Title:
支払カード上で静電放電試験を実行する方法
Document Type and Number:
Japanese Patent JP2010517018
Kind Code:
A
Abstract:
Methods of performing electrostatic discharge testing on a transaction card are disclosed. A transaction card may be placed on an insulated surface. A grounding probe may be placed at a first location on the transaction card. A discharge probe may be charged to a known voltage level. The discharge probe may then be discharged at a second location on the transaction card. A discharge wave shape may be recorded from the ground probe, and one of a pass condition and a fail condition may be assigned based on at least the value of the known voltage level as compared to a reference voltage level. The first location and the second location may each be selected from a plurality of areas on the transaction card.
Inventors:
Top mustapha semal
Kurtech Edward
Russ Joanne
Fine Dun
Weiz Stan
Nelson Chris
Kurtech Edward
Russ Joanne
Fine Dun
Weiz Stan
Nelson Chris
Application Number:
JP2009546557A
Publication Date:
May 20, 2010
Filing Date:
January 18, 2008
Export Citation:
Assignee:
Visa Usa Inc.
International Classes:
G01R31/30; G06K17/00
Domestic Patent References:
| JPH09218241A | 1997-08-19 | |||
| JP2000081468A | 2000-03-21 | |||
| JP2001194404A | 2001-07-19 | |||
| JP2004264147A | 2004-09-24 | |||
| JPH0363798A | 1991-03-19 |
Attorney, Agent or Firm:
Sadao Kumakura
Fumiaki Otsuka
Takaki Nishijima
Hiroyuki Suda
Hiroshi Uesugi
Nobuyuki Taniguchi
Fumiaki Otsuka
Takaki Nishijima
Hiroyuki Suda
Hiroshi Uesugi
Nobuyuki Taniguchi
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