試料分析素子 - Koninklijke Philips Electronics N.V.

Title:

試料分析素子

Document Type and Number:

Japanese Patent JP2009519464

Kind Code:

A

Abstract:

The invention relates to a device for analyzing one or more samples for the presence, amount or identity of one or more analytes in the samples, whereby the device comprises a focal microstructure for improving the signal/background ratio of an optical detection of the analytes.

More Like This:

JP5085594	Continuous monitoring method and continuous monitoring device for molten steel
JP7195525	Optical switch and observation device
JP2020516692	Methods for preparing and analyzing fluorescent compounds in plasma

Inventors:

Koles Nichenko, Alexei
Dirksen, Peter
Akshonov, Yuri

Application Number:

JP2008545238A

Publication Date:

May 14, 2009

Filing Date:

December 15, 2006

Export Citation:

Click for automatic bibliography generation Help

Assignee:

Koninklijke Philips Electronics N.V.

International Classes:

G01N21/64; G01N33/53; G01N33/544

Attorney, Agent or Firm:

Tadahiko Ito
Shinsuke Onuki
Tadashige Ito

Previous Patent: 電流測定回路及び方法

Next Patent: モジュールを初期化するためのシステムおよび方法