Title:
例えばEXAFS(広帯域X線吸収微細構造)測定での蛍光収率(FY)と全電子収率(TEY)との分離を可能にする電離粒子分析器
Document Type and Number:
Japanese Patent JP2007505308
Kind Code:
A
Abstract:
An ionising particle analyser comprises a source of ionising particles, a charged particle detector, and an ionisable gas located between the source and the detector. The analyser further comprises a charged particle impeding device located between the source and the detector. The charged particle impeding device is arranged to be maintained in a first configuration at a potential to impede the passage of charged particles and pass uncharged particles.
Inventors:
James Edmond Bateman
Gareth Derbyshire
Gareth Derbyshire
Application Number:
JP2006525873A
Publication Date:
March 08, 2007
Filing Date:
August 27, 2004
Export Citation:
Assignee:
COUNCIL FOR THE CENTRAL LABORATORY OF THE RESEARCH COUNCILS
International Classes:
G01N23/223; G01N23/22
Domestic Patent References:
| JPH01202650A | 1989-08-15 | |||
| JPS6073446A | 1985-04-25 | |||
| JP2001221754A | 2001-08-17 |
Attorney, Agent or Firm:
Nobuyasu Nishioka
Yoshiko Sugioka
Yoshiko Sugioka