Title:
X線検査装置及び方法
Document Type and Number:
Japanese Patent JP2005511222
Kind Code:
A
Abstract:
An X-ray examination apparatus and method that provides fast and accurate control of the X-ray dose by combining a fast and inaccurate sensor dose signal for an X-ray sensor and a slow and accurate detector dose signal from an X-ray detector. The combination of the signals takes into account the delay between the two signals so that they are measured at essentially the same time.
Inventors:
Wolfs Peter Bee
Application Number:
JP2003551567A
Publication Date:
April 28, 2005
Filing Date:
December 02, 2002
Export Citation:
Assignee:
Koninklijke Philips Electronics N.V.
International Classes:
A61B6/00; G01T1/02; G01T1/17; G21K5/02; H05G1/44; G21K5/00; (IPC1-7): A61B6/00; G01T1/02; G01T1/17; G21K5/00; G21K5/02; H05G1/44
Attorney, Agent or Firm:
Susumu Tsugaru
Akihiko Miyazaki
Fueda Shusen
Akihiko Miyazaki
Fueda Shusen