Login| Sign Up| Help| Contact|

Patent Searching and Data


Matches 1 - 50 out of 26,519

Document Document Title
WO/2018/070915A1
There is provided a test module (100) for testing a fingerprint sensing device (110) comprising: an electrically conductive bottom element (102) comprising an exterior surface portion configured to contact a sensing surface of the finger...  
WO/2018/070684A2
Disclosed is a diagnostic device for a power supply system. The power supply system comprises a battery assembly and at least one contactor. Each of the contactors is configured to selectively open and close a power supply path between t...  
WO/2018/066743A1
The present invention relates to a power cable end test device and, more particularly, to a cable terminal end test device coupled to a cable terminal comprising a core conductor so as to evaluate characteristics of the cable terminal, t...  
WO/2018/066839A1
The present invention relates to a fuse diagnosis device and method using voltage distribution, and to a fuse diagnosis device and method using voltage distribution which can diagnose the state of a fuse by connecting a diagnostic resist...  
WO/2018/064754A1
A resistance-measuring device mountable to a component of a current-carrying transmission line. The device includes a body having a base and two arms with interconnected first ends and spaced-apart second ends. The arms define a gap ther...  
WO/2018/066793A1
A band pass filter including a microstrip transmission line comprises: a substrate having a grounding surface formed on a rear surface thereof; an input port which is formed on an upper surface of the substrate and receives a transmissio...  
WO/2018/059965A1
The invention relates to an optical pulse generator and to a method for operating an optical pulse generator. The invention particularly relates to an optical pulse generator for high-frequency (HF)-pulse width modulation in LiDAR system...  
WO/2018/063304A1
Apparatus and methods for adjusting probes of a integrated circuit tester are provided. In an examples, an apparatus can include an array of probes having a nominal pitch, a space transformer configured to provide electrical connections ...  
WO/2018/063874A1
Probe systems and methods are disclosed herein. The methods include directly measuring a distance between a first manipulated assembly and a second manipulated assembly, contacting first and second probes with first and second contact lo...  
WO/2018/057188A1
This disclosure provides systems, methods and apparatus for a test probe for characterizing piezoelectric material. In one aspect, a test probe may include a conductive tip configured to apply force to the piezoelectric material and prov...  
WO/2018/055961A1
A probe pin includes: a plate-shaped movable pin (20) having an elastic portion (21) that elongates and contracts along a longitudinal direction, and a first contact portion (22) and a second contact portion (23) provided at both end por...  
WO/2018/050768A1
The invention relates to a spring contact pin (5) for contacting a test object (2), in particular an electrical/electronic component or assembly, comprising a pin sleeve (6), in which a test head (8) is mounted with a guide end (10) in a...  
WO/2018/052938A1
A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configu...  
WO/2018/051123A1
A quantum power sensor comprising a two-level quantum system strongly coupled to a transmission line that supports a propagating wave. A method of measuring power in a transmission line, the method comprising: coupling a two-level quantu...  
WO/2018/052944A1
A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configu...  
WO/2018/050767A1
The invention relates to a contact pin, in particular a spring contact pin (1), comprising a test head (3) for contacting an electrically conductive contact surface of a test object, in particular a wafer, a printed circuit board or the ...  
WO/2018/042931A1
This probe pin is provided with: a coil spring (20); a first plunger (30) including a first body section (31) which extends through the coil spring (20) and both ends of which are exposed to the outside of the coil spring (20) when the c...  
WO/2018/043173A1
In the present invention, a substrate formed from an insulator or semiconductor, a first layer formed from a conductive magnetic material, and a second layer formed from a conductive non-magnetic material are laminated, in that order, on...  
WO/2018/044014A1
Disclosed is a testing device. The testing device includes a testing socket configured to support a plurality of probes, a testing-circuit substrate which includes a contact point to contact the probe, a slider which makes the testing so...  
WO/2018/039075A1
Resistivity probes can be used to test integrated circuits. In one example, a resistivity probe has a substrate with multiple vias and multiple metal pins. Each of the metal pins is disposed in one of the vias. The metal pins extend out ...  
WO/2018/038321A1
According to one aspect of the present invention, provided is an electronic part inspection device for inspecting an electronic part, comprising: a frame having a single opening part formed on the upper surface thereof; one pair of condu...  
WO/2018/035515A1
Systems and methods for testing semiconductor wafers are disclosed herein. In one embodiment, an apparatus for testing dies of a semiconductor wafer includes: a wafer translator having a wafer-side configured to face the wafer, and an in...  
WO/2018/034500A1
The present invention relates to a ground structure of a semiconductor chip test socket, and a semiconductor chip test socket having the same, the ground structure: preventing the ground structure made of a soft material and mounted in a...  
WO/2018/033380A1
The invention relates to a measuring arrangement (12) for measuring an electric current (I) in the high-current range, in particular in the current range of more than 1 kA, having a low-resistance current measuring resistor (1) for measu...  
WO/2018/034096A1
An electric connection device 1 is provided with: a probe substrate 16; a probe 20 including a linear body part 21 having a leading end 20a that comes into contact with an object to be inspected and having a base end 20b that is in conta...  
WO/2018/035054A1
Systems and methods for testing semiconductor wafers are disclosed herein. In one embodiment, an apparatus for testing dies of a semiconductor wafer includes a composite space transformer for contacting the dies. The composite space tran...  
WO/2018/030438A1
Provided is a conduction inspection device member: that has conductive parts that do not readily crack or develop voids; that does not readily experience impairment of conductive performance, even after repeated conduction inspections; a...  
WO/2018/029155A1
It is herein described a contact probe (20) of a testing head of an apparatus for testing electronic devices comprising a probe body (20C) being extended in a longitudinal direction between respective end portions (20A, 20B) adapted to r...  
WO/2018/025683A1
A probe card (100) according to the present invention inspects a work (50) that has a plurality of pads (51). The probe card (100) is provided with: a planar secondary battery (10) that comprises a planar electrode (22) and is arranged s...  
WO/2018/026946A1
A method is provided for performing continuous single insertion semiconductor testing of a group of semiconductors that are divided into a first subgroup and a second subgroup at multiple different temperatures. The single insertion semi...  
WO/2018/021661A1
The present invention relates to a current measuring apparatus using a shunt resistor and, more particularly, to a current measuring apparatus using a shunt resistor, which can reduce the volume and price of a battery module and a batter...  
WO/2018/019866A1
The invention describes a testing head (21) of an apparatus for testing electronic devices comprising a plurality of contact probes (22) inserted into guide holes realized in at least one upper support (23) and one lower support (24), a ...  
WO/2018/021088A1
An electrical connection device 10 comprises a plurality of probes 20, a probe substrate 16 that is connected to a base end 20b of the plurality of probes 20, and a probe support 18 that prevents interference between adjacent probes of t...  
WO/2018/021140A1
This inspection jig, which is for bringing a probe Pr into contact with an inspection point provided on a substrate to be inspected, is provided with: an inspection-side support having a counter plate 51 provided with a facing surface F ...  
WO/2018/019863A1
The invention describes a probe card (20) for a testing equipment of electronic devices comprising at least one testing head (21) with a plurality of contact probes (22) inserted into guide holes being realized in at least one upper guid...  
WO/2018/019501A1
The invention relates to a spacer (128) for electrically insulating an energizable connection bolt (116) of an annular current sensor (108), wherein the spacer (128) has an annular insulating body, which can be arranged in a gap between ...  
WO/2018/019132A1
A chip test fixture comprises a base (100) and a fine adjustment structure (210, 220). The base (100) is provided with an accommodating structure (310, 320). The accommodating structure (310, 320) is used for placing a calibration member...  
WO/2018/021216A1
This inspection jig is provided with: a plurality of substantially bar-shaped probes Pr for bringing leading end portions Pra thereof into contact with a plurality of inspection points of a substrate 100, respectively; a supporting membe...  
WO/2018/021729A1
The present invention relates to a connector pin apparatus for semiconductor chip testing, and a method for manufacturing same, the connector pin apparatus enabling a semiconductor chip to have reliable and stable electrical properties a...  
WO/2018/020043A1
The invention concerns a sensing device comprising: - a voltage sensor, the voltage sensor comprising a reference plate and a sensing plate, the reference plate and the sensing plate being ring-shaped, concentric and arranged at a distan...  
WO/2018/010863A1
The invention relates to a method for determining the internal resistance of battery cells (10) of a battery module (1), wherein for this purpose a cell voltage of a battery cell (10) is determined as a voltage of the respective electroc...  
WO/2018/010996A1
The invention relates to a resistor (1), in particular a low-resistance current-sensing resistor (1), comprising two connection parts (2, 3) made of a conductive material and a resistor element (4) introduced between the connection parts...  
WO/2018/009940A1
Systems and methods for testing semiconductor wafers are disclosed herein. In one embodiment, an apparatus for testing dies on a semiconductor wafer includes a test contactor for contacting the dies. The test contactor has a substrate ha...  
WO/2018/009929A1
A mounting mechanism comprising: a first end and a second end; and a shaft extending from the first end to the second end, the shaft including: a peripheral wall; threading extending along at least a portion of the peripheral wall of the...  
WO/2018/003640A1
The purpose of the present invention is to achieve a coaxial connector for inspection with longer service life. In this coaxial connector for inspection, an outer conductor includes a tubular first and second housing which extend in the ...  
WO/2018/003816A1
[Problem] To form a rotation stopper inexpensively in a contact pin which is disposed in a socket main body and which electrically connects an IC package to a wiring board. [Solution] This contact pin includes a barrel, an upper contacti...  
WO/2018/005007A1
An apparatus for testing a die can comprise a first printed circuit board (PCB), a space transformer, and a plurality of probes. The first PCB can be configured to connect to a second PCB. The space transformer can be attached to the PCB...  
WO/2018/003507A1
[Problem] To provide an electrical contacting device with which stable electrical contact with an electrode pad for a grounding connection can be achieved while reducing a pushing-in load. [Solution] An electrical connecting device accor...  
WO/2018/003639A1
The purpose of the present invention is to provide a coaxial connector for inspection which can suppress transmission of high-frequency signals in the reverse direction, and a center conductor. This coaxial connector for inspection is pr...  
WO/2017/222757A1
A dipole antenna includes a feed line, first and second microstrip probes, a first signal transmission line coupled to the feed line and to the first microstrip probe, and a second signal transmission line coupled to the feed line and to...  

Matches 1 - 50 out of 26,519