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JP6173823B2 |
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JP6174296B2 |
In a multi-channel oscilloscope a method of calibrating interleaved digitizer channels initially calibrates each digitizer channel to produce a bandwidth enhanced filter (20a-d) for each digitizer channel to match the respective channel ...
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JP6174310B2 |
The present disclosure provides an acquisition system for oscilloscopes having n input channels. The acquisition system comprises n A/D converters (2. 1 , 2. 2 , ..., 2. n ) with each of the n A/D converters receiving a signal under test...
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JP6155503B2 |
Embodiments of the invention include methods, apparatuses, and systems for automatically identifying a synchronization sub-pattern associated with a test pattern. A test and measurement instrument is triggered in response to a first inst...
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JP6151900B2 |
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JP6151483B2 |
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JP6151895B2 |
A test and measurement instrument includes a display having a time domain graticule (40, 60, 80) and a frequency domain graticule (44, 64, 84). A processor is configured to process an input signal to generate a time domain waveform (42, ...
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JP6134169B2 |
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JP6126771B2 |
A method is disclosed for triggering upon signal events occurring in frequency domain signals (138). The method includes repeatedly sampling a time-varying signal (122) and generating a plurality of digital frequency domain spectrums (12...
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JP6121272B2 |
To change a display position of a waveform displayed without causing a selection button and the like to be displayed.Provided is a processing part that, when causing a signal waveform to be displayed side by side along an orthogonal dire...
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JP6116408B2 |
To improve visibility and operability in a display mode causing a waveform and a cursor to be displayed.Provided are: a touch sensor 22 that is arranged oppositely in a display area AO of a display part 13; and a processing part that cau...
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JP6118125B2 |
To provide a waveform display device that enables any range of a waveform displayed on a display screen to be designated by a simplified operation.A waveform display device 10 comprises: a touch panel 16 that can detect a contact positio...
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JP6116409B2 |
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JP2017062136A |
To reliably and easily inspect an electric component.A processing device comprises a conversion unit for converting a vibration waveform generated when an inspection signal is supplied to an electric component into waveform data, and a p...
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JP2017040646A |
To improve the measurement of a time domain by a sampling module.A test and measurement instrument includes: an input unit configured to receive a reflected and/or transmitted pulse signal from a DUT 114; a reference clock input unit con...
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JP6083922B2 |
A waveform display apparatus and method displays one or more waveforms of a signal under test at high throughput while acquiring digital data of the signal under test in a large acquisition memory (104). A user sets a time interval of us...
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JP6082371B2 |
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JP6069113B2 |
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JP6067998B2 |
A method of grouping multiple waveforms for a single channel of acquired data on a display area (22) uses a graphic icon (10) with the display area. The graphic icon has a first portion with a symbol indicating the single channel and wit...
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JP6067963B2 |
Embodiments of this invention provide enhanced triggering capabilities such as frequency and phase triggering in a test and measurement instrument, such as a Real-Time Spectrum Analyzer (RTSA) or oscilloscope. A test and measurement inst...
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JP6059862B2 |
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JP2017003591A |
To improve a technique for sampling events in an electrical input signal.A cyclically resampling digitizer (CRD) delays a replicated event 120 of an input event 100 in an electrical input signal using a delay loop, and repeatedly capture...
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JP2016223992A |
To facilitate observing (browsing) record data which is recorded by a power supply line monitor or the like, on an external apparatus without a dedicated display program.A measurement signal recording device includes a moving image editi...
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JP2016218042A |
To calibrate the jitter or swing of a DUT(Device Under Test).A system 100 for dynamically calibrating the operation parameter of a device under test (DUT) 130 includes: a signal generation device 110 for generating a test pattern; a DUT ...
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JP6050566B2 |
A test and measurement instrument processes digital data that represents an input signal to produce a target image, and then uses a computer vision technique to recognize a signal depicted within the target image. In some embodiments, th...
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JP6043486B2 |
A dF/dT trigger system and method includes instantaneously triggering on a frequency deviation of a data signal, which can be associated with an SSC signal. After receiving a signal at an input terminal (210) of a test and measurement in...
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JP6042164B2 |
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JP6042224B2 |
To quickly and easily set an operation condition.When touch operation to a determination button 14 is performed in a state where a new set value is inputted to a set value input area 11-1a selected as an input target area and a distance ...
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JP2016206201A |
To broaden a bandwidth of an AWG output signal by a harmonic time interleave.A first sum unit 120 is configured to generate a sum reference signal adding a sample clock fs, and signal having a frequency of the sample clock multiplied by ...
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JP6041096B2 |
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JP2016194516A |
To correctly map a hit count of each pixel of raster images of a waveform display device to luminance information.A rasterizer 206 is configured to sequentially rasterize waveform data from a digitizer 202 to generate a plurality of rast...
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JP5996394B2 |
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JP5995450B2 |
A test and measurement instrument and method for generating IQ-based time domain waveform information and presenting the IQ-based time domain waveform information together with other time domain waveform on a common axis through a user i...
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JP5981700B2 |
A test and measurement instrument including a time domain channel configured to process a first input signal for analysis in a time domain; a frequency domain channel configured to process a second input signal for analysis in a frequenc...
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JP5979829B2 |
A test and measurement instrument (100) and method for receiving a radio frequency (RF) signal, digitizing the RF signal using an analog-to-digital converter (108), downconverting (115) the digitized signal to produce I (in-phase) and Q ...
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JP2016139956A |
To connect, using a single distribution line, trigger signal input and trigger signal output of power oscilloscope devices etc.A trigger signal input output circuit comprises: a transmission photo coupler 4; a reception photo coupler 3; ...
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JP5963560B2 |
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JP5950727B2 |
To easily set cursor displaying at a desired position.When a prescribed operation is performed, an enlarged waveform display screen 12 for displaying signal waveforms W1b and W2b obtained by enlarging waveforms W1a and W2a within a time ...
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JP2016125823A |
To display a cyclically fluctuating (frequency fluctuation) portion included in a signal to be measured in a visually easily understandable manner.A signal to be measured that is successively inputted over a prescribed time is assigned a...
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JP5947407B2 |
An adapter for a sensor measuring a differential signal comprises two electrically conductive test-contact elements which are arranged in each case eccentrically relative to an axis of rotation in order to register respectively one parti...
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JP5946022B2 |
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JP5944207B2 |
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JP2016109598A |
To accurately detect by a purely software technique a crossing point (trigger point) when a signal either rises or falls from a trigger level.An apparatus for implementing a trigger detecting method has control means that detects, where ...
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JP2016102663A |
To display as many logic waveforms as possible at one time in one limited display screen so that HI and LO in adjacent logic waveforms are easy to distinguish.According to the method for displaying a logic waveform formed of binary of HI...
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JP5924952B2 |
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JP5917094B2 |
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JP2016050829A |
To provide a waveform recording apparatus with a similar image retrieval function allowing retrieval of similar waveforms and the like by comparing measured waveforms, without previously setting retrieval conditions.The waveform recordin...
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JP5896617B2 |
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JP5893504B2 |
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JP2016031371A |
To correct timing errors of a clock signal.Each of four samplers 212, 214, 216, 218 receives a clock signal that has been split. A first clock signal 204 is sampled by a first sampler 212 at a first phase, a second clock signal 206 is sa...
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