Login| Sign Up| Help| Contact|

Patent Searching and Data


Matches 351 - 400 out of 26,928

Document Document Title
WO/2017/062735A1
A system and method for detecting dynamic electromagnetic emission of an integrated circuit (IC) chip is provided. One embodiment of the method, includes exciting nitro variance (NV) centers of a diamond slide located in close proximity ...  
WO/2017/060946A1
Provided is an inspection substrate in which the length of a conduction path from a device to be inspected to the inspection substrate can be made shorter. An inspection substrate 1 has a through hole 18 penetrating a substrate portion a...  
WO/2017/061651A1
An embodiment of the present invention may comprise: an inner body which is a first column; an upper contact end which is a second column, an inner surface of the second column covering a circumferential surface of one end of the inner b...  
WO/2017/061739A1
The present invention relates to a cryogenic probe station capable of obtaining continuous data regardless of a temperature sweep by enabling a cabling-type stage, in addition to a conventional probe contact-type stage, to be used. The c...  
WO/2017/061656A1
The present invention relates to a Kelvin test probe, a Kelvin test probe module, and a manufacturing method therefor. The Kelvin test probe according to the present invention comprises: an upper insulating sheet made of a ductile materi...  
WO/2017/056879A1
Provided is a contactor that is easy to produce and can ensure a long stroke. A contactor 1 is provided with: a flexible substrate 10; a plurality of contact sections 20 provided to the flexible substrate 10; a plurality of springs 30 th...  
WO/2017/058325A1
A coaxial electrical interconnect is disclosed. The coaxial electrical interconnect can include an inner conductor including an electrically conductive spring probe. The coaxial electrical interconnect can also include an outer conductor...  
WO/2017/057785A1
The present invention relates to a connection connector and, more specifically, to a connection connector which is disposed between a device to be tested and a testing apparatus and is for electrically connecting a terminal of the device...  
WO/2017/057786A1
The present invention relates to a testing connector and, more specifically, to a testing connector which is disposed between a device to be tested and a testing apparatus and is for electrically connecting a terminal of the device to be...  
WO/2017/057542A1
Provided is a probe card-use laminate wiring substrate that includes a laminate of resin layers, wherein the probe card laminate wiring substrate reduces the occurrence of defects such as lamination deviations and chipping caused by an i...  
WO/2017/051054A1
The invention relates to a system and method for prevention against electric discharges and/or electric arcs for people located close to an electrical installation (20). Specifically, the system comprises an actuator device (200, 200') w...  
WO/2017/051263A2
The present invention pertains to a robotic arm to test the functionality of a touchscreen panel of a computing device. It consists of a stylus which is adapted to move into three dimensional space for emulating various touch based movem...  
WO/2017/053881A1
A system, apparatus, and method for using a magnetic latch to maintain a desired force between a test-probe assembly and a surface of a component. The method includes moving the test-probe assembly into an approach position, the approach...  
WO/2017/053958A1
In an embodiment, a latency measuring head is provided for use in measuring touch-to-response latency in a test device, the test device including a capacitive user interface that responds to touch input. The latency measuring head includ...  
WO/2017/053910A1
In one embodiment, the present invention includes an interface apparatus for semiconductor testing. The interface apparatus includes a housing. The housing includes a lower housing substrate and an upper housing substrate. The lower hous...  
WO/2017/046116A1
The electronic module (1) has connectors (8, 10) for connecting to other (identical or similar) electronic modules. The electronic module (1) by itself as well as a plurality of interconnected electronic modules (1) form a parallel bus-b...  
WO/2017/047495A1
This probe pin comprises a coil spring (50), a first plunger (30), and a second plunger (40). The first plunger (30) includes: a first insertion part (31) positioned inside the coil spring (50); and a first contact part (32) that is expo...  
WO/2017/047362A1
Disclosed is a probe pin (15) comprising an electroconductive plunger part (16), and a coil spring (50) arranged so as to be wound around the plunger part (16). In particular, the plunger part (16) includes: a hook-shaped plunger body (3...  
WO/2017/043879A1
A high frequency (RF) probe socket is disclosed. The disclosed RF probe socket comprises: a conductive noise shield main body for shielding the probe socket from noise by accommodating a plurality of signal probes to be parallel with eac...  
WO/2017/043704A1
An ultraviolet photodetector and a method for manufacturing the same are provided. The ultraviolet photodetector comprises: a substrate; a transparent conductive layer formed on the substrate; and a heterojunction layer comprising a firs...  
WO/2017/035871A1
A signal transferring apparatus and a testing system. The signal transferring apparatus comprises multiple first assembling units, multiple second assembling units, multiple gating switches (50, 70), and a circuit board (80) comprising t...  
WO/2017/036621A1
The invention relates to an apparatus (100) for recording a resistance value of a measuring resistor of a measuring sensor, having a passive electrical resonant circuit (101) for generating a predetermined calibration current, wherein th...  
WO/2017/036723A1
The invention relates to a connection device (100) for connecting a measuring device (119) to a connection pole of an energy store of a motor vehicle, comprising a connecting clamp (101) which is designed to surround the connection pole ...  
WO/2017/040972A3
An apparatus and method for an electrocardiogram (ECG) cable suitable for use inside a Magnetic Resonance (MR) scanner during a Magnetic Resonance Imaging (MRI) operation. In particular, the present invention relates to a patient safe (M...  
WO/2017/039936A1
A test system includes a transporter having test sockets, where each test socket is configured to receive a device to be tested by the test system, and each test socket includes an element that is controllable to change a temperature of ...  
WO/2017/040972A4
An apparatus and method for an electrocardiogram (ECG) cable suitable for use inside a Magnetic Resonance (MR) scanner during a Magnetic Resonance Imaging (MRI) operation. In particular, the present invention relates to a patient safe (M...  
WO/2017/034127A1
An apparatus for assembly and disassembly of a cartridge, according to the present invention, automatically assembles a portable chuck, a wafer, and a contactor to provide a finished cartridge, or disassembles the cartridge into the port...  
WO/2017/032532A1
The invention relates to a device for positioning and contacting a test contact (5) of a test contact arrangement that is arranged on a contact carrier (19), wherein the device comprises a contact head (10) having at least one transmissi...  
WO/2017/032575A1
The invention relates to a method for covering an electric unit which is covered with two plastic molded bodies. Said invention also relates to an electric component which was been produced by means of said method.  
WO/2017/033795A1
In the present invention, a socket body in which an IC package is contained is provided with a contact pin 32, and is electrically contacted with a connection terminal of the contained IC package. The contact pin 32 has a plurality of la...  
WO/2017/028960A1
The invention relates to a battery sensor unit (1) having a first fastening device (2) which can be connected to a terminal of a battery, in particular a pole terminal, a resistance element (3), in particular a measuring shunt, a second ...  
WO/2017/026789A1
The present invention relates to a printed circuit board inspection apparatus for inspecting a hole machined on a printed circuit board. Disclosed are a printed circuit board inspection apparatus and a printed circuit board inspection me...  
WO/2017/026997A1
According to an example, operation of a processing device having a plurality of pins may be enabled through a detection that the plurality of pins of the processing device are in electrical communication with a plurality of contacts in a...  
WO/2017/026675A1
A single-phase multi-circuit measurement device (100) according to the present invention calculates electric power using current data, which is derived from a current signal generated by an embedded penetration-type CT, and voltage data,...  
WO/2017/026304A1
A probe pin comprises an elastic part that comprises a plurality of elastic units (31) connected along a center line (CL2) and that expands and contracts along the center line (CL2), and contact parts (41, 51) provided at both ends of th...  
WO/2017/026802A1
Provided are a probe bonding device and a bonding method using the same, the probe bonding device comprising: at least one tray on which a plurality of probes are loaded; a first gripper for gripping the probes loaded on the tray; a form...  
WO/2017/023053A1
The present invention relates to a stage module of a cryogenic, high magnetic field testing device to be utilized in physical, material, and electrical and electronic experiments utilized in the cryogenic and high magnetic field area, an...  
WO/2017/023130A1
The present invention relates to a probe pin bonding apparatus and, more particularly, to a probe pin bonding apparatus for automatically bonding a probe pin to a probe card. One embodiment of the present invention provides a probe pin b...  
WO/2017/022035A1
[Purpose] The present invention provides a probe card that makes it possible to increase the space between a probe and a side wall of a holder that faces the probe. [Structure] A probe card C is provided with a holder 100a, a holder 100g...  
WO/2017/023037A1
One embodiment of the present invention provides a test socket comprising: a plurality of conductive elastic parts arranged at a position corresponding to a terminal of a device to be inspected, and in which a plurality of conductive par...  
WO/2017/015979A1
A test lead line structure (21), which is used for connecting a signal line (22) inside a display apparatus and an external test line (23), and comprises a first insulation layer (211), a second insulation layer (212), a first lead line ...  
WO/2017/014961A1
Electrical current sensing and monitoring methods include connecting a compensation circuit across a conductor having a non-linear resistance such as a fuse element. The compensation circuit injects a current or voltage to the conductor ...  
WO/2017/014908A1
A method and apparatus for testing electronic devices installed in a portable device. The apparatus incorporates a socket with receptacles for alignment pins, and an alignment plate with openings for the alignment pins. The holes for the...  
WO/2017/007200A2
A test socket manufacturing method comprises the steps of: preparing a PCB, which is provided with a bonding pad; bonding a conductive wire on the bonding pad; mounting a space, which exposes the bonding pad, on the upper surface of the ...  
WO/2017/005473A1
The invention relates to an accessory device assembly for low or medium voltage electric applications. The accessory device comprises a casing and electronic means including one or more current sensors configured to detect a current flow...  
WO/2017/008057A1
A ground loss detection circuit identifies a faulty ground connection in a vehicle electrical system including a pair of redundant ground lines connected between a vehicle battery /chassis ground and an electronic control unit (ECU). In ...  
WO/2017/007200A3
A test socket manufacturing method comprises the steps of: preparing a PCB, which is provided with a bonding pad; bonding a conductive wire on the bonding pad; mounting a space, which exposes the bonding pad, on the upper surface of the ...  
WO/2017/005809A1
The invention relates to a contacting device (1) with an electrically conductive contact (4) for reversibly contacting an object (5) to be measured. The contacting device additionally contains a plurality of particles (3) which can be in...  
WO/2017/003700A1
A EUT (equipment under test) positioning device is disclosed. The device comprises a holder element configured to hold EUT, a sliding element configured to move the holder element horizontally, a rotating element attached to the sliding ...  
WO/2016/209087A1
A Kelvin probe system (100) for analyzing a sample for testing (134), the Kelvin probe system comprising: a drive (102) controlled and powered by a drive control/power (103) for rotating an object (106, 120) around a rotational axis; a K...  

Matches 351 - 400 out of 26,928