Title:
CONNECTION INSPECTION DEVICE, DISPLAY DEVICE, CONNECTION INSPECTION SYSTEM AND CONNECTION INSPECTION METHOD OF DISPLAY DEVICE
Document Type and Number:
Japanese Patent JP2018063223
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a connection inspection device capable of inspecting the connection state of a conductive film for eliminating static without disassembling a product.SOLUTION: Disclosed connection inspection device is a device for inspecting the connection state of a conductive film for eliminating static disposed on the display device. The connection inspection device includes: a capacity coupling member which can be disposed being opposite to a conductive film with a distance therefrom to have a capacitance between the conductive film and the same; an AC signal generation part which is connected to the capacity coupling member to apply an AC signal to the capacity coupling member; a measurement part that measures a current or voltage between the AC signal generation part and the capacity coupling member and calculates the impedance; and a control unit that controls to calculate a resistance corresponding to the connection state of the conductive film based on the impedance calculated by the measurement part.SELECTED DRAWING: Figure 4
Inventors:
ISHIGUCHI KAZUHIRO
Application Number:
JP2016202724A
Publication Date:
April 19, 2018
Filing Date:
October 14, 2016
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G01R31/02; G01R27/02; G02F1/1368
Attorney, Agent or Firm:
Yoshitake Hidetoshi
Takahiro Arita
Takahiro Arita