Title:
アクティブプローブ集積回路を用いた電子回路試験
Document Type and Number:
Japanese Patent JP2010523945
Kind Code:
A
Abstract:
A method and apparatus are provided for transmission/reception of signals between automatic test equipment (ATE) and a device under test (DUT). A probe card has a plurality of associated proximate active probe integrated circuits (APIC) connected to a plurality of probes. Each APIC interfaces with one or more test interface points on the DUT through probes. Each APIC receives and processes signals communicated between the ATE and the DUT. Low information content signals transmitted from the ATE are processed into high information content signals for transmission to the probe immediately adjacent the APIC, and high information content or time critical signals received by the APIC from the DUT are transmitted as low information content signals to the ATE. Because the APIC is immediately adjacent the probe there is minimum loss or distortion of the information in the signal from the DUT.
Inventors:
Slap Sky, Stephen
Moore, Bryan
Sera sambay, christopher, vie
Moore, Bryan
Sera sambay, christopher, vie
Application Number:
JP2010501338A
Publication Date:
July 15, 2010
Filing Date:
April 03, 2008
Export Citation:
Assignee:
Scanimetrics, Inc.
International Classes:
G01R31/26; G01R1/073; G01R31/28; H01L21/66
Domestic Patent References:
| JP2006319125A | 2006-11-24 | |||
| JPS63179267A | 1988-07-23 | |||
| JPS63110744A | 1988-05-16 | |||
| JPS63151041A | 1988-06-23 | |||
| JP2006138787A | 2006-06-01 | |||
| JP2006138705A | 2006-06-01 | |||
| JPS6181645A | 1986-04-25 |
Attorney, Agent or Firm:
Tadahiko Ito
Shinsuke Onuki
Tadashige Ito
Shinsuke Onuki
Tadashige Ito