Title:
【発明の名称】感度を向上するためのイオントラップを有する四重極質量分析計
Document Type and Number:
Japanese Patent JP2003501790
Kind Code:
A
Abstract:
A mass spectrometer method and apparatus has a mass analyzer and a collision cell. The collision cell is configured to trap ions. Precursor ions are selected in the first mass analyzer and then subject to collision-induced dissociation in the collision cell. The fragment ions are then scanned out axially by application of suitable excitation to the ions. The fragment ions can then be detected by a time of flight (TOF) mass spectrometer. For a TOF spectrometer, trapping fragment ions in the collision cell and scanning them out can give enhanced sensitivity.
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| JP5341323 | Mass spectrometer |
Inventors:
Hager, James W
Application Number:
JP2001500825A
Publication Date:
January 14, 2003
Filing Date:
May 26, 2000
Export Citation:
Assignee:
MDS Incorporated
International Classes:
G01N27/62; H01J49/40; H01J49/42; (IPC1-7): H01J49/42; G01N27/62; H01J49/40
Domestic Patent References:
| JPH07201304A | 1995-08-04 | |||
| JPH09326243A | 1997-12-16 |
Foreign References:
| WO1997047025A1 | 1997-12-11 |
Attorney, Agent or Firm:
Seiji Yanagida (1 person outside)