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Patent Searching and Data


Matches 351 - 400 out of 27,602

Document Document Title
WO/2018/147024A1
A probe 20 that electrically connects to each other a first object to be in contact and a second object to be in contact is provided with: a cylindrical barrel section 50 extending in vertical direction Z; a first plunger section 60, a p...  
WO/2018/146911A1
Provided is a magnetically shielded room that is capable of suppressing positional deviation of a measuring tool in an interior space. The magnetically shielded room 1 is provided with: an upper shielding body 11, side periphery shieldin...  
WO/2018/147246A1
Provided is a jig which enables a probe head to be detached from and attached to an electrical connection device, without using a special holding device. This jig (50) is applicable to an electrical connection device (10) which electrica...  
WO/2018/145143A1
The invention relates to a measuring device such as a multimeter, comprising a retractable assembly, and including (i) a cable comprising a first end portion having a first probe and a second end portion having a second probe; (ii) a ree...  
WO/2018/147511A1
The present invention relates to a bidirectional conductive pin using carbon fiber and a bidirectional conductive pattern module, and a bidirectional conductive socket using the same. The bidirectional conductive pin using carbon fiber a...  
WO/2018/144878A1
A flexible electric probe can include: a flexible substrate; and probe line conductors on the flexible substrate, the probe line conductors being essentially parallel to each other and having separations of about 5-50 microns. The flexib...  
WO/2018/143577A1
Disclosed is a test probe for an object with a barrel-shaped contact terminal having a curved surface. The test probe includes a first contact member configured to comprise a contact portion having a pair of contact surfaces which are ar...  
WO/2018/143541A1
A battery management system may comprise: a charge control switch disposed in a high current path between a plurality of pack terminals and a battery module; and a controller which detects a cell voltage of each of a plurality of cells c...  
WO/2018/142170A1
The invention is a contacting device suitable for measurements and/or other contact tests, the device comprising a head unit comprising a plunger (14) having a broadened portion (28) at its first end, and a head element (16) being on a s...  
WO/2017/179869A3
The present invention relates to an apparatus and a method for protecting a MOSFET relay by using a voltage detector and a signal fuse, wherein a voltage value is calculated by detecting, through a voltage detector, the value of a curren...  
WO/2018/135782A1
A probe card according to an embodiment of the present invention is disposed in a state where two probe assemblies are functionally combined, corresponding to a component non-mounted region (R1) and a component mounted region (R2) of a t...  
WO/2018/093109A3
Disclosed is a probe for testing an electric characteristic of an object to be tested. The probe includes a core with conductive properties and shaped like a bar; and an elastic plating layer made of a material having higher elasticity t...  
WO/2018/135674A1
The present invention relates to a bidirectional conductive pattern module, wherein the bidirectional conductive pattern module comprises: a main body in which a plurality of base substrates having an insulating layer made of an insulati...  
WO/2018/132963A1
A capacitance detection apparatus, an electronic device and a pressure detection apparatus. The capacitance detection apparatus comprises: a coding circuit (110) for periodically charging and discharging at least one capacitor to be dete...  
WO/2018/132064A1
Testing apparatus operable to collect optical performance data of optoelectronic devices at different temperatures includes thermal-adjustment devices in thermal and mechanical contact with the optoelectronic devices via optoelectronic d...  
WO/2018/130684A1
The present invention provides an apparatus for controlling the temperature of a substrate, and a corresponding production method. The apparatus is equipped with a planar main body (1; 1a, 1b) with a substrate contact surface (SF), with ...  
WO/2018/132599A1
Crosstalk between probes in a vertical probe array is reduced by providing a grounded metal carrier disposed between the guide plates of the probe array. The metal carrier includes pockets that are laterally separated from each other by ...  
WO/2018/130965A1
The present invention relates to an enclosure assembly (9) and to a metering apparatus (1), comprising a first enclosure portion (10) and a second enclosure portion (11) which are configured to be assembled by being moved towards each ot...  
WO/2018/129439A2
An integrated circuit device testing system includes a socket configured to receive an integrated circuit device, wherein the socket comprises at least one conductive trace made of a material with a resistivity that is a function of temp...  
WO/2018/128699A1
An automated microtester array, for simultaneously testing a plurality of devices under test, includes a plurality of automated microtesters, wherein each of the plurality of automated microtesters is configured to test a plurality of de...  
WO/2018/128361A1
A probe card according to an embodiment of the present invention comprises: a plurality of probes that are in contact with a test target for transmitting an electrical signal; a probe PCB that has a signal line for distributing and trans...  
WO/2018/124737A1
A probe card of the present invention can adjust the movement amount of a second plate and a needle fall prevention plate when moving the same in a first direction with respect to a first plate in the state where a straight needle has be...  
WO/2018/122041A1
The present invention relates to the field of apparatuses and methods for determining or measuring current. In order to present a solution which enables a lower outlay on apparatus and improved stability with regard to failure with respe...  
WO/2018/123878A1
[Problem] To provide an electric contact, as well as a socket for an electric component, in which the plastic deformation of a spring part can be prevented. [Solution] Disclosed is an electric contact 60 that is configured such that a fi...  
WO/2018/121895A1
The invention relates to an adapter device (10, 110, 210) for positioning at least one conductor (68), such as a conductor pair, for example, of a cable (70) to be measured, which adapter device comprises a receiving device (12) and a ho...  
WO/2018/123876A1
[Problem] To provide an electrical contact and an electrical component socket that are configured to come into electric contact with an electrical component as a result of contact between multiple protrusions and a terminal, such that a ...  
WO/2018/123877A1
[Problem] To provide an electric contact, as well as a socket for an electric component, in which the number of components in the electric contact can be reduced, and the resistance value of the electric contact when a first electric com...  
WO/2018/116568A1
This probe structure for characteristic inspection of a connector having at least one terminal is provided with a plunger, a coaxial probe, a flange, a housing, and a spring. One end of the housing and a through hole of the flange have e...  
WO/2018/118894A1
A shunt (100) is composed of multiple pieces (102,104,106) with at least some of the pieces being connected by a conductive channel (108,110) that provides uniform flow of current. The conductive channel may be a recess, raised portion, ...  
WO/2018/119004A1
A universal multi-pin, adjustable probing assembly (100) or manipulator for use in parametric and reliability testing of devices on a semiconductor wafer. The probing assembly can be mounted and adjusted on a metal platen (120) using a m...  
WO/2018/118075A1
An embodiment includes an apparatus comprising: a substrate including a surface that comprises first, second, and third apertures; and first, second, and third probes comprising proximal ends that are respectively included within and pro...  
WO/2018/118909A1
A thermocouple device includes a shared conductor for a shunt measurement and a thermocouple measurement. For example, the thermocouple device may include a shared conductor that provides a signal to both calculate current of a shunt and...  
WO/2018/113059A1
Provided is a circuit protection component with an external electrical test point. The circuit protection component includes a copper-clad laminate, a protective element with a positive temperature effect of resistance, a conductive comp...  
WO/2018/112166A1
A test probe for use with a testing apparatus. The test probe includes a first portion, a second portion, and a third portion, with hinges between the first and second portions and the second and third portions. The first portion folded ...  
WO/2018/108514A1
The invention relates to a motor vehicle with an electric motor (2), in particular a hybrid or electric vehicle, comprising a high-voltage vehicle electrical system (1) with a high-voltage stored energy source (3) which supplies electric...  
WO/2018/108790A1
A testing head (20), adapted to verify the operation of a device under test integrated on a semiconductor wafer, comprises at least one guide (40, 41, 42) provided with a plurality of guide holes (40h, 41h, 42h) adapted to house a plural...  
WO/2018/110044A1
The purpose of the present invention is to provide a contact probe, the durability of which is improved by reduction of the contraction amount after probing in a high temperature environment. A contact probe 1 is provided with a Ni pipe ...  
WO/2018/108777A1
A probe head (20) is described comprising a plurality of contact probes (21A, 21B, 21C) being slidably housed in respective pluralities of guide holes (25A, 27A, 29A, 36A; 25B, 27B, 29B, 36B; 28C, 29C, 36C) being realized in a plate-shap...  
WO/2018/108675A1
A contact probe (20) for a probe head of an apparatus for testing electronic devices comprises a probe body (20C) being essentially extended in a longitudinal direction between respective end portions (20A, 20B) adapted to realize a cont...  
WO/2018/110979A1
The present invention relates to an electronic component inspection socket configured such that, when an electronic component is inspected, deformation of the electronic component and stress generation thereby are minimized, thereby prev...  
WO/2018/105896A1
The present invention relates to a test socket apparatus and, more specifically, a test socket apparatus comprising: a body part fixedly disposed at a lower side of a test substrate; a cover part which is disposed at an upper side of the...  
WO/2018/105316A1
Provided is, as a probing pin that performs a wiping operation during use and that is also economical, an anisotropically conductive member (probing pin 1) equipped with a coil spring 13 and a contact member having a first contact 11 and...  
WO/2018/105444A1
This probe pin (1) is provided with a plunger (10), a coil spring (20), and a connection member (30). The connection member (30) has a first end surface (32) that faces a third end part (12) of the plunger (10) and a second end surface (...  
WO/2018/103074A1
An electrical test probe (200) is presented. It comprises a test prod (210), a tube (220) and an elastic element (230). The test prod (210) has a first terminal (211) provided to form a contact with a power module to be tested and a seco...  
WO/2018/103337A1
Provided is a battery-pack testing apparatus, relating to the technical field of energy-storage device testing; comprised are a console and a cable bundling assembly; said cable bundling assembly comprises a cable bundle and at least two...  
WO/2018/101232A1
This contact terminal comprising a probe Pr includes: a cylindrical body Pa formed from a conductive material into a cylindrical shape; and center conductors Pb, Pc that are each formed from a conductive material into a rod shape. The ce...  
WO/2018/098871A1
A rotating support platform and an antenna measurement isolation room, solving the problem that, for an electronic device to be tested being placed on a test table, testing of the side of the electronic device facing the test table is di...  
WO/2018/101107A1
This electroconductive particle placement film, which is useful as an inspection probe unit for inspecting the continuity of objects that are to be subjected to fine-pitch continuity inspection such as semiconductor devices, has electroc...  
WO/2018/101674A1
Disclosed is a test device which electrically connects a terminal of an object to be tested and a testing terminal of a testing circuit. The test device includes a signal probe; a ground probe; a conductive block configured to comprise a...  
WO/2018/102259A1
Contact engines, probe head assemblies, probe systems, and associated methods for on-wafer testing of the wireless operation of a device under test (DUT). A contact engine includes a flexible dielectric membrane having a first surface an...  

Matches 351 - 400 out of 27,602