A1
A technique for measuring the resistance of a resistive element (4) in the presence of a series diode (10) is provided. By supplying three different currents I1, l2, l3 and measuring corresponding voltages V1, V2, V3 across the resistive...  
WO/2018/079982A1
The present invention relates to a bidirectional conductive pin using carbon fibers and a bidirectional conductive pattern module using carbon fibers, and a bidirectional conductive socket using the same. The bidirectional conductive pin...  
WO/2018/079788A1
This substrate for a probe card is provided with a plurality of through-holes in which probes are disposed, the probes being brought into contact with a substance to be measured. The substrate comprises a silicon nitride ceramic, is prov...  
WO/2018/078752A1
An inspection device according to the invention of the present application is provided with a fixing plate (24), a plurality of expanding and contracting parts (11) that each have one end fixed to the fixing plate (24), a plurality of co...  
WO/2018/080177A1
A battery system bus bar according to one embodiment of the present invention comprises: a first bar member and second bar member distanced from each other; and a third bar member connecting the first bar member and second bar member to ...  
WO/2018/074744A1
The present invention relates to a device and a method for diagnosing a switch using voltage distribution, which, in order to diagnose a state of a switch located on a cathode power supply line that connects a battery and a load, connect...  
WO/2018/073627A1
The disclosure relates to a device for measuring electrical current in an electrical conductor (2), the device comprising: a measuring circuit configured to be connected to the electrical conductor, the measuring circuit comprising: a re...  
WO/2018/075466A1
A device includes a sheet of high purity fused silica that has a thickness of less than 500 µm, where the sheet includes features in the sheet, wherein the features have a cross-sectional dimension of less than 50 µm and a depth of at ...  
WO/2018/075789A1
An instrumented electric power arrester includes a temperature sensor, wireless transmitter, and a visual over-temperature indicator. A disk shaped module, a replacement varister block, or a dummy block containing the sensor/transmitter ...  
WO/2018/070915A1
There is provided a test module (100) for testing a fingerprint sensing device (110) comprising: an electrically conductive bottom element (102) comprising an exterior surface portion configured to contact a sensing surface of the finger...  
WO/2018/070684A2
Disclosed is a diagnostic device for a power supply system. The power supply system comprises a battery assembly and at least one contactor. Each of the contactors is configured to selectively open and close a power supply path between t...  
WO/2018/070684A3
Disclosed is a diagnostic device for a power supply system. The power supply system comprises a battery assembly and at least one contactor. Each of the contactors is configured to selectively open and close a power supply path between t...  
WO/2018/066743A1
The present invention relates to a power cable end test device and, more particularly, to a cable terminal end test device coupled to a cable terminal comprising a core conductor so as to evaluate characteristics of the cable terminal, t...  
WO/2018/066839A1
The present invention relates to a fuse diagnosis device and method using voltage distribution, and to a fuse diagnosis device and method using voltage distribution which can diagnose the state of a fuse by connecting a diagnostic resist...  
WO/2018/064754A1
A resistance-measuring device mountable to a component of a current-carrying transmission line. The device includes a body having a base and two arms with interconnected first ends and spaced-apart second ends. The arms define a gap ther...  
WO/2018/066793A1
A band pass filter including a microstrip transmission line comprises: a substrate having a grounding surface formed on a rear surface thereof; an input port which is formed on an upper surface of the substrate and receives a transmissio...  
WO/2018/059965A1
The invention relates to an optical pulse generator and to a method for operating an optical pulse generator. The invention particularly relates to an optical pulse generator for high-frequency (HF)-pulse width modulation in LiDAR system...  
WO/2018/063304A1
Apparatus and methods for adjusting probes of a integrated circuit tester are provided. In an examples, an apparatus can include an array of probes having a nominal pitch, a space transformer configured to provide electrical connections ...  
WO/2018/063874A1
Probe systems and methods are disclosed herein. The methods include directly measuring a distance between a first manipulated assembly and a second manipulated assembly, contacting first and second probes with first and second contact lo...  
WO/2018/057188A1
This disclosure provides systems, methods and apparatus for a test probe for characterizing piezoelectric material. In one aspect, a test probe may include a conductive tip configured to apply force to the piezoelectric material and prov...  
WO/2018/055961A1
A probe pin includes: a plate-shaped movable pin (20) having an elastic portion (21) that elongates and contracts along a longitudinal direction, and a first contact portion (22) and a second contact portion (23) provided at both end por...  
WO/2018/050768A1
The invention relates to a spring contact pin (5) for contacting a test object (2), in particular an electrical/electronic component or assembly, comprising a pin sleeve (6), in which a test head (8) is mounted with a guide end (10) in a...  
WO/2018/052938A1
A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configu...  
WO/2018/051123A1
A quantum power sensor comprising a two-level quantum system strongly coupled to a transmission line that supports a propagating wave. A method of measuring power in a transmission line, the method comprising: coupling a two-level quantu...  
WO/2018/052944A1
A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configu...  
WO/2018/050767A1
The invention relates to a contact pin, in particular a spring contact pin (1), comprising a test head (3) for contacting an electrically conductive contact surface of a test object, in particular a wafer, a printed circuit board or the ...  
WO/2018/042931A1
This probe pin is provided with: a coil spring (20); a first plunger (30) including a first body section (31) which extends through the coil spring (20) and both ends of which are exposed to the outside of the coil spring (20) when the c...  
WO/2018/043173A1
In the present invention, a substrate formed from an insulator or semiconductor, a first layer formed from a conductive magnetic material, and a second layer formed from a conductive non-magnetic material are laminated, in that order, on...  
WO/2018/044014A1
Disclosed is a testing device. The testing device includes a testing socket configured to support a plurality of probes, a testing-circuit substrate which includes a contact point to contact the probe, a slider which makes the testing so...  
WO/2018/039075A1
Resistivity probes can be used to test integrated circuits. In one example, a resistivity probe has a substrate with multiple vias and multiple metal pins. Each of the metal pins is disposed in one of the vias. The metal pins extend out ...  
WO/2018/038321A1
According to one aspect of the present invention, provided is an electronic part inspection device for inspecting an electronic part, comprising: a frame having a single opening part formed on the upper surface thereof; one pair of condu...  
WO/2018/035515A1
Systems and methods for testing semiconductor wafers are disclosed herein. In one embodiment, an apparatus for testing dies of a semiconductor wafer includes: a wafer translator having a wafer-side configured to face the wafer, and an in...  
WO/2018/034500A1
The present invention relates to a ground structure of a semiconductor chip test socket, and a semiconductor chip test socket having the same, the ground structure: preventing the ground structure made of a soft material and mounted in a...  
WO/2018/033380A1
The invention relates to a measuring arrangement (12) for measuring an electric current (I) in the high-current range, in particular in the current range of more than 1 kA, having a low-resistance current measuring resistor (1) for measu...  
WO/2018/034096A1
An electric connection device 1 is provided with: a probe substrate 16; a probe 20 including a linear body part 21 having a leading end 20a that comes into contact with an object to be inspected and having a base end 20b that is in conta...  
WO/2018/035054A1
Systems and methods for testing semiconductor wafers are disclosed herein. In one embodiment, an apparatus for testing dies of a semiconductor wafer includes a composite space transformer for contacting the dies. The composite space tran...  
WO/2018/030438A1
Provided is a conduction inspection device member: that has conductive parts that do not readily crack or develop voids; that does not readily experience impairment of conductive performance, even after repeated conduction inspections; a...  
WO/2018/029155A1
It is herein described a contact probe (20) of a testing head of an apparatus for testing electronic devices comprising a probe body (20C) being extended in a longitudinal direction between respective end portions (20A, 20B) adapted to r...  

Matches 151 - 200 out of 26,928