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WO/2022/173148A2 |
The present invention drives a plurality of capacitances of the present invention, including a shielding capacitance (Cin_sd), to minimize the variation of the voltage detected by a CDA signal line (200), thereby improving the resolution...
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WO/2022/169033A1 |
The present invention relates to an electromagnetic wave measurement device for estimating a near-field electric field by using a far-field electric field, and provides an electromagnetic wave measurement device for estimating a near-fie...
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WO/2022/169196A1 |
The present invention provides an electrically conductive contact pin which prevents a fatigue fracture in a void part by distributing stress concentration in the void part. The electrically conductive contact pin comprises: a first surf...
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WO/2022/160098A1 |
A chip test apparatus and a chip test method, which relate to the field of chip testing, and can meet the test requirements for a high-frequency high-speed chip. The chip test apparatus comprises a chip test base (4), a main circuit boar...
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WO/2022/164489A2 |
Probe systems configured to test a device under test and methods of operating the probe systems are disclosed herein. The probe systems include an electromagnetically shielded enclosure, which defines an enclosed volume, and a temperatur...
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WO/2022/163007A1 |
This probe device (1) comprises a flange (2), an external plunger (3) that is disposed below the flange (2), a coupling member (7), an elastic member (5) that is provided between the flange (2) and external plunger (3), a coaxial cable (...
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WO/2022/164173A1 |
The present invention has been made to solve a problem of electrode pads, a pitch interval between which has recently become narrower so that, due to the densely formed electro-conductive pins, when an electro-conductive contact pin come...
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WO/2022/158032A1 |
The probe unit according to the present invention comprises a contact probe with which electrodes to be contacted are contacted at both lengthwise direction ends, and a probe holder provided with an insulative body that holds the contact...
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WO/2022/157211A1 |
The present invention relates to a measurement system (100) for determining voltage and current or incident and reflected wave at at least one port of a device under test (OUT). The OUT is excited by at least one modulated signal. The me...
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WO/2022/151702A1 |
A multi-parameter detection opto-mechatronics calculation and control integration apparatus for a multi-section MEMS probe, belonging to the technical fields of precision testing and metering, micro-electro-mechanical systems, IC chip te...
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WO/2022/152357A1 |
The present invention relates to a device (1) for monitoring the state of an electrical conductor network, comprising a feeding coil (2) for feeding a test current and/or a test voltage, a receiving coil (3) for receiving a reaction of t...
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WO/2022/153536A1 |
Provided is a probe card capable of simultaneous measurement of both the optical and electrical characteristics of an opto-electronic device. The present invention is provided with probe pins for measuring the electrical characteristics,...
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WO/2022/153712A1 |
This electrical connection device comprises: a first guide plate having a first guide hole through which a probe passes; a second guide plate having a second guide hole through which the probe passes; and an introduction film which is ar...
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WO/2022/151703A1 |
A method for chip testing in a wide temperature range working environment, belonging to the technical fields of precision testing and metering, micro-electro-mechanical systems, IC chip testing and probe cards. The method comprises a met...
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WO/2022/149783A1 |
Disclosed is a test socket. The test socket includes a base frame shaped like a plate having a plurality of probe holes and conductive probes accommodated in the plurality of probe holes, having terminal portions protruding from both sid...
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WO/2022/145934A1 |
Disclosed is a test device for testing electrical characteristics of an object-to-be-tested. The test device includes a test socket comprising a probe configured to transmit a test signal to the object-to-be-tested, a pusher body coupled...
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WO/2022/141360A1 |
An abnormal discharge detection apparatus for an electronic actuator, relating to the technical field of electronic actuators. The detection apparatus comprises a detection apparatus body (1), a notch (14) is formed in one side of the de...
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WO/2022/145558A1 |
The present invention relates to: a contact pin enabling a maximum compression distance to be ensured while having the minimum length suitable for a test of a high speed signal semiconductor device (IC); and a spring contact and a socket...
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WO/2022/139225A1 |
An aerosol-generating device is disclosed. The aerosol-generating device of the present disclosure includes a first container configured to accommodate an aerosol-generating substance, a heater configured to heat the aerosol-generating s...
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WO/2022/139346A1 |
A battery state estimation system and method for an energy-independent smart sensor are provided. In order to monitor the voltage and the current for each operation state of a sensor to utilize same for the state estimation of a battery ...
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WO/2022/134853A1 |
A convenient testing device and an oven. The convenient testing device comprises: a housing, a testing terminal (2) and a testing bracket (3), wherein the housing is provided with a testing opening (11); the testing bracket (3) is mounte...
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WO/2022/136027A1 |
A method (200) is disclosed for testing of wireless power transfer equipment (20) that has a plurality of wireless power transmitters (22a-n) adapted for concurrent wireless power transfer to respective wireless power receiver devices (1...
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WO/2022/132034A1 |
: An optoelectronic module comprising: a radiation-emitting device; a housing comprising a wall or walls laterally surrounding the radiation-emitting device; two or more terminals disposed on a surface of the wall or walls; a transparent...
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WO/2022/127055A1 |
Provided is a detection and gating module in a battery management system. The detection and gating module is used for choosing to detect the voltage of each battery in a battery pack of N batteries connected in series, wherein N ≥ 1. T...
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WO/2022/132483A1 |
An interposer for a test system includes coaxial cables, each of which is configured to transport a first portion of current originating from a current source, and printed circuit boards (PCBs), each of which is connected to a set of the...
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WO/2022/131429A1 |
The present invention relates to a semiconductor device burn-in and test contact, and a socket device comprising same, and the contact according to the present invention comprises: an upper terminal part (111) having an upper tip portion...
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WO/2022/132331A1 |
The present disclosure relates to a radio frequency (RF) functional probe for testing an RF device in a cryogenic environment. The RF functional probe includes a probe head configured to receive the RF device, a flange structure, an isol...
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WO/2022/128253A1 |
The present invention relates to an individually contacting apparatus (100) for a testing device (500) for testing the continuity of a connector (200), wherein the individually contacting apparatus (100) has a contact pin (102) to be pla...
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WO/2022/122866A1 |
It is herein disclosed a contact probe (20) having a first end portion (20A) which ends with a contact tip (20F) adapted to abut onto a contact pad of a device under test and a second end portion (20B) which ends with a contact head (20E...
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WO/2022/110857A1 |
The present invention belongs to the technical field of probe cards, and particularly relates to a wedge amplitude-modulation probe card and a main body thereof. The probe card comprises a probe card main body, upper wedge plates and low...
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WO/2022/112182A1 |
It is herein described a contact probe (20) having a first contact end portion (20B) adapted to abut onto a contact pad of a device under test and a second contact end portion (20A) adapted to abut onto a contact pad of a PCB board of a ...
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WO/2022/113489A1 |
This probe comprises: an inner housing that is formed in a columnar shape and that has one end section and another end section, the inner housing being such that a coaxial cable is inserted therein; a probe pin that is electrically conne...
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WO/2022/114855A1 |
The present disclosure relates to a 5th generation (5G) or pre-5G communication system for supporting a higher data transmission rate than a 4th generation (4G) communication system such as long term evolution (LTE). A method for measuri...
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WO/2022/112100A1 |
A flexible membrane (30) adapted to carry high-frequency power signals is described, the membrane comprising a plurality of contact pads (31A, 31B) adapted to electrically connect with a plurality of micro contact probes (25) and made in...
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WO/2022/112480A1 |
It is herein disclosed a method for manufacturing a probe head (50) for the functionality testing of devices under test (DUT). The method comprises the steps of providing a containment element (55), arranging a lower guide (60) at a lowe...
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WO/2022/110355A1 |
A make-and-break testing device and method for a product housing. The make-and-break testing device for a product housing comprises a test apparatus and a soft contact element (1) installed at an end portion of the test apparatus. The so...
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WO/2022/112479A1 |
It is herein disclosed a method for manufacturing a probe card (20) for the functionality testing of devices under test (DUT), comprising the steps of providing an interface board (22) configured for interfacing the probe card (20) to a ...
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WO/2022/107225A1 |
The purpose of the present invention is to provide a probe-card multilayer wiring substrate that makes it possible to prevent deterioration of a thin-film resistor 30. A probe-card multilayer wiring substrate (ST substrate) 15 is provide...
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WO/2022/106846A1 |
The present invention provides a method of forming a circuit board assembly, the circuit board assembly comprising a first PCB (110), a second PCB (190), an RF signal connector (120) for carrying RF signals therebetween, and one or more ...
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WO/2022/101295A1 |
It is herein disclosed a probe head (20) for testing the operation of a device under test, said probe head (20) comprising a plurality of contact probes (10) comprising a body (10') extending along a longitudinal axis (H-H) between respe...
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WO/2022/101288A1 |
It is herein disclosed a contact element (10) for a probe head for an electronic device test apparatus, the contact element (10) comprising a body (10', 10pp) extending along a longitudinal axis (H-H) between a first contact end (10a), w...
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WO/2022/102918A1 |
A battery module according to the present invention comprises: a cell stack composed of a plurality of battery cells stacked in one direction; and a sensing module arranged at the front or rear of the cell stack, for voltage sensing and ...
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WO/2022/097884A1 |
The present invention relates to a method for assigning a communication ID, and a system providing same method. The system for assigning a communication ID of the present invention comprises a plurality of slave battery management system...
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WO/2022/096578A1 |
A ultra-wideband interconnection probe (100) connectable to a first access port of a first electronic device (101), the first access port comprising a first tapered coupler (101a) and to a second access port of a second electronic device...
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WO/2022/093449A1 |
A current sensor circuit comprises multiple resistive circuit elements of different values of electrical resistance arranged between at least one input terminal of the current sensor circuit and an output terminal; a first plurality of s...
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WO/2022/091931A1 |
The present invention provides an inspection jig which does not readily break. This inspection jig is provided with: a substrate which is electrically connected to a connector to be inspected; a first mobile member onto and from which ...
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WO/2022/085483A1 |
Provided is a contact probe (1) comprising: a first plunger (30), which has a distal end section (311) and a proximal end section (33); and a spring (70) which biases the first plunger (30), wherein the surface of the distal end section ...
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WO/2022/086097A1 |
Disclosed in the present invention is a battery test device capable of diagnosing defects, or an inspection device capable of diagnosing defects in a battery test device. According to one aspect of the present invention, the battery test...
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WO/2022/077694A1 |
A differential probe and a control method therefor. The differential probe comprises a probe body, a first contact element (200), a second contact element (300) and a driving mechanism (400). The probe body comprises a shell (100), and t...
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WO/2022/080920A1 |
Embodiments of the present invention relate to a connection diagnosis device for diagnosing a connection state between devices. The connection diagnosis device may comprise: an output terminal and an input terminal that are formed to be ...
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