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JP5354446B2 |
To provide a waveform measuring apparatus capable of speedily and accurately informing measurement operators that excessive signals exceeding the input voltage specifications of a waveform measuring apparatus body and a probe have been i...
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JP5354448B2 |
To provide a waveform measuring instrument for effectively using an acquisition data buffer. The waveform measuring instrument including an AD convertor 2 for converting an analog input signal 20 into a digital signal, a digital memory 3...
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JP5348389B2 |
To provide an oscilloscope accelerated in the speed of correction work and simplified in the work. The oscilloscope has a signal source with a probe correction signal as an output and a display means for displaying a correction signal by...
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JP5344213B2 |
To provide a probe accessory with measurement reliability and reproducibility improved by a pin pitch fixing mechanism provided to prevent pins from moving even when a probe is brought into contact with a measurement subject. The probe a...
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JP5344342B2 |
An equalization simulator with training sequence detection uses an oscilloscope to acquire digital samples of an analog waveform signal from a serial data link to produce a digitized waveform record. The equalization simulator has traini...
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JP5344220B2 |
To obtain a measuring apparatus and a method for operating the same, capable of easily displaying a set item in a menu fashion about a function which is displayed and explained on a help window. The measuring apparatus for displaying bot...
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JP5349995B2 |
To easily display an X-Y waveform at a desired display position with a desired display scale. The waveform display device includes a display part 14 for displaying X-Y waveforms W1, W2 in a waveform display screen 21, an operation part a...
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JP5338191B2 |
To provide a waveform measurement device that allows a user to instantaneously and intuitively grasp information about a cursor and thereby enhances user friendliness. A waveform measurement device 1 includes: an A-D conversion section 1...
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JP5340683B2 |
To measure by all synchronous measuring devices by being synchronized with an event generated in one synchronous measuring device. This device is equipped with: selectors 4 (4a-4d) for connecting trigger output terminals 3 (3a-3d) to som...
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JP5341569B2 |
To provide an insulating input type measuring instrument that facilitates changing an insulating input type measuring instrument of a basic insulating input type into a double insulating input type. In this insulating input type measurin...
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JP5339459B2 |
To provide an oscilloscope control system that facilitates accurate operation of an oscilloscope in a hand-free state, without employing any complicated mechanism or control. The oscilloscope control system controls measurements in the o...
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JP5339125B2 |
To provide a waveform display device viewing easily a waveform of a signal to be measured, and reading easily information on the waveform of the signal to be measured. This device is acquired by improving a waveform display device for di...
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JP5332560B2 |
To provide a waveform measuring device capable of immediately confirming a waveform, when aperiodic sampling such as sampling of a low sampling period and external sampling, is performed. The waveform measuring device composed so as to t...
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JP5334551B2 |
To provide a sampling waveform measurement device, capable of measuring an eye waveform with less timing drift even when an approximate value of bit frequency of input signal is unknown, and a signal quality monitor with high accuracy. I...
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JP5328489B2 |
Provided is a sampling apparatus that samples a signal under measurement, including a clock control section that generates a plurality of sampling clocks at a plurality of sampling phases at determined non-uniform intervals, so as to can...
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JP5331375B2 |
To provide a sampling device having a short measuring time. This sampling device for sampling a repeated signal repeated for every repeating period determined beforehand has: a sampling part for sampling at a plurality of sampling timing...
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JP5331575B2 |
Provided is a sampling apparatus that samples a signal under measurement, including a sample processing section that outputs sample data obtained by sampling the signal under measurement with a sampling timing at non-uniform intervals ob...
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JP5326478B2 |
To provide a display device that can prevent lowering of expressive power at a time when an image of image forming elements forming a display image is displayed and can produce an image to be printed from the display image in a short tim...
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JP5328255B2 |
There are provided a waveform observing apparatus and waveform observing system that solve a problem of displacement of a handwritten comment which occurs with enlargement/reduction in display in such a manner that, when a determination ...
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JP5328488B2 |
Provided is a sampling apparatus that samples a signal under measurement, including a sampling section that samples the signal under measurement with a plurality of sampling phases at non-uniform intervals for each sampling repetition cy...
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JP5323365B2 |
To provide a measuring device which can understand setting items so as to enable to designate a suitable measuring condition even if an operator is unfamiliar to operation. The measuring device comprises a measuring condition designation...
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JP5319153B2 |
To scroll a waveform chart displayed on a monitor with the same sense as pulling out the roll-wound waveform chart paper or rewinding it. In a following scroll of S107, processing of making the waveform chart follow the movement of a fin...
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JP5319172B2 |
To provide a waveform observation device enabling a user to enjoy a merit of increasing a capacity of a memory to be loaded on the waveform observation device, by reducing complication for editing measurement data by using an external co...
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JP5319201B2 |
There is provided a waveform observing apparatus, which facilitates management of compressed data and measured data that were created for a reduced display, reduces a calculating amount in making the reduced display, and displays a bound...
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JP5319173B2 |
There are provided a waveform observing apparatus and the system thereof in which, when a removable storage medium is inserted into the waveform observing apparatus to capture a copy of measured data, a difference copy is made while incl...
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JP5306692B2 |
To provide a waveform display, capable of easily acquiring a change with time of a waveform shape or coordinate point. The device includes a recording part for recording data showing changes with time of two or more kinds of physical qua...
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JP5307848B2 |
To provide an inspection apparatus capable of correctly determining the quality of a product even if much time is required from the operation start of a manufacturing process apparatus therefor until the apparatus is stabilized.The inspe...
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JP5304991B2 |
To provide an image composing device in which a composition order conversion unit is greatly reducible in circuit scale. The image composing device operative to generate a desired display image by putting a plurality of images one over a...
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JP5303440B2 |
To perform trigger synchronization on any one signal observed as being input to a plurality of input terminals, without requiring cable replacement operations to signal input terminals, and to constitute a waveform observation apparatus ...
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JP5306709B2 |
To display the whole screen of a measuring device simultaneously referred to on a display part of an external device. This device is equipped with a storage part for storing a display control program for allowing the external device to e...
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JP5299774B2 |
An improved hold-off algorithm that assures that all data associated with all trigger events in a data signal are displayed uses a designated interval starting with a first trigger event (A) to determine whether any subsequent trigger ev...
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JP5299671B2 |
To provide a serial bus trigger circuit for outputting uniform pulses without use of a high-capacity memory. The serial bus trigger circuit includes: an amplifier for inputting a signal transferred on a serial bus in units of frame, and ...
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JP5295679B2 |
There is provided a waveform observing apparatus with a reduced depth in such a manner that the waveform observing apparatus is one including a terminal board, connecting wiring extending from external equipment, a memory for receiving m...
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JP5292999B2 |
To provide a device for measuring a waveform for speedily and efficiently searching for an attention part of waveform data stored in long memory with a relatively easy operation. This device for measuring a waveform is constituted so as ...
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JP5294320B2 |
Pre-trigger and post-trigger acquisition for a no dead time acquisition system, where the data being displayed does not include a related trigger event, has a variable record length buffer having a maximum record length equal to a maximu...
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JP2013181980A |
To provide systems and methods for compressing high-frequency signals.A high-frequency signal can be converted into a lower frequency signal so that it can be processed by one or more devices in a lower frequency infrastructure. The high...
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JP5285528B2 |
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JP5273651B2 |
Position Lock Trigger apparatus employs oscilloscope circuitry and accompanying control software to provide to a user the capability to trigger an oscilloscope on a selected bit position in a received serial bit stream having a fixed pat...
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JP5273715B2 |
A method of region overlap control for the display of a plurality of waveforms on an instrument includes an overlap function that allows selection by a user of a vertical height on a display screen for each of the waveforms. A ground mar...
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JP2013164321A |
To provide a user-friendly measuring instrument capable of setting an arbitrary trigger condition in an expression form that is easy for a user to understand.A measuring instrument having a trigger setting function for setting a prescrib...
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JP5269457B2 |
To easily select an optional part from waveform data of a data strobe signal (DQS) of DDR (Double Data Rate) memory. First and second amble thresholds including a maximum value and minimum value of a high impedance part of the DQS in the...
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JP5264221B2 |
To provide a measurement device capable of designating proper measurement conditions even by an operator not skilled in operations. The measurement device includes a control part for causing a display part 4 to display a measurement cond...
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JP5249499B2 |
An RF/IF signature trigger for acquiring received RF signal data is generated by correlating the received RF signal data in the form of a time domain RF/IF signal, a detected RF/IF signal and/or a frequency domain RF/IF signal with a ref...
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JP5246478B2 |
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JP5239267B2 |
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JP5239395B2 |
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JP5218814B2 |
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JP5218783B2 |
A realtime spectrum trigger system on a realtime oscilloscope considers both the magnitude and phase of an input signal having a periodic component so that successive acquisitions of the input signal are time aligned. A user inputs a fre...
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JP2013124915A |
To provide a power meter capable of changing waveform display contents with relatively easy setting operation.A power meter having a waveform display function is provided with: display form setting condition storage means for storing a p...
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JP5206037B2 |
To achieve a sweeping type measuring device for displaying a smooth graph as a renewal rate maintained. In the sweeping type measuring device including a sweeping part for outputting a sweeping signal in which a signal level is changed i...
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