Title:
試験小片分析装置
Document Type and Number:
Japanese Patent JP2005509886
Kind Code:
A
Abstract:
A test strip analysis apparatus comprising a housing, an insertion station for receiving a test strip to be inspected, an optical measuring unit for measuring the test strip, a transport device for transporting the test strip from said insertion station to the optical measuring unit within the reaction period required for the test strip, and an analyzing unit for evaluating the measurement of the strip, wherein the transport device comprises first and second transport sections which are interconnected through a connecting region and can be driven independently of one another, with the first transport section being capable of transporting the test strip at a higher first transport speed from the insertion station to the connecting region, and the second transport section being capable of transporting the test strip at a slower second transport speed from the connecting region to the optical measuring unit.
Inventors:
Ziegler, Walther
Application Number:
JP2003546083A
Publication Date:
April 14, 2005
Filing Date:
November 18, 2002
Export Citation:
Assignee:
Quidel Corporation
International Classes:
G01N21/78; G01N21/86; G01N35/04; G01N35/00; (IPC1-7): G01N35/04; G01N21/78
Attorney, Agent or Firm:
Hidesaku Yamamoto
Takaaki Yasumura
Natsuki Morishita
Takaaki Yasumura
Natsuki Morishita