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JP5211122B2 |
A sampling apparatus that converts an analog target signal in which the same waveform repeats into a digital value by sampling the target signal at each of a plurality of phases, and outputs the digital value. The sampling apparatus comp...
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JP5208102B2 |
A fast rasterizer uses a fast memory that has a bit-set port for receiving data and a totally independent readout and clear port for outputting a waveform image. The fast memory is organized into rows and columns corresponding to the row...
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JP5205942B2 |
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JP2013104677A |
To allow a user to surely and easily recognize an outline of a measurement result in a graph of any measurement result displaying frame, regarding a region hidden behind a graph of other measurement result displaying frame.A device for d...
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JP5194990B2 |
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JP2013076635A |
To record data capable of displaying or printing an accurate signal waveform surely in a short time.A waveform recording apparatus includes: a signal processing part for performing signal-processing on an input signal; an A/D conversion ...
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JP5186980B2 |
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JP5190754B2 |
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JP5186905B2 |
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JP5186979B2 |
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JP2013072656A |
To provide a data processing technology which can extract useful data and prevent deterioration of accuracy.In a data processing device 20, a receiving portion 22 receives an input signal. An extracting portion 24 extracts data for proce...
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JP2013064655A |
To obtain a waveform measuring device capable of simultaneously displaying analysis results by simultaneously analyzing waveform data fetched to different acquisition data storage areas.The device is provided with: a plurality of analysi...
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JP5177796B2 |
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JP5176534B2 |
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JP5165355B2 |
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JP5165343B2 |
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JP5165291B2 |
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JP5160999B2 |
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JP5163856B2 |
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JP5160178B2 |
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JP5158424B2 |
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JP5155994B2 |
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JP5152473B2 |
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JP5152512B2 |
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JP5152476B2 |
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JP5154236B2 |
To surely and easily refer to display of set states concerning all operation conditions, without any troublesome operation. This measuring device is provided with a controller for displaying each set state concerning five kinds of operat...
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JP5154190B2 |
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JP5136034B2 |
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JP5135890B2 |
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JP2013024835A |
To improve operability when the display position of a display image or a selectable setting value is changed to be displayed.The measuring device is configured to carry out a touch operation by touching a contact surface 27a of a touch s...
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JP5131526B2 |
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JP5125363B2 |
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JP5125382B2 |
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JP5123424B2 |
The probe (1) has two test prods (3) that are provided on a changing device (2). The changing device is connected to the probe and is alternately connected to an electric waveguide (4) such as a coaxial cable that runs inside the probe. ...
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JP5128219B2 |
To provide a display device capable of improving convenience when displaying a trend graph indicating change of measured values. The display device includes: a storage part for storing an event concerning measured data about a physical a...
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JP5120613B2 |
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JP5119973B2 |
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JP2013007565A |
To determine the existence/absence of the incidence of a part omitted from a determination area in a signal waveform in a short period of time.A storing part 4 for storing area data Da showing a determination area A about a determination...
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JP5115795B2 |
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JP5115071B2 |
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JP5115121B2 |
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JP5113822B2 |
A wide bandwidth attenuator input circuit for a measurement probe has a Z 0 attenuator circuit coupled in series with a compensated RC attenuator circuit. The series attenuator elements of the Z 0 and the compensated RC attenuator circui...
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JP5115786B2 |
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JP2013003054A |
To provide a waveform measurement device which displays a fundamental wave component in real time from a PWM waveform signal without using a low-pass filter, and in which an amount of delay of the fundamental waveform component is consta...
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JP5109469B2 |
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JP5109448B2 |
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JP5089555B2 |
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JP2012233832A |
To generate a common determination area for determining waveforms related to different portions of a determination-target signal in a temporal axis direction.A process part performs: an extraction process of extracting plural data string...
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JP2012233851A |
To indicate a degree of approach of a test object signal to a trigger condition.The test object signal is digitalized by an ADC 315, and a digital sample is supplied to a trigger event detector 305. In response to the trigger signal, the...
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JP5080459B2 |
A wideband differential signal probe includes separate paths to convert a lower frequency component and a higher frequency component of a differential signal to a lower frequency single ended signal and a higher frequency single ended si...
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