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Patent Searching and Data


Matches 401 - 450 out of 27,310

Document Document Title
WO/2017/179320A1
A probe pin (10) is provided with: a coil spring (11) which extends and contracts along a centerline; a first contact (25) which has a rectangular cross section and is disposed at one end on the centerline; and a second contact (34) whic...  
WO/2017/178105A1
A contact pin (100; 100 12, 100 32) for electrically connecting a first electrical contact area (13), which is arranged on a measurement object (300) to be measured, and a second electrical contact area (17), which is arranged in a test ...  
WO/2017/178327A1
The invention relates to a cable (20) which is used to test a transformer (2) and connects the transformer (2) to a testing device (10). The cable (2) has at least two twin cables (23-25). Through a first conductor of every twin cable (2...  
WO/2017/175573A1
Provided is a probe card with which the adjustment of height deviations of needle tip parts of probes and the adjustment of parallelism between the probes and an object to be inspected are simplified. The probe card 1 has: a wiring subst...  
WO/2017/175984A1
An embodiment provides an anisotropic conductive sheet for electrically connecting a terminal of a device to be tested and a pad of a testing device, the sheet comprising a plurality of conductive portions which are formed in a thickness...  
WO/2017/176731A1
A resistor assembly can include a resistor having a first end and a second end, and a conductive member, where the conductive member is coupled to the first end of the resistor. The resistor assembly can also include a shield cup and a h...  
WO/2017/081096A9
The invention relates to a contact pin (2), in particular a spring contact pin, comprising a jacket sleeve (4), in which a contact plunger (5) is guided in a longitudinally displaceable manner. At least one light source (15) is provided,...  
WO/2017/176508A1
Shielded probe systems are disclosed herein. The shielded probe systems are configured to test a device under test (DUT) and include an enclosure that defines an enclosure volume, a translation stage with a stage surface, a substrate-sup...  
WO/2017/167732A1
At least two redundant analog input units (1, 2) for a measurement current (I) have analog inputs (3, 4) which are connected in parallel and on which voltage measuring devices (8, 19) directly lie in order to convert the respective appli...  
WO/2017/172917A1
Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges are disclosed herein. The methods are configured to test a plurality of devices under test (DUTs) present on a substrate. The probe system...  
WO/2017/173279A1
The present disclosure relates to nucleic acid probes and kits for determining the length of a region of tandem repeats in a subject's genome and methods of using the DNA probes for determining the length of a region of tandem repeats in...  
WO/2017/169760A1
The purpose of the invention is to reduce, in an electronic device having an electrode formed on a principal surface, the misplacement of a probe pin or the breakage of the electrode. This electronic device 1a is an electronic device to ...  
WO/2017/171339A1
Disclosed is a test socket unit for electrically connecting a test object and a test circuit device. The test socket unit includes: a plurality of support locking pins configured to be stationarily installed on the surface of the test su...  
WO/2017/169761A1
The purpose of the invention is to improve measurement accuracy at the time of nondestructively measuring, in a wiring board having an electrode made of a plurality of plating layers, the thickness of each plating layer of the electrode ...  
WO/2017/172115A2
A prober head to interface an E-testing apparatus to a device under test, which may be an unpackaged die, for example. In some embodiments, the prober head includes an array of conductive pins, each of the pins extending outwardly from a...  
WO/2017/162382A1
The invention relates to a cover (4) for a housing (7), comprising a number of press-fit pins (3, 5) which have at least two different press-fit zones (3a, 3b). The invention also relates to a battery sensor having a cover of this type, ...  
WO/2017/164631A1
Disclosed is a test socket assembly for electrically connecting a contact point to be tested in a test object and a contact point for testing in a testing circuit. The test socket assembly includes: a plurality of signal probes; a socket...  
WO/2017/156780A1
A radio-frequency detection apparatus, comprising a PCB circuit board (10), a probe carrier board (20) and a test board (30). The PCB circuit board (10) is provided on the probe carrier board (20). The test board (30) is located under th...  
WO/2017/160254A1
This invention refers to electric meter and/ or electrical energy measuring tool (A), without connector block that is used for input and output connection of current and /or energy transmitted cables (14), in place of this current and /o...  
WO/2017/160090A2
The present invention relates to a device and a method for manufacturing a probe pin and, more particularly, to a device and a method for manufacturing a probe pin by polishing a pointed end of a metal wire. The present invention provide...  
WO/2017/156779A1
A test probe (20) of a detection apparatus. The test probe comprises a probe sheath (10) and the probe (20). The probe sheath (10) comprises a first connecting end (11), a second connecting end (12) and a connecting lead (13). The connec...  
WO/2017/155707A1
A temperature-controlled fluid forcing system includes a temperature control system generating a stream of flowing temperature-controlled fluid. A heat exchanger includes a thermally conductive housing within which a plurality of walls d...  
WO/2017/153997A1
The present invention provides a method for determining consumption of appliances within a surveyed household in which there are no sensors for measuring consumption of specific appliances. The method comprises - pre-processing historica...  
WO/2017/155134A1
The present invention relates to a probe member for inspection and, more particularly, to a probe member for inspection in which at least a part thereof is inserted into a cylindrical body and an upper end thereof is in contact with a te...  
WO/2017/155155A1
A bidirectional conductive module for testing a semiconductor device, according to one embodiment of the present invention, comprises: a substrate part having a structure bent such that one surface thereof faces the semiconductor device ...  
WO/2017/152326A1
An Internet of Things-based novel oscilloscope comprising a housing (1), a handle (2) provided on the housing (1), a fixing apparatus (10) provided under the housing (1), a display interface (3) provided on the housing (1), a storage int...  
WO/2017/156245A1
Systems, devices, and methods for characterizing semiconductor devices and thin film materials. The device consists of multiple probe tips that are integrated on a single substrate. The layout of the probe tips could be designed to match...  
WO/2017/152567A1
An oscilloscope probe, method, apparatus and system for testing a ripple. The oscilloscope probe comprises a first connector (22) connected to an oscilloscope, and a signal probe (24) and a ground probe (26), wherein the signal probe (24...  
WO/2017/151231A1
An example test system includes a test head and a probe card assembly connected to the test head. The probe card assembly includes: a probe card having electrical contacts, a stiffener connected to the probe card to impart rigidity to th...  
WO/2017/150232A1
A multilayer wiring substrate for probe cards, which has a laminate of resin layers, and which is suppressed in the production cost by reducing the occurrence of defects such as chipping by covering a ceramic substrate with a resin. A mu...  
WO/2017/145706A1
The present invention addresses the problem of achieving a method such as isotropic etching for bending a thin film member in which the etching stop position differs from the position at which bending from IIB processing begins. Provided...  
WO/2017/146256A1
Provided is a current transformer in which an integrated connecting mechanism capable of opening/closing a core and waterproof performance are achieved through a simple structure, which can be given a reduced size and weight overall, and...  
WO/2017/147005A1
A transfer system includes a first mechanical element including a portion of a one of a support platform and a transfer device; a second mechanical element including a portion of a one of the support platform and the transfer device; and...  
WO/2017/140496A1
The invention relates to a measuring resistor calibration device (10), comprising a measurement terminal (24), a reference resistor (30), a reference connection (52) and an analog-to-digital converter (60), wherein the measuring resistor...  
WO/2017/141706A1
Provided is a conductive contact having a first end and a second end that is opposed to the first end. The first end has first to fourth linear ridges and first to fifth tips. The first to fourth ridges are arranged so as to be separated...  
WO/2017/140874A1
The invention relates to a battery sensor in which a voltage is measured via a shunt resistor with alternating parallel connection of a reference resistor. Furthermore, the invention relates to a corresponding method and to a correspondi...  
WO/2017/141327A1
Provided is a ground fault point locating system for locating a ground fault point in a distribution system, said system being characterized by being provided with measurement devices that are respectively disposed at a plurality of loca...  
WO/2017/140589A1
The invention relates to a method for determining a calibration current pulse when it is superimposed by a useful current pulse, wherein the calibration current pulse is computationally determined after measurement over a plurality of me...  
WO/2017/141561A1
This probe pin comprises an elastic cylindrical body that expands and contracts along the central axis thereof, a conductive first plunger that extends into the interior of the elastic cylindrical body along the central axis from one end...  
WO/2017/141564A1
This probe pin comprises an insulating elastic member (11), a first plunger (20) and a second plunger (40). The first plunger (20) and the second plunger (40) respectively comprise fist conductors (30, 50) and second conductors (35, 55) ...  
WO/2017/138305A1
[Problem] To provide a contact terminal, an inspection jig, and an inspection device, whereby generation of a magnetic field due to inspection can be reduced. [Solution] A contact terminal Pr is provided with a conductive outer cylindric...  
WO/2017/138380A1
[Problem] To provide an inspection jig, an inspection jig set, and a substrate inspection device capable of shortening inspection time while temperature stress is applied to a substrate to be inspected. [Solution] An inspection jig (3D) ...  
WO/2017/134057A1
The invention relates to a method and a device for reconstructing a useful signal from an acquired signal made up of a plurality of samples representing physical quantities measured, the acquired signal including said useful signal made ...  
WO/2017/129999A1
A transmission line arrangement having a first end and a second end, the transmission line arrangement being configured to transmit a signal between the first end and the second end, the transmission line arrangement comprising a signal ...  
WO/2017/131394A1
The present invention relates to a test socket for a semiconductor device using an air gap, the test socket comprising: a shield unit which has a plurality of clearance openings which are vertically perforated apart from each other, and ...  
WO/2017/127578A1
A multichannel clip device and methods of use that facilitate connection of multiple electrical components of a first device and a second device for testing and/or verification are provided herein. Such multichannel clip devices can incl...  
WO/2017/126877A1
The present invention relates to an electric characteristic inspection pin and, more particularly, to an electric characteristic inspection pin capable of performing stable electric characteristic inspection and an inspection unit having...  
WO/2017/125661A1
Disclosed is a current-measuring device (1, 10) protected against surge voltages if the device (1, 10) is opened. The device (1, 10) comprises a first current transformer (2), a first connecting terminal (4) to which a first terminal (21...  
WO/2017/126782A1
The present invention relates to a bidirectional conductive pattern module for testing a semiconductor, a semiconductor test socket using the same, and a manufacturing method for the bidirectional conductive pattern module for testing a ...  
WO/2017/121489A1
The invention relates to an arrangement and a method for measuring integral field variables of current-carrying assemblies, in which a dielectric waveguide is arranged along the path that contributes to the integration, said waveguide be...  

Matches 401 - 450 out of 27,310