Title:
質量分析計
Document Type and Number:
Japanese Patent JP2009502017
Kind Code:
A
Abstract:
A mass spectrometer is disclosed comprising a mass selective ion trap 12 and a quadrupole rod set mass filter 14 arranged downstream of the mass selective ion trap 12. Ions are mass selectively ejected from the ion trap 12 in a substantially synchronised manner with the scanning of the mass filter 14 in order to increase the duty cycle of the mass filter 14.
Inventors:
Hoyce, John
Application Number:
JP2008522061A
Publication Date:
January 22, 2009
Filing Date:
July 21, 2006
Export Citation:
Assignee:
Micromass U.K. Limited
International Classes:
H01J49/42; G01N27/62; H01J49/06; H01J49/30
Foreign References:
| US20040031920A1 | 2004-02-19 | |||
| US20040227071A1 | 2004-11-18 | |||
| WO2005067000A2 | 2005-07-21 |
Attorney, Agent or Firm:
Ikeuchi, Sato & Partners