Title:
照明方向に対して垂直な観察方向を有する顕微鏡
Document Type and Number:
Japanese Patent JP2006509246
Kind Code:
A
Abstract:
Microscope (100) with at least one illumination beam path (2) and at least one detection beam path (5) comprises a focussing arrangement (3) for each illumination beam path for producing an extended planar object illumination region in the direction of and perpendicular to an illumination axis of the illumination beam path. A detection device (10) of the detection beam path is arranged approximately orthogonally to the planar object illumination region. A movement arrangement is provided for producing relative movement between the planar object illumination region and an object (4) to be investigated. Independent claims are also included for alternative microscopes.
Inventors:
Ernst Harker Stelzer
Zebastian enders
Yan Huisken
Steffen Lindeck
James H Swagger
Zebastian enders
Yan Huisken
Steffen Lindeck
James H Swagger
Application Number:
JP2004557847A
Publication Date:
March 16, 2006
Filing Date:
June 06, 2003
Export Citation:
Assignee:
Europaeisches Laboratorium fuer Molekularbiologie(EMBL)
International Classes:
G02B21/00; G02B21/06
Domestic Patent References:
| JPS6120841A | 1986-01-29 | |||
| JP2002291702A | 2002-10-08 | |||
| JP2001013445A | 2001-01-19 | |||
| JPH04127152A | 1992-04-28 | |||
| JPH02239642A | 1990-09-21 | |||
| JPH07174687A | 1995-07-14 | |||
| JPH0210230A | 1990-01-16 | |||
| JPS3938343Y1 | ||||
| JPS5324637U | 1978-03-02 |
Foreign References:
| WO2002095476A2 | 2002-11-28 |
Attorney, Agent or Firm:
Toshio Yano
Toshiomi Yamazaki
Takuya Kuno
Einzel Felix-Reinhard
Reinhard Einsel
Toshiomi Yamazaki
Takuya Kuno
Einzel Felix-Reinhard
Reinhard Einsel