Title:
特定の対象物品の識別のためのX線断層撮影検査システム
Document Type and Number:
Japanese Patent JP2012528332
Kind Code:
A
Abstract:
The present invention provides for an improved scanning process comprising an X-ray source arranged to generate X-rays from a plurality of X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, a second set of detectors arranged to detect X-rays transmitted through the scanning region, and processing means arranged to process outputs from the first and second sets of detectors to generate tomographic image data.
Inventors:
Morton, Edward, James
Application Number:
JP2012513219A
Publication Date:
November 12, 2012
Filing Date:
May 26, 2010
Export Citation:
Assignee:
Lapiscan Systems, Inc.
International Classes:
G01N23/04
Domestic Patent References:
| JP2009519457A | 2009-05-14 | |||
| JP2007516435A | 2007-06-21 |
Foreign References:
| WO2008018021A2 | 2008-02-14 | |||
| WO2009024817A1 | 2009-02-26 |
Attorney, Agent or Firm:
Kazuhiro Kitazawa
Shin Koizumi
Akiko Ichikawa
Kunihiko Wakabayashi
Ryuta Ushida
Takataka Aida
Shin Koizumi
Akiko Ichikawa
Kunihiko Wakabayashi
Ryuta Ushida
Takataka Aida