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Patent Searching and Data


Matches 1 - 50 out of 26,963

Document Document Title
WO/2019/054761A1
An FPCB replacement system for display panel inspection is provided to select a clamp block having an appropriate FPCB mounted thereon according to the specifications of a display panel placed on a pallet for inspection and facilitate re...  
WO/2019/049482A1
This electric connection socket (1), for relaying electric signals between a circuit substrate (P) and an electric component (B), is provided with: a metal housing (10) which has a through hole (10a) enabling communication between the to...  
WO/2019/048299A1
An interface element (20) for a testing apparatus of electronic devices comprises at least one support (21) provided with a plurality of through-openings (22) that house respective interconnections elements (23), which extend between a f...  
WO/2019/049481A1
This electric connection socket (1), for relaying electric signals between a circuit substrate (P) and an electric component (B), is provided with: a metal housing (10) which has a through hole (10a) enabling communication between the to...  
WO/2019/046419A1
Vertical probe heads having a space transformer laterally tiled into several sections are provided. This change relative to conventional approaches improves manufacturing yield. These probe heads can include metal ground planes, and in e...  
WO/2019/046631A1
A probe device is disclosed that includes one or more insulating layers and a glassy carbon layer. The glassy carbon layer includes one or more channels. Each channel includes a microstructure, which may include an electrode region, inte...  
WO/2019/045425A1
The present invention relates to a test socket comprising carbon nanotubes and, more specifically, to a test socket comprising carbon nanotubes, comprising: a plurality of conductive parts located at respective positions corresponding to...  
WO/2019/045426A1
The present invention relates to a test socket and conductive particles, and more specifically, to a test socket disposed between a device to be tested and a testing device so as to electrically connect a terminal of the device to be tes...  
WO/2019/039628A1
The present invention relates to a bidirectional conductive pin, a bidirectional conductive pattern module, and a method for manufacturing the same. The bidirectional conductive pin according to the present invention comprises: a pin bod...  
WO/2019/039231A1
This probe is provided with a rod-shaped plunger (11) having a tip part (111) and an insertion part (112), and with a barrel (12) having an open end into which the insertion part (112) is inserted. The barrel (12) has multiple slits (121...  
WO/2019/039232A1
This probe is provided with a rod-shaped plunger (11) having a tip part (111) and an insertion part (112), and with a tube-shape barrel (12) having an open end into which the insertion part (112) is inserted. The barrel (12) has a pair o...  
WO/2019/039233A1
This electrical connection device is provided with: a probe (10) which comprises a top-side plunger (121) and a bottom-side plunger (122), the tip of each exposed from the open ends at both ends of a barrel (11), and which comprises a st...  
WO/2019/031826A1
Disclosed is a test device for testing electric characteristics of an object to be tested. The test device comprises a test circuit board comprising an insulating base substrate formed with a printed circuit, a plurality of signal contac...  
WO/2019/029757A1
The invention relates to a method and a device for determining the electrical resistance of an object. According to the invention, the method is for measuring the electrical resistance of an object, in which at least four measurement con...  
WO/2019/024360A1
Provided are a probe changing device and a PCB impedance tester. The probe changing device comprises: a supporting body (10); a first probe portion configured to be movable relative to the supporting body (10), the first probe portion ha...  
WO/2019/024567A1
The present application relates to the technical field of electromagnetic interference processing, and provides an electromagnetic shield structure, comprising a first shield piece and a second shield piece. The first piece comprises a f...  
WO/2019/026880A1
This board for inspection is board for inspection for electrically connecting, in a thickness direction, an inspecting device and an inspected device disposed respectively on one side and the other side thereof in the thickness direction...  
WO/2019/022204A1
This contact probe is provided with: a cylindrical pipe member; a collar that has a hollow portion, and that is fixed to the inner peripheral side of at least one end in the lengthwise direction of the pipe member; and an inner conductor...  
WO/2019/022721A1
An apparatus and method for performing optical caliper measurements remotely, including an unmanned aerial vehicle, a camera attached to the unmanned aerial vehicle, and an optical caliper measurement tool attached to the unmanned aerial...  
WO/2019/021749A1
The present invention eliminates a tilt of a contact point section of a flexible substrate with respect to a subject to be inspected, and obtains a uniform contact state by making the contact point section inclinable. An inspection jig 1...  
WO/2019/022391A1
Disclosed is a test probe for testing electric characteristics of an object to be test. The test probe includes a barrel; a plunger including at least two divisional plungers which are in parallel and partially inserted facing with each ...  
WO/2019/022272A1
The present invention relates to a probe pin for a probe card and, more specifically, to a probe pin with reduced flux diffusion, which prevents flux from diffusing along the probe pin when the probe pin is attached to an electrode of a ...  
WO/2019/017515A1
The present invention relates to a thin film resistor for a probe card, and more specifically, to a thin film resistor for a probe card in which the occurrence of cracks in the thin film resistor during repeated thermal expansion and con...  
WO/2019/012929A1
The composite wiring board according to the present invention is provided with: a ceramic multilayer wiring board including internal wiring and a plurality of low temperature sintered ceramic layers; and a glass multilayer wiring board s...  
WO/2019/011624A1
The invention relates to a coaxial resistor (1), comprising a forward conductor (6) and a return conductor (7) for conducting the current to be measured in opposite directions and comprising a resistance element made of a resistive mater...  
WO/2019/013289A1
A probe unit according to the present invention comprises: a plurality of contact probes that each contact, on one longitudinal end side, an electrode to be contacted; first grounding members that connect to an external ground; second gr...  
WO/2019/013534A1
The present invention relates to a rechargeable battery defect inspection device and defect inspection method. The rechargeable battery defect inspection device, according to the present invention, comprises: a pair of pressing jigs whic...  
WO/2019/013163A1
[Problem] To manufacture a conductive member using a material and a working method that are different from conventional ones, paying attention to a material constituting a contact pin and to a working method therefor. [Solution] Although...  
WO/2019/014622A1
A test and measurement probe system (100,104), including an input (106) to receive an input signal, the input signal including a low frequency (LF) and/or direct current (DC) component and an alternating current (AC) component, an extrac...  
WO/2019/014132A1
A test fixture (120) includes a mother board (225) that has test signal lines (223) configured to couple (651) to a test station (650). The mother board (225) includes a recessed region with contact pads (428) coupled to the test signal ...  
WO/2019/007878A1
The invention relates to a device (100, 200) for checking the functionality of a first resistor (102, 202) of a battery system, comprising a constant power source (105, 205), a switch (104, 205), a second resistor (103, 203), a first mea...  
WO/2019/004609A1
The present invention relates to a method for manufacturing a multilayered ceramic substrate. A method for manufacturing a multilayered ceramic substrate according to the present invention comprises: a step of sintering a plurality of ce...  
WO/2019/004663A1
The present invention relates to a probe member for a pogo pin, a manufacturing method therefor and a pogo pin comprising same. One embodiment of the present invention provides a probe member used in a test socket, the probe member compr...  
WO/2019/001920A1
A monitoring system adapted to recognize a contingency in a power supply network, PSN, (2), the monitoring system (1) comprising in-field measurement devices (3) adapted to generate measurement data (MD) of said power supply network (2) ...  
WO/2019/004661A1
The present invention relates to a probe member for a pogo pin, a manufacturing method therefor and a pogo pin comprising same. One embodiment of the present invention provides a probe member used in a test socket, the probe member compr...  
WO/2018/235992A1
The present invention relates to an apparatus for measuring the critical current under bending deformation of a high-temperature superconducting wire and, more specifically, to an apparatus for measuring the critical current under bendin...  
WO/2018/235234A1
According to the present invention, a control unit (PLC) for a contact probe inspection device controls drive parts (A1, A2) on the basis of position data inputted into a personal computer (PC) and thereby changes the position of a load ...  
WO/2018/235676A1
The present invention eliminates defects caused by moisture and achieves stable electrical connection between a contact probe of a socket and an electrode of an inspection board. A socket 1 is provided with a contact probe 20 and an insu...  
WO/2018/235233A1
A contact probe inspection device that comprises: support parts (H1, H2) that support a pin board jig (PB1) that has a contact probe (P) arranged thereon; a load cell (LS) that, while in contact with the contact probe (P), applies a load...  
WO/2018/232404A1
A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be conf...  
WO/2018/230752A1
The present invention relates to a wafer inspecting device. According to the present invention, the wafer inspecting device comprises: a magnetic field generating unit for forming a magnetic field such that magnetic field lines travel in...  
WO/2018/230627A1
An electrically conductive contact unit according to the present invention is provided with: a holder base plate, which is an electrically conductive contact holder having a coaxial structure for accommodating an electrically conductive ...  
WO/2018/230085A1
This inspection device has: electric contacts (51) that are electrically connected to an object to be measured by making contact with the object to be measured; conductive sections (52) that are electrically connected to the electric con...  
WO/2018/224458A1
The invention relates to a contact element system having a plurality of pin-type or needle-type and electrically conductive contact elements (4, 5) of equal length, which each have two end regions (4', 5', 4", 5") for electrically contac...  
WO/2018/226745A1
A battery system (12) includes battery cells to store electrical energy and to output electrical power. The battery system further includes a housing (150, 152), a shunt (146), a control board (98), and a connector assembly (148). The ho...  
WO/2018/225152A1
[Problem] To provide a load testing system that has a structure that makes it difficult for humidity, dust, debris, and the like, to enter a testing device from the outside and thus prevents load test disturbance and makes it possible to...  
WO/2018/221834A1
Provided are a wafer probe card that matches in one-to-one correspondence with an LED wafer by implementing a probe system having the same size as the LED wafer, and inspects brightness and wavelength of light emitted from a plurality of...  
WO/2018/221886A1
The present invention relates to a vertical probe pin and a probe pin assembly comprising same. The present invention provides a probe pin used for a probe pin assembly comprising a first support body having a first through-hole formed t...  
WO/2018/221777A1
The present invention relates to a contact and a socket device for testing a semiconductor device, and the contact of the present invention is a spring contact integrally formed by punching and bending a metal plate, and comprises an ela...  
WO/2018/221234A1
This electrical connection apparatus is provided with: a wiring arrangement member (30); a probe (10) that has a base end connected to a wiring pattern formed in the wiring arrangement member (30) and a tip that makes contact with a body...  

Matches 1 - 50 out of 26,963