イオントラップ質量分析計を走査するための方法および装置 - MDS Analytical Technologies, A Business Unit of MDS Incorporated, Doing Business Through It's Sci-X Division

Title:

イオントラップ質量分析計を走査するための方法および装置

Document Type and Number:

Japanese Patent JP2009516900

Kind Code:

A

Abstract:

A mass spectrometer system having an ion trap and a downstream mass spectrometer is provided. A plurality of groups of ions are provided to the ion trap and a first mass-to-charge ratio is selected. The downstream mass spectrometer is configured to filter out one of (i) ions having a first unselected mass-to-charge ratio different from the first mass-to-charge ratio, and (ii) mass signals for ions having the first unselected mass-to-charge ratio different from the first mass-to-charge ratio. A first group of ions is ejected of the first mass-to-charge ratio from the ion trap to the downstream mass spectrometer.

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Inventors:

Hager, James W.

Application Number:

JP2008541553A

Publication Date:

April 23, 2009

Filing Date:

October 12, 2006

Export Citation:

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