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Patent Searching and Data


Matches 1 - 50 out of 26,744

Document Document Title
WO/2018/186802A1
A vertical type test assembly with adjustable contact pressure feature for test on wafer. The test assembly having a probe head comprising a plurality of guide plates with a plurality of through holes wherein at least one the plurality o...  
WO/2018/187068A1
Probe systems and methods including electric contact detection. The probe systems include a probe assembly and a chuck. The probe systems also include a translation structure configured to operatively translate the probe assembly and/or ...  
WO/2018/180633A1
The objective of the present invention is to prevent localized wear of a socket and a plunger even if the plunger has a small diameter. A Kelvin inspection jig 1 is provided with a socket 90 and a pair of probes 10 attached to the socket...  
WO/2018/182727A1
A coaxial wire interconnect architecture and associated methods are described. In one example, the coaxial wire interconnect architecture is used in a test socket interconnect array. Flexible bends are formed in one or more of the coaxia...  
WO/2018/181776A1
This contact probe is a conductive contact probe capable of extending/retracting in the axis line direction. The contact probe is provided with: a first contact member to be in contact with one subject to be in contact with; a second con...  
WO/2018/182719A1
Space transformation technology for probe cards at sort is disclosed. In one example, a space transformer transforms a pitch of electrical contacts from a first distribution to a second distribution. The space transformer comprises a sub...  
WO/2018/181273A1
The probe according to one embodiment of the present invention is provided with: a first plunger; a first end section having a first cutout for fitting in the first plunger; a first spiral section having a first spiral groove; and a firs...  
WO/2018/182327A1
A semiconductor package test socket and a method for manufacturing the same are disclosed. The test socket of the present invention is manufactured by the steps of: disposing a first film layer on a lower portion of a support plate havin...  
WO/2018/181216A1
This probe holder holds a plurality of contact probes each contacting, on one end side in the longitudinal direction thereof, one electrode to be contacted, wherein a plurality of holder holes are formed which comprise a single sheet of ...  
WO/2018/178847A1
A wire harness test system designed to facilitate and harmonize the integration of electrical test modules into the test table is disclosed, making it more versatile and multipurpose in terms of the diversity of wire harness families tha...  
WO/2018/182116A1
The present invention relates to an electric conductance inspection device installed on a printed circuit board, the electric conductance inspection device comprising: a probe pin contacting an inspection device for inspecting the perfor...  
WO/2018/171187A1
Disclosed is a panel testing device, comprising: a support member (1) and a plurality of testing needles (2) arranged on the support member (1), wherein the plurality of testing needles (2) correspond to a plurality of signal needles (4)...  
WO/2018/173448A1
The present invention is provided with: a probe (11); a probe head (12) that holds the probe (11); and an electrode substrate (13), on which an electrode pad (131) for connecting to a base end portion of the probe (11) is disposed. A gui...  
WO/2018/173884A1
This probe structure 1 is provided with: a holding plate 2 which has a first surface 21 and a second surface 22, and wherein at least the first surface 21 is insulated; a plurality of electrodes 3 which are formed on the first surface 21...  
WO/2018/168136A1
The present invention is provided with a coil spring that expands and contracts along a center line and a first plunger and second plunger that are disposed serially with the coil spring on both sides of the direction following the cente...  
WO/2018/166737A1
The invention relates to a test socket having a plurality of contact elements, each for contacting an electrical signal or an electrical potential, and having at least one contacting device for contacting a high frequency signal each. Th...  
WO/2018/169308A1
The present invention relates to a voltage conversion device having an improved inductor current cutoff speed, the device comprising: a current measuring means installed in a path through which an inductor current flows; a threshold curr...  
WO/2018/167207A1
Disclosed is a carrier including: a base (100) on which a circuit board (121) is mounted; a loading device (111) mounted on the base (100) and configured to load an electronic device (1) thereon; a first pressing device mounted on the ba...  
WO/2018/162956A1
A method of testing a transistor component, the method comprising the step of, (a) capturing a first image of the transistor component which is to be positioned into a nest for testing; (b) identifying from the first image the locations ...  
WO/2018/163755A1
This positioning mechanism for a Kelvin inspection terminal makes it possible to simply assemble a Kelvin inspection terminal together with an IC socket and enhance the accuracy of the positioning of the Kelvin inspection terminal in rel...  
WO/2018/162343A2
A probe for direct nano- and micro-scale electrical characterization of materials and semi conductor wafers. The probe comprises a probe body, a first cantilever extending from the probe body. The first cantilever defining a first loop w...  
WO/2018/163487A1
[Problem] To provide a current measurement apparatus that is capable of reducing or removing the necessity of the work of pulling out a conductor in which measurement is to be performed, from a wiring duct or the like, and facilitating c...  
WO/2018/160557A1
A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combina...  
WO/2018/158330A1
A current sensor for detecting a current from or into a vehicle battery, comprising: * a measurement circuit; and * an electric conductor, having: - at least one first measurement path, defined by a first potential pick-up contacting mea...  
WO/2018/154586A1
A system and methods are provided for robot-assisted, interactive testing of electronic circuits comprising a test fixture comprising a robotic arm, a probe, and a bracket configured to hold a unit-under-test, wherein the probe is config...  
WO/2018/153963A1
A testing head (20), apt to verify the working of a device under test integrated on a semiconductor wafer, said testing head (20) comprising at least one guide (40) provided with a plurality of guide holes (40h) and a plurality of contac...  
WO/2018/153949A1
It is hereinafter described a testing head (10) adapted to verify the functionality of a device under test (16) integrated on a semiconductor wafer, such testing head (10) comprising at least one guide (14, 13, 24) provided with a plural...  
WO/2018/155005A1
Provided is an electrical characteristic inspection tool that is capable of electrical characteristic inspection even if an oxide film has been formed on pads or bumps formed at a fine pitch. This electrical characteristic inspection too...  
WO/2018/149847A1
A probe card (20) of a testing apparatus of electronic devices comprises a testing head (21), which houses a plurality of contact elements (22) extending along a longitudinal axis (H-H) between a first end portion (24A) and a second end ...  
WO/2018/150478A1
The present invention provides a substrate inspection probe capable of reliably and easily touching electrodes of an extremely small surface-mount component, particularly a chip component or QFP LSI. In the present invention, a contact b...  
WO/2018/151398A1
The present invention relates to a system and a method for assigning a unique number to a cell module controller and, more specifically, to a system and a method for assigning a unique number to a cell module controller, the system and t...  
WO/2018/149838A1
A probe card (20) for a testing apparatus of electronic devices comprises a testing head (21), which houses a plurality of contact elements (22) extending along a longitudinal axis (H-H) between a first end portion (24A) and a second end...  
WO/2018/147024A1
A probe 20 that electrically connects to each other a first object to be in contact and a second object to be in contact is provided with: a cylindrical barrel section 50 extending in vertical direction Z; a first plunger section 60, a p...  
WO/2018/146911A1
Provided is a magnetically shielded room that is capable of suppressing positional deviation of a measuring tool in an interior space. The magnetically shielded room 1 is provided with: an upper shielding body 11, side periphery shieldin...  
WO/2018/147246A1
Provided is a jig which enables a probe head to be detached from and attached to an electrical connection device, without using a special holding device. This jig (50) is applicable to an electrical connection device (10) which electrica...  
WO/2018/145143A1
The invention relates to a measuring device such as a multimeter, comprising a retractable assembly, and including (i) a cable comprising a first end portion having a first probe and a second end portion having a second probe; (ii) a ree...  
WO/2018/147511A1
The present invention relates to a bidirectional conductive pin using carbon fiber and a bidirectional conductive pattern module, and a bidirectional conductive socket using the same. The bidirectional conductive pin using carbon fiber a...  
WO/2018/144878A1
A flexible electric probe can include: a flexible substrate; and probe line conductors on the flexible substrate, the probe line conductors being essentially parallel to each other and having separations of about 5-50 microns. The flexib...  
WO/2018/143577A1
Disclosed is a test probe for an object with a barrel-shaped contact terminal having a curved surface. The test probe includes a first contact member configured to comprise a contact portion having a pair of contact surfaces which are ar...  
WO/2018/143541A1
A battery management system may comprise: a charge control switch disposed in a high current path between a plurality of pack terminals and a battery module; and a controller which detects a cell voltage of each of a plurality of cells c...  
WO/2018/142170A1
The invention is a contacting device suitable for measurements and/or other contact tests, the device comprising a head unit comprising a plunger (14) having a broadened portion (28) at its first end, and a head element (16) being on a s...  
WO/2018/135782A1
A probe card according to an embodiment of the present invention is disposed in a state where two probe assemblies are functionally combined, corresponding to a component non-mounted region (R1) and a component mounted region (R2) of a t...  
WO/2018/135674A1
The present invention relates to a bidirectional conductive pattern module, wherein the bidirectional conductive pattern module comprises: a main body in which a plurality of base substrates having an insulating layer made of an insulati...  
WO/2018/132963A1
A capacitance detection apparatus, an electronic device and a pressure detection apparatus. The capacitance detection apparatus comprises: a coding circuit (110) for periodically charging and discharging at least one capacitor to be dete...  
WO/2018/132064A1
Testing apparatus operable to collect optical performance data of optoelectronic devices at different temperatures includes thermal-adjustment devices in thermal and mechanical contact with the optoelectronic devices via optoelectronic d...  
WO/2018/130684A1
The present invention provides an apparatus for controlling the temperature of a substrate, and a corresponding production method. The apparatus is equipped with a planar main body (1; 1a, 1b) with a substrate contact surface (SF), with ...  
WO/2018/132599A1
Crosstalk between probes in a vertical probe array is reduced by providing a grounded metal carrier disposed between the guide plates of the probe array. The metal carrier includes pockets that are laterally separated from each other by ...  
WO/2018/130965A1
The present invention relates to an enclosure assembly (9) and to a metering apparatus (1), comprising a first enclosure portion (10) and a second enclosure portion (11) which are configured to be assembled by being moved towards each ot...  
WO/2018/129439A2
An integrated circuit device testing system includes a socket configured to receive an integrated circuit device, wherein the socket comprises at least one conductive trace made of a material with a resistivity that is a function of temp...  
WO/2018/128699A1
An automated microtester array, for simultaneously testing a plurality of devices under test, includes a plurality of automated microtesters, wherein each of the plurality of automated microtesters is configured to test a plurality of de...  

Matches 1 - 50 out of 26,744