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Title:
METHOD FOR DETECTING ABNORMALITY OF HIGH-PRESSURE PROBE DEVICE AND INNER SURFACE OF TIRE
Document Type and Number:
Japanese Patent JP2015157632
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To detect abnormalities in a tire testing device and on a surface of a tire.SOLUTION: A high-pressure probe having a conductive spring electrode is arranged adjacent to a part of a surface of a tire so that the conductive spring electrode is compressed to s surface of the tire. A relative motion is given between the high-pressure probe and the surface of the tire. Discharge is generated at a place of an abnormality on the surface of the tire between the high-pressure probe and a reference electrode. A device and a method are constituted so as to determine an exact azimuth angle and an exact position in a radial direction of the discharge on the tire. The conductive spring electrode can have sufficient length for securing contact with a given point on the surface of the tire at speed on the tire surface, which increases in a charge cycle to the high-pressure probe.

Inventors:
CHRISTIAN ALBERT BECCAVIN
FRANK E GRAMLING
DAVID ANDREW JUDD
BRADLEY D SCHOBER
Application Number:
JP2015099000A
Publication Date:
September 03, 2015
Filing Date:
May 14, 2015
Export Citation:
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Assignee:
COMPANY GENERAL DE ETABLISMAN MICHELIN
MICHELIN RECH TECH
International Classes:
B60C19/00; G01M17/02
Domestic Patent References:
JP2007003379A2007-01-11
JP2000289416A2000-10-17
JP2012514207A2012-06-21
Foreign References:
US20090078034A12009-03-26
WO2010076532A12010-07-08
Attorney, Agent or Firm:
Koichi Tsujii
Sadao Kumakura
Disciple Maru Ken
Ino Sato
Mitsuru Matsushita
Ichiro Kurasawa
Yasushi Yamamoto



 
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