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Patent Searching and Data


Matches 1 - 50 out of 26,632

Document Document Title
WO/2018/129439A2
An integrated circuit device testing system includes a socket configured to receive an integrated circuit device, wherein the socket comprises at least one conductive trace made of a material with a resistivity that is a function of temp...  
WO/2018/128699A1
An automated microtester array, for simultaneously testing a plurality of devices under test, includes a plurality of automated microtesters, wherein each of the plurality of automated microtesters is configured to test a plurality of de...  
WO/2018/128361A1
A probe card according to an embodiment of the present invention comprises: a plurality of probes that are in contact with a test target for transmitting an electrical signal; a probe PCB that has a signal line for distributing and trans...  
WO/2018/124737A1
A probe card of the present invention can adjust the movement amount of a second plate and a needle fall prevention plate when moving the same in a first direction with respect to a first plate in the state where a straight needle has be...  
WO/2018/122041A1
The present invention relates to the field of apparatuses and methods for determining or measuring current. In order to present a solution which enables a lower outlay on apparatus and improved stability with regard to failure with respe...  
WO/2018/123878A1
[Problem] To provide an electric contact, as well as a socket for an electric component, in which the plastic deformation of a spring part can be prevented. [Solution] Disclosed is an electric contact 60 that is configured such that a fi...  
WO/2018/121895A1
The invention relates to an adapter device (10, 110, 210) for positioning at least one conductor (68), such as a conductor pair, for example, of a cable (70) to be measured, which adapter device comprises a receiving device (12) and a ho...  
WO/2018/123876A1
[Problem] To provide an electrical contact and an electrical component socket that are configured to come into electric contact with an electrical component as a result of contact between multiple protrusions and a terminal, such that a ...  
WO/2018/123877A1
[Problem] To provide an electric contact, as well as a socket for an electric component, in which the number of components in the electric contact can be reduced, and the resistance value of the electric contact when a first electric com...  
WO/2018/116568A1
This probe structure for characteristic inspection of a connector having at least one terminal is provided with a plunger, a coaxial probe, a flange, a housing, and a spring. One end of the housing and a through hole of the flange have e...  
WO/2018/118894A1
A shunt (100) is composed of multiple pieces (102,104,106) with at least some of the pieces being connected by a conductive channel (108,110) that provides uniform flow of current. The conductive channel may be a recess, raised portion, ...  
WO/2018/119004A1
A universal multi-pin, adjustable probing assembly (100) or manipulator for use in parametric and reliability testing of devices on a semiconductor wafer. The probing assembly can be mounted and adjusted on a metal platen (120) using a m...  
WO/2018/118075A1
An embodiment includes an apparatus comprising: a substrate including a surface that comprises first, second, and third apertures; and first, second, and third probes comprising proximal ends that are respectively included within and pro...  
WO/2018/118909A1
A thermocouple device includes a shared conductor for a shunt measurement and a thermocouple measurement. For example, the thermocouple device may include a shared conductor that provides a signal to both calculate current of a shunt and...  
WO/2018/113059A1
Provided is a circuit protection component with an external electrical test point. The circuit protection component includes a copper-clad laminate, a protective element with a positive temperature effect of resistance, a conductive comp...  
WO/2018/112166A1
A test probe for use with a testing apparatus. The test probe includes a first portion, a second portion, and a third portion, with hinges between the first and second portions and the second and third portions. The first portion folded ...  
WO/2018/108514A1
The invention relates to a motor vehicle with an electric motor (2), in particular a hybrid or electric vehicle, comprising a high-voltage vehicle electrical system (1) with a high-voltage stored energy source (3) which supplies electric...  
WO/2018/108790A1
A testing head (20), adapted to verify the operation of a device under test integrated on a semiconductor wafer, comprises at least one guide (40, 41, 42) provided with a plurality of guide holes (40h, 41h, 42h) adapted to house a plural...  
WO/2018/110044A1
The purpose of the present invention is to provide a contact probe, the durability of which is improved by reduction of the contraction amount after probing in a high temperature environment. A contact probe 1 is provided with a Ni pipe ...  
WO/2018/108777A1
A probe head (20) is described comprising a plurality of contact probes (21A, 21B, 21C) being slidably housed in respective pluralities of guide holes (25A, 27A, 29A, 36A; 25B, 27B, 29B, 36B; 28C, 29C, 36C) being realized in a plate-shap...  
WO/2018/108675A1
A contact probe (20) for a probe head of an apparatus for testing electronic devices comprises a probe body (20C) being essentially extended in a longitudinal direction between respective end portions (20A, 20B) adapted to realize a cont...  
WO/2018/110979A1
The present invention relates to an electronic component inspection socket configured such that, when an electronic component is inspected, deformation of the electronic component and stress generation thereby are minimized, thereby prev...  
WO/2018/105896A1
The present invention relates to a test socket apparatus and, more specifically, a test socket apparatus comprising: a body part fixedly disposed at a lower side of a test substrate; a cover part which is disposed at an upper side of the...  
WO/2018/105316A1
Provided is, as a probing pin that performs a wiping operation during use and that is also economical, an anisotropically conductive member (probing pin 1) equipped with a coil spring 13 and a contact member having a first contact 11 and...  
WO/2018/105444A1
This probe pin (1) is provided with a plunger (10), a coil spring (20), and a connection member (30). The connection member (30) has a first end surface (32) that faces a third end part (12) of the plunger (10) and a second end surface (...  
WO/2018/103074A1
An electrical test probe (200) is presented. It comprises a test prod (210), a tube (220) and an elastic element (230). The test prod (210) has a first terminal (211) provided to form a contact with a power module to be tested and a seco...  
WO/2018/103337A1
Provided is a battery-pack testing apparatus, relating to the technical field of energy-storage device testing; comprised are a console and a cable bundling assembly; said cable bundling assembly comprises a cable bundle and at least two...  
WO/2018/101232A1
This contact terminal comprising a probe Pr includes: a cylindrical body Pa formed from a conductive material into a cylindrical shape; and center conductors Pb, Pc that are each formed from a conductive material into a rod shape. The ce...  
WO/2018/098871A1
A rotating support platform and an antenna measurement isolation room, solving the problem that, for an electronic device to be tested being placed on a test table, testing of the side of the electronic device facing the test table is di...  
WO/2018/101107A1
This electroconductive particle placement film, which is useful as an inspection probe unit for inspecting the continuity of objects that are to be subjected to fine-pitch continuity inspection such as semiconductor devices, has electroc...  
WO/2018/101674A1
Disclosed is a test device which electrically connects a terminal of an object to be tested and a testing terminal of a testing circuit. The test device includes a signal probe; a ground probe; a conductive block configured to comprise a...  
WO/2018/102259A1
Contact engines, probe head assemblies, probe systems, and associated methods for on-wafer testing of the wireless operation of a device under test (DUT). A contact engine includes a flexible dielectric membrane having a first surface an...  
WO/2018/095709A1
The invention relates to a current measuring device for measuring an electric current (Ip, In) in accordance with the four-wire technique with a low-resistance current-measuring resistor (RCu1, RCu, R0). The invention additionally provid...  
WO/2018/097446A1
The present invention relates to a screw fastening device for a probe card and a probe card assembling device having the same, the present invention comprising: a plurality of screws which are fastened to the probe card; a plurality of f...  
WO/2018/092909A1
Provided are an electrical contact and an electric component socket configured to be electrically connected to an electric component by a contacting portion coming into contact with a terminal, wherein the electrical contact is capable o...  
WO/2018/092967A1
Provided in one embodiment of the present invention is a test socket for a semiconductor comprising: a base layer having a first surface and a second surface opposite the first surface, provided with a first area and a second area outsid...  
WO/2018/091830A1
The subject matter of the present invention is a device for protecting an electronic computer (2) against a short circuit, the electronic computer (20), a sensor (40) comprising a first sensor pin (40_1), and a shunt resistor (100), char...  
WO/2018/093109A2
Disclosed is a probe for testing an electric characteristic of an object to be tested. The probe includes a core with conductive properties and shaped like a bar; and an elastic plating layer made of a material having higher elasticity t...  
WO/2018/086809A1
A contact system (100; 100'; 100'') contains at least one pneumatically driven contact pin (121, 122, 123), a pressure chamber (1) and a first bushing (37; 37') which is provided in a housing (2) of the pressure chamber (1) for each cont...  
WO/2018/088411A1
A probe 20 which electrically connects a first contact object and a second contact object to each other, and which is provided with a barrel part 50, a plunger part 60 and an insulation part 70. The barrel part 50 comprises spring parts ...  
WO/2018/089659A1
Systems and methods for testing semiconductor wafers are disclosed herein. In one embodiment, an apparatus for testing dies of a semiconductor wafer includes: a tester-side printed circuit board (PCB); a wafer-side support plate having a...  
WO/2018/088504A1
This probe pin (1) is provided with a barrel (2) having a hollow space (3), an elastic body (4) disposed within the barrel (2), a plunger (5), a slide part (5a) that is a portion of the plunger (5) that is accommodated within the barrel ...  
WO/2018/085015A1
A test socket with a link and mount system is used to couple a device under test to a testing apparatus for quick and reliable testing of microchips post-production. The socket includes a pivoting link that connects to the DUT, an elasto...  
WO/2018/083437A1
A technique for measuring the resistance of a resistive element (4) in the presence of a series diode (10) is provided. By supplying three different currents I1, l2, l3 and measuring corresponding voltages V1, V2, V3 across the resistive...  
WO/2018/079982A1
The present invention relates to a bidirectional conductive pin using carbon fibers and a bidirectional conductive pattern module using carbon fibers, and a bidirectional conductive socket using the same. The bidirectional conductive pin...  
WO/2018/079788A1
This substrate for a probe card is provided with a plurality of through-holes in which probes are disposed, the probes being brought into contact with a substance to be measured. The substrate comprises a silicon nitride ceramic, is prov...  
WO/2018/078752A1
An inspection device according to the invention of the present application is provided with a fixing plate (24), a plurality of expanding and contracting parts (11) that each have one end fixed to the fixing plate (24), a plurality of co...  
WO/2018/080177A1
A battery system bus bar according to one embodiment of the present invention comprises: a first bar member and second bar member distanced from each other; and a third bar member connecting the first bar member and second bar member to ...  
WO/2018/074744A1
The present invention relates to a device and a method for diagnosing a switch using voltage distribution, which, in order to diagnose a state of a switch located on a cathode power supply line that connects a battery and a load, connect...  
WO/2018/073627A1
The disclosure relates to a device for measuring electrical current in an electrical conductor (2), the device comprising: a measuring circuit configured to be connected to the electrical conductor, the measuring circuit comprising: a re...  

Matches 1 - 50 out of 26,632