Title:
一体的な寿命検出能力を有する構造
Document Type and Number:
Japanese Patent JP2008546590
Kind Code:
A
Abstract:
A structure subjected to stresses that can lead to structural failure. The structure includes first and second conductive layers and an intermediate layer therebetween formed of a dielectric, semiconductive, or resistive material, such that the first, second, and intermediate layers form in combination an electrical element, namely, a capacitive or resistive element. The electrical element is located within the structure so as to be physically responsive to transitory and permanent distortions of the structure resulting from extrinsic and intrinsic sources. The structure further includes applying an electrical potential to at least one of the first and second conductive layers so as to generate an electrical signal from the electrical element, sensing changes in the electrical signal generated by the electrical element in response to the electrical element physically responding to the transitory and permanent distortions, and transmitting the changes in the electrical signal to a location remote from the structure.
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Inventors:
Kratz, Gray, William
Harmeyer, keith
Holland, Michael, A.
Harmeyer, keith
Holland, Michael, A.
Application Number:
JP2008518378A
Publication Date:
December 25, 2008
Filing Date:
June 22, 2006
Export Citation:
Assignee:
Purdue Research Foundation
Kratz, Gray, William
Harmeyer, keith
Holland, Michael, A.
Kratz, Gray, William
Harmeyer, keith
Holland, Michael, A.
International Classes:
B60C19/00; B60C11/00; B60C19/08
Domestic Patent References:
| JP2006179013A | 2006-07-06 | |||
| JP2006205781A | 2006-08-10 | |||
| JPS51140641U | 1976-11-12 | |||
| JP2004069360A | 2004-03-04 | |||
| JP2004001716A | 2004-01-08 | |||
| JP2005075134A | 2005-03-24 |
Foreign References:
| DE801864C | 1951-01-25 | |||
| WO2004002758A1 | 2004-01-08 |
Attorney, Agent or Firm:
Kameda Tetsuaki