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Patent Searching and Data


Matches 1 - 50 out of 27,052

Document Document Title
WO/2019/095792A1
Disclosed are a circulator/isolator text fixture, comprising a ground plate, a PCB board, an adjustable capacitor and a high-frequency connector. The PCB board is provided with a microstrip circuit; one end of the microstrip is electrica...  
WO/2019/095774A1
An automatic electric testing machine for a port element of a connector, the automatic electric testing machine comprising a machine frame (1) provided with a power allocation control chamber (2) and an operation display screen (3) mutua...  
WO/2019/098079A1
The present invention provides a probe head capable of reducing an inductance value of a ground probe. In this probe head 1, a pin plate 40, a pin block 50, and a solder resist film 60 are laminated integrally in said order from the side...  
WO/2019/096695A2
A probe for direct nano- and micro-scale electrical characterization of materials and semi conductor wafers. The probe comprises a probe body, a first cantilever extending from the probe body, and a first thermal detector extending from ...  
WO/2019/095258A1
A pressure resistance test platform for aluminum substrate, comprising a test stand (1) and a pressure resistance tester (2), the test stand (1) comprising a base (11), a bottom plate (12), a test support plate (13), an upper press plate...  
WO/2019/097629A1
A probe card (10) has an edge sensor (12). The edge sensor (12) has a first needle (14) and a second needle (16). The first needle (14) and the second needle (16) are in contact with each other when the first needle (14) and a wafer are ...  
WO/2019/093370A1
This ceramic includes, in mass%, 20.0-60.0% of Si3N4, 25.0-70.0% of ZrO2, and 5.0-15.0% of at least one selected from MgO, Y2O3, CeO2, CaO, HfO2, TiO2, Al2O3, SiO2, MoO3, CrO, CoO, ZnO, Ga2O3, Ta2O5, NiO, and V2O5. The ceramic has a ther...  
WO/2019/091946A1
A contact probe (10) for a testing head of an apparatus for testing electronic devices comprises a body (10') extending along a longitudinal axis (H-H) between a first end portion (10a) and a second end portion (10b), the second end port...  
WO/2019/093527A1
The purpose of the present invention is to provide an IC inspection device in which the electrical distance between an IC to be inspected and a bypass capacitor is less than in the prior art and which is maintenance-free. In order to ach...  
WO/2019/093614A1
Disclosed is a test probe assembly. The test probe assembly includes: a conductive pipe; a probe inserted in the pipe without contacts and elastically retractable along a lengthwise direction; and an insulation probe supporting member co...  
WO/2019/091782A1
The disclosure comprises an electric connection module (100) for connecting a signal line (101) to a communication line (103), wherein the signal line (101) has an electric shield (105), comprising a connecting contact (107) which can be...  
WO/2019/090324A1
An electric winch control module (28) of this disclosure provides improved means for detecting changes in a current carried by an electric winch motor power lead (59). The module's housing (41 ) includes a magnetic flux shield (60) conta...  
WO/2019/089332A1
A current sensing circuit includes a current sense amplifier and a correction circuit. The current sense amplifier has an offset voltage. The correction circuit is configured to evaluate the offset voltage of the current sense amplifier....  
WO/2019/088803A1
A battery pack is disclosed. The battery pack according to the present invention comprises: a cell module assembly having battery cells arranged in a stacked manner, a cell case accommodating the battery cells, and a first cathode bus ba...  
WO/2019/089611A1
Probes are connected to the space transformer via multiple carrier plates. Electrical contacts from the probes to the space transformer are by way of spring tail features on the probes that connect to the space transformer and not to the...  
WO/2018/075466A8
A device includes a sheet of high purity fused silica that has a thickness of less than 500 µm, where the sheet includes features in the sheet, wherein the features have a cross-sectional dimension of less than 50 µm and a depth of at ...  
WO/2019/082259A1
Provided is an inspection jig for allowing easy replacement of plungers. A jig base 20 has: plunger accommodation chambers 20a that each accommodate and hold a large-diameter section 13 of a plunger 10 so as to be capable of advancing an...  
WO/2019/084318A1
An integrated chip package assembly test system (100) and method for testing a chip package assembly are described herein. In one example, an integrated circuit chip package test system (100) includes a socket (120) and a workpress (106)...  
WO/2019/081565A2
The invention relates to a connection strip (10) for a counter (20), wherein the connection strip (10) has either at least one movable housing element (104), which is in a first position when the counter (20) is connected to the connecti...  
WO/2019/083485A2
The present invention differs in air and leakage testing machines of endoscopic scopes used in medicine and industry, is unlike conventional operator manual mechanical air leakage testers and specially designed to automatically and conti...  
WO/2019/081365A1
The invention relates to a method for operating a battery sensor and to a battery sensor, comprising at least one first battery sensor connection (Vat+) and a second battery sensor connection (Vba-), in particular for connecting to a bat...  
WO/2019/082014A1
The present invention concerns a heating assembly (10, 15) for generating heat in order to carry out temperature-dependent tests on an electronic component (3, 200) arranged inside a socket (2), the heating assembly (10, 15) comprising: ...  
WO/2019/075663A1
An electrical connection device (10) and a test machine (100) used for connecting to a workpiece to be tested (200). The workpiece to be tested (200) comprises a first connection surface (210) and a test area (220) formed on the first co...  
WO/2019/077849A1
This electrical connection device is provided with: a probe (10) having a tubular barrel (11) and also having a bar-shaped top-side plunger (121) and a bar-shaped bottom-side plunger (122), which are joined to the barrel (11) with the fr...  
WO/2019/076164A1
The present invention relates to a waveform splitter, comprising a first electronic switch, a second electronic switch and a control module. The first electronic switch and the second electronic switch are separately connected to a curre...  
WO/2019/078364A1
A ceramic which comprises, in terms of mass%, 20.0-55.0% of BN, 5.0-40.0% of SiC and 3.0-60.0% of ZrO2 and/or Si3N4. This ceramic has a heat expansion coefficient at -50 to 500°C of 1.0×10-6 to 5.0×10-6/°C, a low chargeability (106 t...  
WO/2019/077428A1
The invention relates to a multipart housing (1) comprising a first and a second housing part (2, 3) which are secured against each other by means of a latching connection (6). The aim of the invention is to protect the latching connecti...  
WO/2019/070518A1
Probe systems for testing a device under test are disclosed herein. The probe systems include a platen that defines an upper surface, an opposed lower surface, and a platen aperture. The probe systems also include a chuck that defines a ...  
WO/2019/069576A1
Provided is a probe that can accurately perform characteristic testing of a connector terminal. This probe for performing characteristic testing of a connector comprises: a flange; a housing; a fixed plunger; a first elastic body; a mova...  
WO/2019/066365A1
The present invention relates to an anisotropic conductive sheet used for a test socket or the like used to inspect a semiconductor element or the like and, more particularly, to an anisotropic conductive sheet comprising: a plurality of...  
WO/2019/066135A1
The present invention relates to a bidirectional conductive module and a method for manufacturing the same. A bidirectional conductive module according to the present invention comprises: an insulative body which is made of an insulative...  
WO/2019/066256A1
The present invention relates to a substrate testing cartridge provided for simultaneously testing multiple substrates for which a substrate treatment process has been finished, and a method for manufacturing same. According to an embodi...  
WO/2019/066410A1
A printed circuit board according to various embodiments of the present invention may comprise: a plurality of layers having at least one opening formed therein; and at least one antenna included in at least one layer of the plurality of...  
WO/2019/064265A1
The invention relates to a sensor (3) for measuring a voltage in a HV/MV power network in a separable connector (2), the sensor comprising: - an adapter element (11) comprising a high voltage connection adapted to be mechanically and ele...  
WO/2019/062207A1
An impedance test probe, comprising: at least two probe pins (1, 2) and a probe pin short-circuiting device (3). The probe pin short-circuiting device (3) is an elastic short-circuiting device. One end of the probe pin short-circuiting d...  
WO/2019/060877A1
A test socket for a testing an integrated circuit with controlled impedance while maintaining the structural integrity of the test pins. The pin can have a sidewall with a thick portion and a thinner portion along the length of the pin. ...  
WO/2019/056624A1
Disclosed is a probe device (100), comprising: a base (10), a probe (20) and a conductive member (30), wherein the base (10) comprises a body (11), a cavity (12) provided in the body (11) and a through hole (14) provided in the body (11)...  
WO/2019/059629A1
The present invention relates to a test socket and, more specifically, to a test socket comprising: a housing having an accommodation space, in which an test connector for electrically connecting, with a test device, a device to be teste...  
WO/2019/054761A1
An FPCB replacement system for display panel inspection is provided to select a clamp block having an appropriate FPCB mounted thereon according to the specifications of a display panel placed on a pallet for inspection and facilitate re...  
WO/2019/049482A1
This electric connection socket (1), for relaying electric signals between a circuit substrate (P) and an electric component (B), is provided with: a metal housing (10) which has a through hole (10a) enabling communication between the to...  
WO/2019/048299A1
An interface element (20) for a testing apparatus of electronic devices comprises at least one support (21) provided with a plurality of through-openings (22) that house respective interconnections elements (23), which extend between a f...  
WO/2019/049481A1
This electric connection socket (1), for relaying electric signals between a circuit substrate (P) and an electric component (B), is provided with: a metal housing (10) which has a through hole (10a) enabling communication between the to...  
WO/2019/046419A1
Vertical probe heads having a space transformer laterally tiled into several sections are provided. This change relative to conventional approaches improves manufacturing yield. These probe heads can include metal ground planes, and in e...  
WO/2019/046631A1
A probe device is disclosed that includes one or more insulating layers and a glassy carbon layer. The glassy carbon layer includes one or more channels. Each channel includes a microstructure, which may include an electrode region, inte...  
WO/2019/045425A1
The present invention relates to a test socket comprising carbon nanotubes and, more specifically, to a test socket comprising carbon nanotubes, comprising: a plurality of conductive parts located at respective positions corresponding to...  
WO/2019/045426A1
The present invention relates to a test socket and conductive particles, and more specifically, to a test socket disposed between a device to be tested and a testing device so as to electrically connect a terminal of the device to be tes...  
WO/2019/039628A1
The present invention relates to a bidirectional conductive pin, a bidirectional conductive pattern module, and a method for manufacturing the same. The bidirectional conductive pin according to the present invention comprises: a pin bod...  
WO/2019/039231A1
This probe is provided with a rod-shaped plunger (11) having a tip part (111) and an insertion part (112), and with a barrel (12) having an open end into which the insertion part (112) is inserted. The barrel (12) has multiple slits (121...  
WO/2019/039232A1
This probe is provided with a rod-shaped plunger (11) having a tip part (111) and an insertion part (112), and with a tube-shape barrel (12) having an open end into which the insertion part (112) is inserted. The barrel (12) has a pair o...  
WO/2019/039233A1
This electrical connection device is provided with: a probe (10) which comprises a top-side plunger (121) and a bottom-side plunger (122), the tip of each exposed from the open ends at both ends of a barrel (11), and which comprises a st...  

Matches 1 - 50 out of 27,052