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Matches 551 - 600 out of 3,742

Document Document Title
JP4830217B2  
JP4826871B2  
JP4802363B2  
JP4778962B2  
JP4729269B2  
JP2011118427A
To enable switching of at least two of the observation methods in an optical microscope system for e.g. bright field observation, dark field observation, and differential interference observation.A confocal laser scanning microscope for ...  
JP2011107732A
To switch at least two types of observation methods, in observation methods of an optical microscope system, for example, such as bright field observation, dark field observation or differential interference observation.A confocal laser ...  
JP4690036B2  
JP2011103303A
To prevent a short circuit between an electron emission material and a grid electrode, and to suppress the diffusion of an electron beam.The triode-type cathode structure is configured to laminate an electrode 13 forming a cathode, a sup...  
JP4684342B2  
JP4670154B2  
JP4651084B2  
JP2011040292A
To provide an electron gun which does not cause displacement in horizontal direction of a cathode electrode.The electron gun 10 has a case 11. A cathode member 31, a heating device 32, and an anode electrode 3 are arranged in the case 11...  
JP2011018653A
To reduce space charge phenomenon and sample charging and increase accuracy in measurement of amount of irradiation currents in a gas cluster ion beam processing system.A vented Faraday cup 302 includes a conductive shock plate 308 with ...  
JP4580438B2  
JP4580439B2  
JP4550395B2  
JP4538126B2  
JP4535743B2  
JP2010181415A
To provide an electron beam accelerator and an electron accelerating method, which facilitate maintenance of an electron beam device in a short time.The electron beam accelerator includes: a vacuum chamber 46 having an electron beam radi...  
JP2010164582A
To provide an electron accelerator performing maintenance of an electron beam device easily in a short time, and an electron acceleration method. The electron accelerator includes: a vacuum chamber 46 having an electron beam exit window ...  
JP4510629B2  
JP4506260B2  
JP4498024B2  
JP4484868B2  
JP4468126B2  
JP4456891B2  
JPWO2008068806A1
集束性の高い電子ビームを出力することがで きる小型で低額なRF電子銃は、筐体部(1 0)、ポールピース(13d)およびコイル (14d)から構成され、静磁場を生成...  
JP4409846B2  
JP4405260B2  
JP2009259848A
To provide an electron acceleration method facilitating maintenance of an electron beam device, and increasing the degree of vacuum in a vacuum chamber without operating a vacuum pump for continuous exhaust.This electron acceleration met...  
JP4359597B2  
JP4345403B2  
JP4330795B2  
JP4328673B2  
JP4328192B2  
JP4307003B2  
JP4298399B2  
JP4293780B2  
JP4255616B2  
JP2009076474A
To provide an electron-optical lens barrel suitable for miniaturization, and its manufacturing method.The electron-optical lens barrel is provided with a barrel body 1 and an electrostatic lens 2 arranged on an inner surface of the barre...  
JP4234794B2  
JP4220209B2  
JP4220543B2  
JP4219724B2  
JP4220122B2  
JP4213770B2  
JP4206081B2  
JP4204075B2  
JP2008300358A
To provide a system and a method for rapid adjustment of a focal distance of a charged particle beam.The system and the method for rapidly changing a focal distance of a charged particle beam are provided. The method is provided with a s...  

Matches 551 - 600 out of 3,742