Title:
可変反射体を有するX線検出器用シンチレータ
Document Type and Number:
Japanese Patent JP2007526475
Kind Code:
A
Abstract:
The invention concerns an X-ray detector with a photo-sensitive detector layer (10) above which a scintillation layer (30) for the conversion of X-rays (X) into photons (v) is disposed. Photons (v) are reflected back into the scintillation layer (30) by a reflector (40) that is provided on the scintillation layer (30) for an improved signal gain and signal-to-noise ratio. The reflectivity of the reflector (40) can be externally controlled. This is achieved for example by a reflective layer (41, 42, 43) of E-Ink being disposed between two electrodes (44a, 44b). Thus the reflectivity can be decreased at sufficiently high X-ray doses in order to improve image sharpness and dynamic range of the detector.
Inventors:
Lutten, Walther
Overdick, michael
Overdick, michael
Application Number:
JP2007501387A
Publication Date:
September 13, 2007
Filing Date:
February 21, 2005
Export Citation:
Assignee:
Koninklijke Philips Electronics N.V.
International Classes:
G01T1/20; A61B6/00; H01L27/14; H01L31/09; H04N5/32
Attorney, Agent or Firm:
Tadahiko Ito
Shinsuke Onuki
Tadashige Ito
Shinsuke Onuki
Tadashige Ito