Title:
物質の平均原子番号及び質量を求めるための方法及びシステム
Document Type and Number:
Japanese Patent JP2008506124
Kind Code:
A
Abstract:
Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.
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Inventors:
Redou, Robert, Jay.
Bertozzi, William
Bertozzi, William
Application Number:
JP2007520562A
Publication Date:
February 28, 2008
Filing Date:
July 08, 2005
Export Citation:
Assignee:
PASSPORT SYSTEMS, INC.
International Classes:
G01N23/227
Domestic Patent References:
| JPH05212028A | 1993-08-24 | |||
| JPH04319654A | 1992-11-10 | |||
| JPH07505216A | 1995-06-08 |
Attorney, Agent or Firm:
Mizuno Yuuki
Junji Endo
Junji Endo