Login| Sign Up| Help| Contact|

Patent Searching and Data


Matches 1 - 50 out of 26,403

Document Document Title
WO/2018/010863A1
The invention relates to a method for determining the internal resistance of battery cells (10) of a battery module (1), wherein for this purpose a cell voltage of a battery cell (10) is determined as a voltage of the respective electroc...  
WO/2018/010996A1
The invention relates to a resistor (1), in particular a low-resistance current-sensing resistor (1), comprising two connection parts (2, 3) made of a conductive material and a resistor element (4) introduced between the connection parts...  
WO/2018/009940A1
Systems and methods for testing semiconductor wafers are disclosed herein. In one embodiment, an apparatus for testing dies on a semiconductor wafer includes a test contactor for contacting the dies. The test contactor has a substrate ha...  
WO/2018/009929A1
A mounting mechanism comprising: a first end and a second end; and a shaft extending from the first end to the second end, the shaft including: a peripheral wall; threading extending along at least a portion of the peripheral wall of the...  
WO/2018/003640A1
The purpose of the present invention is to achieve a coaxial connector for inspection with longer service life. In this coaxial connector for inspection, an outer conductor includes a tubular first and second housing which extend in the ...  
WO/2018/003816A1
[Problem] To form a rotation stopper inexpensively in a contact pin which is disposed in a socket main body and which electrically connects an IC package to a wiring board. [Solution] This contact pin includes a barrel, an upper contacti...  
WO/2018/005007A1
An apparatus for testing a die can comprise a first printed circuit board (PCB), a space transformer, and a plurality of probes. The first PCB can be configured to connect to a second PCB. The space transformer can be attached to the PCB...  
WO/2018/003507A1
[Problem] To provide an electrical contacting device with which stable electrical contact with an electrode pad for a grounding connection can be achieved while reducing a pushing-in load. [Solution] An electrical connecting device accor...  
WO/2018/003639A1
The purpose of the present invention is to provide a coaxial connector for inspection which can suppress transmission of high-frequency signals in the reverse direction, and a center conductor. This coaxial connector for inspection is pr...  
WO/2017/222757A1
A dipole antenna includes a feed line, first and second microstrip probes, a first signal transmission line coupled to the feed line and to the first microstrip probe, and a second signal transmission line coupled to the feed line and to...  
WO/2017/222833A1
Certain aspects relate to systems and usage techniques for modular lateral flow assay reader devices that can receive a number of different modules having a barcode scanning input device and optional network connectivity capabilities. A ...  
WO/2017/222116A1
Provided is a standard sample for calibration of nanoscale analysis equipment, comprising: a glass substrate; a plurality of pad parts arranged on the glass substrate and to which a preset predetermined voltage is applied; a pattern part...  
WO/2017/219707A1
A circuit for eliminating electromotive force of contacts of a relay comprises a capacitor (C) and a double-pole double-throw relay (RL). The double-pole double-throw relay (RL) comprises a first moveable contact (1), a second moveable c...  
WO/2017/217042A1
This probe pin (10) is provided with: an elastic part (20); a first contact part (30) provided with a pair of leg parts (32, 33) which extend along the longitudinal direction from one end of the elastic part (20), and are capable of bend...  
WO/2017/217043A1
This socket (1) is provided with: a pair of housings (10, 10) which are respectively provided with accommodating recesses (20) capable of accommodating and holding contact elements (2) each having a first contact point (4) at one end and...  
WO/2017/217041A1
This probe pin (10) is provided with: an elastic part (20); a first contact part (30) provided with a pair of leg parts (32, 33) which extend along the longitudinal direction from one end of the elastic part (20), and are capable of bend...  
WO/2017/215170A1
A non-contact sensor circuit, the circuit comprising a capacitor C2, a resistor R1, a resistor R2 and an operational amplifier A, wherein one end of the capacitor C2 is connected to an in-phase input end of the operational amplifier A, a...  
WO/2017/218158A1
Probe head assemblies and probe systems for testing integrated circuit devices are disclosed herein. In one embodiment, the probe head assemblies include a contacting structure and a space transformer assembly, in another embodiment, the...  
WO/2017/212814A1
This inspection jig (3) comprises: an electrode (34a); a probe (Pr) having a front end section (P1) and a rear end section (P2), which are adapted to make contact with a bump (BP) of an object (101) to be inspected; and a support member ...  
WO/2017/213387A1
A rubber socket comprises a lower film, an upper film, an electrical connection member, and a rubber layer. The lower film comprises a plurality of lower electrode parts coupled to a synthetic resin film. The upper film is arranged in pa...  
WO/2017/212266A1
An Electrical Clamp An electrical clamp for use with electrical meters, the clamp comprising a pair of opposed body members, a pair of electrical contact elements and a biasing element; wherein each electrical contact element is coupled ...  
WO/2017/209357A1
The present invention relates to a bidirectional conductive pin, a bidirectional conductive pattern module and a method for preparing same. A bidirectional conductive pin, according to the present invention, comprises: an upper contact p...  
WO/2017/208690A1
[Problem] To provide a contact conduction jig and an inspection device which easily improve the ability to absorb variations in height of an object to be in contact with. [Solution] An inspection jig 3 is provided with: a support plate 3...  
WO/2017/210108A1
Apparatus and methods provide burn-in testing for semiconductors. A burn-in test apparatus (1) may include an outer housing forming an aperture with a test socket to receive a tile or wafer. The tile or wafer may include semiconductor de...  
WO/2017/207838A1
The invention relates to an open-centre three-phase current transformer, which comprises three individual current sensors accommodated in the same casing, and which can be separated into two parts, either completely or by rotating said p...  
WO/2017/209356A1
The present invention relates to a bidirectional conductive pin, a bidirectional conductive pattern module and a method for preparing same. A bidirectional conductive pin, according to the present invention, comprises: a pin body formed ...  
WO/2017/209872A1
A probe for identifying and measuring volume fraction constituents of a fluid using time domain analysis and frequency domain analysis to identify individual volume fraction constituents within a pipe on a real time basis and to measure ...  
WO/2017/207258A1
The invention relates to a contacting assembly for circuit boards comprising a compressible electrical conductor and a receiving plate, wherein the conductor has a first end region, a second end region and a bent region, which is designe...  
WO/2017/203876A1
In high-frequency-probe positioning in position calibration carried out in conventional high-frequency characteristic inspection, a prescribed standard pattern for standard alignment is used and probe positions are determined using a mic...  
WO/2017/204062A1
Provided is a coaxial connector for inspection having a probe that is short in height and will not damage a switch-equipped coaxial connector even when not properly mated with the switch-equipped coaxial connector. The coaxial inspection...  
WO/2017/200147A1
The present invention relates to a semiconductor probe pin and provides a semiconductor probe pin for enhancing electrical properties. To this end, the semiconductor probe pin according to the present invention comprises: a tubular metal...  
WO/2017/200146A1
The present invention relates to a case for semiconductor probe pins and to a case which can accommodate and maintain probe pins having been subjected to ultraprecision micromachining so as to be mounted to a probe used for semiconductor...  
WO/2017/196092A1
The present invention relates to a testing socket, more specifically to a testing socket which is placed between a device to be tested and a testing apparatus to electrically connect a terminal of the former and a pad of the latter. The ...  
WO/2017/196830A1
Space transformers, planarization layers for space transformers, methods of fabricating space transformers, and methods of planarizing space transformers are disclosed herein. In one embodiment, the space transformers include a space tra...  
WO/2017/197269A1
Various examples are provided for contactless wideband current sensing. A combination of magnetoresistive (MR) sensor and Rogowski coil outputs can be combined to provide current sensing from DC to 10 MHZ or more. In one example, a syste...  
WO/2017/196093A1
The present invention relates to a testing socket, more specifically to a testing socket which is placed between a device to be tested and a testing apparatus to electrically connect a terminal of the former and a pad of the latter. The ...  
WO/2017/196094A1
The present invention relates to a testing socket, more specifically to a testing socket which is placed between a device to be tested and a testing apparatus to electrically connect a terminal of the former and a pad of the latter. The ...  
WO/2017/197077A1
The disclosure generally relates to polyimide compositions and in particular, compositions having a filler. The polyimide compositions may be made of polyimide resins having titanium dioxide particle fillers. The use of titanium dioxide-...  
WO/2017/191726A1
This invention is provided with: an insulating plate 41 comprising a plurality of insulating synthetic resin layers; wiring circuits 44a, 44b, 44c provided to the insulating plate 41; a thin-film resistor 46 formed so as to be embedded i...  
WO/2017/192256A1
A busbar current sensor assembly (10) includes a busbar member (12) that includes a first cavity (60) and a second cavity (68). The second cavity is disposed opposite the first cavity. The busbar current sensor assembly also includes a f...  
WO/2017/187271A1
Disclosed is a socket apparatus (100) for gripping the balls of a ball grid array (BGA) (170), including a base member (130) of electrically insulative material, an array of pairs of electrical contacts (160) disposed in the base member ...  
WO/2017/188595A1
The present invention provides a bipartite probing device comprising: a barrel formed in a hollow cylindrical shape opened at both ends thereof so as to have a first opening and a second opening; an intermediate member disposed such that...  
WO/2017/186410A1
The invention relates to a method for determining a load current, which is based on the passage of a calibration current in a specific manner and on specific calculation methods.  
WO/2017/189660A1
A cable for communicating digital or analog signals between connectors at its opposite ends has means for indicating to an installer who has access to one end of the cable which connector is connected at the opposite end of the same cabl...  
WO/2017/183757A1
The present invention relates to a contact pin for testing an electrical terminal mounted on a printed circuit board, etc. The present invention provides a contact pin comprising: a substrate, which is made of a single material, and whic...  
WO/2017/183788A1
An embodiment of the present invention provides a test socket for a semiconductor device, comprising: a base layer having a first surface and a second surface opposite to the first surface, and having, on the second surface, an external ...  
WO/2017/179836A1
The present invention relates to a CIS probe card which prevents light projected for CIS inspection from being interfered with by lead-in wires and to a method for producing the CIS probe card. The CIS probe card comprises: a plurality o...  
WO/2017/179390A1
Provided is an electrical characteristic inspection method whereby electrical characteristics of a semiconductor device can be inspected even in the cases where an electrode of the semiconductor device is not protruding. An electrical ch...  
WO/2017/179869A2
The present invention relates to an apparatus and a method for protecting a MOSFET relay by using a voltage detector and a signal fuse, wherein a voltage value is calculated by detecting, through a voltage detector, the value of a curren...  
WO/2017/179320A1
A probe pin (10) is provided with: a coil spring (11) which extends and contracts along a centerline; a first contact (25) which has a rectangular cross section and is disposed at one end on the centerline; and a second contact (34) whic...  

Matches 1 - 50 out of 26,403