Title:
【発明の名称】原子間力顕微鏡による分子間の相互作用を測定する方法及び装置並び原子間力顕微鏡用試料保持部材及びカンチレバー
Document Type and Number:
Japanese Patent JP2003505665
Kind Code:
A
Abstract:
A sample support member for atomic force microscopy of intermolecular interactions includes a sample support base having a plurality of protrusions, each protrusion having an apical substrate region or tip that has been chemically modified by the immobilization thereon of a sample compound or of a linking compound that is capable of binding a sample compound. A reference compound support member has a surface region having at least one reference compound immobilized thereon. The relative position and orientation of the reference compound support member and the substrate support member are controlled to select a particular protrusion and to cause an interaction between a reference compound immobilized on the surface region of the free end of the cantilever and the sample compound immobilized on the apical substrate area of the selected protrusion. A physical parameter associated with the interaction between the reference compound and the sample compound can be measured.
Inventors:
De Bolt, Green, Jiyoung-Blues.
Lee, Gil, You.
Lee, Gil, You.
Application Number:
JP2000548680A
Publication Date:
February 12, 2003
Filing Date:
May 05, 1999
Export Citation:
Assignee:
THE UNITED STATES OF AMERICA
International Classes:
G01B21/30; G01B5/00; G01B5/30; G01Q30/02; G01Q60/24; G01Q60/42; (IPC1-7): G01N13/10; G01B21/30; G01N13/16
Attorney, Agent or Firm:
Shigeru Yagita (2 outside)