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WO/2012/059335 |
The present invention relates to a partial discharge sensor (11) for a high- voltage insulation monitoring device (11; 13) comprising a housing (15) and located in the housing (15) a measurement circuit (17) for measurement of partial di...
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WO/2012/061568 |
Resilient electrical interposers that may be utilized to form a plurality of electrical connections between a first device and a second device, as well as systems that may utilize the resilient electrical interposers and methods of use a...
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WO/2012/057502 |
The present invention relates to an improvement in the performance of one or more surface contact-type probes. More particularly, the present invention relates to a probe apparatus for measuring constant-pressure electric resistance (Kor...
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WO/2012/057799 |
In one embodiment, an automated test equipment (ATE) system includes a tester having a tester electronics module, an application specific electronics module, and a tester-to-device under test (DUT) interface mount. The tester electronics...
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WO/2012/057991 |
The present invention relates to an apparatus for testing of back-contact solar cells. In one embodiment, the apparatus includes a support plate having vacuum holes with suction cups partially within the holes and probe pins within the s...
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WO/2012/051801 |
A test pin assembly with electrostatic discharge (ESD) protection comprising a tubular barrel which includes a crimp (14) separating said barrel into a first portion (11a) and a second portion (11b), a first resilient means (15) containe...
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WO/2012/051695 |
The present invention allows simultaneous measurement of current and voltage produced by a PV cell by removably pressing first and second parallel spaced apart closely adjacent sensing conductors, electrically insulated from each other, ...
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WO/2012/048546 |
A single-board power-on device includes power-on rods (2) provided with extensible hooks. Power-on spring contacts serving as connection points for the single-board power supply are provided on the single-board. The device also includes ...
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WO/2012/045551 |
Additional connection plug (10) for electrical conductors, for plugging into direct plugging connections (25) with clamping spring (7) and self-locking of connection devices (6) of connection terminals (2), with a housing (11) with a con...
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WO/2012/041578 |
The invention relates to a high frequency test probe (8) for detachably contacting a high frequency contact partner (30) having an inner and an outer contact, in particular a high frequency socket or high frequency connector or a contact...
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WO/2012/043658 |
[Problem] To provide a mullite sintered object with excellent chemical resistance, a circuit board using the same, and a probe card on which the circuit board has been applied. [Solution] A mullite sintered object with excellent chemical...
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WO/2012/042457 |
Battery current sensor comprising a battery post connection clamp portion (2) comprising a tubular clamping body configured to be clamped around a terminal post (3) of a battery (5), and a current sensing portion (16) comprising a magnet...
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WO/2012/043449 |
Provided is a structure having circuit boards connected therein, wherein an anisotropic conductive member is connected to a rigid circuit board having a first electrode and a flexible circuit board having a second electrode as a land usi...
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WO/2012/039226 |
Provided is an inspecting jig (1) for electrically inspecting a printed wiring board and the like, wherein an electrode section (40) is configured by having an electrode (41) disposed on the surface of an electrode plate (42), a contact ...
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WO/2012/039916 |
A system for the measurement of degradation of electrical wire insulation quality is described. The system includes a clamping device for engaging the electrical wire to be tested for insulation degradation, the clamping device comprisin...
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WO/2012/036922 |
The present invention is a probe array for probing a device using a power probe pin with one or more projections or skates to enhance scrub performance and having a width greater than the input signal probe pin to avoid high current dama...
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WO/2012/037055 |
The present invention relates generally to detecting energy theft within an energy distribution system and more particularly to systems and methods for detecting energy discrepancies in voltages and/or currents reported by electric meter...
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WO/2012/033338 |
The invention relates to a probe card, comprising a plurality of unit plates including a pad area and a contact probe area, a plurality of electrode pads formed on the pad area, a plurality of contact probes formed on the contact probe a...
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WO/2012/033802 |
The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that in...
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WO/2012/023792 |
A probe unit is provided. The probe unit for testing a liquid crystal panel includes a body block configured to have a bottom surface to which a tab IC film for use in the liquid crystal panel is attached while one end of the tab IC film...
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WO/2012/023792 |
A probe unit is provided. The probe unit for testing a liquid crystal panel includes a body block configured to have a bottom surface to which a tab IC film for use in the liquid crystal panel is attached while one end of the tab IC film...
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WO/2012/024050 |
An electrical probe and associated method are provided to establish electrical contact with a wire. The electrical probe includes an elongate member extending between opposed first and second ends, and first and second needles connected ...
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WO/2012/014905 |
In order to manufacture a large number of contacts each having an insulating coating in an arbitrarily defined position, this method comprises a step for forming a plated layer produced from a conductive material around a core to form a ...
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WO/2012/015869 |
A system for positioning a load including a support column, a drive rail unit coupled to the support column, the drive rail unit moveable relative to the support column, a vertical carriage moveable along the support column, wherein the ...
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WO/2012/014673 |
Disclosed is an inspection jig (1), wherein a contact (10) in which a conductive contact pin (11) and a coil spring (12) are arranged in series or overlapping one another is thereby held in a contact holder (20) and presses on an electro...
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WO/2012/014331 |
A contact sheet (20) comprises: a contact ball (24) that has a core member (25) which is configured of a resin material, and a coating layer (26) which is configured of a metal material and covers the surface of the core member (25); and...
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WO/2012/014935 |
When the electrical characteristics of an inspection target are measured, higher magnification and higher resolution of an SEM image and real time performance are realized without affecting the electrical characteristics of the inspectio...
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WO/2012/015869 |
A system for positioning a load including a support column, a drive rail unit coupled to the support column, the drive rail unit moveable relative to the support column, a vertical carriage moveable along the support column, wherein the ...
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WO/2012/012702 |
An adjustable insertion assembly for an electrochemical sensor includes an electrode holder to receive the sensor, having a distal aperture to permit process fluid to contact the sensor. A receptacle slidably receives the holder, for a s...
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WO/2012/008128 |
Provided is a probe pin for semiconductor inspection devices, wherein tin, which is the main component of a solder, is prevented from adhering to the contact section of the probe pin when the probe pin comes into contact with the solder,...
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WO/2012/008502 |
Disclosed is a ceramic member, which is a sintered body containing enstatite and boron nitride as constituents, said boron nitride being oriented in one direction. Also disclosed is a method of producing the ceramic member and a probe ho...
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WO/2012/008541 |
A plate-shaped contact probe (20) connecting different substrates, and being provided with: a conduction part which comprises a first contact section (21) that has a side surface curved in an arc shape at a leading end and is in contact ...
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WO/2012/005234 |
Provided is a member for lathe processing which, when used for forming, by lathe processing, a product configured of materials including a rare and expensive material, can inhibit such material from being wasted and attain a reduction in...
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WO/2012/001157 |
The invention relates to a current sensor (1) comprising at least one resistance element (2) on which voltage (U GS ) for measuring the current (i Mess ) flowing through the resistance element (2) is detected. Said resistance element (2)...
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WO/2012/002763 |
A method of fabricating a test probe includes a first conductive providing operation in which a first conductive member formed of a conductive metal material is provided, the first conductive member including a probe portion that has a p...
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WO/2012/002763 |
A method of fabricating a test probe includes a first conductive providing operation in which a first conductive member formed of a conductive metal material is provided, the first conductive member including a probe portion that has a p...
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WO/2011/162362 |
The disclosed contact probe is provided with: a conductive first flange (21) that coaxially has a tip section (21a) having a tapered tip shape, a flange section (21c) extending from the base end of the tip section (21a) and having a diam...
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WO/2011/162363 |
Disclosed is a method for producing a probe holder (3) provided with: an insulating holder member (31) that holds a plurality of contact probes (2) that perform input/output of signals from/to a circuit structure; and a substrate (32) th...
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WO/2011/161855 |
Provided are a contact head which is configured so that contact sections are less likely to be crushed and damage to an electrode is reduced, a probe pin which is provided with the contact head, and an electrical connection device which ...
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WO/2011/157048 |
A generation device for very fast transient overvoltage (VFTO) is disclosed, which comprises an impulse voltage generator (11), an overhead line (12), a high-voltage bushing (13), a housing (10), a first bus section (14), a first harmoni...
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WO/2011/153787 |
An environmental simulation device for testing the normal operating cell temperature (NOCT) of a module is provided, which belongs to the technical field of solar module testing equipment. The device comprises an environmental simulation...
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WO/2011/153054 |
To provides a contact holder, capable of compensating a change of signal transmission characteristic at the outer edge area of the substrate. A substrate 21 has grounding conductive layers 291, 292 arranged on or above surfaces 212, 213 ...
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WO/2011/153054 |
To provides a contact holder, capable of compensating a change of signal transmission characteristic at the outer edge area of the substrate. A substrate 21 has grounding conductive layers 291, 292 arranged on or above surfaces 212, 213 ...
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WO/2011/150873 |
A testing fixture comprises a base. A horizontal rail is set on the said base, and a horizontally movable bracket is set on the said horizontal rail. A carrier plate used for carrying the object to be tested is also set on the said base....
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WO/2011/152588 |
The present invention relates to a probe for inspecting electronic components, and more particularly, to a probe for inspecting electronic components which connects an electronic component, which is an inspection object, to an inspecting...
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WO/2011/150873 |
A testing fixture comprises a base. A horizontal rail is set on the said base, and a horizontally movable bracket is set on the said horizontal rail. A carrier plate used for carrying the object to be tested is also set on the said base....
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WO/2011/149203 |
The present invention relates to a structure for a spring contact, comprising: an upper contact pin including a cylindrical contact portion and a head portion configured with a plurality of contact projections on the circumferential end ...
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WO/2011/148540 |
A probe is precisely positioned and is mounted at a fine pitch. Disclosed is a probe structure which communicates electric signals with a device to be tested and which is provided with: a contact point for transmitting electric signals; ...
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WO/2011/149203 |
The present invention relates to a structure for a spring contact, comprising: an upper contact pin including a cylindrical contact portion and a head portion configured with a plurality of contact projections on the circumferential end ...
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WO/2011/145877 |
The present invention relates to a touch pin of a touch sensor testing apparatus, and particularly, to a touch pin of a touch sensor testing apparatus in which an air cylinder for providing uniform pressure is employed, and a coating lay...
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