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Patent Searching and Data


Matches 1 - 50 out of 27,921

Document Document Title
WO/2021/002690A1
The present invention relates to a test socket used for measuring electrical properties of an electric element. The present invention provides a test socket disposed between opposing terminals to electrically connect the terminals, the t...  
WO/2021/002572A1
A probe block assembly for inspecting a display panel, according to the present invention, may comprise: a plurality of probe blocks being in contact with a plurality of electrode pads of a display panel so as to inspect whether there is...  
WO/2021/003486A1
A ratio metric (RM) approach to providing the current sensing function of service currents to smart metering applications results in an RM current sensor assembly and RM differential current sensor assembly that can replace prior art sen...  
WO/2020/259253A1
An analysis device for a detection chip, and an operation method and an analysis system thereof. The analysis device comprises a base and a control module. The control module comprises a positioning sub-module, an operation sub-module an...  
WO/2020/253552A1
Disclosed are a high-precision resistor measurement system and method based on the combination of a differential method and a proportional method. The system comprises: a constant-current source, a reference resistor, a first differentia...  
WO/2020/257190A1
A probe chip consisting of multiple probes integrated on a single substrate. The layout of the probes could be designed to match specific features on the device under test. The probes are spring-loaded to allow for reversible deformation...  
WO/2020/256132A1
The present invention pertains to a microfabrication device and a microfabrication method by which products of the same or greater precision can be obtained as when using an electroforming method, etc., the device and the method being su...  
WO/2020/250638A1
This probe pin comprises: a plate-shaped body section; a first contact point section provided on one end of the body section in a first direction; and a pair of second contact point sections that are provided on one end of the body secti...  
WO/2020/250637A1
This probe pin comprises: an elastic section that can be elastically deformed along a first direction; a first contact section to which one end of the elastic section, in the first direction thereof, is connected; and a second contact se...  
WO/2020/244107A1
Disclosed is a cathode protection test probe, comprising an outer cavity, a polarized test piece, an inner cavity, an alternating-current test piece, a copper electrode and a test cable, wherein the polarized test piece is of a hollow cy...  
WO/2020/247239A1
Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems. The calibration chucks include a calibration chuck body that defines a calibration ...  
WO/2020/242208A1
A technology for a current sensor is disclosed. The current sensor comprises: a magnetic core having an opening through which a conductor can pass, wherein a current to be measured flows through the conductor; a magnetic core gap provide...  
WO/2020/242805A1
A damper for a semiconductor metrology or inspection system includes a pair of parallel plates with a fluid with a variable viscosity retained between plates. At least one wire is disposed between the plates, which may include one or mor...  
WO/2020/239515A1
A duct probe (20) for sampling a fluid from a main fluid flow (Fm) in a duct (10) defines an elongated supply channel (21) and an elongated discharge channel (22). The supply channel has at least one inflow opening (23) for diverting a p...  
WO/2020/241990A1
The present invention relates to a conductive pin using a spring, and a test socket and an interposer using same. The conductive pin, according to the present invention, comprises: an upper pin making contact with an upper device; a lowe...  
WO/2020/242216A1
Disclosed is a contact for electrically connecting a first contact point and a second contact point. The contact includes: a first contact part in contact with the first contact point; a second contact part in contact with the second con...  
WO/2020/235769A1
Disclosed is a contact probe comprising: an upper plunger which is formed by a first processing method, and in which a first tip coming into contact with a terminal of an object to be inspected is formed at one end thereof; a board conta...  
WO/2020/229240A1
The invention relates to a test adapter (1; 1') for testing an electrical connection, comprising a body (10) comprising a plug-in portion (100), on which an electrical test contact (11) is arranged and which can be plugged into a test sh...  
WO/2020/230945A1
The present invention relates to a socket having a thin structure and a spring contact suitable for same, the socket enabling durability degradation of a contact itself to be alleviated, having excellent electrical characteristics in hig...  
WO/2020/228261A1
A support mechanism for chip testing. A chip is fixed on a circuit board; a testing base is provided on an upper side surface of the circuit board; the support mechanism comprises a support frame (200) supported on a bottom side surface ...  
WO/2020/226194A1
A probe assembly and a micro vacuum probe station comprising same are disclosed. A probe assembly according to one embodiment may comprise: a base; a guide rail installed on the base; a guide member sliding along the guide rail; a probe ...  
WO/2020/226009A1
This connection device for inspection comprises: a probe head (30) which retains an electrical connector (10) and an optical connector (20) in a state in which the leading end parts thereof are exposed on the lower surface; and a transfo...  
WO/2020/225337A1
The invention relates to a device for detecting electrical currents on or in the vicinity of electrical conductors that are part of a lightning current arrester, an interception rod or the like, the device comprising a plurality of reed ...  
WO/2020/226963A1
A voltage/current probe includes: a circuit board; a first inductor that is located on the circuit board, that is wound in a first direction, and that includes: a first end connected to a first output conductor; and a second end; a secon...  
WO/2020/222327A1
A pin for testing a microelectrode circuit according to the present invention comprises: a pin having a pair of contact portions formed at both ends thereof and an elastic portion formed to connect the both ends with an elastic restoring...  
WO/2020/220598A1
A display screen (10) and a test device (20). The display screen (10) comprises: a display part (11); a non-display part (12) located on the periphery of the display part (11); a plurality of test terminals arranged on the non-display pa...  
WO/2020/220605A1
Provided are a probe (120) module (100), and a machining method and test method therefor. The probe (120) module (100) comprises: a substrate (110) and a plurality of probes (120) located on the substrate (110), wherein a second part of ...  
WO/2020/221830A1
Examples of a test switch unit (100, 300, 600, 900, 1200, 1500) for testing an IED are described. Each of the test switch units may be utilized for opening of a trip circuit, the shorting of a CT circuit and subsequently the isolation of...  
WO/2020/217816A1
A contact probe (10), which can be used to inspect a semiconductor package (80) in which a recess is formed in a terminal part (81), comprises a plunger (10a) having a distal-end part (11A) for contacting the terminal part (81). The dist...  
WO/2020/218779A1
Disclosed is a test device for testing an electric characteristic of an object to be tested. The test device includes a block comprising a probe hole, a probe supported in the probe hole and retractably configured to connect a first cont...  
WO/2020/219362A1
Circuits and methods for testing power electronics devices. In some examples, a reconfigurable load tester includes a power conversion circuit configured to couple to a device under test (OUT). The power conversion circuit includes a num...  
WO/2020/217561A1
[Problem] In order to enhance conduction performance, the present invention makes it possible to reduce the number of component parts and enhance sliding ability of an elastic member, to control elastic force in accordance with the chara...  
WO/2020/220012A1
A probe-on-carrier architecture is provided, where several vertical probes are disposed on each probe carrier and the probe carriers are affixed to the space transformer. Each vertical probe has two flexible members. The first flexible m...  
WO/2020/217804A1
This probe pin comprises an elastic part capable of elastically deforming along a first direction, a first contact part provided at one first-direction end of the elastic part, and a second contact part provided at the other first-direct...  
WO/2020/217729A1
Provided is a probe device in which variations in electrical characteristics and a probe load are sufficiently small and a useful life is sufficiently long. The present invention comprises a probe 3a (first metal plate) serving as a si...  
WO/2020/218803A1
Disclosed is a probe cleaner for cleaning and decontaminating a probe. The probe cleaner includes a main body including a cleaning surface facing toward a test socket in which probes are arranged; a cleaning member provided in the cleani...  
WO/2020/218685A1
The present invention relates to a device measuring apparatus comprising a frame having a measuring unit provided on the inner side thereof, the measuring unit capable of measuring data of a device to be coupled to a substrate, wherein t...  
WO/2020/213899A1
A three-layer MEMS spring pin of the present invention comprises: a lower-layer spring pin, in which a lower-layer wave is connected between a lower-layer top plunger and a lower-layer bottom plunger; an upper-layer spring pin, in which ...  
WO/2020/213435A1
The present invention provides a connection device for inspection including: a probe head (30) that holds an electrical connector (10) and an optical connector (20) with the respective tip portions being exposed from a lower surface of t...  
WO/2020/206475A1
The invention relates to a testing device (10) for electrically testing a test piece (100), comprising a first electrical test string (20) having a first rectifier (22) and a first converter (24), and at least one second electrical test ...  
WO/2020/209577A1
The present invention relates to an inverter system capable of detecting an output ground fault and an output ground fault detection method using same and, particularly, to an inverter for detecting an output ground fault by detecting th...  
WO/2020/209583A1
Provided is a test socket for electrically connecting a device to be inspected and an inspection device. The test socket comprises: an insulation film having a first through hole and a second through hole that are spaced apart from each ...  
WO/2020/202735A1
Provided is a contact probe that has a simple shape and can be inexpensively manufactured. This contact probe comprises a barrel 15, upper plunger 16, lower plunger 17, and coil spring 18. The upper plunger 16 is an advancing and retreat...  
WO/2020/203154A1
A contact terminal comprises: a first insertion section having a first contact portion having a first plane along an axial direction; a second insertion section having a second contact portion having a second plane along the axial direct...  
WO/2020/199369A1
The present invention relates to a linear compact feed automatic switching system, arranged on one side of a row of wave-absorbing materials, said wave-absorbing materials having reserved holes, comprising: a frame, a bottom plate, brack...  
WO/2020/203848A1
An inspection jig comprising: a plate-shaped insulating member having a recess; a first substrate having a first electrode; and a conductive wire electrically connected to the contact terminal. The insulating member has a through-hole pe...  
WO/2020/203155A1
Provided is a contact terminal comprising a tubular body extending axially in parallel to the central axis of the contact terminal, and a bar-like conductor having electrical conductivity. The conductor includes a protruding portion prot...  
WO/2020/203153A1
The present invention provides a contact terminal comprising an electroconductive cylindrical body extending in the axial direction of the contact terminal, a rod-shaped first conductor which is electroconductive and which can contact an...  
WO/2020/204245A1
The present invention relates to a BGA socket apparatus which is a lidless-type from which a cover, generally provided on the top part of a socket body in order for the loading/unloading operation of an IC, is removed, the BGA socket app...  
WO/2020/187630A1
The invention relates to a method (30) for electrically contacting components (11) in a semiconductor wafer (12) comprising the following steps: providing a flexible plate (14), having a first main surface (15) on which a plurality of co...  

Matches 1 - 50 out of 27,921