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Patent Searching and Data


Title:
X線を利用したオブジェクトの関心領域を解析するための方法及び装置
Document Type and Number:
Japanese Patent JP2014502518
Kind Code:
A
Abstract:
A method and a device for analyzing a region of interest in an object is proposed. The method comprises: (a) providing measurement data by a differential phase contrast X-ray imaging system, and (b) analyzing characteristics of the object in the region of interest. Therein, the measurement data comprise a 2-dimensional or 3-dimensional set of pixels wherein for each pixel the measurement data comprises three types of image data spatially aligned with each other, including (i) absorption representing image data A, (ii) differential phase contrast representing image data D, and (iii) coherence representing image data C. The analyzing step is based, for each pixel, on a combination of at least two of information comprised in the absorption representing image data A and information comprised in the differential phase contrast representing image data D and information comprised in the coherence representing image data C.

Inventors:
Carlsen, Ingvar-Kurt
Koehler, Thomas
Martin, Gerhard
Wrestle, Ewald
Rafael, Wiem Carr
Application Number:
JP2013542650A
Publication Date:
February 03, 2014
Filing Date:
December 05, 2011
Export Citation:
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Assignee:
KONINKLIJKE PHILIPS N.V.
International Classes:
A61B6/00; A61B6/03
Foreign References:
EP1731099A12006-12-13
US20050117699A12005-06-02
EP1879020A12008-01-16
EP1731099A12006-12-13
US20050117699A12005-06-02
Attorney, Agent or Firm:
Tadashige Ito
Tadahiko Ito
Shinsuke Onuki