Title:
DRIED STATE MONITORING DEVICE FOR DRIED MATERIAL APPLIED TO FREEZER DRYER AND DRIED STATE MONITORING METHOD
Document Type and Number:
Japanese Patent JP2016125682
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a dried state monitoring device and a dried state monitoring method for a freezer drier capable of monitoring a dried state of dried material and completely eliminating dangerous characteristics in which the dried material is collapsed at the primary drying stage and the secondary drying stage without using any temperature sensors.SOLUTION: A sequencer PLC sets free a variation in vacuum Pdc at a dry warehouse at the primary drying stage and the secondary drying stage and calculates sublimation speed Qm [dehumidifying speed Qm' at the secondary drying stage], an average bottom component temperature Tb and an average sublimation surface temperature Ts in this order. As for calculation of the average bottom component temperature [Tb], not only latent heat of the dried material but also its sensible heat are considered. In addition, as the variation in vacuum Pdc at a dry warehouse and a cold trap degree of vacuum Pct, average values of a plurality of measured values detected in several seconds are applied. Further, at the primary drying stage and the secondary drying stage, specific dry warehouse wall temperatures are applied.SELECTED DRAWING: Figure 3
Inventors:
SAWADA HIROYUKI
TONEGAWA KAZUNORI
HOSOMI HIROSHI
TONEGAWA KAZUNORI
HOSOMI HIROSHI
Application Number:
JP2014264638A
Publication Date:
July 11, 2016
Filing Date:
December 26, 2014
Export Citation:
Assignee:
KYOWA SHINKU GIJUTSU
International Classes:
F26B25/00; F26B5/06
Domestic Patent References:
| JP2011252654A | 2011-12-15 | |||
| JPH05272867A | 1993-10-22 | |||
| JP2014202429A | 2014-10-27 | |||
| JP2011252654A | 2011-12-15 | |||
| JPH05272867A | 1993-10-22 |
Foreign References:
| WO2008034855A2 | 2008-03-27 | |||
| US6971187B1 | 2005-12-06 | |||
| WO2012108470A1 | 2012-08-16 | |||
| WO2008034855A2 | 2008-03-27 | |||
| US6971187B1 | 2005-12-06 |
Attorney, Agent or Firm:
Patent Business Corporation Takewa International Patent Office