LIGHTING DEVICE, OPTICAL INSPECTION DEVICE, AND OPTICAL MICROSCOPE

Title:

LIGHTING DEVICE, OPTICAL INSPECTION DEVICE, AND OPTICAL MICROSCOPE

Document Type and Number:

Japanese Patent JP2016042124

Kind Code:

A

Abstract:

PROBLEM TO BE SOLVED: To provide a lighting device capable of changing the beam angle distribution of illumination light while restraining loss in the quantity of light.SOLUTION: A lighting device comprises: a light source 2 that emits light; a multiple reflection element 4 that passes light through a light incident surface, reflects light therein multiples times, and then emits light from a light emission surface; and a plurality of optical elements 3 with different types that change the beam angle distribution of light. Any one of the plurality of optical elements 3 is placed in a replaceable manner on an optical path between the light source 2 and the multiple reflection element 4.SELECTED DRAWING: Figure 1

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Inventors:

KIMURA NOBUYUKI
TOGASHI MITSUHIRO
TAKADA MASAKI
NUMATA MITSUNORI

Application Number:

JP2014165414A

Publication Date:

March 31, 2016

Filing Date:

August 15, 2014

Export Citation:

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Assignee:

SAMSUNG ELECTRONICS CO LTD

International Classes:

G02B19/00; G01N21/84; G01N21/956; G02B21/06

Domestic Patent References:

JP2007159740A	2007-06-28
JP2001155993A	2001-06-08
JPH0894942A	1996-04-12
JPS5857385U	1983-04-18

Attorney, Agent or Firm:

Shinya Mitsuhiro

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